| X射线分光晶体高阶衍射效率标定方法 |
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| 引用本文： | 杨国洪,李军,韦敏习,侯立飞,易涛,刘慎业.X射线分光晶体高阶衍射效率标定方法[J].红外与激光工程,2013,42(12):3325-3329. |
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| 作者姓名： | 杨国洪 李军 韦敏习 侯立飞 易涛 刘慎业 |
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| 作者单位： | 1.中国工程物理研究院 激光聚变研究中心,四川 绵阳 621909 |
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| 基金项目： | 国家自然科学基金（11105129） |
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| 摘 要： | 包含高阶衍射的X射线分光晶体积分衍射效率是X射线光谱准确辨识、X射线分光晶体性能研究、X射线光谱定量测量和高分辨X射线单能成像的基础。基于X射线衍射仪，选择适当厚度的镍滤片和控制X射线管电压，极大地抑制Cu K及韧致辐射，将X射线管光源Cu K单能化。以常用的X射线分光晶体季戊四醇PET（002）]为样品，对X射线分光晶体的高阶积分衍射效率进行标定其结果表明，在 Cu K能点，PET（002）晶体的积分衍射效率，二阶为一阶的14.36%，三阶为一阶的4.07%；Cu K1最大峰值比，二阶衍射为一阶的7.7%，三阶衍射为一阶的1.3%。基于X射线衍射仪的X射线分光晶体高阶衍射效率实验标定具有快速高效、方便灵活的特点。
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| 关 键 词： | 高阶衍射 X射线分光晶体 标定 X射线衍射仪 |
| 收稿时间： | 2013-04-03 |
Calibration of high order integral diffraction coefficient for X-ray plane crystal |
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| Affiliation: | 1.Research Center of Laser Fusion,China Academy of Engineering Physics,Mianyang 621909,China |
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| Abstract: | Integral diffraction coefficient including high diffraction order is the basis of identification of X-ray line, study of X-ray crystal characteristy, X-ray line intensity quantitative measurement and X-ray monochromatic image diagnosis. On the automatic X-ray diffractometer (XRD), based on the stability and precision control of and 2 goniometer, special plane crystal holder was made. Bremsstrahlung and Cu K line were attenuated for 5 orders by 40 m-thick pure Nickel filter in 15 kV and 20 mA supply to X-ray Cu tube, X-ray source of Cu taget is to be Cu K monochromatic source, transmission coefficient of Nickel filter is the criterion of Cu K monochromatic source. For X-ray Pentaerythritol(002) crystal,integral diffraction coefficient of 1-3 order diffraction on Cu K energy were calibrated. The results show that integral diffraction coefficient of the 2nd order and the 3rd order is only 14.36% and 4.07%, the Cu K1 intensity ratio of the 2nd order and the 3rd order is only 7.7% and 1.3% compared with the 1st order diffraction. This kind of calibration is efficient and convenient on XRD in common laboratory. |
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