| 非全视场条件下目标红外发射率的测试和计算 |
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| 引用本文： | 张彤,代晓东,陈春生,陈亮,代梦艳,刘海锋,任丽娜.非全视场条件下目标红外发射率的测试和计算[J].红外与激光工程,2015,44(1):1-5. |
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| 作者姓名： | 张彤 代晓东 陈春生 陈亮 代梦艳 刘海锋 任丽娜 |
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| 作者单位： | 1.国民核生化灾害防护国家重点实验室,北京102205 |
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| 摘 要： | 非全视场条件下测试物体辐射特性时,背景干扰是影响其准确性的最关键因素。根据普朗克辐射定律,通过方法研究和公式推导消除背景干扰,建立了非全视场条件下目标辐射特性的测试和计算方法。在此基础上,采用SR-5000N 光谱辐射计,在全视场和非全视场两种模式下开展铝板和碳纳米管(MWCNTs)复合涂层的红外光谱发射率测试实验,进一步验证该测试计算方法的有效性。结果表明,在非全视场条件下,尤其在测定高发射率目标时,该方法得到的样品红外发射率与全视场条件下的测试结果数据较为一致,可基本反映样品的真实光谱特性,有效解决了视场大小对目标辐射特性测试的局限,拓展其应用领域。
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| 关 键 词： | 光谱辐射 发射率 非全视场 测试 计算 |
| 收稿时间： | 2014-05-11 |
Measurement and calculation of infrared emissivity of target with non-full field of view |
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| Zhang Tong,Dai Xiaodong,Chen Chunsheng,Chen Liang,Dai Mengyan,Liu Haifeng,Ren Lina.Measurement and calculation of infrared emissivity of target with non-full field of view[J].Infrared and Laser Engineering,2015,44(1):1-5. |
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| Authors: | Zhang Tong Dai Xiaodong Chen Chunsheng Chen Liang Dai Mengyan Liu Haifeng Ren Lina |
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| Affiliation: | 1.State Key Laboratory of NBC Protection for Civilian,Beijing 102205,China |
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| Abstract: | Background disturbance is the main factor affecting the testing results of infrared radiation characteristics with non-full field of view (FOV). In this paper, according to Planck's radiation law, the methods of measuring and calculating radiation characteristics of targets with non-full FOV were established with formula derivation and disturbance offset. On this basis, the infrared emissivities of aluminum plate and carbon nanotubes(MWCNTs)composite coatings were tested comparatively by using a SR-5000N spectroradiometer with both full FOV and non-full FOV. The results show that with non-full FOV, the infrared emissivities obtained by this method are in accord with the results measured with full FOV and can reflect the true spectral characteristics of the samples. This progress can effectively solve the FOV limitations to the radiation characteristics test of the target and greatly expand its application field. |
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| Keywords: | spectral radiation emissivity non-full field of view measurement calculation |
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