| 用于识别面阵探测器相连缺陷元的新型光学滤光片 |
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| 引用本文： | 侯治锦,傅莉,鲁正雄,司俊杰,王巍,吕衍秋.用于识别面阵探测器相连缺陷元的新型光学滤光片[J].红外与激光工程,2018,47(7):720003-0720003(7). |
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| 作者姓名： | 侯治锦 傅莉 鲁正雄 司俊杰 王巍 吕衍秋 |
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| 作者单位： | 1.西北工业大学 电子信息学院,陕西 西安 710072; |
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| 基金项目： | 航空创新基金（2011D01406） |
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| 摘 要： | 相连缺陷元识别一直是面阵探测器研究难点。面阵探测器相连缺陷元的光电信号与正常元基本相同，因此采用现有面阵测试方法无法识别相连缺陷元。提出了一种新型光学滤光片来识别面阵探测器中的相连缺陷元。在提出的滤光片结构中，有两种不同透光率、且交错排列的阵列组成。采用该滤光片后，相连缺陷元的响应电压值是正常单元响应电压的50%，面阵探测器相连缺陷元可以被显著识别。
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| 关 键 词： | 面阵探测器 滤光片 相连缺陷元 识别 |
| 收稿时间： | 2018-02-12 |
Novel optical filter to identify the connected defective elements in focal plane array |
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| Affiliation: | 1.School of Electronics and Information,Northwestern Polytechnical University,Xi'an 710072,China;2.Luoyang Optoelectro Technology Development Center,Luoyang 471099,China;3.Aviation Key Laboratory of Science and Technology on Infrared Detector,Luoyang 471099,China |
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| Abstract: | The connected defective elements identifications has always been the research difficulty of focal plane array (FPA) detector. It is difficult to identify connected defective elements by FPA test-bench because the response voltage of connected defective elements is basically the same as that of normal elements. Novel optical filter for connected defective elements identifications was proposed. The presented filter had sorted elements of FPA detector into two kinds of detection units. The two kinds of detection units were designed in pairs and staggered arrangement closed to each other. The response voltage of the connected defective elements was 50% of that of normal elements. The connected defective elements were identified markedly by using the proposed filter. |
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