| Fault Diagnosis of Physical Defects Using Unknown Behavior Model |
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| 作者姓名： | Xiao-QingWen HideoTamamoto： KewalK.Saluja KozoKinoshita |
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| 作者单位： | [1]DepartmentofCSE,KyushuInstituteofTechnology,Iizuka,Fukuoka820-8502,Japan [2]DepartmentofInformationEngineering,AkitaUniversity,Akita010,Japan [3]DepartmentofECE,UniversityofWisconsin,Madison,WI53706,U.S.A. [4]FacultyofInformatics,OsakaGakuinUniversity,Suita,Osaka564-8511,Japan |
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| 摘 要： | A new fault model, called the X-fault model, is proposed for fault diagnosis of physical defects with unknown behaviors by using X symbols. An efficient X-fault simulation method and an efficient X-fault diagnostic reasoning method are presented. Fault diagnosis based on the X-fault model can improve the accuracy of failure analysis for a wide range of physical defects in complex and deep submicron integrated circuits.
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| 关 键 词： | 故障诊断 X故障模型 物理故障 集成电路 |
| 收稿时间： | 15 June 2004 |
Fault Diagnosis of Physical Defects Using Unknown Behavior Model |
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| Xiao-Qing?WenEmail author,Hideo?Tamamoto,Kewal?K.?Saluja,Kozo?Kinoshita.Fault Diagnosis of Physical Defects Using Unknown Behavior Model[J].Journal of Computer Science and Technology,2005,20(2):187-194. |
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| Authors: | Email author" target="_blank">Xiao-Qing?WenEmail author Hideo?Tamamoto Kewal?K?Saluja Kozo?Kinoshita |
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| Affiliation: | (1) Department of CSE, Kyushu Institute of Technology, Iizuka, Fukuoka, 820-8502, Japan;(2) Department of Information Engineering, Akita University, Akita 010, Japan;(3) Department of ECE, University of Wisconsin, Madison, WI, 53706, U.S.A.;(4) Faculty of Informatics, Osaka Gakuin University, Suita, Osaka 564-8511, Japan |
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| Abstract: | A new fault model, called the X-fault model, is proposed for fault diagnosis of physical defects with unknown behaviors by using X symbols. An efficient X-fault simulation method and an efficient X-fault diagnostic reasoning method are presented. Fault diagnosis based on the X-fault model can improve the accuracy of failure analysis for a wide range of physical defects in complex and deep submicron integrated circuits. |
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| Keywords: | fault diagnosis X-fault model fault simulation Byzantine behavior diagnostic resolution |
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