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Transient Electronics: Thermally Triggered Degradation of Transient Electronic Devices (Adv. Mater. 25/2015)
Authors:Chan Woo Park  Seung‐Kyun Kang  Hector Lopez Hernandez  Joshua A Kaitz  Dae Seung Wie  Jiho Shin  Olivia P Lee  Nancy R Sottos  Jeffrey S Moore  John A Rogers  Scott R White
Affiliation:1. Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana‐Champaign, Urbana, IL, USA;2. Department of Materials Science and Engineering, Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana‐Champaign, Urbana, IL, USA;3. Department of Mechanical Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana‐Champaign, Urbana, IL, USA;4. Department of Chemistry Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana‐Champaign, Urbana, IL, USA;5. Department of Chemical and Biomolecular Engineering, University of Illinois at Urbana‐Champaign, Urbana, IL, USA;6. Department of Materials Science and Engineering Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana‐Champaign, Urbana, IL, USA;7. Department of Materials Science and Engineering, Chemistry, Mechanical Science and Engineering Electrical and Computer Engineering, Beckman Institute for Advanced Science and Technology, and Frederick Seitz Materials, Research Laboratory, University of Illinois at Urbana‐Champaign, Urbana, IL, USA;8. Department of Aerospace Engineering Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana‐Champaign, Urbana, IL, USA
Abstract:
Keywords:heat triggers  remote triggering  transient electronics  triggered degradation  wax encapsulation
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