材料光谱发射率精密测量装置

采用光栅单色仪方案研究了光谱发射率的测量装置,以加热方式将材料样品温度控制在473～1 000 K,可在2～15 μm测量样品的定向光谱发射率.应用锁相放大技术和统计测量方法提高样品与黑体的辐射亮度比较测量的信噪比.对测量装置性能进行了评价实验,并提出一种双黑体法评价光谱辐射测量系统的线性度.测量了氧化不锈钢样品和高发射率涂料的光谱发射率并进行了不确定度评定,合成标准不确定度小于0.04.     

辐射温度计的等效波长及其应用

经典的有效波长和亮度温度理论仅适用于高温测量等可忽略环境辐射影响的场合.考虑了环境辐射影响,基于中值定理推导并定义等效波长,用于简化测温数学模型.用有效辐射和等效波长概念定义单色和带通辐射温度计的测量结果--亮度温度.阐述了等效波长的计算方法.利用矩形带通光谱响应近似模型,解决了难以测定光谱响应度的宽带辐射温度计的等效波长计算问题.针对(8～14)μm宽带辐射温度计计算了等效波长,可简化计算和不确定度评定.在应用实例中分析了黑体辐射源发射率对宽带辐射温度计校准的影响和用黑体辐射源直接校准发射率设定值为0.95的宽带辐射温度计的方法误差.     

高温下材料发射率测量的新方法

本文提出了一种用激光加热、采用半球形镜反射空腔测量高温下材料发射率的新方案,介绍了测量装置、测量原理及有关的空腔理论分析,进行了误差评估并给出典型的测量结果。理论分析和测试结果表明,材料表面的法向光谱发射率测量总不确定度不超过0.05。     

高光谱热红外温度发射率分离的相关-小波法

针对高光谱数据热红外温度和发射率反演为病态方程且易受大气下行辐射噪声干扰的问题,提出了基于相关性和小波滤波相结合的高光谱热红外温度发射率分离方法,即相关-小波法。在相关性方法的基础上,引入小波降噪的思想,生成一系列温度梯度,在不同温度梯度下,带入大气下行辐射计算得到的发射率曲线和不考虑大气下行辐射直接小波滤波得到的发射率曲线计算相关性,取相关性最大时的温度为反演温度。同时在反演发射率时利用相关性计算不同尺度的小波信号所占的比例合成发射率曲线。模拟数据结果显示:相关-小波法在温度梯度为0.01K时,温度反演平均误差为0.05K,并且相关-小波法在温度反演精度和发射率反演精度上都优于相关性方法和小波法。由此表明,该算法可一定程度上抑制大气校正不准确引入的误差,有效提高热红外温度和发射率的反演精度。     

辐射光谱测温法测量误差实验研究

针对辐射光谱测温法测量误差问题,利用黑体炉搭建了标准辐射测温实验平台,选用200~1 100nm波段光谱仪对标准高温源进行辐射光谱测量。讨论了高温源辐射光谱特征,并基于辐射光谱测温法获得了温度测量值,该值与标准参考值的相对偏差小于4%,同时分析了测量重复性引起的标准不确定度分量,为辐射测温法应用提供参考。     

多光谱测温法的实验研究——发射率模型的自动判别

在多光谱辐射温度计的数据处理中需要假设发射率与波长的数学模型,本文提出一种自动判别发射率与波长数学模型的新方法,并通过实验证明了此方法的确是一种解决目标真温及光谱发射率等测量问题行之有效的方法。     

单吸收罩发射率测量补偿方法

针对表面辐射率的在线长时间测量问题,在前置探测罩的双罩发射率测量方法基础上,研究了一种单吸收罩测量发射率的方法.建立了探头的有效发射率模型,对吸收罩表面发射率和自身辐射能导致的误差进行了分析,归纳出误差参数及误差补偿方法.用实验数据拟合获得了误差参数并应用于测量方程,同时改进了探测罩外形设计,分析比较了误差补偿前后发射率偏差.该方法拓展了测量范围和温度适应范围,实现了发射率低至0.2,温度低至100℃的条件下的有效测量.     

超临界水蒸气氧化的12Cr钢发射率试验研究

对于大型旋转机械的强度设计和寿命评估而言,其表面温度是一个不可或缺的重要参数。使用红外辐射测温技术可以实现对旋转机械表面的非接触温度测量。由于长期工作在高参数的水蒸气环境中,汽轮机转子表面的氧化膜对红外辐射测温有重要影响。为研究转子钢的氧化对红外辐射测温的影响,建立金属试样在超临界水蒸气(24 MPa、400℃)环境中进行氧化及试样带宽发射率测量的试验台架,实现用于超(超)临界汽轮机转子的材料——精炼12Cr钢试样在超临界水蒸气环境中的氧化,并使用单色测温仪测量氧化后精炼12Cr钢试样的发射率。结果表明,随着氧化的深入,精炼12Cr钢试样发射率的分散性及其随温度变化的速度逐渐降低,认为可以选择发射率的某个测量值(如0.88)作为设定值,使用单色测温仪对金属目标温度变化进行监测。为实现红外测温技术在汽轮机转子表面温度检测中的应用奠定基础。     

成像光谱仪辐射定标影响量的测量链与不确定度

分析了成像光谱仪遥感观测数据中包含的地物光谱特征、仪器参数和大气传输特性等的信息结构。研究了成像光谱仪辐射定标的物理过程和测量链,应用1993年国际标准化组织(ISO)颁布的《测量不确定度表示指南》,分析了辐射定标11项影响量的测量不确定度和合成标准不确定度。遥感辐射定标的绝对精度就是不确定度。辐射定标需要辐射标准、积分球光源、光谱辐射计以及遥感器上设置星上定标装置等专用设备和技术,并经过多级测量链的测试过程才能完成。光谱辐照度标准的不确定度在3%~5%,辐射定标中其它影响量的测量不确定度限制在1%~2%,成像光谱仪辐射定标的绝对精度才能达到5%~8%,这需要相当好的仪器设备和光辐射测试技术。     

国产X射线衍射仪低温测试的温度准确性验证

采用冷压陶瓷技术开发具有一级相变、居里温度（TC）低于室温的（Ba0.91La0.09）Ti1-0.09/4O3（BL9T）单相陶瓷。该陶瓷用于国产X射线衍射仪低温粉末XRD测量时的温度准确性验证。考虑晶体结构随温度的弛豫后,由介电温谱和变温拉曼光谱技术综合确定的砭最高为-62℃,以确保BL9T在％以上始终处于立方结构。以BL9T的单胞体积（圪）与温度的线性膨胀关系为依据,验证了在低于室温进行粉末×RD测量时变温样品室具有较高的温度准确性。在-30℃到-60℃温度范围内,变温样品室内热电偶的监控温度（瓦）与陶瓷粉末样品表面的实际温度（t）的偏差非常小（〈2℃）。     

金属切削刀具和工件的波段发射率标定

使用红外热像仪对切削加工中常见的工件材料碳钢和模具钢、常用的刀具材料硬质合金和涂层硬质合金在300～900 ℃进行表面发射率的标定,并考虑加热箱内环境热辐射对试样的作用,分析温度、表面结构、几何形状对试样表面发射率的影响。结果表明钢材表面发射率随温度升高而增大,但模具钢在较宽的温度范围内保持较小的表面发射率;试样表面平整性影响表面发射率;涂层刀具的表面发射率在比较宽的温度范围内一直稳定在相当低的值。     

红外热像仪精确测温技术

为实现红外热像仪对温度的精确测量,根据热辐射理论和红外热像仪的测温原理,推导了计算被测物体表面真实温度的通用计算公式;讨论了发射率对测温精度的影响,分析了用红外热像仪进行精确测温的条件,探讨了环境、大气和热像仪本身对测量精度的影响,并绘制了各种因素对测温精度影响的理论曲线。结果表明:发射率为0.7时,真实温度为50℃,发射率偏离0.1时,对于3~5 μm热像仪来说,测温结果偏离真实温度0.76~0.89 ℃; 对于8~14 μm热像仪来说,测温结果偏离真实温度1.56~1.87℃。本研究结果对提高热像仪测量温度和表面发射率的准确性,减小不必要的测量误差具有实际意义。     

Methodology for spectral emissivity measurement by means of single color pyrometer

The application of non-intrusive optical devices, such as infrared pyrometers able to measure the temperature of surfaces, makes possible the evaluation of emissivity curve of the tested materials at different temperature values. In this paper the authors propose a methodology for the spectral emissivity measurement by means of a single color pyrometer providing a semi-empirical formula, obtained experimentally at CIRA’s laboratory. The semi-empirical formula allows to know the actual emissivity value of the sample’s surface for whatever emissivity value set up on the pyrometer. The agreement between the experimental emissivity and the emissivity predicted by semi-empirical formula was verified.     

Measurement technology for material emissivity under high temperature dynamic heating conditions

The thermal dissipation of radiation is main heat shield mechanism for non-ablative thermal protection materials on hypersonic vehicles withstanding high temperature dynamic heating cycle during endo-atmospheric ascent, cruise and reentry. Therefore, it is necessary to know the thermal radiative properties of the material under the simulated high temperature dynamic heating conditions on the ground. The emissivity depends on the surface state and its temperature. A new simultaneous measurement technology of emissivity and varying surface temperature is proposed under high temperature dynamic heating conditions. This new technology solved synchronous measurement problems by utilizing spectral signal of Fourier transform infrared (FTIR) spectroscopy. The calibration of different temperature ranges, the background disturbances, the influences on temperature measurement by wavelength range and its corresponding fluctuations of measurement signal, were thoroughly investigated. The measured results of steel and graphite as reference materials proved the effectiveness of this simultaneous measurement technology and showed great potential in engineering applications under high temperature dynamic heating conditions.     

Simultaneous measurement of emissivity and temperature of silicon wafers using a polarization technique

The emissivity of a silicon wafer under various conditions was theoretically and experimentally investigated. A quantitative relationship between the ratio of p-polarized to s-polarized radiances, and the polarized emissivity was obtained, irrespective of the emissivity change of silicon wafers due to oxide film thickness under wide variations of impurity concentration. We propose a new radiation thermometry method that can measure both the temperature and the spectral polarized emissivity of a silicon wafer, and we estimate the uncertainty of these measurements. Currently, the expanded uncertainty of the temperature measurement is estimated to be 3.52 K (2k) and 3.80 (2k) for p-polarization and s-polarization, respectively, at temperatures above 900 K.     

Experimental mathematical model as a generalization of sensitivity analysis of high temperature spectral emissivity measurement method

The development of an experimental mathematical model describing temperature state of the sample during high temperature spectral emissivity measurement is introduced. Dimensional analysis of the measurement process gives the physical dimensionless quantities and sensitivity analysis of the measurement process provides the large set of performed model experiments. Evaluated experimental mathematical models are presented including their accordance with model experiments. Established equations are generalization of sensitivity analysis of high temperature spectral emissivity measurement method and can be used for computation of spectral emissivity total uncertainty.     

大型空间反射镜发射率测量及误差分析

为了准确测定空间相机主镜毛坯件的表面发射率以便定量分析相机热控效果,本文在分析热像仪测温原理的基础上,利用现有测量条件,提出一种利用两种已知发射率材料作为参考的发射率测量方法.根据测量试验,得到主镜表面发射率为0.565.为定量反映各因素对测量精度的影响,对测量公式进行了误差分析.分析结果表明,与被测件表面发射率接近的材料的热像仪测温误差及发射率标称误差对测量精度有较大影响,同时得到本次试验因热像仪测温误差及参考材料发射率标称误差带来的测量误差为±0.028.最后,结合相机热平衡试验的数据对测量结果进行了验证,结果表明测量得到的主反射镜的发射率基本反映了热平衡试验的主镜表面状态,证明本文的方法对主反射镜发射率的测量是适用有效的.     

Dual-band pyrometry for emissivity and temperature measurements of gray surfaces at ambient temperature: The effect of pyrometer and background temperature uncertainties

A dual-band pyrometry model for target temperature (240–360 K) and emissivity measurement was developed, in which two pyrometers with different spectral bands are surrounded by an enclosure at a given background temperature. Nine equal-power spectral bands were selected for the pyrometers from wavelengths between 8 and 14 μm. The Monte Carlo method was used to compute the dual-band measurement uncertainties of temperature and emissivity caused by the propagation of the uncertainties associated with the temperatures of the two pyrometers and the temperature of the background. It was found that the rate of decrease of dual-band measurement uncertainties with increasing difference between target and background temperatures decreases with increasing target temperature. Considering the uncertainty of the background temperature, it was found that dual-band measurement uncertainties are virtually not affected by the background temperature uncertainty when the background temperature is lower than the target temperature, and dual-band measurement uncertainties increase significantly with increasing background temperature uncertainty when the background temperature is higher than the target temperature.     

Application of multispectral radiation thermometry in temperature measurement of thermal barrier coated surfaces

Ceramics coatings are materials widely used in gas turbines to provide thermal shielding of superalloy materials against excessive turbine temperatures. However, measurement of their surface temperatures using conventional radiation thermometers, more so in the presence of high ambient radiation and low emissivity is quite challenging. A multispectral method employing curve fitting technique to measure the temperature of such targets in the range of 800–1200 K and ambient temperature of 1273 K is implemented in this paper through simulation. Several simulated experiments were carried out to identify emissivity models best suited for multispectral radiation thermometry applicable to ceramic coatings. The best emissivity model applicable to yttria-stabilized zirconia of coating thickness of 330 μm in the wavelength range of 3.5–3.9 μm was found to predict temperature with an error of less than 1.5% in the presence and absence of background noise.