共查询到17条相似文献,搜索用时 328 毫秒
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镀钽TiNi形状记忆合金表面的XPS分析 总被引:2,自引:0,他引:2
采用多弧离子镀的方法在Ti 50.6%(原子分数)Ni形状记忆合金表面沉积了钽镀层。通过X射线光电子能谱(XPS)剖面分析发现TiNi合金表面钽镀层厚度均匀,并且在镀层与基体之间形成一薄层过渡层。将镀钽TiNi合金曝露于空气中后,通过XPS的全谱和高分辨谱图对其表面的成分和价态分析发现,镀钽层表面由于钽在空气中自然氧化形成了一层很薄的钽的氧化膜,最表面为高价钽的氧化物(Ta2O5),次表面为低价钽氧化物的混合物TaO2、TaO和TaOx(x<1)。 相似文献
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钽铝合金薄膜工艺的正交试验 总被引:1,自引:0,他引:1
钽铝合金薄膜由于具有优良的热稳定性而适合制作薄膜功率型电阻网络。薄膜制备工艺条件对薄膜的电性能有很大的影响。该论文介绍了一种正交试验方法以获取最佳工艺条件。根据正交试验的算法,用FORTRAN语言编写了优化程序,在微机上进行了数据处理。用所选取的最佳工艺条件制出了性能优良的钽铝薄膜中功率衰减器,从而证实了正交试验法是行之有效的。 相似文献
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本工作以单晶硅为衬底,乙醇钽和水分别为钽源和氧源,研究原子层沉积技术制备氧化钽薄膜的工艺,考察了乙醇钽温度、衬底温度、脉冲时间等工艺条件对氧化钽薄膜的生长速率、粗糙度和表面形貌等特性的影响.通过椭偏仪、原子力显微镜、扫描电子显微镜以及高分辨X射线光电子能谱测试分析表明,制备获得的氧化钽薄膜表面光滑,粗糙度小于1 nm,薄膜生长速率受工艺参数的影响较大,其中在乙醇钽源瓶温度170℃、脉冲时间0.1 s以及衬底温度200℃时,氧化钽的生长速率为0.253?/cycle.本工作基于原子层沉积高性能氧化钽薄膜的工艺研究,将对氧化钽薄膜在介质材料、存储介质以及光学涂层等领域的应用奠定基础. 相似文献
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提纯和后续加工各种钽萃取方法提供了纯度为99.5~99.8%的钽粉,表1列举了用不同方法还原的钽原料化学成分。杂质的存在使得钽不能直接投入使用,因为与杂质的沸点相比,钽的熔点是非常高的。可以通过真空或者惰气内加热来提纯芝,并且必须在还原过程中精 相似文献
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世界钽粉生产工艺的发展 总被引:11,自引:1,他引:10
论述了国内外电容器级高压钽粉、中压钽粉、高比容钽粉的生产工艺发展过程。在钽粉生产工艺发展过程中,各种先进的装备被应用,各钽粉生产厂家围绕着钽粉比容的提高,杂质含量的降低,物理性能的优化等综合性能的改善,不断开发出新工艺、新技术,使钽粉适应并推动着钽电容器的发展。 相似文献
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An experimental method has been developed for coating long mild steel tubes with tantalum as a protection against acid corrosion. The tantalum is deposited onto the inner surface of the tubes by the hydrogen reduction of tantalum pentachloride at atmospheric pressure. Smooth “orange peel” pore-free coatings can be produced, giving reliable protection. 相似文献
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引述了Ta电容器与Al电容器、多层陶瓷电容器相比突出的性能与应用特征,分析了Ta电容器片式化、小型化促进电容器级Ta粉高比容化发展的新趋势,叙述了航空、航天和军工领域对高压电容器高可靠性能的需求,以及对中高压Ta粉向更高电压、更低SER方向发展的引领,回顾了电容器用高比容Ta粉、中高压Ta粉发展应用进程,介绍了经典氟钽酸钾(K2TaF7)金属Na还原法、电子束熔炼法、球磨片式化法生产的高比容Ta粉、高压Ta粉、中压(片状)Ta粉的性能、产品品级及关键技术,分析了30~80kμFV/gTa粉耐压性能影响因素,介绍了Ta粉高比容化、高压化新技术、装置、产品形貌、性能及优缺点,在此基础上提出了电容器级Ta粉高比容化、高压化创新进步的思路。 相似文献
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Carlos Mas-Moruno Beatriz Garrido Daniel Rodriguez Elisa Ruperez F. Javier Gil 《Journal of materials science. Materials in medicine》2015,26(2):109
The use of tantalum as biomaterial for orthopedic applications is gaining considerable attention in the clinical practice because it presents an excellent chemical stability, body fluid resistance, biocompatibility, and it is more osteoconductive than titanium or cobalt-chromium alloys. Nonetheless, metallic biomaterials are commonly bioinert and may not provide fast and long-lasting interactions with surrounding tissues. The use of short cell adhesive peptides derived from the extracellular matrix has shown to improve cell adhesion and accelerate the implant’s biointegration in vivo. However, this strategy has been rarely applied to tantalum materials. In this work, we have studied two immobilization strategies (physical adsorption and covalent binding via silanization) to functionalize tantalum surfaces with a cell adhesive RGD peptide. Surfaces were used untreated or activated with either HNO3 or UV/ozone treatments. The process of biofunctionalization was characterized by means of physicochemical and biological methods. Physisorption of the RGD peptide on control and HNO3-treated tantalum surfaces significantly enhanced the attachment and spreading of osteoblast-like cells; however, no effect on cell adhesion was observed in ozone-treated samples. This effect was attributed to the inefficient binding of the peptide on these highly hydrophilic surfaces, as evidenced by contact angle measurements and X-ray photoelectron spectroscopy. In contrast, activation of tantalum with UV/ozone proved to be the most efficient method to support silanization and subsequent peptide attachment, displaying the highest values of cell adhesion. This study demonstrates that both physical adsorption and silanization are feasible methods to immobilize peptides onto tantalum-based materials, providing them with superior bioactivity. 相似文献
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S. Duenas E. Casta′n J. Barbolla R. R. Kola P. A. Sullivan 《Journal of Materials Science: Materials in Electronics》1999,10(5-6):379-384
In this work we report on very thin (10 to 100 nm) tantalum oxide fabricated by anodic oxidation of tantalum nitride and tantalum silicide to be used as the dielectric of high density MIM and MIS capacitors. These films exhibit greatly improved leakage currents, breakdown voltage and very low defect density, thus allowing the fabrication of large area capacitors. Several counter and bottom electrodes have been used and compared. The effects of the different processing conditions (top-electrode metals, annealing conditions, bottom electrode stoichiometry) on the capacitor performances are extensively discussed throughout this work. The nitrogen content of tantalum nitride films seems to have an important influence on the insulator quality. Leakage currents in the insulator have been carefully studied in order to determine the nature and physical origin of the dominant conduction mechanisms in the insulator. The electrical behaviour of the resulting high-density MIM capacitors has been extensively characterized. Finally, we describe a new method to fabricate MIS diodes with anodic tantalum oxide as insulator. 相似文献