篮球技术多媒体CAI课件在体育教学中的研究与应用价值分析

随着科学技术水平的不断提高，在学校教育中应用多媒体CAI的现象越来越普遍，并且受到了广大师生的喜爱。在篮球技术教学中，多媒体CAI课件得到了广泛的应用，并且发挥了非常重要的作用，促进了学生篮球技术水平的提高，实现了预期的教学效果。     

“电子技术”课程CAI教学模式的探索

本文提出了注重教学环节的设计、教学内容的演绎过程、体现教学规律及学生的认知规律、展现教师的教学个性和教学特色以及在现代化教学手段和教育技术中融入传统的教学方法,从而为学生建立合适的教学情景、注重引导学生通过发现和探究的途径获取知识的"电子技术"课程CAI教学模式,使现代化教学手段在实践先进教学思想、传授教学内容及提高教学效果中起到应有的作用.     

电工技术课程CAI自习自检系统的研制

在传统的教学方式中,教师是教学的主体,学生的学习活动是被动的,教师无法做到根据每个学生的特点和要求组织教学。CAI软件可以利用计算机的智能化特点,转化教学过程中的主被动关系,学生通过与计算机的交互活动,可以积极主动地进行探索式的自主化和个别化的学习,这些都有利于学生创造思维的开发和学习能力的培养。因此,把CAI引入课程建设,是提高教学质量的有力措施和有效途径。而且“电工技术”这门必修的技术基础课,普遍存在内容多、学时少和学生多、教师少的矛盾。为处理好这两对矛盾。尚需借助CAI这一现代化的教学手段。     

浅谈计算机技术在教学领域的应用

计算机技术在教学领域中的应用是本世纪后半期教育发展的重大成就之一，也是当今教育现代化的一个重要标志。而计算机辅助教学（Computer Assisted Instruction）作为一种现代化的教学技术，越来越受到大家喜爱和重视。但在具体课堂教学中，还存在着一些不尽人意的地方。针对这个问题，本文将对CAI 做个简单基础的了解以及谈一谈个人在应用计算机辅助教学过程中的一些体会。     

CAI大学语文课件的选题与制作

将CAI技术引入到大学语文教学中,可以提高教师的教学水平和学生的学习兴趣。针对CAI语文教学,该课题论述了CAI大学语文课件的文本、动画等教学素材的采集及制作技术,课件的开发平台是Authorwares7.0,其中还会用到动画素材编辑软件Flash MX,图像处理软件Photoshop 7.0等多种软件,与硬件相结合制作出高效实用的CAI课件辅助教学。     

中职电子技术应用数字化课程资源开发与应用分析

<正>在数字化技术快速发展的背景下，中职应当随着数字化技术发展机遇，积极地利用数字化技术，开发电子技术应用数字化课程资源，提高课程建设水平，以促使职业教育走上现代化发展之路，给予学生良好的学习体验。伴随着教育深化改革的推进，我国强调实施教育数字化战略，以促进教育高质量发展。数字化课程资源具有交互性、协作性、智能性特征，有助于加强师生互动，激发学生学习兴趣，保证学生学习质量。在教育数字化战略背景下，有必要将开发数字化课程资源作为教育数字化建设的切入点，助力教育事业发展。对于中职院校来讲，     

人机对话式视频系统

本文介绍了国外先进的交互式视频技术,将对促进我国计算机辅助教学(CAI)和电教系统的现代化发展有引介作用。     

软件工程原理在多媒体课件开发中的应用

随着多媒体技术的快速发展,CAI课件在现代教学中占据越来越重要的位置,课件的开发也逐渐受到重视。课件开发遵循软件开发一般规律,将软件工程原理应用于多媒体课件开发可以有效提高课件开发效率,促进多媒体课件开发的专业化和标准化,制作出更多高效优质的多媒体课件。     

一种新兴教学手段的尝试姚——“电磁场”、“电磁场与电磁波”课程中计算机辅助教学系统的研究

(一)前言随着计算机的发展与应用,近二十年来发展起来一门新兴的综合性边缘学科,即计算机辅助教学,简称CAI(Computer Assisted Instruction),它是现代教育技术的一个重要领域,国外一些先进国家对此非常重视,CAI的发展已有相当大的规模,国内计算机辅助教学是近几年才开始的,大部分是从事语言方面的计算机辅助教学的研究,但对工程技术类的课程如何利用CAI手段来提高其教学效果方面的研究还较少。为了促进这项工作的深入开展,     

CAI软件在高频电子技术中的开发及其应用

在对高频电子技术这一基础课程进行教学工作时运用到CAI软件实现课件开发与应用,使教师在教学工作上更加的深化,从而有利于提高学生对高频电子技术内涵与实质的掌握。因此,本文主要基于CAI软件对高频电子技术这一基础课程的课件开发与运用进行浅论,以期能为我国相关教学工作提供一份参考资料。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.