基于最小误差算法的BGA图像分割

针对BGA封装元器件焊点的空洞缺陷难以用常规方法检测的问题,本文利用数字图像处理理论中的图像分割技术对基于X射线所采集的图像检测BGA元器件焊点在PCB板上所存在的空洞缺陷。针对一些经典分割算法的优缺点,本文提出一种首先将X射线图像根据其灰度特征,投影到不同的小区域然后在不同的小区域内使用最小误差算法相结合的方法,实现了焊点图像的分割检测,并给出了相关实验结果。实验结果表明本文的方法在分割检测BGA图像的空洞缺陷上是有效的。     

BGA无铅焊点零空洞缺陷控制研究

在无铅BGA封装工艺过程中,通过不同组分的BGA焊球合金与焊膏合金组合焊接、焊膏助焊剂活性剂不同配比及其不同再流焊接条件等实验,对焊料合金和助焊剂配比、再流焊接峰值温度、再流保温时间等参数变化,以降低BGA焊点空洞缺陷进行了研究。结果表明选用相同或相似的BGA焊球和焊膏合金组合焊接、选用活性强的焊膏、选择焊接保温时间较长均有助于降低BGA焊点空洞缺陷产生的几率和空洞面积,BGA焊点最佳再流焊接峰值温度为240℃,当峰值温度设置为250℃时,BGA焊点产生空洞缺陷几率会比240℃高出25%～30%。     

BGA器件及其焊接技术

BGA的出现促进了SMT的发展和革新,并成为高密度、高性能、多功能和高I／O数封装的最佳选择。结合实际工作中的一些体会和经验,详细论述了BGA器件的种类与特性;BGA保存及使用环境的温度、湿度及烘烤时间要求;BGA回流焊接的焊膏印刷、器件贴装、焊接温度曲线设置、单个BGA焊接及返修的热风回流焊接技术;BGA器件焊接质量2D—X射线检测、5D—x射线断层扫描检测及BGA焊点焊接接收标准。     

基于微焦点X射线BGA焊点缺陷检测

BGA封装是是一种高集成的封装方式,其焊点缺陷会影响封装器件性能。为克服全局阈值分割、边缘检测方法对BGA焊点缺陷检测错误率较高的问题,本文提出采用Otsu阈值分割、轮廓提取、边界跟踪方法提取焊点轮廓,并用灰度形态学顶帽操作、直方图拉伸、Blob分析提取焊点气泡轮廓。通过分析BGA焊点缺陷类型及特征,提出基于焊点轮廓、气泡轮廓特征参数的焊点检测与分类算法。试验研究表明该算法较全局阈值、Canny算子焊点缺陷检测的准确率高,能够准确的完成焊点缺陷分类。     

BGA焊点可靠性工艺研究

伴随高密度电子组装技术的发展,BGA(Ball Grid Array)成为高密度、高性能、多功能及高I/O数封装的最佳选择。文章分析了影响BGA焊点可靠性的关键因素,特别提出了减少焊点空洞缺陷和提高剪切强度的主要措施,并通过试验优化出各工艺参数。结果表明:运用优化的工艺参数制作的BGA焊点,焊接空洞以及芯片剪切强度有了明显改善,其中对BGA焊接样品进行150℃、1000h的高温贮存后,焊点的剪切强度完全满足GJB548B-2005的要求。     

堆叠结构BGA焊接可靠性评价方法

设计了基于实时监测菊花链拓扑结构动态电阻的叠层球栅阵列封装(BGA)焊接可靠性评价方法,使用该方法研究叠层器件BGA焊接互连结构的环境可靠性.以基于硅通孔(TSV)技术的BGA互连的硅基双层器件为例,首先通过有限元仿真确定叠层器件各层焊点在-55～125℃条件下的应变和应力,并根据应变和应力将每一叠层焊点划分为敏感焊点和可靠焊点;然后将敏感焊点通过器件键合焊盘、键合丝、TSV、垂直过孔、可靠焊点和PCB布线相连接形成菊花链.由于敏感焊点是菊花链的薄弱环节,可以通过监测菊花链电阻变化来研究叠层器件的环境可靠性,并以此为基础设计了堆叠结构BGA产品焊接可靠性试验系统.该方法简单高效,能快速解决常规失效分析方法无法检测的BGA虚焊接、微小缺陷等问题.     

BGA技术与质量控制

BGA(Ball Grid Array球栅阵列封装)是一项已经进入实用化阶段的高密度组装技术。本文将就BGA器件焊点的质量控制作一介绍。BGA检测中存在的问题 目前,对以中等规模到大规模采用BGA器件进行电子组装的厂商,主要是采用电子测试的方式来筛选BGA器件的焊接缺陷。在BGA器件装配期间     

混装条件下BGA焊点空洞问题

阐述了在实际工作中遇到的混装BGA焊点空洞问题;介绍了常用的混装BGA焊接方法并对其利弊进行了分析;介绍了BGA焊点空洞的检验标准;通过对无铅BGA焊点与有铅BGA焊点的对比,分析了BGA焊点空洞的成因;从管理措施、工艺手段和操作经验等多个角度总结了控制BGA焊点空洞形成的诸多要素.     

国外工艺文献导读

20 0 30 4 0 1　在线BGA焊点开路检测—GlenLeinbach .CircuitsAssembly,2 0 0 3 ,1 4 (3) :36～ 40 (英文)随着BGA器件的广泛应用 ,并逐步替代传统的封装形式如QFP、SOIC、TSOP、SSOP和PLCC等。然而所有的面阵列封装都存在一个普遍的问题 ,焊点不在封装的边缘 ,而隐藏在器件体的下面 ,这就给PCB质量检验和缺陷检测带来许多困难。本文从AXI与BGA、BGA焊点、BGA焊点开路、翘曲等方面介绍了一种探测BGA焊点开路的新方法 ,该方法采用AXI,对再流焊后的BGA焊球尺寸进行比较 ,从而探测出BGA开路缺陷。2 0 0 30 4 0 2　无铅…     

含有BGA、CSP的组装件的检测技术

本文阐述了BGA、CSP等隐藏在封装器件下面的焊点的检测设备和检测方法。     

用真空再流焊实现BGA的无铅无空洞焊接

BGA焊接后常常会在焊点中形成很多的空洞,特别是对于BGA的无铅焊接,由于焊接温度高,氧化严重,以及焊料的特殊性能决定了BGA的无铅焊接更容易形成空洞.空洞的产生不仅影响焊点的导热、导电性能,也会影响焊点的强度,从而对BGA工作的长期可靠性产生影响.分析了空洞产生的机理,以及用真空再流焊接实现BGA无铅、无空洞焊接的原理和工艺过程.指出真空再流焊接工艺在解决BGA的无铅、无空洞化焊接问题上确实是一项行之有效的方法.     

BGA植球工艺技术

BGA(ball grid array)球栅阵列封装技术是20世纪90年代以后发展起来的一种先进的高性能封装技术,是一种用于多引脚器件与电路的封装技术。BGA最大的特点就是采用焊球作为引脚,这不仅提高了封装密度,也提高了封装性能。而植球工艺作为BGA封装中的关键工艺将会直接影响器件与电路的性能及可靠性。影响BGA植球工艺的主要因素有:植球材料、植球工艺及回流焊工艺。文章通过对BGA植球的基板、焊膏/助焊剂、焊球等材料的详细介绍,详实阐述了植球工艺过程,并对BGA后处理的回流焊工艺进行了详细描述,提供了BGA植球工艺的检测方法,对植球工艺的可靠性进行了探讨。     

SMT工艺中BGA焊接不良原因分析

介绍了SMT工艺中最常见的一种BGA焊接不良的原因分析。以一款客诉PCB BGA焊接不良为例对其产生的原因进行分析和讲解,最终寻找到导致该款PCB BGA焊接不良的真正原因,并针对焊接不良问题提出了相应的改善措施,突出了SMT过程中的具体控制技巧。为同行业进行SMT工艺提供一定的参考依据。     

Development of numerical algorithm to guide solder joint structure and component structural design during manufacturing

In order to improve the production technology of the lead-free BGA (Ball Grid Array) assembly, a numerical method is developed to predict the yield of the soldering process based on calculated stand-off stiffness curves and component warpage. The stand-off stiffness curve which reflects the relationship of the force and height of solder joints is obtained by solving the differential equations of the solder joint shapes of BGA solder joints using the Runge-Kutta method. The analytical expression of thermal warpage of component in free boundary constraint conditions is proposed based on the lamination theory of the elastic mechanics. The expression can reflect the material parameter variation with temperature and provide an effective calculation method to analyze component warpage with large changing temperature during soldering reflow process. Considering the manufacture deviation of volumes and the randomness of the positions of the solder joints, combined with the stand-off stiffness curves and the component warping deformation, the yield of the soldering process can be predicted. According to the types and positions of the failure solder joints, the production technology can be improved. Based on the stand-off curves of solder joints, the influence of the deviation rate of volume of the solder joint and diameter of pad on the yield of self-assembly are simulated. The optimal matching relations of the solder joint volume and the diameter of the pad with the 0.35 mm pitch and 0.3 mm pitch are analyzed.     

BGA/CSP焊接和光学检查

介绍BGA?CSP焊接方法和一种低成本可替代或者补充X光技术的检查隐蔽焊点的光学检查方法。     

镀金引线SMD焊接工艺方法探讨

随着武器系统高可靠性要求的不断加强和国产电子元器件基础水平的不断提高,越来越多的陶瓷封装军用SMD开始应用于型号产品。该类器件的引线多采用镀金工艺,焊接时必须进行除金处理。用四种焊接工艺方法对镀金引脚器件焊接,对比分析器件焊点的焊接质量,得出镀金引脚器件最佳焊接工艺方法。     

BGA空洞形成的机理及对焊点可靠性的影响

BGA空洞是BGA组装过程常见的工艺缺陷,系统介绍了BGA空洞形成的机理与主要影响因素,讨论了BGA空洞的接受标准及其对焊点可靠性的影响,提出了消除及减少空洞缺陷的主要措施.     

A reliability study of the lead-free solder connections of miniature chip components on hybrid circuits

The results of the influence of lead-free solder paste, design and process parameters on the attachment reliability of chip surface-mounted components (SMCs) on thick-film conductor pads are presented. The purpose of the investigation was to compare the quality of the soldered joints made with new solder pastes that do not contain lead with joints soldered with standard SnPb solders. The miniature zero-ohm chip resistors were soldered with selected lead-free solder pastes. The visual appearance of the solder joint according to the standards of lead-free soldered components was compared with components soldered with SnPb solders. On the test sample with soldered chip resistors connected in series, the solder-joint resistance was measured before and after temperature cycling. On the same test sample the solder-joint resistance changes were measured with impedance spectroscopy. After temperature cycling the damaged samples were analysed with SEM and EDS. The reliability test results after temperature cycling indicate two lead-free solder pastes that are the most convenient for chip-component soldering on thick-film conductor pads with the reliability of the joints being equal or better than solder joints with Pb-containing solder paste.     

Wave soldering with a low melting point Bi-Sn Alloy: Effects of soldering temperatures and circuit board finishes

Wave soldering with low solid fluxes at temperatures as low as 175°C on test boards with a Cu/Imidazole surface finish has been shown to be feasible using a Pb-free, Bi-45%Sn-0.33%Ag solder that melts at temperatures of ∼140∼145°C. Other surface finishes such as Pd/Ni, Au/Ni, and Bi exhibit unacceptable soldering at temperatures below 210°C. Intermediate in performance are Sn surface finishes, which exhibit acceptable soldering at 190°C, but not at 175°C. Acceptable joints wave soldered on Cu/Im finishes passed class I/II inspection criterion and exhibited pull strengths in excess of the ultimate strength of the component leads.