立、卧式磁性复合流体抛光对比实验研究

针对磁性复合流体(MCF)抛光的两种抛光头,进行MCF抛光特性对比实验研究。开展了黄铜H26的平面抛光实验,调查立式和卧式抛光头分别对工件材料去除率、表面形貌与粗糙度以及MCF水分损耗等抛光特性的影响。实验结果表明,卧式MCF抛光能够较快地降低表面粗糙度,获得较高的材料去除率,MCF水分损失相对较快;立式MCF抛光能够在相对较长时间内获得稳定的材料去除率和表面粗糙度,MCF水分损失也较为平稳。     

磁场分布对磁性复合流体抛光材料去除率的影响

针对光学玻璃抛光效率和抛光精度不断提高的需求,提出采用磁性复合流体(Magnetic compound fluid,MCF)抛光轮进行抛光加工的方法,并自行研制出相应的抛光试验装置。运用标量磁位法、矢量叠加原理,建立MCF抛光轮外部空间磁场分布的解析表达式,通过对比分析磁铁磁场强度的解析计算结果和实际测量结果,说明解析表达式能较好地反映抛光轮外部空间磁场的分布规律。以Preston方程为依据,分析磁场产生的磁化压力对被加工工件表面材料去除率的影响规律;在自行研制的试验装置上利用磁性复合流体对熔融石英玻璃进行120 min的往复抛光加工,当两个环形磁铁采用NS-SN和NS-NS磁极布置方式时,最大材料去除深度分别为13 m和8 m,而且采用NS-NS磁极布置方式时,在工件中部的材料去除量几乎为零,因此NS-SN磁极布置方式由于其产生的磁场强度较大,从而导致其材料去除率也较大,验证不同磁场分布对熔融石英玻璃材料去除率的影响。     

超声波磁流变复合抛光中几种 工艺参数对材料去除率的影响

提出了一种光学抛光的新方法——超声波磁流变复合抛光。介绍了该抛光方法的基本原理和实验装置,进行了超声波磁流变复合抛光实验,采用轮廓仪实测了光学玻璃超声波磁流变抛光材料去除轮廓曲线。通过该项工艺实验,研究了五种工艺参数(磁场强度、超声振幅、抛光工具头与工件的间隙、抛光工具头转速、工件转速)对光学玻璃材料去除率的影响。在一定实验条件下,获得的材料去除率为0.139 μm/min,并获得了超声波磁流变复合抛光工艺参数与材料去除率的关系曲线,得出了光学玻璃超声波磁流变复合抛光的材料去除规律。     

用于模具自由曲面的新型气囊抛光中磨粒场的分析

为提高模具自由曲面抛光的效率和品质,提出一种基于柔性抛光理念的新型气囊抛光技术。研究了气囊抛光接触区内磨粒的运动轨迹、压力分布和抛光力的分布情况,建立了气囊抛光接触区内磨粒的运动模型、压力模型,揭示了气囊抛光接触区内磨粒直径对抛光力和被加工工件内部剪切应力的影响规律,研究了抛光过程中工件内部的剪切应力分布,明确了材料疲劳去除机理。为气囊抛光的应用奠定了理论基础。     

内循环式非牛顿流体抛光单晶硅的仿真与试验研究

为了提高磨料流抛光的效率与应用范围,提出内循环式非牛顿流体抛光方法对传统磨料流加工方式和使用的磨料进行改进。利用计算流体动力学软件对抛光区域的仿真,研究了流道中抛光流体的速度与压力的分布规律和流道槽深与入口速度对于壁面剪切应力的影响。通过单因素试验,研究了磨粒的粒径、质量分数和流道槽深对工件材料去除率和表面粗糙度的影响,并将入口处压力的试验结果与仿真结果对比。结果表明:抛光盘入口处压力仿真结果与试验结果相对误差不超过6%,验证了仿真的可靠性;材料去除率最高可达0.193μm/min,表面粗糙度由280nm降至37nm,证明了内循环式非牛顿流体抛光技术的可行性。     

磁性复合流体抛光过程中水分对抛光性能的影响

磁性复合流体(Magnetic Compound Fluid,MCF)具有优异的抛光性能,然而MCF抛光液中的水分在抛光过程中流失,抛光性能随之降低,这将增加抛光成本并严重影响MCF抛光的工程应用。针对磁性复合流体抛光液在抛光过程中水分流失的问题,探究了抛光过程中MCF水分含量对MCF形貌特征、抛光区域温度、正压力与抛光质量的关系,构建MCF中水分对抛光质量的影响机理。首先,分析了抛光过程中不同水分占比抛光液对抛光性能的影响规律,采用工业相机观察MCF抛光液抛光前后的形貌特征。然后,通过总结抛光过程温升-磁流体状态-抛光作用力-抛光质量的内在联系,构建不同水分含量MCF的抛光机理。最后,通过向MCF抛光液中定量补充水分,有效地缓解了MCF抛光液抛光效果降低的问题。实验结果表明：(1)当MCF抛光液水分占比为45%时初始抛光效果较好,抛光10 min内工件的表面粗糙度由0.410μm下降到0.007μm;而使用已持续抛光50 min的MCF加工10 min后工件的表面粗糙度由0.576μm下降到0.173μm。MCF随着抛光时间的增加MCF抛光性能大幅下降;(2)随着抛光液中含水量的降低...     

行星式双面抛光均匀性研究

文中通过行星轮式双面抛光的运动分析,得到工件相对于抛光盘的速度表达式;在Preston方程基础上,建立了材料去除函数和抛光均匀性函数;进行计算机仿真,讨论了不同转速比对抛光均匀性的影响;并通过加工实验验证了仿真与实验结果的一致性,为抛光加工工艺参数的确定提供理论依据.     

液体喷射抛光技术材料去除机理的有限元分析

实验研究了液体喷射抛光技术的材料去除量分布特征,并利用有限元分析方法,分析了抛光头(液体柱)与工件表面相互作用时流场的分布特点。实验结果及计算机模拟的结果表明,材料去除量与射流碰撞工件后流体沿工件表面的速度有关,即材料去除量的分布与抛光液在工件表面速度场的分布有关,速度分布最大的边缘部分,材料去除量最大;相互作用区外,速度逐渐减小,材料去除量也随之渐少。该现象说明,抛光液中磨料粒子的径向流动对工件产生的径向剪切应力是材料去除的关键。     

基于灰色关联分析的叶片砂带抛光参数优化

针对复杂曲面构件抛光过程中表面粗糙度的最小化与材料去除率的最大化等多目标优化问题,采用正交实验方法设计四因素三水平的钛合金试件数控砂带抛光实验;基于灰色关联分析将多目标优化问题转化为单目标优化问题,利用主成分分析法确定表面粗糙度和材料去除率对灰色关联度的影响权重;通过对实验数据的回归分析,建立灰色关联度与主要抛光工艺参数(砂带粒度、砂带线速度、工件进给速度和抛光深度)的二阶预测模型;基于各工艺参数对表面粗糙度、材料去除率和灰色关联度的影响规律进行分析,确定抛光工艺参数优化方案。利用响应曲面求解工艺参数优化问题并进行叶片抛光实验,结果表明:该优化方法获得的工艺参数组合可在满足表面粗糙度要求的基础上大幅度提高抛光材料去除率。     

磁流变抛光的材料去除数学模型

对磁流变抛光液在抛光区域的固态核分布进行了理论分析。在这基础上,以Preston方程为根据,即被加工工件表面材料去除率与压力参数p成正比的关系,该压力由磁化压力和流体动压力组成,建立磁流变抛光的材料去除数学模型。在自研的试验装置上利用磁流变抛光方法加工BK7平面镜工件,验证了数学模型的合理性。     

磁场分布对多磨头磁流变抛光材料去除的影响

为研究磁场分布对材料去除的影响,设计轴向充磁异向排布、轴向充磁同向排布、径向充磁异向排布、径向充磁同向排布4种磁铁充磁和排布方式,利用有限元软件Maxwell仿真不同磁场的磁力线分布及抛光轮表面的磁感应强度分布,并采用数字特斯拉计测量实际磁感应强度。对单晶硅基片进行定点抛光试验,检测抛光斑沿抛光轮轴向的去除轮廓及峰值点的表面形貌。仿真和实际磁感应强度检测结果表明,不同磁场分布方式对抛光区的磁场分布有很大影响,磁铁轴向充磁同向排布与径向充磁异向排布时,具有较高的磁场强度和较好的多磨头效果。定点抛光试验表明,采用轴向充磁同向排布与径向充磁异向排布这两种方式时,能实现多点加工,其中轴向充磁同向排布时加工效率较高;但采用径向充磁同向排布时,由于抛光区磁感应强度较低,磁流变微磨头无法对工件进行有效地抛光。峰值点表面形貌检测结果表明,采用不同磁场分布方式时,对工件表面均是以塑性去除方式去除。研究表明,通过优化磁铁充磁和排布方式,可实现多磨头磁流变抛光的加工原理。     

Research on unbounded abrasive polishing process with assisted ultrasonic vibration of workpiece

Ultrasonic-assisted machining was an effective method to improve the material removal quality especially to difficult-to-cut metal materials. The ultrasonic vibration was usually superimposed on the machining tool but seldom on the workpiece, although the ultrasonic vibration of workpiece could improve the processability of material more effectively. In this paper, a rectangle hexahedron ultrasonic sonotrode with optimized slots was developed as a platform to realize the assisted ultrasonic vibration of workpiece and the ultrasonic-assisted polishing process of austenitic stainless steel was also studied. The unbounded abrasive was selected as polishing medium, and the path compensation strategy of soft polishing tool was carried out for getting uniform polishing force. The orthogonal experiments were designed to study the optimization of ultrasonic polishing parameters and the relation between different types of ultrasonic polishing path and polishing quality. The results appear that the horizontal ultrasonic vibration of workpiece can reduce polishing force and improve polished surface roughness, which can also reinforce the proportion of plastic shear effect in the material removal process. The ultrasonic polishing path keeping consistent with workpiece vibration direction can get more uniform polishing force and better surface roughness. And the 45° oblique crossing ultrasonic path can get the maximum average polishing force reduction by 75.2 %.     

Investigation on the polishing of aspheric surfaces with a doughnut-shaped magnetic compound fluid (MCF) tool using an industrial robot

Aspheric elements have become essential optical surfaces for modifying optical systems due to their abilities to enhance the imaging quality. In this work, a novel method employing a doughnut-shaped magnetic compound fluid (MCF) polishing tool, and an industrial robot was proposed for polishing aspheric surfaces. Firstly, investigations on the MCF tool, including the formation process and geometry, were conducted to form an appropriate polishing tool. The distribution of abrasive particles was observed using SEM and EDX mapping. Thereafter, a conic workpiece constructed from 6061-aluminum alloy was selected as the workpiece, which was used to discover the effects of the parameters on the polishing ability of aspheric surfaces. Finally, a polishing experiment was conducted with an aspheric element under the optimized conditions. The obtained results are shown as follows. (1) A relatively regular MCF tool was obtained when the eccentricity (r), amount of MCF slurry supplied (V), revolution speed of the MCF carrier and magnet (n_c and n_m, respectively) were given at appropriate values. (2) Abrasive particles entrapped in or attached to the clusters were observed abundantly on the MCF tool sample. (3) The surface profile of the conic workpiece after 60 min of polishing indicated that material was removed evenly, and an annular polishing area was attained. Meanwhile, a higher material removal rate and better surface roughness were achieved with a smaller working gap (h) and larger volume of the MCF slurry supplied (V). (4) The roughness (Ra) of the aspheric surface decreased from 49.81 to 10.77 nm after 60 min of polishing. The shape retention obtained a Pearson correlation coefficient (Pcc) of 0.9981, which demonstrated that this novel method is appropriate for polishing aspheric elements.     

介电泳效应平面抛光的电极同层布置方式数值仿真与实验

针对化学机械平面抛光（CMPP）过程中,抛光液受抛光盘旋转离心力作用,抛光液有效利用率低、在抛光盘表面分布不均,从而影响平面抛光效率和质量的问题,提出了一种电极同层布置方式的介电泳平面抛光方法（SLAE-DEPP）。采用COMSOL Multiphysics对电极同层布置方式下封闭式圆环电极和非封闭式圆环电极的电势变化和电场强度平方梯度变化进行仿真,仿真结果表明,非封闭式圆环电极方式的电场强度平方梯度在半径ρ方向和角度θ方向都存在变化,在开口处最大电场强度平方梯度变化约为封闭式电极方式电场强度平方梯度变化的1.5倍。采用非封闭圆环电极同层布置方式制作抛光盘,搭建实验平台进行抛光实验,实验结果表明,与传统CMPP抛光相比,SLAE-DEPP方式抛光直径为76.2 mm硅片,抛光6 h后,工件中心处表面粗糙度Ra从初始690 nm下降到1 nm以下,工件平面度（RMS值）为0.268 μm,工件材料去除率（MRR）提高了近27.3%,工件表面去除均匀达到镜面,抛光效率和抛光质量均优于传统CMPP方式。     

蓝宝石基片的磁流变化学抛光试验研究

分析了磁流变化学抛光的加工机理,对蓝宝石基片的磁流变化学抛光进行了试验研究。结果表明:磁流变化学抛光可将蓝宝石基片加工到亚纳米级粗糙度的超光滑镜面,材料去除率受化学反应速率和剪切去除作用共同影响,化学反应速率越快,剪切去除作用越强,材料去除率越高;混有硅胶溶液与α-Al2O3磨料的磁流变化学抛光液去除率最高;材料去除率随工作间隙,励磁间隙以及加工时间的增大而减少,随铁粉浓度减少而减少;利用磁流变化学抛光方法加工蓝宝石基片可获得Ra 0.3 nm的超光滑表面。     

Modelling of the Polished Profile in Computer-Controlled Polishing by a Sub-Aperture Pad

High-quality part surfaces with high surface finish and form accuracy are increasingly in demand in the mold/die and optics industries. The computer-controlled polishing (CCP) is commonly used as the final procedure to improve the surface quality. This paper presents a theoretical and experimental study on the polished profile of CCP with sub-aperture pad. A material removal model is proposed based on the evaluation of the amount of material removed from the surface along a direction orthogonal to the tool path. The model assumes that the material removal rate follows the Peterson equation. The distribution of the sliding velocity at the contact region is presented. On the basis above, the approaches to calculate the polished profiles are developed for the sub-aperture pad polishing along a straight path and a curved path. The model is validated by a series of designed polishing experiments, which reveals that polishing normal force, angular spindle velocity, feed rate and polishing path all have effects on the polished profile. The result of experiments demonstrates the capability of the model-based simulation in predicting the polished profile.     

Effect of interfacial friction force on material removal in full aperture continuous polishing process

Full aperture continuous polishing using pitch lap is a key process of finishing large flat optical workpiece. The friction force of the workpiece and pitch lap interface significantly affects material removal. In this work, the friction force was determined by a measurement system that uses force transducers to support the workpiece. Experimental and theoretical analyses have been carried out to investigate the evolution of friction force with polishing time and its effect on material removal. Our results show that the friction coefficient of the workpiece/lap interface decreases during polishing, which is due to surface smoothing of the viscoelastic pitch lap by loading conditioner. In addition, the spatial average and uniformity of material removal rate (removal coefficient) increases with the increase of friction coefficient, which is due to rough lap surface, provides more sharp asperities to charge the polishing particles.