CdTe/CdS thin film solar cells grown in substrate configuration

The ability to grow efficient CdTe/CdS solar cells in substrate configuration would not only allow for the use of non‐transparent and flexible substrates but also enable a better control of junction formation. Yet, the problems of barrier formation at the back contact as well as the formation of a p–n junction with reduced recombination losses have to be solved. In this work, CdTe/CdS solar cells in substrate configuration were developed, and the results on different combinations of back contact materials are presented. The Cu content in the electrical back contact was found to be a crucial parameter for the optimal CdCl₂‐treatment procedure. For Cu‐free cells, two activation treatments were applied, whereas Cu‐containing cells were only treated once after the CdTe deposition. A recrystallization behavior of the CdTe layer upon its activation similar to superstrate configuration was found; however, no CdTe–CdS intermixing could be observed when the layers were treated consecutively. Remarkably high V_OC and fill factor of 768 mV and 68.6%, respectively, were achieved using a combination of MoO₃, Te, and Cu as back contact buffer layer resulting in 11.3% conversion efficiency. With a Cu‐free MoO₃/Te buffer material, a V_OC of 733 mV, a fill factor of 62.3%, and an efficiency of 10.0% were obtained. Copyright © 2012 John Wiley & Sons, Ltd.     

Application of copper thiocyanate for high open‐circuit voltages of CdTe solar cells

Copper thiocyanate (CuSCN) has proven to be a low‐cost, efficient hole‐transporting material for the emerging organic–inorganic perovskite solar cells. Herein, we report that CuSCN can also be applied to CdTe thin‐film solar cells to achieve high open‐circuit voltages (V_OCs). By optimizing the thickness of the thermally evaporated CuSCN films, CdTe cells fabricated by close space sublimation in the superstrate configuration have achieved V_OCs as high as 872 mV, which is about 20–25 mV higher than the highest V_OC for the reference cells using the standard Cu/Au back contacts. CuSCN is a wide bandgap p‐type conductor with a conduction band higher than that of CdTe, leading to a conduction band offset that reflects electrons in CdTe, partially explaining the improved V_OCs. However, due to the low conductivity of CuSCN, CdTe cells using CuSCN/Au back contacts exhibited slightly lower fill factors than the cells using Cu/Au back contacts. With optimized CdS:O window layers, the power conversion efficiency of the best CdTe cell, using CuSCN/Au back contact, is 14.7%: slightly lower than that of the best cell (15.2%) using Cu/Au back contact. Copyright © 2015 John Wiley & Sons, Ltd.     

CdS/CdTe thin‐film solar cells with Cu‐free transition metal oxide/Au back contacts

Superstrate CdS/CdTe thin‐film solar cells with Cu‐free transition metal oxide (TMO)/Au and Au‐only back contacts have been fabricated. The TMOs include MoO_3‐x, V₂O_5‐x, and WO_3‐x. The incorporation of the TMO buffer layers at the back contacts resulted in significant improvement on open‐circuit voltage (V_OC) as compared with the cells with Cu‐free Au‐only back contacts. Among the cells using TMO buffer layers, the ones with MoO_3‐x buffer layers exhibited the best performance, yielding an efficiency of 14.1% under AM1.5 illumination with V_OC of 815 mV and a fill factor of 67.9%. Though the performance is slightly behind the best reference cell with a Cu/Au back contact fabricated in our lab with V_OC of 844 mV, fill factor of 76.3%, and efficiency of 15.7%, the use of Cu‐free back contacts may lead to improved long‐term cell stability. Copyright © 2013 John Wiley & Sons, Ltd.     

Voltage dependent photocurrent collection in CdTe/CdS solar cells

The voltage dependence of the photocurrent J_L(V) of CdTe/CdS solar cells has been characterized by separating the forward current from the photocurrent at several illumination intensities. J_L(V) reduces the fill factor (FF) of typical cells by 10–15 points, the open circuit voltage (V_OC) by 20–50 mV, and the efficiency by 2–4 points. Eliminating the effect of J_L(V) establishes superposition between light and dark J(V) curves for some cells. Two models for voltage dependent collection give reasonable fits to the data: (1) a single carrier Hecht model developed for drift collection in p‐i‐n solar cells in which fitting yields a parameter consistent with lifetimes of 10⁻⁹ s as measured by others; or (2) the standard depletion region and bulk diffusion length model fits almost as well. The simple Hecht‐like drift collection model for photocurrent gives very good agreement to J(V) curves measured under AM1·5 light on CdTe/CdS solar cells with FF from 53% to 70%, CdTe thickness from 1·8 to 7·0 µm, in initial and stressed states. Accelerated thermal and bias stressing increases J_L(V) losses as does insufficient Cu. This method provides a new metric for tracking device performance, characterizes transport in the high field depletion region, and quantifies a significant FF loss in CdTe solar cells. Copyright © 2007 John Wiley & Sons, Ltd.     

Stable CdTe thin film solar cells with a MoOx back‐contact buffer layer

MoO_x thin films were employed as a buffer layer in the back contact of CdTe solar cells. A monograined CdS layer was employed as the window layer to reduce light absorption. The insertion of a MoO_x buffer layer in the back contact greatly reduced the Schottky barrier leading to increased fill factor and open‐circuit voltage. A CdTe solar cell, with an efficiency as high as 14.2%, was fabricated. The use of a MoO_x buffer layer made it possible to fabricate high‐efficient CdTe solar cell with much less Cu in the back contact, thus greatly enhancing the cell stability. Copyright © 2015 John Wiley & Sons, Ltd.     

CdTe solar cell in a novel configuration

Polycrystalline thin‐film CdTe/CdS solar cells have been developed in a configuration in which a transparent conducting layer of indium tin oxide (ITO) has been used for the first time as a back electrical contact on p‐CdTe. Solar cells of 7·9% efficiency were developed on SnO_x:F‐coated glass substrates with a low‐temperature (<450°C) high‐vacuum evaporation method. After the CdCl₂ annealing treatment of the CdTe/CdS stack, a bromine methanol solution was used for etching the CdTe surface prior to the ITO deposition. The unique features of this solar cell with both front and back contacts being transparent and conducting are that the cell can be illuminated from either or both sides simultaneously like a ‘bi‐facial’ cell, and it can be used in tandem solar cells. The solar cells with transparent conducting oxide back contact show long‐term stable performance under accelerated test conditions. Copyright © 2004 John Wiley & Sons, Ltd.     

Novel Cu Nanowires/Graphene as the Back Contact for CdTe Solar Cells

Cu‐nanowire‐doped graphene (Cu NWs/graphene) is successfully incorporated as the back contact in thin‐film CdTe solar cells. 1D, single‐crystal Cu nanowires (NWs) are prepared by a hydrothermal method at 160 °C and 3D, highly crystalline graphene is obtained by ambient‐pressure CVD at 1000 °C. The Cu NWs/graphene back contact is obtained from fully mixing the Cu nanowires and graphene with poly(vinylidene fluoride) (PVDF) and N‐methyl pyrrolidinone (NMP), and then annealing at 185 °C for solidification. The back contact possesses a high electrical conductivity of 16.7 S cm^?1 and a carrier mobility of 16.2 cm² V^?1 s^?1. The efficiency of solar cells with Cu NWs/graphene achieved is up to 12.1%, higher than that of cells with traditional back contacts using Cu‐particle‐doped graphite (10.5%) or Cu thin films (9.1%). This indicates that the Cu NWs/graphene back contact improves the hole collection ability of CdTe cells due to the percolating network, with the super‐high aspect ratio of the Cu nanowires offering enormous electrical transport routes to connect the individual graphene sheets. The cells with Cu NWs/graphene also exhibit an excellent thermal stability, because they can supply an active Cu diffusion source to form an stable intermediate layer of CuTe between the CdTe layer and the back contact.     

Ultrathin CdTe Solar Cells with MoO3−x /Au Back Contacts

We report on the fabrication and characterization of CdTe thin-film solar cells with Cu-free MoO_3?x /Au back contacts. CdTe solar cells with sputtered CdTe absorbers of thicknesses from 0.5 to 1.75 μm were fabricated on Pilkington SnO₂:F/SnO₂-coated soda–lime glasses coated with a 60- to 80-nm sputtered CdS layer. The MoO_3?x /Au back contact layers were deposited by thermal evaporation. The incorporation of MoO_3?x layer was found to improve the open circuit voltage (V _OC) but reduce the fill factor of the ultrathin CdTe cells. The V _OC was found to increase as the CdTe thickness increased.     

Analysis of governing factors for photovoltaic loss mechanism of n‐CdS/p‐CdTe heterojunction via multi‐way data decomposition

An analytical framework for identifying key factors of the degradation of photovoltaic efficiency over time is presented. We demonstrate that, in many photovoltaic experimental settings, reliability data sets are easily cast in a multi‐ or N‐way format. We adopt a statistical technique, N‐way partial least squares, that generates a multi‐linear model using all of the data simultaneously. With this approach, we are able to model variables of interest such as cell efficiency while representing the data in a lower‐dimensional space in which salient features are more easily identified. We illustrate our approach with reliability data for CdS/CdTe heterojunction solar cell devices. Even with the inclusion of a noisy parameter such as the net acceptor density, and with a relatively small number of devices, we automatically identify key factors that are highly related to performance degradation. In particular, the conductance at the back contact is related to short stress‐time degradation (0–300 h), whereas the net acceptor density near the junction (at +0.08 V DC bias) is correlated with more gradual, long stress‐time degradation (300–1000 h). These notable degradation modes are explained with respect to our processing conditions and Cu‐diffusion in the cells. Copyright © 2013 John Wiley & Sons, Ltd.     

Beam injection methods for characterizing thin‐film solar cells

II–VI and I–III–VI solar cells are promising for future thin‐film photovoltaics. In this paper, the roles of electron‐beam‐induced current (EBIC) and cathodoluminescence in evaluating the influence of interfaces on those solar cells are reviewed. CdTe and Cu(In,Ga)Se₂ (CIGS) are the absorbers of the cells investigated. For CdTe/CdS solar cells, a detailed study has been conducted of the effects of grain boundaries and the Te/CdTe or ZnTe:Cu/CdTe interfaces for back‐contacting. For CIGS solar cells, we have investigated different buffer layer schemes, showing that these interfaces are critical in the definition of the mechanisms for carrier collection. Copyright © 2002 John Wiley & Sons, Ltd.     

Copper (I) Oxide (Cu2O) based back contact for p‐i‐n CdTe solar cells

In this paper a promising solution for the notorious problem of manufacturing a stable low ohmic back contact of a CdTe thin film superstrate solar cell is presented without using elemental copper. Instead we have used a Cu₂O layer inserted between the CdTe absorber and metal contact (Au). In contrast to the barrier free band alignment gained by using the transitivity rules, XPS measurements show a barrier in the valence band of the Cu₂O layers directly after deposition, which results in a low performing JV curve. The contact can be improved by a short thermal treatment resulting in efficiencies superior to copper based contacts for standard CdS/CdTe hetero junction solar cells prepared on commercial glass/FTO substrates. By replacing the CdS window layer with a CdS:O buffer layer efficiencies of >15% could be achieved. Copyright © 2016 John Wiley & Sons, Ltd.     

Features of the light current-voltage characteristics of bifacial solar cells based on thin CdTe layers

It is shown that the features of the illuminated current-voltage characteristics of bifacial solar cells glass/SnO₂:F/CdS/CdTe/Cu/ITO with a thin base layer are associated with the photovoltaic effect at the back contact. An equivalent circuit of the device structure under study, which takes into account the existence of two illuminated diodes—a frontal diode (main separating barrier) and a diode at a back contact—is suggested.     

Copper migration in cdte heterojunction solar cells

CdTe solar cells were fabricated by depositing a Au/Cu contact with Cu thickness in the range of 50 to 150Å on polycrystalline CdTe/CdS/SnO₂/glass structures. The increase in Cu thickness improves ohmic contact and reduces series resistance (R_s), but the excess Cu tends to diffuse into CdTe and lower shunt resistance (R_sh) and cell performance. Light I-V and secondary ion mass spectros-copy (SIMS) measurements were performed to understand the correlations between the Cu contact thickness, the extent of Cu incorporation in the CdTe cells, and its impact on the cell performance. The CdTe/CdS/SnO₂/glass, CdTe/ CdS/GaAs, and CdTe/GaAs structures were prepared in an attempt to achieve CdTe films with different degrees of crystallinity and grain size. A large grain polycrystalline CdTe thin film solar cell was obtained for the first time by selective etching the GaAs substrate coupled with the film transfer onto a glass substrate. SIMS measurement showed that poor crystallinity and smaller grain size of the CdTe film promotes Cu diffusion and decreases the cell performance. Therefore, grain boundaries are the main conduits for Cu migration and larger CdTe grain size or alternate method of contact formation can mitigate the adverse effect of Cu and improve the cell performance.     

Interface Engineering for Both Cathode and Anode Enables Low‐Cost Highly Efficient Solution‐Processed CdTe Nanocrystal Solar Cells

Low‐cost solution‐processed CdTe nanocrystal (NC) solar cells always suffer from a high interface energy barrier and unbalanced hole/electron transport as well as anisotropic atom diffusion on the CdTe surface due to the limited amount of hole/electron interface materials or the difficulty in interface processing. In this work, a novel strategy is first adopted with gradient electron transport layer (CdS/CdSe) modification in the cathode and a new crosslinkable hole transport polymer (P‐TPA) implantation in the anode. The carrier recombination at interfaces is greatly decreased and thus the carrier collection is increased. Moreover, the light harvesting is improved both in short and long wavelength regions, making J_sc and V_oc increase simultaneously. A champion solar cell shows a very high power conversion efficiency of 9.2% and an outstanding J_sc of 25.31 mA cm^?2, which are among the highest values for all solution‐processed CdTe NC solar cells with a superstrate structure, and the latter value is even higher than that of traditional thick CdTe thin‐film solar cells (2 µm) via the high temperature close space sublimation method. This work demonstrates that facile surface modifications in both the cathode and anode with stepped extraction and organic–inorganic hybridization are very promising in constructing next‐generation highly efficient NC photovoltaic devices.     

Effect of a rear contact on the electrical properties of the CdS/CdTe-based thin-film solar cells

The comparative study of dark current-voltage and capacitance-voltage characteristics of the CdS/CdTe/Cu/Au and CdS/CdTe/ITO thin-film solar cells is carried out. The physical properties of the p ⁺-CdTe/n ⁺-ITO rear contact are experimentally determined for the first time.     

Influence of surface composition on back‐contact performance in CdTe/CdS PV devices

The atomic composition of the surface of the CdTe layer in a CdTe/CdS photovoltaic (PV) device has a significant influence on the quality of the electrical contact to this layer. This paper reports the results of a systematic study that correlates the composition of the back surface as measured with X‐ray photoelectron spectroscopy (XPS) with pre‐contact processing and device performance. We found that certain processing steps produce an oxide layer that degrades device performance by producing a metal – oxide – semiconductor (MOS) contact, rather than the intended metal – semiconductor, Schottky barrier contact. We also found that the as‐deposited CdTe film is cadmium‐rich for several hundred angstroms at the back surface. This n‐type layer may impede current flow for majority holes, degrading device performance. Published in 2000 by John Wiley & Sons, Ltd.     

Stability of sub‐micron‐thick CdTe solar cells

Sputtered CdS/CdTe cells with only 0.75 µm of CdTe have reached AM1.5 efficiencies over 12.5%. But the use of very thin absorber layers of CdTe raises questions about the possible impact on long‐term stability when the back contact is very close to the main junction. In this study, we have performed accelerated life testing (ALT) on unencapsulated CdTe dot cells with absorber thickness ranging from 0.7 to 2.1 µm. After 900 h of ALT at 85°C under continuous one‐sun illumination, with open circuit biasing and no encapsulation, we find that any decrease in stability as CdTe thickness decreases is within the ~10% statistical uncertainty shown by the sample sets of more than 20 cells each. Cells of all thicknesses exhibited some decrease in performance under these stress conditions, and open‐circuit voltage appears to be the key factor in decreased efficiency. These changes in performance under ALT at 85°C are found to be consistent with a projected field lifetime of about 40 years in typical conditions. Secondary ion mass spectroscopy depth profiles of several elements including Cu showed no evidence of ALT‐driven diffusion in these sputtered CdTe cells. Copyright © 2013 John Wiley & Sons, Ltd.     

Model for electronic transport in Cu(In,Ga)Se2 solar cells

Temperature-dependent measurements of the current–voltage characteristics and of the junction admittance of ZnO/CdS/Cu(In,Ga)Se₂ heterojunction solar cells are presented, together with numerical modelling of these experimental results. We explain the cross-over between dark and illuminated current–voltage characteristics currently observed for this type of device by the impact of the defect chalcopyrite layer at the surface of the Cu(In,Ga)Se₂ absorber. Our model assumes an illumination-dependent voltage drop across a defect layer with a thickness of 15 nm to explain the cross-over. The voltage drop results from the electrical dipole made up of donor-like states at the interface between the defect layer and CdS and deep acceptor states in the defect layer itself. The illumination dependence of this voltage drop is explained by photogenerated holes trapped by the deep acceptor states in the defect layer. Numerical simulations have been carried out using the program SCAPS-1D in order to verify our model assumptions. From our model, indirect conclusions are derived concerning the maximum conduction band offsets between CdS and the defect layer and between CdS and ZnO. Copyright © 1998 John Wiley & Sons, Ltd.     

CuxS背接触层制备及在碲化镉薄膜太阳电池中应用研究

本文采用化学水浴法沉积CuxS薄膜,通过改变Cu元素比例研究其对碲化镉电池效率的影响。研究表明化学水浴法沉积的CuxS是非晶的,采用适当退火条件可以使其晶化,随着退火温度的提高,薄膜变得致密且结晶明显。CuxS薄膜厚度对电池性能有很大的影响,结果表明,随着CuxS薄膜厚度增加,电池性能先增加后减少。薄膜厚度为75nm时,CdS/CdTe电池性能最佳,达到了最高转化效率(η)为12.19%,填充因子(FF)为68.82%,开路电压(Voc)为820mV。     

The structural,optical, and electrical properties of vacuum evaporated Cu-doped ZnTe polycrystalline thin films

We have studied the structural, optical, and electrical properties of thermally evaporated, Cu-doped, ZnTe thin films as a function of Cu concentration and post-deposition annealing temperature. X-ray diffraction measurements showed that the ZnTe films evaporated on room temperature substrates were characterized by an average grain size of 300Å with a (111) preferred orientation. Optical absorption measurements yielded a bandgap of 2.21 eV for undoped ZnTe. A bandgap shrinkage was observed for the Cu-doped films. The dark resistivity of the as-deposited ZnTe decreased by more than three orders of magnitude as the Cu concentration was increased from 4 to 8 at.% and decreased to less than 1 ohm-cm after annealing at 260°C. For films doped with 6–7 at.% Cu, an increase of resistivity was also observed during annealing at 150–200°C. The activation energy of the dark conductivity was measured as a function of Cu concentration and annealing temperature. Hall measurements yielded hole mobility values in the range between 0.1 and 1 cm²/V·s for both as-deposited and annealed films. Solar cells with a CdS/CdTe/ZnTe/metal structure were fabricated using Cudoped ZnTe as a back contact layer on electrodeposited CdTe. Fill factors approaching 0.75 and energy conversion efficiencies as high as 12.1% were obtained.