Gap tolerant bubble propagation circuit

A new bubble propagation pattern for field access devices has been developed which has a period to gap ratio of 8:1. In this pattern of semicircular elements (half-disk) the gaps are situated between essentially parallel poles in contrast to the TI pattern where gaps are located between orthogonal poles. The bubble, therefore, comes under the influence of two strong parallel poles causing it to stretch across the gap. The energy barrier that would normally be encountered thus virtually disppears. Devices of 32, 18, and 10 μm periods have been designed and fabricated. The results show a typical margin of at least 20% of the bias field under normal operating conditions. The operating drive field is relatively low for small bubbles. The minimum drive field for a 10 μm period pattern is only 13 Oe.     

68 kbit capacity 16 µm-period magnetic bubble memory chip design with 2 µm minimum features

A bubble propagating structure that operates well on a 14 μm to 18 μm propagate period with a nominal 2 μm minimum feature size has been designed. The structure consists of only 1 discrete permalloy feature per circuit period. Sixty-eight kbit-capacity memory chips based on such structures have been designed, built, characterized, packaged and the packages have been characterized. The chip is organized as a set of minor (storage) loops with separate write and read major lines. The bubble manipulating functions, of which the replicate and transfer gates are the most critical, have also been designed with 2 μm minimum features. The design is adequate to provide a 14 Oe bias field margin range with drive fields of about 35 Oe, using a bubble garnet material with approximately 170 Oe free bubble collapse field. Sixty-eight kbit single loop shift register type chips designed using similar propagating structures, however, provide over 20 Oe bias field margin ranges with drive fields of about 35 Oe.     

Design and characterization of ion-implanted tracks for 16 Mbit/cm2storage density bubble memory devices

The ion-implanted propagation tracks with contiguous disk patterns (CD tracks) have been confirmed to be better for high density propagation tracks (≥ 16 Mbit/cm²) than those with snake patterns (snake tracks), because of less interactions between bubbles on the other side in the same track. The CD tracks with 1.8 µm × 2.0 µm cell size for 0.5 µm bubbles have been evaluated. The large operating bias field margin of 12.4 percent is obtained at the quasi-static operation with rotating field HRof 60 Oe. The minimum rotating field is 40 Oe. Interdigital folded minor loops are proposed and operated. The proposed minor loops are composed of straight propagation tracks connected alternately to relax the in-side turns. The overall operating margin of 8.4 percent (46 Oe) is obtained at HR= 60 Oe. The feasibility of 16 Mbit/cm²storage density bubble memory devices is confirmed.     

Eight-micron period bubble devices

Magnetic bubble shift register devices of 68 121- and 266 473-bit capacity have been fabricated and tested. The epitaxial garnet bubble films were nominally 1.7 μm thick, supported nominally 1.7-μm diameter bubbles, and had collapse fields of about 260 Oe. The storage area per bit was 64 μm², which was realized with a minimum coded feature dimension of 1 μm and contact photolithography using EBES chrome masters. Initial yields obtained in two experimental batches each of the two chip capacities are discussed. Parametric test results are presented for generator current, transfer current and phase, and rotating field intensity. Nominal values have been established to be 130-mA generate current, 21-mA transfer current, and 60-Oe drive. The detector signals were about half as large as normally obtained from 3.3-μm bubble devices with comparable resistance and conventional design.     

New method for routine measurement of coercivity in magnetic bubble films

We describe a new technique for measuring coercivity in magnetic bubble films which consists of placing the film in a weak field gradient (∼1 Oe./μm) in order to obtain a set of finger-like domains. The unconstrained ends of these domains are caused to move back and forth in response to an oscillatory field, and the coercivity is obtained from an extrapolation of the linear portion of the response vs. drive field curve. We present a comparison between coercivity values in materials with 3μm and 1.7μm stripe-widths obtained using the new technique and bubble translation. Good correlation is observed for both types of material, the values obtained with the new technique being somewhat higher than the bubble translation values. The difference is ascribed to material non-uniformities.     

Complementary permalloy bubble propagation structure

Field-access bubble propagation has been achieved in a novel Permalloy structure made up of a pattern and its complement. The pattern is defined by a step in a nonmagnetic spacer on top of which the Permalloy is deposited leaving the Permalloy in two levels. The two layers act in concert to provide coherently travelling potential wells for bubble propagation. The stepped structure is fabricated using a lift-off technique (4000-6000 Å) of Schott glass. Permalloy (1500-2500 Å) is then deposited by radio frequency sputtering over the entire device area. Devices of 10-μm period and 2- to 3-μm minimum feature were fabricated on 2-μm bubble garnets. A propagation margin >10 percent was obtained for 35-to 50-Oe drive fields.     

High-frequency propagation and failure of asymmetric half-disk field access magnetic bubble device elements

High-frequency propagation characteristics and failure modes in 14-μm period, 1.8-μm gap, asymmetric half-disk field-access device were studied using a high-speed optical sampling technique. Propagation elements as well as normal and hand gun corners and chevron structures were included. The operating bias margin at 1MHz, for a structure that had 1.2 MHz as highest possible frequency, was about half of the margin for frequencies of 200 kHz and below. The phase lag between the bubble leading wall and the instantaneous rotating field direction was nearly 90° as the bubble moved through the center of the element where the lag was the greatest. The peak velocity of the leading wall of 55 m/s and the trailing wall of 46 m/s is attributed to bubble interaction with the Permalloy structure creating a ∼125 Oe in-plane field that greatly increases the free bubble "saturation" velocity.     

Some characteristics of ion-implanted bubble chips

The relations between the position of charged walls and the bubble motion around propagation circuits are discussed. Long walls which extend between adjacent propagation loops are revealed by the Bitter technique. The examination of the domain structure in the implanted layer shows the existence of a magnetic gradient which is a function of the distance from the propagation circuits. The switching of magnetization in particular directions of the in-plane field is reported and correlated with the bubble movement. An additional easy axis is observed along the circuits due to shape anisotropy. Propagation margins are very similar to those obtained with permalloy circuits. Fabrication technology as well as design of 16 μm period circuits is discussed. Nucleation and transfer have been achieved with currents in the range of 50 mA to 200 mA. Phase margins of about a quarter of a period are found, and bias field margins fall between 10 and 15 Oe.     

A practical magnetic bubble AND-OR gate

The design and operation of a magnetic bubble AND-OR gate are reported. Operation at 100 kHz in a 25 Oe rotating field with 28.2 μm circuit periodicity was achieved with about 50 percent of the free bubble bias field margins. A transfer pulse is used to divert bubbles from a propagation path which delivers the AND output tO one which delivers the OR output. The transfer is defeated by the presence of a bubble in the appropriate cycle of the OR path. The AND bubble is then delayed by one cycle instead of being transferred. This frastrated transfer strategy was devised to circumvent the restrictive bias field limitations in the operation of previous logic circuits.     

Bubble propagation by disks formed by ion-implantation

The investigation of implantation conditions for bubble propagation points to the necessity for a minimum dose (1.5 times 10^{16}ions cm²) and a sufficiently thick profile (0.4 μ). The use of flat profiles gives uniform implanted layers and allows values of the maximum defect concentration far away from the amorphization threshold. Unlike in permalloy circuits, bubble stability and bias field margins do not increase with the drive field. The propagation is not critically dependent upon disk diameter and spacing.     

Operation of 3µm bubble serial loop devices designed on single level masking

An all-permalloy single mask level design for a serial loop circuit has been developed and successfully operated using 3 μm bubbles. The design of individual elements for a single level circuit such as generator, replicator and annihilator which were compatible with half-disk propagation patterns was successfully investigated and optimization of permalloy and SiO2spacer film thickness was achieved. The small capacity test chips fabricated provided 13-16 Oe "window margins" with circular drive field ranges of 40 to 50 Oe at 100 kHz. The critical stretching pulse phase margin for replication, which was the minimum phase margin for all functions was found to be 10 degrees. Details of design and characteristics are also discussed including operating margin dependence on frequency and temperature.     

Control function margin degradation in a bubble memory chip

Chip control function and propagation circuit margin degradation due to long-term memory operation, was observed, using the bias field switching technique. 16 kbit major-minor loop organized bubble memory chips with 28 μm bit period, which had an average access time of 2.7 ms for a 100-kHz rotating field, were used. It was seen that degradations in the lower side of the bias field range were independent of chip functional elements. However, at the upper side of the bias field range, degradations in the performance can be classified by dividing the elements into two categories. These were propagation circuits (Permalloy patterns only) such as H-bars, chevrons, etc., and control functions (Permalloy and conductor patterns), such as generators, replicators, etc. Also, it was found that the degradation in the performance of propagation circuits is small compared with that of the control functions. These differences were considered to be caused by a failure in the Permalloy steps over conductors and/or by the magnetic interaction of the bubble and the conductor current.     

Optimum design considerations for dual conductor bubble devices

A design for dual conductor, current-access bubble devices with 8-μm periods has been optimized with a numerical calculation method for bubble motion in a propagating magnetic field, generated around hole patterns in conductor layers. Magnetic bias field distributions are calculated for an oval hole chain in the conductor layers. Bubble motion equations are obtained with analytical field distribution functions approximating the calculated field distributions. Minimum drive current density Jminfor normal bubble propagation is determined by a solution to the equations. The hole shape has been optimized by the minimization of the drive power Pmin, the product of Jminand conductor resistance, which is calculated from current distributions around the hole pattern. Optimum layer thickness have also been obtained for 8-μm period bubble devices. Both registration tolerance between the two conductor layers and bubble skew effects have been studied semiquantitatively on the basis of the equations of motion. The numerical calculation method developed here is found to be a highly effective means to optimize pattern design for smaller period devices.     

Contiguous-disk bubble domain devices

Contiguous-disk bubble devices are an approach to higher bit density through the use of coarse overlay patterns in manipulating small bubbles to relax device lithography requirements. As a first step towards such an objective, a fully processed chip using ion-implanted devices has been tested, showing the feasibility of all required memory functions with 5-μm bubbles and 25-μm period overlay patterns. A critique of permalloy versus implanted contiguous-disk devices is made, pointing out their basic difference in magnetization reversal processes and explaining the superiority of the latter over the former in achieving a good edge affinity of bubbles. The requirements for a good implanted device are reviewed, including the selection of garnet material parameters (K1, λ111), of implantation parameters (ion energy and dosage) and of device pattern geometry (thickness and shape of implanted layer). An understanding of these requirements has made it possible to demonstrate 1-μm bubble propagation in several contiguous-disk type circuits with 4.5-μm periods, yielding an areal density of over 3 × 10⁷bit/in²made by conventional photolithography.     

Magnetic bubble device processing and pickax circuit design

The processing of Permalioy field-access magnetic bubble devices will be discussed for lead-first, double level circuits emphasizing 5 μm diameter bubble circuits, but with reference to scaling down the process to 2 μm bubble diameter circuits. Device structures will be presented with typical material thicknesses and processes used for each level. A new bubble circuit based on the pickax replicator and the pickax propagation element will be introduced with emphasis on the relaxation of processing constraints that this circuit provides. Also quasi-static propagation margins for several of the key pickax elements will be presented.     

The propagation of magnetic bubbles on permalloy disks

A magnetic bubble generator consisting of a Permalloy disk and a current conductor loop has been used recently in a mass memory design utilizing magnetic bubble technology. The bias field range in which the disk can hold the seed bubble is measured in this report as a function of of the rotating field frequency. Above a critical frequency fc, the bias field margins begin to decrease. The dependence of fcon disk size is obtained for disks with diameters from 16 μm up to 43 μm at rotating fields of 20 and 30 Oe. The separation between Permalloy disks and the garnet film is kept at 0.8 μm or 1.6 μm. Results show that at a fixed rotating field, a smaller disk is preferable at higher frequency for a magnetic bubble material with a given mobility. The critical frequency fcobtained is in good agreement with a theoretical calculation using the viscous damping model by Rossol et al. For frequencies below fc, the bias field margin on the disk is equal to that of the propagating channel and circuit failure due to the loss of the generator seed bubble can be eliminated.     

Operation of a 100-bit, 2.6 µm bubble shift register

Complete circuit operation for a small 100-bit serial shift register memory with a 10.6 μm period fabricated on a garnet wafer using electron beam lithography and single level all-permalloy technology is reported. Overall circuit operation including generation, propagation, and detection was achieved with a 6 Oe bias margin using a 1 kHz rotating field. Although the circuit design and fabrication techniques were not optimized, we believe that this is the first published report of complete circuit operation for a single level device with bubbles as small as 2.6 μm. The performance of two different types of chevron expander detectors and two different generators was evaluated and circuits combining disk generators with herringbone detectors were found to provide the best overall operating margin. At low speeds (∼5 Hz) high-bias failures were caused by failure of the domains to strip out fully in the detector while the low bias limit was determined by the introduction of spurious bubbles into the track near the generator.     

A fast access memory design using 3µm bubble 80K chip

A fast-access, non-volatile memory system using 3- μm bubble 80-kbit chips has been designed for an experimental model and evaluated from a systems viewpoint. The goal of this project is to investigate from both the side of technology and cost if the memories built with major-minor organized 3 μm bubble chips are acceptable in the commercial market. This paper describes the practical design of a bubble memory system, with a capacity of 8-Mbits and an average access time of approximately 1 ms at drive frequencies of up to 500 kHz, which involves memory system organization, redundancy design using chips with excess minor loops, packaging, electronic circuits scheme and other considerations. The results of the experiment and the system cost estimate based on this design are also described.     

Effect of conductor crossings on propagation margins

The effects of conductor delineation technique on magnetic bubble propagation across the conductor edge are described. Propagation margins are obtained for bubble circulation around 18-μm diameter Permalloy discs which cross four edges of an Al-Cu feature. Specifically investigated are isotropic wet etching, anisottopic wet etching to achieve a uniform taper, ion beam milling, and metal lift-off to provide a planar structure. Margins are obtained at ± 40°C, with the most significant degradation observed at the lower temperature. Permalloy magnetic continuity in the crossings can be inferred from hysteresis loop measurements of a Permalloy sheet deposited over a grating pattern formed by the above processing techniques. Although the least anisotropic loops are invariably obtained with smoothly tapered Al-Cu edges under the Permalloy, propagation margins are not maximized with such structures, but rather favor a planar crossing. The results suggest that although patterned stress is still an important concern in functional operation, other geometric effects can be more significant. In particular, poor magnetic step coverage as inferred from loop measurements leads to spurious pole formation from the drive field, while even with adequate step coverage, static bias-field distortions can result because of the component of the field along the step.     

The effect of DC in plane field on the operation of field access bubble memory devices

The effect of a small dc in-plane field on the start-stop operation of field access bubble devices has been studied. Experimental results show that the bias margin in this mode is very sensitive to the magnitude of the field and its orientation relative to the start-stop direction of the drive field. In a T-I circuit a complete margin loss was observed for an in-plane field of 3 Oe oriented antiparallel to the start-stop direction. For parallel orientations of the in-plane field the start-stop margin improved and approached that of the continuous propagation margin at an in-plane field of approximately 6 Oe. Dependence of the start-stop margin on the orientation of the start-stop direction relative to the pattern was also observed. Measurements of the bubble collapse field at various points in the pattern show a very strong dependence on the in-plane field and the permalloy geometry. The collapse-field results and magnetostatic energy considerations which take into account local field variations and bubble-bubble interactions provide a basis for understanding the experimentally observed start-stop margins. These results show that a small tilt (2 to 3°) should be introduced in the bias field to overcome normal alignment tolerances and ensure that a favorable in-plane field is always present. This assures reliable start-stop operation.