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1.
This paper deals with a new process to improve the stability of a-Si:H pin solar cells deposited in a single batch process by proper passivation of the interfaces. The process consists in removing partially a deposited sacrificial oxide layer grown between the p/i or i/n interfaces by SF6 etching. This layer is an absorber of defects and impurities that are introduced in the interfaces, mainly from the chamber walls and the substrate surface. The results achieved in laboratory samples lead to devices in which the fill factor and short circuit current density were improved respectively towards 75% and 16.5 mA cm−2, with a final working efficiency of about 9.5%.  相似文献   

2.
Computer modelling is used as a tool for optimising a-Si : H/a-Si : H tandem cells on textured substrate in order to achieve current matching between the top and bottom cell. To take light scattering at the textured interfaces of the cell into account, we developed a multirough-interface optical model which was used for calculating the absorption profiles in the tandem cells. In order to simulate multi-junction solar cell as a complete device we implemented a novel model for tunnel/recombination junction (TRJ), which combines the trap-assisted tunnelling and enhanced carrier transport in the high-field region of the TRJ.We investigated the influence of light scattering and thickness of the intrinsic layer of the bottom cell on the optimal ratio i2/i1 between the thicknesses of the bottom (i2) and top (i1) intrinsic layers in the current-matched cell. The simulation results show that increasing amount of scattering at the textured interfaces leads to a lower ratio i2/i1 in the current-matched cell. This ratio depends on the thickness of the intrinsic layer of the bottom cell. The simulation results demonstrate that a-Si : H/a-Si : H tandem cell with 300 nm thick intrinsic layer in the bottom cell exhibits higher efficiency than the cell with 500 nm thick bottom intrinsic layer.  相似文献   

3.
We develop amorphous silicon (a-Si:H)-based solar cells by plasma-enhanced chemical vapor deposition (PECVD) at deposition temperatures of Ts=75°C and 100°C, compatible with low-cost plastic substrates. The structural and electronic properties of low-temperature standard PECVD a-Si:H, both doped and undoped, prevent the photovoltaic application of this material. In this paper, we demonstrate how to achieve device-quality a-Si:H even at low deposition temperatures. In the first part, we show the dependence of structural and carrier transport properties on the deposition temperature. The sub-band gap absorption coefficient and the Urbach energy increase when the deposition temperature declines from Ts=150°C to 50°C, the conductivity of doped layers and mobility-lifetime product of intrinsic a-Si:H drop drastically. Therefore, in the second part we investigate the impact of increasing hydrogen dilution of the feedstock gases on the properties of low-temperature a-Si:H. We restore n-type a-Si : H device-quality conductivity while the p-type a-Si:H conductivity is still inferior. For undoped layers, we depict the hole diffusion length, the mobility-lifetime product for electrons, the Urbach energy, and sub-band gap absorption coefficient as a function of the hydrogen dilution ratio. We incorporate these optimized materials in solar cell structures of single and multilayer design and record initial efficiencies of η=6.0% at a deposition temperature of Ts=100°C, and η=3.8% at Ts=75°C. For prospective opaque polymer substrates we develop, in addition to our conventional pin cells, devices in nip design with similar performance.  相似文献   

4.
Profiled a-SiGe:H-buffer layers between the doped and the absorption layers of amorphous silicon germanium (a-SiGe:H) solar cells are routinely used to avoid bandgap discontinuities and high-defect densities at the p/i- and i/n interface. Here, we present a much simpler approach replacing the profiled a-SiGe:H-buffer layers at both interfaces by a-Si:H-buffer layers. It is demonstrated that for a-SiGe:H solar cells (thickness of the EG=1.5 eV part is 54 nm) these structures yield similar open circuit voltage VOC and fill factor (FF) compared to the bandgap profiled layer at the same short circuit current density jSC. The influence of thickness, optical bandgap and position of the buffer layers on the solar cell performance is investigated.  相似文献   

5.
The growth kinetics and optoelectronic properties of intrinsic and doped microcrystalline silicon (μc-Si:H) films deposited at low temperature have been studied combining in situ and ex situ techniques. High deposition rates and preferential crystallographic orientation for undoped films are obtained at high pressure. X-ray and Raman measurements indicate that for fixed plasma conditions the size of the crystallites decreases with the deposition temperature. Kinetic ellipsometry measurements performed during the growth of p-(μc-Si:H) on transparent conducting oxide substrates display a remarkable stability of zinc oxide, while tin oxide is reduced at 200°C but stable at 150°C. In situ ellipsometry, conductivity and Kelvin probe measurements show that there is an optimum crystalline fraction for both phosphorous- and boron-doped layers. Moreover, the incorporation of p-(μc-Si:H) layers produced at 150°C in μc-Si:H solar cells shows that the higher the crystalline fraction of the p-layer the better the performance of the solar cell. On the contrary, the optimum crystalline fraction of the p-layer is around 30% when hydrogenated amorphous silicon (a-Si:H) is used as the intrinsic layer of p–i–n solar cells. This is supported by in situ Kelvin probe measurements which show a saturation in the contact potential of the doped layers just above the percolation threshold. In situ Kelvin probe measurements also reveal that the screening length in μc-Si:H is much higher than in a-Si:H, in good agreement with the good collection of microcrystalline solar cells  相似文献   

6.
TCO and light trapping in silicon thin film solar cells   总被引:6,自引:0,他引:6  
For thin film silicon solar cells and modules incorporating amorphous (a-Si:H) or microcrystalline (μc-Si:H) silicon as absorber materials, light trapping, i.e. increasing the path length of incoming light, plays a decisive role for device performance. This paper discusses ways to realize efficient light trapping schemes by using textured transparent conductive oxides (TCOs) as light scattering, highly conductive and transparent front contact in silicon p–i–n (superstrate) solar cells. Focus is on the concept of applying aluminum-doped zinc oxide (ZnO:Al) films, which are prepared by magnetron sputtering and subsequently textured by a wet-chemical etching step. The influence of electrical, optical and light scattering properties of the ZnO:Al front contact and the role of the back reflector are studied in experimentally prepared a-Si:H and μc-Si:H solar cells. Furthermore, a model is presented which allows to analyze optical losses in the individual layers of a solar cell structure. The model is applied to develop a roadmap for achieving a stable cell efficiency up to 15% in an amorphous/microcrystalline tandem cell. To realize this, necessary prerequisites are the incorporation of an efficient intermediate reflector between a-Si:H top and μc-Si:H bottom cell, the use of a front TCO with very low absorbance and ideal light scattering properties and a low-loss highly reflective back contact. Finally, the mid-frequency reactive sputtering technique is presented as a promising and potentially cost-effective way to up-scale the ZnO front contact preparation to industrial size substrate areas.  相似文献   

7.
Light induced degradation of single junction and double junction a-Si:H solar cells has been studied. Cells with and without buffer layers at the p/i interfaces have been fabricated. It is found that light induced degradation is faster in the cells with buffer layers. Defect density increases faster and degraded efficiency with respect to the initial efficiency decreases at a higher rate for the cells with buffer layers. Spectral response study for double junction cells shows that collection efficiency decreases for the bottom cell only. So it is found that the absolute stabilized efficiency is highest for a double junction cell with buffer layer at the top cell only.  相似文献   

8.
We have measured and modelled a-Si,Ge:H pin cells with the purpose of refining the existing modelling parameters, so that the model can be used for designing cells. In this work, we have employed the numerical device model AMPS. We have found that we can satisfactorily model the performance of as-deposited alloy cells by suitably changing the band gap, mobility gap, optical absorption spectrum, and electron affinity.  相似文献   

9.
For amorphous and ‘micromorph’ silicon multi-junction solar cells, we have developed tunnel recombination junctions consisting of two microcrystalline doped layers with a defect-rich interface. While the solar cells performed reasonably well under AM 1.5 light, we found in spectral response measurements that the first deposited cell of tandem structures in nip and pin configuration was apparently leaking under low light conditions. Insertion of a thin protection layer of n-type amorphous silicon solved this issue, and led to an increase in open-circuit voltage. Voltages as high as 1.76 V have been obtained for a-Si/a-Si pinpin tandem cells.  相似文献   

10.
The intrinsic a-Si:H passivation layer inserted between the doped a-Si:H layer and the c-Si substrate is very crucial for improving the performance of the a-Si:H/c-Si heterojunction (SHJ) solar cell. The passivation performance of the a-Si:H layer is strongly dependent on its microstructure. Usually, the compact a-Si:H deposited near the transition from the amorphous phase to the nanocrystalline phase by plasma enhanced chemical vapor deposition (PECVD) can provide excellent passivation. However, at the low deposition pressure and low deposition power, such an a-Si:H layer can be only prepared in a narrow region. The deposition condition must be controlled very carefully. In this paper, intrinsic a-Si:H layers were prepared on n-type Cz c-Si substrates by 27.12 MHz PECVD at a high deposition pressure and high deposition power. The corresponding passivation performance on c-Si was investigated by minority carrier lifetime measurement. It was found that an excellent a-Si:H passivation layer could be obtained in a very wide deposition pressure and power region. Such wide process window would be very beneficial for improving the uniformity and the yield for the solar cell fabrication. The a-Si:H layer microstructure was further investigated by Raman and Fourier transform infrared (FTIR) spectroscopy characterization. The correlation between the microstructure and the passivation performance was revealed. According to the above findings, the a-Si:H passivation performance was optimized more elaborately. Finally, a large-area SHJ solar cell with an efficiency of 22.25% was fabricated on the commercial 156 mm pseudo-square n-type Cz c-Si substrate with the opencircuit voltage (Voc) of up to 0.732 V.  相似文献   

11.
《Solar Cells》1991,30(1-4):261-270
Multijunction solar cell modules based on a-Si:H and its alloys have been developed. Triple junction devices have been modeled to quantify parasitic optical losses. A laser patterning method for modules has been developed and 98% active/aperture areas demonstrated. An ad hoc module of light-induced stability is developed which suggests much improved stability is to be expected in the triple junction devices; this is verified by experimental data. Triple junction 939.6 cm2 a-Si:H/a-Si:H/a-SiGe:H modules tested at SERI have demonstrated an aperture area efficiency of 9.27%.  相似文献   

12.
Monodisperse, indium doped zinc oxide (IZO) nanoparticles were prepared via the polyol-mediated synthesis and incorporated into regular and inverted poly-(3-hexylthiophene-2,5-diyl) and [6,6]-phenyl C61-butyric acid methyl ester organic photovoltaic devices as buffer layers between the active layer and the cathode. Efficient hole blocking at the particle buffer layers leads to an enhanced open-circuit voltage of the solar cells. This effect is even more pronounced for inverted device architectures. Device degradation studies revealed a solar cell performance reduction upon sample exposition to ambient atmosphere. However, this degradation is fully reversible under UV illumination. In addition, the n-doped IZO particles form suitable charge carrier transport layers for an efficient recombination in an intermediate recombination zone in tandem solar cells. Accordingly we have fabricated fully solution-processed tandem solar cells and investigated their optoelectronic properties.  相似文献   

13.
In silicon heterojunction solar cells, a thin intrinsic amorphous-silicon (a-Si:H) buffer layer between a doped emitter and a c-Si wafer is essential to minimize carrier recombination. This study examines the effect of H2 dilution on the properties of the intrinsic a-Si:H layers deposited on Si wafers by plasma-enhanced chemical vapor deposition. A H2/SiH4 ratio of 24 led to improvements in the quality of intrinsic a-Si:H films and in the performance of passivation compared to a-Si:H film without H2 dilution. A high H2-dilution ratio, however, degraded the passivation of the a-Si:H film. The Si heterojunction solar cells with an optimal intrinsic a-Si:H layer showed an efficiency of 12.3%.  相似文献   

14.
Development of doped silicon oxide based microcrystalline material as a potential candidate for cost-effective and reliable back reflector layer (BRL) for single junction solar cells is discussed in this article. Phosphorus doped μc-SiOx:H layers with a refractive index ∼2 and with suitable electrical properties were fabricated by radio frequency plasma enhanced chemical vapor deposition (RF-PECVD) technique, using the conventional capacitively coupled reactors. Optoelectronic properties of these layers were controlled by varying the oxygen content within the film. The performance of these layers as BRL have been investigated by incorporating them in a single junction amorphous silicon solar cell and compared with the conventional ZnO:Al based reflector layer. Single junction thin film a-Si solar cells with efficiency ∼9.12% have been successfully demonstrated by using doped SiO:H based material as a back reflector. It is found that the oxide based back reflector shows analogous performance to that of conventional ZnO:Al BRL layer. The main advantage with this technology is that, it can avoid the ex-situ deposition of ZnO:Al, by using doped μc-SiO:H based material grown in the same reactor and with the same process gases as used for thin-film silicon solar cells.  相似文献   

15.
We simulated device characteristics of a-Si:H single junction, μc-Si:H single junction and a-Si:H/μc-Si:H tandem solar cells with the numerical device simulator Advanced Semiconductor Analysis (ASA). For this purpose we measured and adjusted electrical and optical input parameters by comparing measured and simulated external quantum efficiency, current−voltage characteristic and reflectivity spectra. Consistent reproducibility of experimental data by numerical simulation was achieved for all types of cells investigated in this work. We also show good correspondence between the experimental and simulated characteristics for a-Si:H/μc-Si:H tandem solar cells with various absorber thicknesses on both Asahi U-type SnO2:F and sputtered/etched (Jülich) ZnO:Al substrates. Based on this good correlation between experiment and theory, we provide insight into device properties that are not directly measurable like the spatially resolved absorptance and the voltage-dependent carrier collection. These data reveal that the difference between tandem solar cells grown on Asahi U-type and Jülich ZnO substrates primarily arises from their optical properties. In addition, we find out that the doped layers do not contribute to the photocurrent except for the front p-layer. We also calculated the initial efficiencies of a-Si:H/μc-Si:H tandem solar cells with different combinations of a-Si:H and μc-Si:H absorber layer thicknesses. The maximum efficiency is found at 260 nm/1500 nm for tandem solar cells on Asahi U-type substrates and at 360 nm/850 nm for tandem solar cells on Jülich ZnO substrates.  相似文献   

16.
It has long been known that the use of finely textured transparent conducting oxide layers substantially improves the performance of thin film amorphous silicon (a-Si:H) solar cells. Major efforts to understand the nature of this effect and to fully capture its potential have been made by researchers using advanced modeling techniques. In this work, modeling the oblique angle optical performance and use of an effective medium approximation to simulate microrough interfaces suggests that effective interface grading makes a significant contribution to optical enhancement.  相似文献   

17.
Heterojunction with intrinsic thin layer (HIT) solar cells fabricated on p-type silicon substrates usually demonstrate inferior performance than those formed on n-type substrates. The influence of various structure parameters on the performance of the c-Si(p)-based bifacial HIT solar cell, i.e., the TCO/a-Si:H(n)/a-Si:H(i)/c-Si(p)/a-Si:H(i)/a-Si:H(p+)/TCO solar cell, was investigated in detail by computer simulation using the AFORS-HET software. The work function of the transparent conductive oxide was found to be a key factor to affect the solar cell performance. Detailed influence mechanisms were analysed. Accordingly, the design optimization of the bifacial HIT solar cells on c-Si(p) substrates was provided.  相似文献   

18.
The performance of multijunction amorphous silicon-based thin film solar cells has been reported using thin layers of TiO2 and SiOx acting as refractive index matching optical layers for different interfaces of the superstrate device structure. Improvement of short-circuit current from the sub-cells of a-Si/μc-Si cells is demonstrated with TiO2 as anti-reflection layer at TCO/Si interface and SiOx as intermediate-reflector layer between two sub-cells. An initial efficiency of 11.8% is achieved by applying both the TiO2 and SiOx optical layers in a-Si/μc-Si solar cell.  相似文献   

19.
Real time spectroscopic ellipsometry has been applied to develop deposition phase diagrams that can guide the fabrication of hydrogenated silicon (Si:H) thin films at low temperatures (<300°C) for highest performance electronic devices such as solar cells. The simplest phase diagrams incorporate a single transition from the amorphous growth regime to the mixed-phase (amorphous+microcrystalline) growth regime versus accumulated film thickness [the a→(a+μc) transition]. These phase diagrams have shown that optimization of amorphous silicon (a-Si:H) intrinsic layers by RF plasma-enhanced chemical vapor deposition (PECVD) at low rates is achieved using the maximum possible flow ratio of H2 to SiH4 that can be sustained while avoiding the a→(a+μc) transition. More recent studies have suggested that a similar strategy is appropriate for optimization of p-type Si:H thin films. The simple phase diagrams can be extended to include in addition the thickness at which a roughening transition is detected in the amorphous film growth regime. It is proposed that optimization of a-Si:H in higher rate RF PECVD processes further requires the maximum possible thickness onset for this roughening transition.  相似文献   

20.
Amorphous silicon/alloy superlattices provide advantages in solar cell design, such as (a) effective band gap widening (b) effective mass separation (c) increased open-circuit voltage. The latter increases via Fermi level control, due to p-doping of potential barriers, pushing EF towards the valence bands, with simultaneous widening of the effective band gap, thus leading to potentially higher collection incident wavelengths. The density of gap states in the heavily doped layer is modeled as an exponential whose parameter kT* can be varied by the doping concentrations, while its activation energy saturates at some value. This communication provides (i) a general formulation of the problem at finite temperatures as well as numerical results for specific realizable contacts (ii) detailed treatment of gap states (iii) the neutrality condition (iv) a relation between Fermi level position and open-circuit voltage in the nitride region (superlattice p-region). For a p-(a-SiN: H/a-Si: H)-i (a-Si: H)-n (a-Si: H) sample, we compute the Fermi level position relative to the a-Si: H valence band edge. For low and wide gap thin layers of the order of 2.5–3.5 nm, open-circuit voltage values are predicted in excess of 1.05 V, and efficiencies are predicted in excess of 12%.  相似文献   

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