Wide-range length metrology by dual-imaging-unit atomic force microscope based on porous alumina

A new dual-imaging-unit atomic force microscope (DIU-AFM) was developed for wide-range length metrology. In the DIU-AFM, two AFM units were combined, one as a reference unit, and the other a test one. Their probes with Z piezo elements and tips were horizontally set in parallel at the same height to reduce errors due to geometric asymmetry. An XY scanner was attached to an XY block that was able to move in the X direction with a step of about 500 nm. A standard porous alumina film was employed as the reference sample. Both reference sample and test sample were installed at the center of the XY scanner on the same surface and were simultaneously imaged. The two images had the same lateral size, and thus the length of the test sample image could be accurately measured by counting the number of periodic features of the reference one. The XY block together with the XY scanner were next moved in the X direction for about 1.5 microm and a second pair of reference and test images were obtained by activating the scanner. In this way, a series of pairs of images were acquired and could be spliced into two wide-range reference and test images, respectively. Again, the two spliced images were of the same size and the length of test image was measured based on the reference one. This article presents a discussion about the structure and control of the DIU-AFM system. Some experiments were carried out on the system to demonstrate the method of length calculation and measurement. Experiments show a satisfactory result of wide-range length metrology based on the hexagonal features of the porous alumina with a periodic length of several tens of nanometers. Using this method the DIU-AFM is capable of realizing nanometer-order accuracy length metrology when covering a wide range from micron to several hundreds of microns, or even up to millimeter order.     

用计量型AFM对一维纳米基准栅的标定及不确定度估计

利用轻敲模式的计量型AFM对公称栅距为240nm一维基准样板进行了标定,在充分分析AFM的结构和特性、测量过程、数据处理的基础上,得到了基准栅的平均栅距估计值和扩展不确定度。通过全面的不确定度分析,估计值的扩展不确定度达到了亚纳米量级。该不确定度分析表明,对于纳米量级测量,不确定度估计不仅需要全面掌握测量仪器、测量过程中各种测量不确定因素的影响,还需要考虑和估计常规测量过程中可以忽略的二次误差的影响。     

基于AFM的微位移测量新方法研究

提出了一种测量物体微位移的新方法。原子力显微镜作为测量工具,样品和扫描器置于待测物体上,物体每移动一定距离就由AFM扫描获得一幅样品图像,由此获得一系列连续的序列图像。采用模板匹配方法检测相邻序列图像的偏移,从而可计算出物体的微位移。实验结果表明,用该方法还可实现物体二维方向的微位移测量,且精度达到纳米量级。     

基于平板扫描器的新型AFM系统

研制了一种基于平板扫描器的新型原子力显微镜(AFM)系统。该系统创新地把二维平板扫描器和一维反馈控制器相结合,有效地克服了传统扫描器Z向反馈控制与XY扫描平面之间的非线性交叉耦合误差,同时保证了大范围扫描时检测光路的稳定性。利用该系统与传统AFM作了氧化铝薄膜和光栅对比扫描实验,结果表明这种AFM系统能够获得无扭曲、规则的理想图像。     

Metrological atomic force microscope using a large range scanning dual stage

We developed a metrological atomic force microscope (MAFM) using a large range scanning dual stage and evaluated the performance in the measurement of lateral dimension. AFMs are widely used in nanotechnology for very high spatial resolution, but the limitation in measurement range should be overcome to expand its application in nanometrology. Therefore, we constructed new MAFM having a large measurement of 200 mm × 200 mm by using a dual stage and an AFM head module. The dual stage is composed of a coarse and a fine stage to obtain large scanning range and high resolution simultaneously. Precision surfaces and PTFE sliding pads guide the motion of coarse stage, drove by a fine pitch screw and DC motors. Flexure hinges and PZT actuators are utilized for the fine stage. Multi-axis interferometers measure the five degrees of freedom motion of the dual stage for the position control and the compensation of parasitic angular motions. The vertical displacement of AFM tip is measured by a built-in capacitive sensor in the AFM head module within the range of 38 μm. The performance of the dual stage was evaluated and the expanded uncertainty (k = 2) in the measurements of 1-D displacement L was estimated as $ U(L) = \sqrt {(2.8nm)^2 + (3.0 \times 10^{ - 7} \times L)^2 } $ U(L) = \sqrt {(2.8nm)^2 + (3.0 \times 10^{ - 7} \times L)^2 } . The relative uncertainty in pitch measurement was less than 0.02 % and the improvement of accuracy was verified by comparing with other MAFM, which are mostly due to the expansion of scan range and the compensation of angular motion. To enhance the performance, we will reduce the vibration and examine the motion of stage in the vertical direction during a long range scan.     

Design and control of a nanoprecision XY Theta scanner

This paper describes the design and control of a nanoprecision XY Theta scanner consisting of voice coil motors and air bearing guides. The proposed scanner can be installed on a conventional XY stage with long strokes to improve the positioning accuracy and settling performance. Major design considerations in developing a high precision scanner are sensor accuracy, actuator properties, structural stability, guide friction, and thermal expansion. Considering these factors, the proposed scanner is made of invar, which has a small thermal expansion coefficient and good structural stiffness. Four voice coil motors drive the scanner, which is suspended by four air bearing pads, in the x, y, and theta directions. The scanner's position is measured by three laser interferometers which decouple the scanner from the conventional stage. The mirror blocks reflecting the laser beams are fixed using viscoelastic sheets, ensuring that the scanner has a well-damped structural mode. A time delay control algorithm is implemented on the real-time controller to control the scanner. The effectiveness of the proposed scanner is verified experimentally.     

计量型原子力显微镜的位移测量系统(英文)

针对纳米结构表征和纳米制造的质量控制需要,中国计量科学研究院设计并搭建了一台计量型原子力显微镜用于纳米几何结构的测量.为了将位移精确溯源到国际单位米,研制了单频8倍程干涉仪测量位移,样品表面形貌则由接触式原子力显微镜测量.一个立方体反射镜与原子力显微镜的测头固定,作为干涉仪的参考镜.两个互相垂直的干涉仪用于测量样品与探针在x-y方向的相对位置.样品台置于具有三面反射镜的零膨胀玻璃块上,由压电陶瓷位移台驱动.另外两台干涉仪测量样品与探针在z方向的位移,探针针尖位于干涉仪光束的交点以减小Abbe误差.由于光学器件的缺陷产生的相位混合会引起非线性误差,采用谐波分离法拟合干涉信号来修正误差,修正后干涉仪测量误差减小为0.7 nm.     

阿贝原则再认识

为探究阿贝原则在现代超精密制造和测量中的适应性,回顾了古典阿贝原则及其扩展,剖析了要素布局产生的一次误差,研究了二维长度测量中的阿贝原则。通过分析测量系统的标准量、被测量、瞄准点、读数点、导向面5个要素的不同布局产生的误差,发现当标准量和被测量按经典阿贝原则要求处于同一条直线上,而其余要素不在这条直线上时,也会产生一次误差。提出了瞄准共线、读数共线、导向共线以及阿贝臂误差、瞄准臂误差、读数臂误差、导向臂误差和阿贝综合误差等概念。揭示了阿贝原则的隐含条件,重新表述了阿贝原则。讨论了上下堆叠式和共平面式二维结构的阿贝原则适应性,提出了一种提升工具显微镜精度的简明方案,介绍了一种减小阿贝误差的共平面二维精密工作台。对阿贝原则的再认识,可更新设计理念,用于研制超精密仪器和机械,也可用于经典量仪的精度再提升。     

大范围扫描原子力显微镜自动调平控制技术

为了进一步扩大原子力显微镜(AFM)的应用范围,研制出一套大范围高速AFM系统.该系统采用上、下两个扫描器,上扫描器负责Z方向闭环控制的动态响应,下扫描器负责X、Y方向平面扫描及Z方向补偿控制.针对样品放置倾斜对大范围扫描成像的影响,提出基于多线扫描的样品自动调平控制技术.首先通过多线扫描确定样品倾斜位置,然后将所有扫描点的倾斜位移差用函数式表达,最后将位移差换算为控制电压作为扫描器Z向的前馈控制输入.实验结果表明,能消除样品倾斜对AFM大范围扫描的影响.     

GTG banding pattern on human metaphase chromosomes revealed by high resolution atomic-force microscopy

Surface topography of human metaphase chromosomes following GTG banding was examined using high resolution atomic force microscopy (AFM). Although using a completely different imaging mechanism, which is based on the mechanical interaction of a probe tip with the chromosome, the observed banding pattern is comparable to results from light microscopy and a karyotype of the AFM imaged metaphase spread can be generated. The AFM imaging process was performed on a normal 2 n  = 46, XX karyotype and on a 2 n  = 46, XY, t(2;15)(q23;q15) karyotype as an example of a translocation of chromosomal bands.     

Limitations of precision length measurements based on interferometers

The most important principles, the basis and operation of heterodyne and homodyne interferometers are discussed. Their benefits and limitations are covered based on a metrological analysis. The resolution of interferometers can be determined by calculating the smallest resolvable distance increment. Also, it is shown here how the Abbe comparator principle can be fulfilled in all three measuring dimensions by using interferometers. Other factors in addition to the Abbe errors are discussed which affect the measurement uncertainty of interferometric length measurements.     

Fast contact-mode atomic force microscopy on biological specimen by model-based control

The dynamic behavior of the piezoelectric tube scanner limits the imaging rate in atomic force microscopy (AFM). In order to compensate for the lateral dynamics of the scanning piezo a model based open-loop controller is implemented into a commercial AFM system. Additionally, our new control strategy employing a model-based two-degrees-of-freedom controller improves the performance in the vertical direction, which is important for high-speed topographical imaging. The combination of both controllers in lateral and vertical direction compensates the three-dimensional dynamics of the AFM system and reduces artifacts that are induced by the systems dynamic behavior at high scan rates. We demonstrate this improvement by comparing the performance of the model-based controlled AFM to the uncompensated and standard PI-controlled system when imaging pUC 18 plasmid DNA in air as well as in a liquid environment.     

Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis

State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical mappings with excellent sensitivity and spatial resolution. Several important artifacts however arise from the fact that SIMS 3D mapping does not take into account the surface topography of the sample. In order to correct these artifacts, we have integrated a specially developed scanning probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new high-precision sample stage, a scanner with a range of 100 μm in x and y direction, and a dedicated SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy modes. Topographical information gained from AFM measurements taken before, during, and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D reconstruction using the software program "SARINA," which was developed for this first combined SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMS-SPM approach.     

双成象单元扫描探针显微镜在纳米计量中的应用

研制了用于纳米计量的双成象单元扫描隧道显微镜一原子力显微镜，由扫描隧道显微镜参考单元和原子力显微镜被测单元组合而成。两者共用同一XY扫描器，同时对参考样品石墨和被测样品扫描成象。得到的石墨原子晶格参考图象与被测样品图象横向尺度相同，计数前者的原子晶格个数，即可精确测定被测样品图象的尺寸。利用本方法可对任何样品表面的超微观结构进行严格的纳米计量。     

Investigation of error separation for three dimensional profile rotary measuring system

High precision 3D profile rotary measuring systems for large diameter workpieces are urgently needed in precision engineering. Error separation is critical for improving the accuracy of the system. In order to obtain higher accuracy for 3D profile rotary measuring systems, the random and systematic errors are analyzed and separated in this paper. In the measuring system, roll and pitch caused by the probe tilt violate the Abbe principle. Roll is removed by using two probes and pitch is separated by the interferometer method. The radial run-out and the perpendicularity error between the probe and the spindle axis are compensated by a two-probe-two-step method carried out on a standard hemisphere artifact. As the form error of the artifact is mixed with the perpendicularity error, the least-squares method is applied to fit the hemisphere and work out the perpendicularity error and the profile error of the hemisphere. Finally, numerical validation is presented using Matlab program to demonstrate the effectiveness and correctness of the proposed method.     

A linear air bearing stage with active magnetic preloads for ultraprecise straight motion

In this paper, we propose a linear motion stage designed with magnetically preloaded air bearings. The magnetic actuators for preloading air bearings were combined with permanent magnets and coils to adjust the air bearing clearance by actively controlling the magnetic force. The system was designed to achieve a simplified configuration of air bearing stage while providing ultraprecise straight motion by actively compensating for the motion errors. The porous aerostatic bearings and magnetic preload actuators were designed and analyzed numerically for a single-axis prototype linear stage driven by a coreless linear motor. A magnetic circuit model was derived for the magnetic actuators. The static stiffness and load capacity of the air bearing stage in the vertical (magnetically preloaded) direction were experimentally measured and compared with the results from the numerical analysis. Motion control laws for three degrees of freedom (i.e., vertical, pitch, and roll motions) were obtained with a high linearity and independence for each axis. The active compensation of three motion errors, the vertical, pitch and roll motion errors were performed through curve-fitting the three errors measured with combination of capacitive gap sensors and a laser interferometer. The errors were reduced from 1.09 to 0.11 μm for the vertical straightness error, from 9.42 to 0.18 arcsec for the pitch motion, and from 2.42 to 0.18 arcsec for the roll motion as level of measured repeatability.     

Volumetric phase-measuring interferometer for three-dimensional coordinate metrology

We present a volumetric interferometer that has been specially designed to improve the measurement accuracy of the three-dimensional coordinate metrology by reducing excessive Abbe offsets. The interferometer is composed of two main parts; one is a three-dimensionally movable target and the other is a stationary two-dimensional array of photo-detectors. The target made of point diffraction sources emanates two spherical wavefronts, of which interference intensity is monitored by the photo-detectors. Applying phase shifting allows the phases of the photo-detectors to be precisely obtained, and the measured phases are fitted to a geometric model of multilateration so as to determine the xyz-location of the target by minimizing least square errors. A prototype built on a CMM demonstrates that the proposed interferometer is capable of measuring the xyz-coordinates of the probe with a volumetric uncertainty of less than 1.0 μm.     

基于原子力显微镜的微纳结构力学测试系统

原子力显微镜是微纳米尺度科学研究中的一个精密仪器,从原理和应用,设备的软件、硬件的扩展都具有很大的发展空间.随微纳机电系统的应用,非常迫切需要开发基于原子力显微镜的力学相关测试系统.在此情况下,着重开发部分相关力学测试软件和系统硬件的扩展.基于原子力显微镜中的一个最基本的力-位移曲线功能,开发力学测试软件,实施单点、多点的力曲线测量,疲劳度测量和单线扫描四个测试功能,系统在硬件上增添微动平台,具有较大的横向位移,保证微纳结构尺寸的测试.相关测试表明,该软件具有较好的一致性和使用性,能方便地进行力学量的提取.     

Micromachined Si cantilever arrays for parallel AFM operation

Silicon cantilever arrays with a very small pitch for parallel AFM operations were studied. We fabricated 1x104 in eight groups and 1x30 Si probe arrays and produced a smaller pitch (15 μm) between probe tips by using Si anisotropic etching with a vertical wall shaped oxide mask. The vertical controls of Si probes were able to operate individually or in a group by integrating electrostatic actuators into the cantilevers of the probes. The fabricated Si cantilever arrays showed reasonable dynamic characteristics for the probe cantilever and reliable parallel operation of AFM.     

Components for high speed atomic force microscopy

Many applications in materials science, life science and process control would benefit from atomic force microscopes (AFM) with higher scan speeds. To achieve this, the performance of many of the AFM components has to be increased. In this work, we focus on the cantilever sensor, the scanning unit and the data acquisition. We manufactured 10 microm wide cantilevers which combine high resonance frequencies with low spring constants (160-360 kHz with spring constants of 1-5 pN/nm). For the scanning unit, we developed a new scanner principle, based on stack piezos, which allows the construction of a scanner with 15 microm scan range while retaining high resonance frequencies (>10 kHz). To drive the AFM at high scan speeds and record the height and error signal, we implemented a fast Data Acquisition (DAQ) system based on a commercial DAQ card and a LabView user interface capable of recording 30 frames per second at 150 x 150 pixels.