共查询到17条相似文献,搜索用时 196 毫秒
1.
单粒子效应对航天器的威胁及空间飞行试验评论(一) 总被引:2,自引:0,他引:2
列举了若干航天器因单粒子效应而出现的异常或故障。阐述了单粒子效应空间飞行试验方法和预估方法。总结了多颗航天器单粒子效应空间飞行试验结果。依据空间飞行试验结果,对静止卫星、低太阳同步轨道卫星和椭圆轨道卫星在太阳宁静和太阳耀斑期间单粒子效应作了比较。 相似文献
2.
单粒子效应对航天器的威胁及空间飞机试验评论(二) 总被引:1,自引:0,他引:1
列举了若干航天器因单粒子效应而出现的异常或故障。阐述了单粒子效应空间飞行试验方法和预估方法。总结了多颗航天器单粒子效应空间飞行试验结果。依据空间飞行试验结果,对静止卫星、低太阳同步轨道卫星和椭圆轨道卫星在太阳宁静和太阳耀斑期间单粒子效应作了比较。 相似文献
3.
4.
5.
6.
针对设计研制的512×512 CMOS APS图像传感器,采用聚焦脉冲激光束研究了其空间单粒子效应特性。试验结果表明,CMOS APS器件图像传感器存在单粒子翻转(SEU)和单粒子锁定(SEL)现象。验证了CMOS APS图像传感器抗单粒子锁定设计的有效性。当对图像传感器移位寄存器区进行照射时,同时发生单粒子翻转和单粒子锁定,器件其它区域也有类似现象。分析了器件单粒子效应的敏感性,获得了器件发生单粒子翻转和锁定的脉冲激光能量阈值及器件锁定电流大小。 相似文献
7.
8.
9.
10.
11.
Maguang Zhu Peng Lu Xuan Wang Qian Chen Huiping Zhu Yajie Zhang Jianshuo Zhou Haitao Xu Zhengsheng Han Jianwei Han Rui Chen Bo Li Lian-Mao Peng Zhiyong Zhang 《Small (Weinheim an der Bergstrasse, Germany)》2023,19(1):2204537
Carbon nanotube (CNT) field-effect transistors (FETs) have been considered ideal building blocks for radiation-hard integrated circuits (ICs), the demand for which is exponentially growing, especially in outer space exploration and the nuclear industry. Many studies on the radiation tolerance of CNT-based electronics have focused on the total ionizing dose (TID) effect, while few works have considered the single event effects (SEEs) and displacement damage (DD) effect, which are more difficult to measure but may be more important in practical applications. Measurements of the SEEs and DD effect of CNT FETs and ICs are first executed and then presented a comprehensive radiation effect analysis of CNT electronics. The CNT ICs without special irradiation reinforcement technology exhibit a comprehensive radiation tolerance, including a 1 × 104 MeVcm2 mg−1 level of the laser-equivalent threshold linear energy transfer (LET) for SEEs, 2.8 × 1013 MeV g−1 for DD and 2 Mrad (Si) for TID, which are at least four times higher than those in conventional radiation-hardened ICs. The ultrahigh intrinsic comprehensive radiation tolerance will promote the applications of CNT ICs in high-energy solar and cosmic radiation environments. 相似文献
12.
D. Pavarin A. Francesconi R. Destefanis M. Faraud M. Lambert A. Bettella C. Giacomuzzo P.C. Marucchi-Chierro R. Ullio F. Angrilli 《International Journal of Impact Engineering》2008
In order to analyze the propagation of shocks due to hypervelocity impact of micrometeoroids and space debris on spacecrafts, it was necessary to analyze the high-frequency shock-propagation-dynamic on complex structures representative of real spacecraft structure. Objective of this research is the GOCE satellite due to its highly accurate accelerometer very sensitive to the micro-vibration environment. After a detailed analysis of the most-probable shock-propagation-path within the satellite, several representative targets have been designed. Then an extensive test campaign has been conducted on these targets exploring a wide range of impact conditions. As a result, a database was established which correlates the impact conditions in the experimental range (0.6–2.3 mm projectiles at 2.5–5 km/s) with the shock spectra on selected locations on various types of structural models. The behaviour of structural joints was also analyzed under shock conditions that are not normally reproduced by pyroshock testing. The database represent a fundamental tool in order to validate the numerical analysis that will be used to assess the vibration environment, due to in-orbit micrometeoroids and space debris at the accelerometer location. This paper presents the test procedure applied and the general results achieved. 相似文献
13.
14.
S. B. Umesh S. R. Kulkarni R. Sandhya G. R. Joshi R. Damle M. Ravindra 《Bulletin of Materials Science》2005,28(5):473-476
Several very large scale integrated (VLSI) devices which are not available in radiation hardened version are still required
to be used in spacecraft systems. Thus these components need to be tested for highenergy heavy ion irradiation to find out
their tolerance and suitability in specific space applications. This paper describes the high-energy heavy ion radiation testing
of VLSI devices for single event upset (SEU) and single event latch up (SEL). The experimental set up employed to produce
low flux of heavy ions viz. silicon (Si), and silver (Ag), for studying single event effects (SEE) is briefly described. The
heavy ion testing of a few VLSI devices is performed in the general purpose scattering chamber of the Pelletron facility,
available at Nuclear Science Centre, New Delhi. The test results with respect to SEU and SEL are discussed. 相似文献
15.
蜂窝板是一种特殊的高强度轻质复合材料,在卫星等航天器结构中应用广泛。MSC/NASTRAN和ANSYS等大型通用有限元软件中没有蜂窝结构单元库,只能用蜂窝板等效结构参数进行计算,等效过程中的简化导致有限元计算结果与试验测量值之间存在差异。基于响应面的模型修正方法可以避免每次迭代都调用有限元程序,提高计算效率。依据三明治夹芯板理论计算蜂窝芯等效结构参数,用ANSYS中的SHELL91单元建立多铺层碳纤维蜂窝板模型,用基于均匀设计的试验设计方法进行试验设计,获得蜂窝板在各因素和水平下的试验数据,构造二次多项式响应面,并用带变异算子的改进粒子群算法对蜂窝芯结构等效参数进行修正,修正后参数代入有限元模型,能有效改善模型计算质量。 相似文献
16.
17.