pH值对CBD-CdS薄膜性能的影响

重点考察了化学水浴沉积法(CBD)制备CdS多晶薄膜时pH值对薄膜质量的影响规律.分别采用SEM、XRD、UV光谱仪和台阶仪研究了薄膜的表面形貌、晶体结构、透过率和厚度特征.研究表明,当pH值在8.43～10.09间变化时,薄膜为立方晶型,随着pH值的降低,晶粒出现择优生长,薄膜透过率逐渐升高,吸收边蓝移,禁带宽度增大.当pH值为8.43时得到的薄膜光学禁带宽度为2.44eV,接近其本征值.     

CdS薄膜的生长和结构分析

使用化学浴沉积(CBD)在硫酸镉-硫脲的氨溶液中,成功地制备出了高质量的CdS薄膜.用扫描电境(SEM)、X射线衍射(XRD)及紫外-可见-近红外光谱仪对其进行了测试分析,结果表明,NH3摩尔浓度对生成CdS薄膜的表面致密性影响很大,当NH3摩尔浓度比较大时,无法生成连续致密的胶体颗粒薄膜,反应体系中S2-和Cd2 溶液的摩尔浓度增加,CdS胶体粒度增大.在相同NH3摩尔浓度下,随着S2-和Cd2 摩尔浓度比值([S2-]/[Cd2 ])的增大,CdS胶体粒子粒度减小;透过光谱的峰位随着胶体粒子尺寸的减小向短波方向移动,当NH3摩尔浓度变化时,在一定的范围内改变CdS膜的透过率.将化学浴沉积(CBD)过程的研究从薄膜厚度优化改进为胶体粒子尺寸优化,促进了CBD技术的发展.     

透明致密ZnO薄膜的恒电流沉积及生长过程研究

采用阴极恒电流沉积方法, 以Zn(NO ₃)₂水溶液为电沉积液, 在经电化学预处理后的ITO导电玻璃上生长了具有c轴高度择优取向、均匀致密的透明ZnO薄膜. 采用X射线衍射、扫描电镜和光学透过谱等技术, 对不同沉积时间条件下薄膜的结晶特性、表面和断面结构、光学性质等进行了研究. 结果表明, 沉积时间对ZnO薄膜质量影响明显: 在薄膜生长后期(120min), ZnO薄膜的结晶性和表面平整度明显降低, 晶粒尺寸增大, 可见光透过率下降, 表明高质量ZnO薄膜的电化学沉积有一最佳生长时间; 此外, 薄膜厚度随时间呈线性变化, 表明可通过生长时间实现对ZnO薄膜厚度的精确控制.     

络合剂对化学水浴沉积 ZnS薄膜的影响

采用不同络合剂化学水浴沉积ZnS薄膜,应用台阶仪、SEM、XRD、波谱仪等手段测定了ZnS薄膜的厚度、表面、物相结构及透过率等.结果表明,氨水体系沉积薄膜速度明显慢于另外两种体系,沉积的ZnS薄膜都为立方结构.柠檬酸钠体系沉积的ZnS 薄膜结晶和透过率最佳,但薄膜表面缺陷较多;氨水-联氨体系沉积的ZnS薄膜表面质量最佳,结晶和透过率也较好;氨水体系沉积的ZnS薄膜质量较差.用3种体系沉积的ZnS薄膜用于制备铜铟镓硒Cu(In,Ga)Se2太阳电池,氨水和氨水-联氨体系沉积的ZnS薄膜制备的电池转换效率明显高于柠檬酸钠体系沉积的ZnS制备的太阳电池.     

磁控溅射法制备的CdS:Al薄膜的性质研究

采用Al和CdS双靶共溅射的方法, 调控Al和CdS源的沉积速率, 制备出不同Al掺杂浓度的CdS:Al薄膜。通过XRD、SEM、AFM、紫外-可见透射光谱分析、常温霍尔测试对CdS: Al薄膜的结构、形貌、光学和电学性质进行表征。XRD结果表明, 不同Al掺杂浓度的CdS:Al薄膜均为六方纤锌矿结构的多晶薄膜, 并且在(002)方向择优生长。SEM和AFM结果表明, CdS:Al薄膜的表面均匀致密, 表面粗糙度随着Al掺杂浓度的增加略有增加。紫外-可见透射光谱分析表明, CdS:Al薄膜禁带宽度在2.42~2.46 eV 之间, 随着Al掺杂浓度的增加而略微减小。常温霍尔测试结果证明, 掺Al对CdS薄膜的电学性质影响显著, 掺Al原子浓度3.8%以上的CdS薄膜, 载流子浓度增加了3个数量级, 电阻率下降了3个数量级。掺Al后的CdS薄膜n型更强, 有利于与CdTe形成更强的内建场, 从而提高太阳电池效率。用溅射方法制备的CdS:Al薄膜的性质适合用作CdTe薄膜太阳电池的窗口层。     

沉积气压对电弧离子镀制备MgO薄膜的结构及性能的影响

采用阴极真空电弧离子沉积技术在玻璃及Si衬底上成功地制备了具有择优结晶取向的透明MgO薄膜。利用X射线衍射仪（XRD）、扫描电子显微镜（SEM）及紫外-可见吸收光谱仪分别对MgO薄膜微观结构、表面形貌及可见光透过率进行了测试与分析。XRD结果表明,所制备的MgO薄膜具有NaCl型立方结构的（100）、（110）和（111）3种结晶取向,在沉积气压为0.7～3.0Pa的范围内,薄膜的择优结晶取向随沉积气压的升高先由（100）转变为（110）,最后变为（111）。SEM图表明随着沉积气压的升高,MgO薄膜的晶粒逐渐变小,薄膜结晶质量变差。在380～900nm范围内,沉积气压为0.7Pa下制备的MgO薄膜其可见光透过率高于90%,随着沉积气压的升高,薄膜的可见光透过率有所下降。     

沉积时间对脉冲激光沉积法制备ZnO薄膜性能的影响

采用脉冲激光沉积技术(PLD)在氧气气氛中以高纯Zn为(99.999%)靶材,在单晶硅和石英衬底表面成功生长了ZnO薄膜.通过X射线衍射仪、表明轮廓仪、荧光光谱仪、紫外可见分光光度计对合成薄膜材料的晶体结构、厚度、光学性质等进行了研究,分析了ZnO薄膜的沉积时间对其性能的影响.结果表明,采用PLD法在室温下可以制备出(002)结晶取向和透过率高于75%的ZnO薄膜,但室温下沉积的ZnO薄膜的发射性能较差,沉积时间的延长不能改善薄膜的发光性能.     

掺In纳米ZnO、CdS薄膜结构、光学特性分析

采用真空气相沉积法在玻璃衬底上制备纳米级ZnO和CdS薄膜.研究掺In和热处理对ZnO、CdS薄膜结构、光学特性的影响.实验给出,适当掺杂能够明显改善纳米ZnO、CdS薄膜的物相结构,ZnO薄膜的晶粒尺寸随掺杂含量的增加而减小,CdS薄膜晶粒尺寸随掺杂含量的增加而变大,但薄膜的光透射性有所降低.在短波范围内,ZnO薄膜的光透率好于CdS薄膜;在500 nm～1000 nm范围内,CdS薄膜的光透率好.掺In后ZnO薄膜的光学带宽从3.2eV减小至2.85 eV;掺In后CdS薄膜光学带宽从2.42 eV减小至2.35eV.     

沉积电位对CdSe纳米晶薄膜的结构、形貌和光学性质的影响

使用电化学法在ITO玻璃上制备了CdSe纳米晶薄膜.研究了沉积电位对薄膜晶体结构、表面形貌及光学性质的影响,并讨论了所得样品禁带宽度与晶粒尺寸的关系.X-ray衍射结果表明:沉积电位在-600～-700mV之间均可得到立方相CdSe,晶粒尺寸随沉积电位降低而增大.原子力显微镜观察表明,沉积电位较高时,粒子聚集为块状或柱状,沉积电位较低时,粒子呈现不均匀团聚.透射光谱测试显示:在350～850nm波段范围内,随沉积电位降低,透过率降低,吸收边红移.所得样品的禁带宽度均比体相CdSe大,且随晶粒尺寸的增大而减小,表现出明显的量子尺寸效应.     

气溶胶辅助化学气相沉积制备Al掺杂ZnO透明导电薄膜

采用气溶胶辅助化学气相沉积(AACVD)法在玻璃衬底上制备了Al掺杂ZnO(AZO)薄膜. 研究了Al掺杂(2at%~8at%)对ZnO薄膜结构及光电性能的影响. 利用XRD、SEM、EDAX、紫外可见分光光度计等手段对样品进行测试. 结果表明, 制备的所有AZO薄膜均具有纤锌矿结构, 不具有沿c轴方向的择优取向, XRD图谱中未观察出Al的相关分相. 在可见光范围内, AZO薄膜的平均透过率大于72%, 光学禁带宽度随Al掺杂量的增加而变窄. 同时根据四探针技术所得的数据得知: Al的掺杂导致薄膜方块电阻的变化, 随着Al掺杂量的增加, 方块电阻有明显变小的现象, 掺杂6at%Al的AZO薄膜具有最低方块电阻(18Ω/□).     

Analysis of the early growth mechanisms during the chemical deposition of CdS thin films by spectroscopic ellipsometry

Chemically deposited CdS thin films were analyzed in this work by means of the spectroscopic ellipsometry technique. The CdS thin films were deposited from an ammonia-free process at short durations in order to obtain information about the layer microstructure and kinetic growth process. We found that the conditions of the ammonia-free reaction solution promote the ion-by-ion deposition process at the early growth stages yielding a compact, high refraction index and highly crystalline oriented CdS layers. Using a concentration of 1.82 mg/ml of cadmium in the reaction solution, the resulting films possess a double layer microstructure which consists of an inner compact layer and an external porous one. The inner layer is developed during the first 15 min of deposition time and it reaches a thickness around of 80 nm. After this time and on this inner layer of CdS, it grows an external porous layer whose thickness increases with the deposition time. The formation of the CdS compact layer at the early stages is related with the ion-by-ion growth mechanism. The subsequent CdS porous layer is formed during the cluster-by-cluster growth stage at longer deposition times. By reducing the cadmium concentration in reaction solution down to 0.76 mg/ml, maintaining constant molar ratio concentrations of Cd/complexing and Cd/thiourea, the chemically deposited CdS films develop only the inner compact layer with a thickness of about 80 nm after 35 min of deposition time.     

Structural, photoluminescence and optical properties of chemically deposited (Cd1−xBix)S thin films as a function of dopant concentration

In this study, (Cd_1?xBi_x)S thin films were successfully deposited on suitably cleaned glass substrate at 60 °C temperature, using the chemical bath deposition technique. After deposition, the films were also annealed at 400 °C for 2 min in air. The structural properties of the deposited films were characterized using X-ray diffraction and AFM. Formation of cubic structure with preferential orientation along the (111) plane was confirmed together with BiS second phase from structural analysis. The interplanar spacing, lattice constant, and crystallite size of (Cd_1?xBi_x)S thin films were calculated by the XRD. The crystallite size of the un-doped CdS thin films was found to be 7.84 nm, which increased to 11.1 nm with increasing Bi content from 0 to 10 %. The surface roughness of the films was measured by AFM studies. The photoluminescence spectra were observed at red shifted band edge peak with increasing doping concentration of Bi from 0 to 5 % in the un-doped CdS thin films. The optical properties of the films are estimated using optical absorption and transmission spectra in the range of 400–800 nm using UV–VIS spectrophotometer. The optical band gap energy of the films was found to be decreased from 2.44 to 2.23 eV with the Bi content being from 0 to 5 %. After annealing, the band gap of these films further decreased.     

Chemical bath deposition of CdS thin films doped with Zn and Cu

Zn- and Cu-doped CdS thin films were deposited onto glass substrates by the chemical bath technique. ZnCl₂ and CuCl₂ were incorporated as dopant agents into the conventional CdS chemical bath in order to promote the CdS doping process. The effect of the deposition time and the doping concentration on the physical properties of CdS films were investigated. The morphology, thickness, bandgap energy, crystalline structure and elemental composition of Zn- and Cu-doped CdS films were investigated and compared to the undoped CdS films properties. Both Zn- and Cu-doped CdS films presented a cubic crystalline structure with (1 1 1) as the preferential orientation. Lower values of the bandgap energy were observed for the doped CdS films as compared to those of the undoped CdS films. Zn-doped CdS films presented higher thickness and roughness values than those of Cu-doped CdS films. From the photoluminescence results, it is suggested that the inclusion of Zn and Cu into CdS crystalline structure promotes the formation of acceptor levels above CdS valence band, resulting in lower bandgap energy values for the doped CdS films.     

Optical and structural properties of chemically deposited CdS thin films on polyethylene naphthalate substrates

CdS thin films were deposited on polyethylene naphthalate substrates by means of the chemical bath deposition technique in an ammonia-free cadmium-sodium citrate system. Three sets of CdS films were grown in precursor solutions with different contents of Cd and thiourea maintaining constant the concentration ratios [Cd]/[thiourea] and [Cd]/[sodium citrate] at 0.2 and 0.1 M/M, respectively. The concentrations of cadmium in the reaction solutions were 0.01, 7.5 × 10⁻³ and 6.8 × 10⁻³ M, respectively. The three sets of CdS films were homogeneous, hard, specularly reflecting, yellowish and adhered very well to the plastic substrates, quite similar to those deposited on glass substrates. The structural and optical properties of the CdS films were determined from X-ray diffraction, optical transmission and reflection spectroscopy and atomic force microscopy measurements. We found that the properties of the films depend on both the amount of Cd in the growth solutions and on the deposition time. The increasing of Cd concentration in the reaction solution yield to thicker CdS films with smaller grain size, shorter lattice constant, and higher energy band gap. The energy band gap of the CdS films varied in the range 2.42-2.54 eV depending on the precursor solution. The properties of the films were analyzed in terms of the growth mechanisms during the chemical deposition of CdS layers.     

Multiple dip deposition of CdS films prepared by oscillating chemical bath

Highly oriented CdS thin films with thicknesses greater than 1 μm were deposited using the oscillating chemical bath deposition technique with multiple dips at 75 °C, and from 15 to 75 min as deposition times. Samples with different thicknesses were deposited by repeating the chemical deposition process one, two and three times. All CdS films present the α-greenockite hexagonal structure with (002) as the preferential orientation. Band-gap energy values ranged from 2.35 to 2.42 eV, being the smaller value for the two dip processes. Energy dispersion spectroscopy measurements show good stoichiometry of the CdS films with 4.3 at.% as the maximum Cd variation.     

Deposition of CdS thin films onto Si(111) substrate by PLD with femtosecond pulse

The effect of laser fluence (laser incident energy in the range of 0.5-1.5 mJ/pulse with the same laser spot size of 0.5 mm × 0.7 mm) on the structural quality and optical properties synthesized by femtosecond pulsed-laser deposition has been studied. The structural quality and optical properties of the deposited CdS thin films were investigated by X-ray diffraction, atomic force microscopy and photoluminescence measurement. The studies revealed an improvement in the structural quality and optical properties of the CdS thin films with increasing the laser fluence in some range. However, too high laser fluence could lead to the structural quality and optical properties of the CdS thin films to degrade. We defined the optimum laser incident energy was around 1.2 mJ/pulse. And the kinetic energy of the plasma produced by femtosecond laser strongly affects the structure and properties of the deposited CdS thin films.     

Structural and optical characterization of CdS and CdHgTe thin films for the fabrication of CdHgTe/CdS structure

This article presents the deposition and characterization of CdS and CdHgTe thin films for the fabrication of CdHgTe/CdS structure. The growth of CdS and CdHgTe thin films on FTO-coated conducting glass substrates have been performed by chemical bath deposition (CBD) and electrodeposition methods, respectively. The deposition conditions have been optimized for getting better quality layers of CdS and CdHgTe. The grown layers of both CdS and CdHgTe have been characterized by photoelectrochemical cell (PEC) measurement, X-ray diffraction (XRD), scanning electron microscopy (SEM) and UV–vis spectrophotometer. Annealing effect of the deposited films has also been investigated. Finally the fabrication of CdHgTe/CdS structure has been performed and investigated by I–V characteristics. PEC, XRD, SEM and UV–vis spectrophotometer studies reveal that chemically deposited CdS layers are n-type with band gap values vary from 2.29 to 2.41 eV and cubic with (111) preferential orientation, and have spherical grain distributed over the surface. However, electrodeposited CdHgTe layers are p-type with band gap values varying from 1.50 to 1.53 eV and cubic with highly oriented CdHgTe crystallites with the (111) planes parallel to the substrate, and have uniform distribution of granular grains over the surface. The fabricated CdHgTe/CdS structure gave an open-circuit photovoltage and a short-circuit photocurrent of 510 mV and 13 mA/cm² respectively, under AM 1.5 illumination.     

Deposition and properties of CBD and CSS CdS thin films for solar cell application

We deposited cadmium sulfide (CdS) thin films using the chemical-bath deposition (CBD) and close-spaced sublimation (CSS) techniques. The films were then treated in CdCl₂ vapor at 400 °C for 5 min. The CSS CdS films had hexagonal structure, and good crystallinity. The CdCl₂ treatment did not produce major changes, but there was a decrease in the density of planar defects. The untreated CBD CdS films had cubic structure and poorer crystallinity than the CSS films. After the CdCl₂ treatment, these films recrystallized to the hexagonal phase, resulting in better crystallinity and a lower density of planar defects. The conformal coverage and the presence of bulk oxygen are the key issues in making the CBD films more suitable for photovoltaic applications.     

Formation and properties of cadmium sulfide buffer layer for CIGS solar cells grown using hot plate bath deposition

In the present study, cadmium sulfide (CdS) thin films were deposited on different substrates [soda glass, fluoride doped tin oxide, and tin doped indium oxide (ITO) coated glass] by a hot plate method. To control the thickness and the reproducibility of the sample production, the thin films were coated at different temperatures and deposition times. The CdS thin films were heated at 400 °C in air and forming gas (FG) atmosphere to investigate the effect of the annealing temperatures. The thickness of the samples, measured by ellipsometry, could be controlled by the deposition time and temperature of the hot plate. The phase formation and structural properties of CdS thin films were studied by X-ray diffraction and scanning electron microscopy, whereas the optical properties were obtained by UV–vis spectroscopy. A hexagonal crystal structure was observed for CdS thin films and the crystallinity improved upon annealing. The structural and optical properties of CdS thin films were also enhanced by annealing at 400 °C in FG atmosphere (95 % N₂, 5 % H₂). The optical band gap was changed from 2.25 to 2.40 eV at different annealing temperatures and gas atmospheres. A higher electrical conductivity, for the sample annealed at FG, was noticed. The samples deposited on ITO and annealed in FG atmosphere showed the best structural and electrical properties compared to the other samples. CdS thin films can be widely used for application as a buffer layer for copper–indium–gallium–selenide solar cells.     

The effect of sulfur concentration on the properties of chemical bath deposited CdS thin films

We study the structural, surface morphology and optical properties of chemical bath deposited (CBD) cadmium sulfide (CdS) thin films under the effect of variation of S/Cd ratio. CdS thin films have been successfully deposited by CBD technique with solutions containing S/Cd ionic concentration ratio of 5.0, 2.5, 1.0, 0.5 and 0.25. Single phase CdS, with a hexagonal structure, is observed for the concentration of S/Cd = 5.0, 2.5, 1.0 and 0.5 films while for the ratio of 0.25, the films exhibited a partially amorphous nature. These have been confirmed by X-ray diffraction (XRD), transmission and scanning electron microscopy (TEM and SEM) analyses. The band gaps of the films obtained by transmission and photoacoustic spectra are found to be in the range of 2.40 to 3.26 eV. The large variation of band gaps of the films with composition is discussed by employing quantum size effect phenomena. The transition levels of CdS are also studied using photoacoustic spectroscopy.