Effects of CCl4 concentration on nanocrystalline diamond film deposition in a hot-filament chemical vapor deposition reactor

The effect of CCl₄ concentration on the nanocrystalline diamond (NCD) films deposition has been investigated in a hot-filament chemical vapor deposition (HFCVD) reactor. NCD films with a thickness of few-hundred nanometers have been synthesized on Si substrates from 2.0% and 2.5% CCl₄/H₂ at a substrate temperature of 610 °C. Polycrystalline diamond films and nanowall-like films with higher formation rates than those of the NCD films were deposited from lower and higher CCl₄ concentrations, respectively. The grain sizes of the diamond film grown using 2.0% CCl₄ increased with film thickness while a diamond film with uniform nanocrystalline structure all over a thickness of 1 μm can be deposited in the case of 2.5% CCl₄. We suggest that both the primary nucleation and the secondary nucleation processes are crucial for the growth of the NCD films on Si substrates.     

Seeding of polymer substrates for nanocrystalline diamond film growth

Nanocrystalline diamond (NCD) thin films and structures are grown by microwave plasma CVD technique on SiO₂/Si substrates patterned by polymer. The substrates are seeded by ultra-dispersed diamond (UDD) nanoparticles in polymer, by spin coating of UDD drop and by ultrasonic treatment in solution of UDD.For all samples, the deposited NCD film is strongly related to the primary polymer deposited over the Si/SiO₂ substrate. For a certain concentration of UDD, seeding by polymer composite results in formation of fully closed layer. The drop of UDD requires using of spin coating process and by repeating of this procedure, a NCD layer with clear 3D geometry is achieved. Ultrasonic treatment leads in “implanting” of UDD into the polymer bulk. The primary polymer stripes are damaged during this procedure. In addition, 3D porous like layer is observed after the CVD growth.Optimizing the seeding procedure and the dimension of the primary polymer allow a direct growth of self-standing air bridges suitable for MEMS/NEMS applications.     

Comparative study of diamond films grown on silicon substrate using microwave plasma chemical vapor deposition and hot-filament chemical vapor deposition technique

Diamond films on the p-type Si(111) and p-type(100) substrates were prepared by microwave plasma chemical vapor deposition (MWCVD) and hot-filament chemical vapor deposition (HFCVD) by using a mixture of methane CH₄ and hydrogen H₂ as gas feed. The structure and composition of the films have been investigated by X-ray Diffraction, Raman Spectroscopy and Scanning Electron Microscopy methods. A high quality diamond crystalline structure of the obtained films by using HFCVD method was confirmed by clear XRD-pattern. SEM images show that the prepared films are poly crystalline diamond films consisting of diamond single crystallites (111)-orientation perpendicular to the substrate. Diamond films grown on silicon substrates by using HFCVD show good quality diamond and fewer non-diamond components.     

Effect of substrate temperature on the selective deposition of diamond films

Selective diamond films on roughened Si(100) substrates with patternings have been achieved by microwave plasma chemical vapor deposition (MP-CVD). The films have been characterized by scanning electron microscopy (SEM) and Raman spectra. The influence of substrate temperature on the selective deposition of diamond films has been discussed in detail: the diamond nucleation density on the SiO₂ mask increased with substrate temperature while the effect of the selective deposition of diamond films deteriorated; the optimized deposition temperature conditions have been concluded.     

The effect of ion bombardment on the nucleation of CVD diamond

The nucleation effect of CVD diamond by ion bombardment was studied by a two-step process. In the first step, hydrocarbon and hydrogen ion bombardment was used to induce nucleation on mirror-polished (001) Si substrates. In the second step, diamond films were subsequently deposited on the ion-bombarded substrates by a conventional hot filament chemical vapor deposition. It was found that after the ion bombardment, an amorphous layer embedded with nano-crystalline diamond particles formed on the Si substrate. These nano-crystalline diamond particles were proposed to serve as the nucleation centers for the growth in the second step. The nucleation density depended strongly on the ion dosage and a nucleation density of up to 2×10⁹ cm⁻² could be achieved under optimized conditions.     

Microstructure of c-BN thin films deposited on diamond films

Diamond films were used as substrates for cubic boron nitride (c-BN) thin film deposition. The c-BN films were deposited by ion beam assisted deposition (IBAD) using a mixture of nitrogen and argon ions on diamond films. The diamond films exhibiting different values of surface roughness ranging from 16 to 200 nm (in R_rms) were deposited on Si substrates by plasma enhanced chemical vapor deposition. The microstructure of these c-BN films has been studied using in situ reflexion electron energy loss spectroscopy analyses at different primary energy values, Fourier transform infrared spectroscopy and high resolution transmission microscopy. The fraction of cubic phase in the c-BN films was depending on the roughness of the diamond surface. It was optimized in the case of the smooth surface presenting no particular geometrical effect for the incoming energetic nitrogen and argon ions during the deposition. The films showed a nanocrystalline cubic structure with columnar grains while the near surface region was sp² bonded. The films exhibit the commonly observed layered structure of c-BN films, that is, a well textured c-BN volume lying on a h-BN basal layer with the (00.2) planes perpendicular to the substrate. The formation mechanism of c-BN films by IBAD, still involving a h-BN basal sublayer, does not depend on the substrate nature.     

Diamond coating of coloured Si3N4 ceramics

The effect of Si₃N₄ secondary phases on chemical vapour deposition (CVD) diamond film growth was analyzed. Silicon nitride substrates were obtained by pressureless sintering, placing the green samples inside a powder bed of Si₃N₄/BN. Local variations in the sintering atmosphere led to samples with different grey colouration as well as chemical and physical characteristics, determined by X-ray diffraction and thermal conductivity tests, which affected the diamond film growth. A complete characterization of the films, including thickness, average crystal size, surface roughness, texture and adhesion, was done. The Si₃N₄ substrate with glassier phase gave thicker diamond films, with smaller crystal sizes and better film adhesion to the substrate than the diamond films grown on ceramic substrates with less vitreous phase.     

Microcrystalline diamond growth in presence of argon in millimeter-wave plasma-assisted CVD reactor

The additions of argon and oxygen to H₂–CH₄ feed gas and high-electron-density plasma generated by the millimeter-wave power were used to deposit microcrystalline diamond films having high quality and high growth rate simultaneously. Microcrystalline diamond films were grown on silicon substrates with 60–90 mm diameter in the millimeter-wave plasma-assisted CVD reactor based on 10 kW gyrotron operating at a frequency of 30 GHz. The growth process and morphology of diamond films at wide variation of parameters (gas pressure, substrate temperature, microwave power, argon and oxygen concentrations in gas mixtures Ar–H₂–CH₄ and Ar–H₂–CH₄–O₂) are investigated. For understanding of growth conditions the investigations of the plasma parameters (electron density and gas temperature) in novel CVD reactor are presented.     

Tribological properties and cutting performance of boron and silicon doped diamond films on Co-cemented tungsten carbide inserts

Boron and silicon doped diamond films are deposited on the cobalt cemented tungsten carbide (WC-Co) substrate by using a bias-enhanced hot filament chemical vapor deposition (HFCVD) apparatus. Acetone, hydrogen gas, trimethyl borate (C₃H₉BO₃) and tetraethoxysilane (C₈H₂₀O₄Si) are used as source materials. The tribological properties of boron-doped (B-doped), silicon-doped (Si-doped) diamond films are examined by using a ball-on-plate type rotating tribometer with silicon nitride ceramic as the counterpart in ambient air. To evaluate the cutting performance, comparative cutting tests are conducted using as-received WC-Co, undoped and doped diamond coated inserts, with high silicon aluminum alloy materials as the workpiece. Friction tests suggest that the Si-doped diamond films present the lowest friction coefficient and wear rate among all tested diamond films because of its diamond grain refinement effect. The B-doped diamond films exhibit a larger grain size and a rougher surface but a lower friction coefficient than that of undoped ones. The average friction coefficient of Si-doped, B-doped and undoped diamond films in stable regime is 0.143, 0.193 and 0.233, respectively. The cutting results demonstrate that boron doping can improve the wear resistance of diamond films and the adhesive strength of diamond films to the substrates. Si-doped diamond coated inserts show relatively poor cutting performance than undoped ones due to its thinner film thickness. B-doped and Si-doped diamond films may have tremendous potential for mechanical application.     

Low temperature CVD diamond deposition using halogenated precursors — deposition on low melting materials: Al,Zn and glass

Using HFCVD and MWCVD processes with 0.5–2.0% C₂H₅Cl+H₂, deposition was carried out at substrate temperatures between 650 and 1073 K onto Si, Zn, Al and glass (DESAG type D263) substrates. A coolable substrate holder allowed control of the substrate temperature independently from the CVD process. The temperature was measured using thermocouples. The melting point of Zn (692 K) and the unchanged shape of the substrate after deposition experiments are further proof of the correct temperature measurements. The deposited films were analyzed using Raman spectroscopy and SEM. On Si substrates, the adhesion of diamond deposited at low temperatures (650–700 K) is rather poor. In contrast to this result, we observed quite good adhesion on Al (melting point T_m 933 K) for films deposited at 760 K. The Raman spectrum shows the presence of diamond, with a peak located at 1332 cm⁻¹ with a broad luminescence background. The deposition onto Zn (T_m 692 K) proved to be much more difficult than on Al or glass D 263.     

Nitrogen-doped diamond films selected-area deposition by the plasma-enhanced chemical vapor deposition process

The nitrogen-doped diamond films have been successfully synthesized by using urea as the nitrogen source. Selected-area deposition of diamond nuclei was formed by using a SiO₂ layer as the masking material. Diamond pads, around 9 μm in diameter, were obtained when the N-doped diamond films were deposited on these patterned diamond nuclei using the chemical vapor deposition process. An emission current density as high as 200 μA/cm², with a turn-on field of around 8 V/μm, was obtained. However, the diamond emitters broke down easily, which is ascribed to the localized melting of the substrate materials surrounding the diamond pads.     

Surface acoustic wave properties of natural smooth ultra-nanocrystalline diamond characterized by laser-induced SAW pulse technique

Diamond is one of the best SAW substrate candidates due to its highest sound velocity and thermal conductivity. But conventional diamond films usually express facet structure with large roughness. Ultra-nanocrystallined diamond (UNCD) films grown in a 2.45 GHz IPLAS microwave plasma enhanced chemical vapor deposition (MPECVD) system on Si (100) substrates in CH₄-Ar plasma possess naturally smooth surface and are advantageous for device applications. Moreover, highly C-axis textured aluminum nitride (AlN) films can be grown by DC-sputtering directly on UNCD coated Si substrate. However, properties of UNCD films are much complex than microcrystalline diamond films, that is because this is a very complex material system with large but not fixed portion of grain boundaries and sp²/sp³ bonding. Properties of UNCD films could change dramatically with similar deposition condition and with similar morphologies. A simple and quick method to characterize the properties of these UNCD films is important and valuable. Laser-induced SAW pulse method, which is a fast and accurate SAW properties measuring system, for the investigation of mechanical and structure properties of thin films without any patterning or piezoelectric layer.     

Oxidation of carboxylic acids at boron-doped diamond electrodes for wastewater treatment

Thin boron-doped diamond films have been prepared by HF CVD (hot filament chemical vapour deposition technique) on conductive p-Si substrate (Si/Diamond). The morphology of these Si/diamond electrodes has been investigated by SEM and Raman spectroscopy. The electrochemical behaviour of the Si/diamond electrodes in 1 M H₂SO₄ and in 1 M H₂SO₄ + carboxylic acids has been investigated by cyclic voltammetry. Finally, the electrochemical oxidation of some simple carboxylic acids (acetic, formic, oxalic) has been investigated by bulk electrolysis. These acids can be oxidized at Si/diamond anodes to CO₂, in the potential region of water and/or the supporting electrolyte decomposition, with high current efficiency.     

Low surface temperature synthesis and characterization of diamond thin films

Polycrystalline diamond films are deposited on p-type Si(100) and n-type SiC(6H) substrates at low surface deposition temperatures of 370–530 °C using a microwave plasma enhanced chemical vapor deposition (MPECVD) system. The surface temperature during deposition is monitored by an IR pyrometer capable of measuring temperature between 250 and 600 °C in a microwave environment. The lower deposition temperature is achieved by using an especially designed cooling stage. The influence of the deposition conditions on the growth rate and structure of the diamond film is investigated. A very high growth rate up to 1.3 μm/h on SiC substrate at 530 °C surface temperature is attributed to an optimized Ar-rich Ar/H₂/CH₄ gas composition, deposition pressure, and microwave power. The structure and microstructure of the films are characterized by X-ray diffraction, scanning electron microscopy, and Raman spectroscopy. A detailed stress analysis of the deposited diamond films of grain sizes between 2 and 7 μm showed a net tensile residual stress and predominantly sp³-bonded carbon in the deposited films.     

Diamond growth on Ir/CaF2/Si substrates

A new multi-layered structure of heteroepitaxial (1 0 0) and (1 1 1) Ir grown on CaF₂-buffered (0 0 1) and (1 1 1) Si wafers by UHV electron-beam evaporation was prepared for the deposition of diamond films. A two-step process of bias-enhanced nucleation and a subsequent growth by controlling the α growth parameter was performed to deposit (0 0 1) and (1 1 1) diamond films by chemical vapor deposition, respectively. Scratching or seeding by fine diamond powders was also attempted on the (1 1 1) substrates to enhance the diamond nucleation density. Raman spectroscopy, X-ray diffraction, scanning electron microscopy and high-resolution transmission electron microscopy were used to characterize the Ir/CaF₂/Si substrates as well as the diamond films grown on top of iridium layer. Heteroepitaxial relationship between the deposited diamond grains and (0 0 1) substrates has been observed.     

Friction force microscopy study of diamond films modified by a glow discharge treatment

A glow discharge treatment technique has been developed which enables control of the surface roughness and morphology of diamond films for applications in optical and electrical components. A conventional hot filament chemical vapour deposition (CVD) system was used to deposit the diamond films onto silicon substrates via a three-step sequential process: (i) deposition under normal conditions; (ii) exposure to either a pure hydrogen plasma or 3% methane in an excess of hydrogen using DC-bias; and (iii) diamond deposition for a further 2 h under standard conditions. The frictional characteristics and roughness of the film surfaces were investigated by atomic force microscopy (AFM) and the morphology and the growth rates determined from scanning electron microscope images. Lateral force microscopy (LFM) has revealed significant differences in frictional behaviour between the high quality diamond films and those modified by a glow discharge treatment. Friction forces on the diamond films were very low, with coefficients ∼0.01 against silicon nitride probe tips in air. However, friction forces and coefficients were significantly greater on the DC-biased films indicating the presence of a mechanically weaker material such as an amorphous carbon layer. A combination of growth rate and frictional data indicated that the exposure to the H₂ plasma etched the diamond surface whereas exposure to CH₄/H₂ plasma resulted in film growth. Re-Nucleation of diamond was possible (stage iii) after exposure to either plasma treatment. The resultant friction forces on these films were as low as on the standard diamond film.     

Influence of SiC particle addition on the nucleation density and adhesion strength of MPCVD diamond coatings on Si3N4 substrates

It is generally accepted that SiC layers are often involved in the adhesion efficiency of chemical vapour deposition (CVD) diamond films on Si-containing substrates. Si₃N₄–SiC composite substrates with different amounts of SiC particles (0–50 wt%) were then used for diamond deposition. Samples were produced by pressureless sintering (1750°C, N₂ atmosphere, 2–4 h). The diamond films were grown on a commercial MPCVD reactor using H₂/CH₄ mixtures. Despite there being no special substrate pre-treatment, the films were densely nucleated when SiC was added (N_d≈1×10¹⁰ cm⁻²) with primary nanosized (∼100 nm) particles, followed by a less dense (N_d≈1×10⁶ cm⁻²) secondary nucleation. Indentation experiments with a Brale tip of up to 588 N applied load corroborated the benefit of SiC inclusion for a strong adhesion. The low thermal expansion coefficient mismatch between Si₃N₄ and diamond resulted in very low compressive stresses in the film, as proved by micro-Raman spectroscopy.     

Growth mechanism of 3C-SiC(lll) on Si without carbonization process

We have used rapid thermal chemical vapor deposition (RTCVD) technique to grow epitaxial SiC thin films on Si wafers without carbonization process by pyrolyzing tetramethylsilane (TMS). The growth rate of SiC films increases with TMS flow rate and temperature, but it decreases with temperature at higher TMS flow rates. The XRD spectra of the films indicate that the growth direction is along the (111) direction of β-SiC. IR and RBS measurements have been employed to analyze the chemical composition of the films. At 1100°C TMS molecules dissociate almost completely into Si atoms, CH₄ and C₂H₂ gases. The growth mechanism of SiC films on Si substrates without carbonization process has been proposed based on the analyses by TEM and QMS.     

SiCl3CCl3 as a novel precursor for chemical vapor deposition of amorphous carbon films

Amorphous carbon films, characterized by XRD, AFM, SEM and Raman, were deposited from SiCl₃CCl₃ on quartz substrates at 773-1273 K by low pressure chemical vapor deposition using a hot-wall reactor. XPS studies showed that the films grown at 773 K contained 90% C and 10% Cl, while the films grown at 1273 K contained 100% C. SiCl₄, CCl₄ and Cl₂CCCl₂ were detected by on-line FT-IR studies. The extrusion of dichlorocarbene, :CCl₂, from SiCl₃CCl₃ should provide the source of carbon in the reaction. On Si substrates, an etching process at the film-substrate interface assisted the lift-off of the films from the substrates. The C films curled and formed rolls.     

Selective synthesis of diamond and CNT nanostructures directly on stainless steel substrates

Without surface pretreatment or applying additional interlayer, diamond films have been directly synthesized on an Fe-25Cr-5Al steel substrate by a hot filament chemical vapor deposition method from an H₂-1vol.% CH₄ gas mixture. Due to an effective removal of intermediate graphite phase from the diamond-steel interface, the coated diamond films were continuous and adherent well to the steel substrate. Aligned conical diamond structures were also achieved on this steel substrate by negatively biasing the substrate holder and inducing a glow discharge. The deposition behavior of carbon on Fe-Cr-Ni steel substrate was different. A graphite-rich carbon film incorporated with diamond particles grew in the absence of biasing, then aligned carbon nanotube bundles were formed in the presence of negative biasing and glow discharge. The different deposition behavior of carbon on the two kinds of steel substrates was addressed in terms of the effect of their chemical compositions.