1/f noise in very-long-wavelength infrared Hg1−xCdx Te detectors

This paper investigates 1/f noise performance of very-long-wavelength infrared (VLWIR) Hg_1−xCd_xTe (cutoff wavelengths λ_c=15 μm and λ_c=16 μm) photodiodes at 78 K, where detector current is varied by changing detector area, detector bias, and illumination conditions. Holding detector bias and temperature constant, the 1/f noise current is proportional to the detector current. Significant nonuniformity is observed in the noise data for each detector area because of the varying detector quality. Defects are presumed resident in the detectors to produce greater nonuniformity in 1/f noise as compared to dark current at 100-mV reverse bias. For λ_c=16 μm, 4-μ-radius, diffusion-limited diodes at 78 K and 100-mV reverse bias, the average dark current is I_d=9.76±1.59×10⁻⁸ A, while the average noise current measured at 1 Hz is i_n=1.01±0.63×10⁻¹² A/Hz^1/2. For all detector areas measured, the average ratio in 1-Hz bandwidth is α _D =i_n/I_d=1.39±1.09×10⁻⁵. The 1/f noise was also measured on one diode as a function of detector-dark current as the applied bias is varied. In the diffusion-limited portion of this detector’s current-voltage (I-V) curve, to about 130 mV, the 1/f noise was independent of bias. For this diode, the ratio α_D=i_n/I_d=1.51±0.12×10⁻⁵. The 1/f noise associated with tunneling currents is a factor of 3 greater than the 1/f noise associated with diffusion currents, α_T=i_n/I_T=5.21±0.83×10⁻⁵. In addition, 1/f noise was measured on detectors held at −100 mV and 78K under dark and illuminated conditions. The measured ratios α_P ∼α_D ∼1.5×10⁻⁵ were about the same for the dark and photon-induced diffusion currents. Therefore, the diffusion current appears to have a unique value of α as compared to the tunneling current. This may be indicative of unique noise-generation mechanisms associated with each current.     

Large VLWIR Hg1−xCdxTe photovoltaic detectors

Very long wavelength infrared (VLWIR; 15 to 17 μm) detectors are required for remote sensing sounding applications. Infrared sounders provide temperature, pressure and moisture profiles of the atmosphere used in weather prediction models that track storms, predict levels of precipitation etc. Traditionally, photoconductive VLWIR (λ_c >15 μm) detectors have been used for sounding applications. However, photoconductive detectors suffer from performance issues, such as non-linearity that is 10X – 100X that of photovoltaic detectors. Radiometric calibration for remote sensing interferometry requires detectors with low non-linearity. Photoconductive detectors also suffer from non-uniform spatial optical response. Advances in molecular beam epitaxy (MBE) growth of mercury cadmium telluride (HgCdTe) and detector architectures have resulted in high performance detectors fabricated in the 15 μm to 17 μmm spectral range. Recently, VLWIR (λ_c ∼ 17 μm at 78 K) photovoltaic large (1000 μm diameter) detectors have been fabricated and measured at flux values targeting remote sensing interferometry applications. The operating temperature is near 78 K, permitting the use of passive radiators in spacecraft to cool the detectors. Detector non-AR coated quantum efficiency >60% was measured in these large detectors. A linear response was measured, while varying the spot size incident on the 1000 μm detectors. This excellent response uniformity, measured as a function of spot size, implies that low frequency spatial response variations are absent. The 1000 μm diameter, λ_c ∼ 17 μm at 78 K detectors have dark currents ∼160 μA at a −100 mV bias and at 78 K. Interfacing with the low (comparable to the contact and series resistance) junction impedance detectors is not feasible. Therefore a custom pre-amplifier was designed to interface with the large VLWIR detectors operating in reverse bias. A breadboard was fabricated incorporating the custom designed preamplifier interfacing with the 1000 μm diameter VLWIR detectors. Response versus flux measurements were made on the large VLWIR detectors and non-linearity <0.15% was measured at high flux values in the 2.5×10¹⁷ to 3.5×10¹⁷ ph-cm⁻²sec⁻¹ range. This non-linearity is an order of magnitude better than for photoconductive detectors.     

MWIR DLPH HgCdTe photodiode performance dependence on substrate material

Mid wavelength infrared p-on-n double layer planar heterostructure (DLPH) photodiodes have been fabricated in HgCdTe double layers grown in situ by liquid phase epitaxy (LPE), on CdZnTe and for the first time on CdTe/sapphire (PACE-1). Characterization of these devices shed light on the nature of the material limits on device performance for devices performing near theoretical limits. LPE double layers on CdZnTe and on PACE-1 substrates were grown in a horizontal slider furnace. All the photodiodes are p-on-n heterostructures with indium as the n-type dopant and arsenic the p-type dopant. Incorporation of arsenic is via implantation followed by an annealing step that was the same for all the devices fabricated. The devices are passivated with MBE CdTe. Photodiodes have been characterized as a function of temperature. R₀A_imp values obtained between 300 and 78K are comparable for the two substrates and are approximately a factor of five below theoretical values calculated from measured material parameters. The data, for the PACE-1 substrate, indicates diffusion limited performance down to 110K. Area dependence gives further indications as to the origin of diffusion currents. Comparable R₀A_imp for various diode sizes indicates a p-side origin. R₀A and optical characteristics for the photodiodes grown on lattice-matched CdZnTe substrates and lattice mismatched PACE-1 are comparable. Howover, differences were observed in the noise characteristics of the photodiodes. Noise was measured on 50 × 50 μm devices held under a 100 mV reverse bias. At 110K, noise spectrum for devices from the two substrates is in the low 10⁻¹⁵ A/Hz^1/2 range. This value reflects the Johnson noise of the room temperature 10¹⁰ Ω feedback resistor in the current amplifier that limits the minimum measurable noise. Noise at 1 Hz, −100 mV and 120K for the 4.95 μm PACE-1 devices is in the 1–2 × 10⁻¹⁴ A/Hz^1/2, a factor of 5–10 lower than previously grown typical PACE-1 n⁺-on-p layers. Noise at 120K for the 4.60 μm PACE-1 and LPE on CdZnTe was again below the measurement technique limit. Greatest distinction in the noise characteristics for the different substrates was observed at 163K. No excess low frequency noise was observed for devices fabricated on layers grown by LPE on lattice-matched CdZnTe substrates. Photodiode noise measured at 1Hz, −100 mV and 163K in the 4.60 μm PACE-1 layer is in the 1–2×10⁻¹³ A/Hz^1/2, again a factor of 5–10 lower than previously grown PACE-1 n⁺-on-p layers. More variation in noise (4×10⁻¹³−2×10⁻¹² A/Hz^1/2) was observed for devices in the 4.95 μm PACE-1 layer. DLPH devices fabricated in HgCdTe layers grown by LPE on lattice-matched CdZnTe and on lattice-mismatched PACE-1 have comparable R₀A and quantum efficiency values. The distinguishing feature is that the noise is greater for devices fabricated in the layer grown on lattice mismatched substrates, suggesting dislocations inherent in lattice mismatched material affects excess low frequency noise but not zero bias impedance.     

Correlation between visual defects and increased dark current in large-area Hg1−xCdxTe photodiodes

The Cross-Track Infrared Sounder (CrIS) program [an instrument on the National Polar-Orbiting Operational Environmental Satellite System (NPOESS)] requires photodiodes with spectral cutoffs denoted by short-wavelength infrared [γ_c(98 K) ∼5.1 μm], midwavelength infrared [γ_c(98 K) ∼9.1 μm], and long-wavelength infrared (LWIR) [γ_c(81 K) ∼15.5 μm]. The CrIS instrument also requires large-area (850-μm-diameter) photodiodes with state-of-art performance. Molecular beam epitaxy (MBE) is used to grow n-type short-wavelength infrared, midwavelength infrared, or LWIR Hg_1−xCd_xTe on latticematched CdZnTe. Detectors with p-type implants 7 μm in diameter are used to constitute the 850-μm-diameter lateral collection diodes (LCDs). The photodiode architecture is the double-layer planar heterostructure architecture. Quantum efficiency, I-V, R_d-V, and 1/f noise in photovoltaic Hg_1−xCd_xTe detectors are critical parameters that limit the sensitivity of infrared sounders. These are some of the parameters used to select photodiodes that will be part of the CrIS focal plane module (FPM). During fabrication of the FPM, the photodiodes are subject to a significant amount of handling while transitioning from part of newly processed Hg_1–xCd_xTe wafers to individual photodiodes mounted in a CrIS FPM ready to be flown on NPOESS. Quantum efficiency, I-V, noise, and visual inspections are performed at several steps in the detector’s journey. Initial I-V and visual inspections are conducted at the wafer level followed by I-V, noise, and quantum efficiency after dicing and mounting the photodiodes in leadless chip carriers (LCCs). A visual inspection is performed following removal of the detectors from the LCCs. Finally, the individual photodiodes are precision mounted on an FPM base, and I-V, noise, quantum efficiency, and visual inspections are performed again. Each step in the FPM fabrication process requires handling and environmental conditioning that can result in detector dark current and noise increase. Some photodiodes on the first flightlike FPMs fabricated exhibited an increase in dark current and noise characteristics at the FPM level as compared to the measurements performed when the photodiodes were in LCCs prior to integration into the FPM. The degradation observed resulted in an investigation to discern the cause of the performance degradation (baking at elevated temperatures, mechanical handling, electrical stress, etc.). This paper outlines the results of the study and the corrective actions that led to the successful manufacture of LWIR large detectors from material growth to insertion into flight FPMs for the CrIS program.     

Staebler-Wronski effect as a function of the Fermi level position and structure of nondoped, amorphous, hydrated silicon

The photoconductivity degradation rates γ (σ _ph∼t ^−γ ) of nondoped, amorphous, hydrated silicon films deposited at T _s =300–400 °C and subjected to illumination for 5 h at 300 K (light source 100 mW/cm², λ<0.9 μm) were investigated. It was shown that the degradation rate γ depends on the preillumination position of the Fermi level ɛ _c −ɛ _F and often is not directly related to the hydrogen content in the film. It was found that there are correlations between the value of γ and the bonds in the silicon-hydrogen subsystem [isolated SiH and SiH₂ complexes, clusters (SiH)_n, and chains (SiH₂)_n]. Fiz. Tekh. Poluprovodn. 32, 484–489 (April 1998)     

Resistivity variation of semi-insulating Cd1−xZnx Te in relationship to alloy composition

We investigated the resistivity variation of semi-insulating Cd_1−xZn_xTe used as room temperature nuclear radiation detectors, in relationship to the alloy composition. The resistivity and the zinc composition were determined using leakage current measurements and triple axis x-ray diffraction lattice parameter measurements, respectively. While the zinc content of the nominally x_Zn∼0.1 ingot varied monotonically according to the normal freezing behavior with an effective segregation coefficient of k_eff=1.15, the resistivity was found to vary non-systematically throughout the ingot. Furthermore, the “expected” relationship of higher zinc content with higher resistivity was not always observed. For example, wafer regions of x_Zn∼0.12 and x_Zn∼0.08 exhibited resistivity values of ∼10¹⁰ and ∼10¹¹ Ω·cm, respectively. In general, the experimental resistivity values can be explained by calculated values which take into account a compensating deep level defect and various electron and hole mobility values. The relative influence of the parameters that govern the resistivity (n,p, μ_e, and μ_h) are quantitatively investigated.     

High performance SWIR HgCdTe detector arrays

Short wave infrared (SWIR) devices have been fabricated using Rockwell’s double layer planar heterostructure (DLPH) architecture with arsenic-ion implanted junctions. Molecular beam epitaxially grown HgCdTe/CdZnTe multilayer structures allowed the thin, tailored device geometries (typical active layer thickness was ∼3.5 μm and cap layer thickness was ∼0.4 μm) to be grown. A planar-mesa geometry that preserved the passivation advantages of the DLPH structure with enhanced optical collection improved the performance. Test detectors showed Band 7 detectors performing near the radiative limit (∼3-5X below theory). Band 5 detector performance was ∼4-50X lower than radiative limited performance, apparently due to Shockley-Hall-Read recombination. We have fabricated SWIR HgCdTe 256 × 12 × 2 arrays of 45 um × 45 μm detector on 45 μm × 60 μm centers and with cutoff wavelength which allows coverage of the Landsat Band 5 (1.5−1.75 μm) and Landsat Band 7 (2.08−2.35 μm) spectral regions. The hybridizable arrays have four subarrays, each having a different detector architecture. One of the Band 7 hybrids has demonstrated performance approaching the radiative theoretical limit for temperatures from 250 to 295K, consistent with test results. D* performance at 250K of the best subarray was high, with an operability of ∼99% at 10¹² cm Hz^1/2/W at a few mV bias. We have observed 1/f noise below 8E-17 AHz ^1/2 at 1 Hz. Also for Band 7 test structures, Ge thin film diffractive microlenses fabricated directly on the back side of the CdZnTe substrate showed the ability to increase the effective collection area of small (nominally <20 μm μm) planar-mesa diodes to the microlens size of 48 urn. Using microlenses allows array performance to exceed 1-D theory up to a factor of 5.     

Characteristics of nuclear radiation detectors based on semi-insulating gallium arsenide

The characteristics of detectors based on bulk semi-insulating GaAs (SI-GaAs) have been studied by α particle detection and spectrometry. A distinctive feature of these detectors is the dependence of the width of the space charge region W on reverse bias voltage U. The rate of increase in W(U) is ∼1 μm/V, which permits formation of a sensitive region a few millimeters thick. The main obstacle to applying kilovolt-range bias voltages U is the reverse current noise. The characteristics of diode structures in which a rectifying barrier to SI-GaAs was formed by metal deposition (Schottky diodes) and by growing heterostructures with heavily doped AlGaAs or GaAsSb epitaxial layers were compared. Nonequilibrium carrier transport in epitaxial structures capable of sustaining bias voltages above 1 kV was investigated in both weak (below 1 kV/cm) and strong (10–30 kV/cm) electric fields. In both cases, the carrier lifetimes were found to be about a few nanoseconds. Such low values are due to the high concentration of trapping centers (EL2-type native defects), which limits the carrier transport. An analysis of the spectral line shape revealed that the lifetime is almost constant throughout the detector volume. The charge introduced by a particle was found to be enhanced in fields of ∼30 kV/cm. This effect can be qualitatively explained by focusing the electric field lines at the vertex of the α-particle track, which leads to an increase in the local field strength to ∼10⁻⁵ V/cm and impact ionization by nonequilibrium electrons. __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 38, No. 4, 2004, pp. 490–497. Original Russian Text Copyright ? 2004 by Verbitskaya, Eremin, Ivanov, Strokan, Vasil'ev, Gavrin, Veretenkin, Kozlova, Kulikov, Markov, Polyakov.     

Transformation of luminescence centers in CVD ZnS films subjected to a high hydrostatic pressure

The cathodoluminescence and optical-transmission spectra of ZnS were analyzed to study the effect of a high hydrostatic gas pressure (1500 atm at 1000°C) on the equilibrium between intrinsic point defects in zinc sulfide grown by chemical vapor deposition (CVD) with an excess of zinc. The cathodoluminescence spectra were measured at 80–300 K and excitation levels of 10²² and 10²⁶ cm⁻³ s⁻¹; the optical-transmission spectra were measured at 300 K in the wavelength range 4–12 μm. It is found that exposure to a high hydrostatic gas pressure transforms the self-activated emission in the cathodoluminescence spectrum: (i) a new short-wave-length band appears at 415 nm with its intensity increasing by one to three orders of magnitude; and (ii) the long-wavelength band that peaks at 445 nm and is observed in as-grown crystals becomes quenched. Simultaneously, the cathodoluminescence band peaked at 850 nm and related to vacancies V _S is no longer observed after high-pressure treatment. These effects are attributed to a partial escape of excess zinc (Zn_i) from crystals and additional incorporation of oxygen into lattice sites (O_S). A doublet band I ₁, which peaked at ∼331–332 nm at 80 K and at ∼342–343 nm at 300 K and is related to excitons bound to acceptor levels of oxygen centers, was observed. This band is found to be dominant in the cathodoluminescence spectrum at an excitation level of 10²⁶ cm⁻³ s⁻¹. Traces of the ZnO phase are apparent after the high-pressure treatment in both the cathodolumi-nescence spectra (the bands at 730 and 370 nm) and the transmission spectra (narrow bands in the region of 6–7 μm). __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 38, No. 1, 2004, pp. 39–43. Original Russian Text Copyright ? 2004 by Morozova, Karetnikov, Plotnichenko, Gavrishchuk, Yashina, Ikonnikov.     

Silicon carbide detectors of high-energy particles

The results of studying 4H-SiC p ⁺-n junctions ion-implanted with aluminum as detectors of high-energy particles are reported. The junctions were formed in SiC epitaxial films grown by chemical vapor deposition. The concentration of uncompensated donors was (3–5)×10¹⁵ cm⁻³, and the charge-carrier diffusion length was L _p=2.5 μm. The detectors were irradiated with 4.8–5.5-MeV alpha particles at 20°C. The efficiency of collection of the induced charge was as high as 0.35. The possibilities of operating SiC detectors at elevated temperatures (∼500°C) are analyzed. __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 36, No. 6, 2002, pp. 750–753. Original Russian Text Copyright ? 2002 by Violina, Kalinina, Kholujanov, Kossov, Yafaev, Hallén, Konstantinov.     

Detection of paramagnetic recombination centers in proton-irradiated silicon

The method of spin-dependent recombination was used to record electron spin resonance (ESR) spectra of recombination centers in a thin (∼1 μm) surface layer of p-type silicon grown by the Czochralski method and irradiated by protons with energies of ∼100 keV. Spectra of excited triplet states of the oxygen + vacancy complex (A-centers) were observed along with complexes consisting of two carbon atoms and an interstitial silicon atom (C_S-Si_I-C_S complexes). The intensity of the ESR spectra of these radiation-induced defects was found to be largest at irradiation doses of ∼10¹³ cm⁻², and decreased with increasing dose, which is probably attributable to passivation of the radiation-induced defects by hydrogen. Fiz. Tekh. Poluprovodn. 33, 1164–1167 (October 1999)     

Mid-wavelength infrared p-on-n Hg1−xCdxTe heterostructure detectors: 30–120 kelvin state-of-the-Art performance

We report on Hg_1−xCd_xTe mid-wavelength infrared (MWIR) detectors grown by molecular-beam epitaxy (MBE) on CdZnTe substrates. Current-voltage (I-V) characteristics of HgCdTe-MWIR devices and temperature dependence of focal-plane array (FPA) dark current have been investigated and compared with the most recent InSb published data. These MWIR p-on-n Hg_1−xCd_xTe/CdZnTe heterostructure detectors give outstanding performance, and at 68 K, they are limited by diffusion currents. For temperatures lower than 68 K, in the near small-bias region, another current is dominant. This current has lower sensitivity to temperature and most likely is of tunneling origin. High-performance MWIR devices and arrays were fabricated with median R_oA values of 3.96 × 10¹⁰ Ω-cm² at 78 K and 1.27 × 10¹² Ω-cm² at 60 K; the quantum efficiency (QE) without an antireflection (AR) coating was 73% for a cutoff wavelength of 5.3 μm at 78 K. The QE measurement was performed with a narrow pass filter centered at 3.5 μm. Many large-format MWIR 1024 × 1024 FPAs were fabricated and tested as a function of temperature to confirm the ultra-low dark currents observed in individual devices. For these MWIR FPAs, dark current as low as 0.01 e⁻/pixel/sec at 58 K for 18 × 18 μm pixels was measured. The 1024 × 1024 array operability and AR-coated QE at 78 K were 99.48% and 88.3%, respectively. A comparison of these results with the state-of-the-art InSb-detector data suggests MWIR-HgCdTe devices have significantly higher performance in the 30–120 K temperature range. The InSb detectors are dominated by generation-recombination (G-R) currents in the 60–120 K temperature range because of a defect center in the energy gap, whereas MWIR-HgCdTe detectors do not exhibit G-R-type currents in this temperature range and are limited by diffusion currents.     

Gain and internal losses in InGaAsSb/InAsSbP double-heterostructure lasers

We report on a study characterizing internal losses and the gain in InGaAsSb/InAsSbP diode-heterostructure lasers emitting in the mid-infrared (3–4 μm). Numerical simulations of the current dependence of the intensity of spontaneous emission above the laser threshold and of the differential quantum efficiency allowed us to determine the intraband absorption k ₀ ≈5.6×10⁻¹⁶ cm². The cavity-length dependence of the threshold current is used to estimate the internal losses at zero injection current α ₀≈5 cm⁻¹. Calculations of the internal losses at laser threshold showed that they increase more than fourfold when the cavity length is decreased from 500 μm to 100 μm. The temperature dependence of the differential quantum efficiency is explained on the assumption that intraband absorption with hole transitions into a split-off band occurs. It is shown that the maximum operating temperature of “short-cavity” lasers is determined by the intraband absorption rather than by Auger recombination. The internal losses are shown to have a linear current dependence. The separation of the quasi-Fermi levels as a function of current demonstrates an absence of voltage saturation of the p-n junction above threshold. Fiz. Tekh. Poluprovodn. 33, 759–763 (June 1999)     

Advances in large-area Hg1−xCdxTe photovoltaic detectors for remote-sensing applications

State-of-the-art large-area photovoltaic (PV) detectors fabricated in HgCdTe grown by molecular beam epitaxy (MBE) have been demonstrated for the Crosstrack Infrared Sounder (CrIS) instrument. Large-area devices (1 mm in diameter) yielded excellent electrical and optical performance operating at 81 K for λ_c ∼ 15 μm, at 98 K for λ_c ∼ 9 μm, and λ_c ∼ 5-μm spectral cutoffs. Fabricated detectors have near-theoretical electrical performance, and Anti Reflection coated quantum efficiency (QE) is greater than 0.70. Measured average R₀A at 98 K is 2.0E7 Ωcm², and near-theoretical QEs greater than 0.90 were obtained on detectors with λ_c ∼ 5-μm spectral cutoffs. These state-of-the-art large-area PV detector results reflect high-quality HgCdTe grown by MBE on CdZnTe substrates in all three spectral bands of interest.     

<Emphasis Type="Italic">E</Emphasis><Subscript>0</Subscript> photoreflectance spectra of semiconductor structures with a high density of interface states

The results of a photoreflectance spectroscopy study of Ga₂Se₃/n-GaAs samples prepared by long-term annealing of GaAs wafers (n≈10¹⁷ cm⁻³) in a Se-vapor atmosphere are presented. It was established that no photovoltage appears in the interface region of these structures under illumination. Photogeneration of the charge carriers in the substrate does not lead to a change in the Fermi level position at the interface, with only the depth of the space-charge region being modulated. The quantitative analysis of the spectra also indicates that the growth of a thick (∼ 1 μm) Ga₂Se₃ layer does not result in the expected shift of the Fermi level position in comparison to the natural oxide-covered surface. __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 36, No. 7, 2002, pp. 838–842. Original Russian Text Copyright ? 2002 by Kuz’menko, Domashevskaya.     

InAsSb/InAsSbP double-heterostructure lasers emitting in the 3–4 µm spectral range

Our earlier reports concerning the fabrication by liquid-phase epitaxy and investigation of InAsSbP/InAsSb/InAsSbP double heterostructure lasers emitting at 3–4 μm are reviewed. The dependences of spectral characteristics and the spatial distribution of the laser emission on temperature and current are discussed. Lasing modes are shifted by 0.5–1.0 cm⁻¹ to longer wavelengths with increasing temperature. The tuning of the lasing modes by means of current is very fast (10⁻⁸–10⁻¹² s). With increasing current, the modes are shifted to shorter wavelengths by 50–60 ? at 77 K. The maximum mode shift of 104 ? (10 cm⁻¹) is observed at 62 K. The spectral line width of the laser is as narrow as 10 MHz. Abnormally narrow directional patterns in the p-n junction plane are observed in some cases in the spatial distribution of laser emission. The current tuning of lasers, due to nonlinear optical effects, has been modeled mathematically in good agreement with the experiment. Transmittance spectra of OCS, NH₃, H₂O, CH₃Cl, and N₂O gases were recorded using current-tuned lasers. __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 35, No. 12, 2001, pp. 1466–1480. Original Russian Text Copyright ? 2001 by Danilova, Imenkov, Kolchanova, Yakovlev. See [1].     

Mechanism of oxide thickness and temperature dependent current conduction in n+-polySi/SiO2/p-Si structures — a new analysis

The conduction mechanism of gate leakage current through thermally grown silicon dioxide (SiO₂) films on (100) p-type silicon has been investigated in detail under negative bias on the degenerately doped n-type polysilicon (n⁺-polySi) gate. The analysis utilizes the measured gate current density J_G at high oxide fields E_ox in 5.4 to 12 nm thick SiO₂ films between 25 and 300℃. The leakage current measured up to 300℃ was due to Fowler–Nordheim (FN) tunneling of electrons from the accumulated n⁺-polySi gate in conjunction with Poole Frenkel (PF) emission of trapped-electrons from the electron traps located at energy levels ranging from 0.6 to 1.12 eV (depending on the oxide thickness) below the SiO₂ conduction band (CB). It was observed that PF emission current I_PF dominates FN electron tunneling current I_FN at oxide electric fields E_ox between 6 and 10 MV/cm and throughout the temperature range studied here. Understanding of the mechanism of leakage current conduction through SiO₂ films plays a crucial role in simulation of time-dependent dielectric breakdown (TDDB) of metaloxide–semiconductor (MOS) devices and to precisely predict the normal operating field or applied gate voltage for lifetime projection of the MOS integrated circuits.     

Leakage currents over the Surface of CdHgTe-based photodiodes

The leakage current I _p over the surface of Cd_xHg_1−x Te-based photodiodes that have a cutoff wavelength of the photosensitivity spectrum of λ=9.8–11.6 μm and are fabricated by implanting Zn⁺⁺ ions into the p-type solid solution is investigated. The surface character of the I _p current is indicated by a coordinate shift of the peak in the sensitivity profile of n ⁺-p junctions, which is measured in a scanning mode by the beam of a CO₂ laser with a wavelength of 10.6 μm, with an increase in voltage U across the photodiode and the shift of spectral characteristics to shorter wavelengths with increasing U. __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 38, No. 7, 2004, pp. 890–895. Original Russian Text Copyright ? 2004 by Biryulin, Turinov, Yakimov.     

MOVPE growth of HgCdTe for high performance 3–5 µm photodiodes operating at 100–180K

New results are reported on the growth of high performance medium wavelength infrared (3–5 μm) (MWIR) HgCdTe photodiodes in the three-layer P-n-N configuration. The detector structures were grown in situ by metalorganic vapor phase epitaxy (MOVPE) on (211)B oriented CdZnTe substrates. The mobilities of the single n-type layers with x-values of ∼0.30 are in the range of (3–4.5)×10⁴ cm²/V-s at 80K. The lifetimes on unpassivated films range from 1–5 and 4–10 μs at 80 and 180K, respectively, which are within a factor of two or less of the lifetimes calculated for Auger-1 and radiative recombination. The P-n-N films were processed into variable-area backside-illuminated diagnostic arrays and tested for quantum efficiency, spectral response, R_DA, I–V curves and 1/f noise in the 120–180K range. The internal one-dimensional quantum efficiencies are in the range of 85–100%. The optical collection lengths are typically ∼25 μm. I–V curves showed that diffusion current is the dominant junction current mechanism for temperatures ≥100K. R₀A values are at the one-dimensional limit for n-side diffusion currents over the 100–180K range. 1/f noise was measured to be very low at 120K and is the same as that measured in similarly processed arrays from recent LPE grown P-on-N heterojunctions. The results demonstrate that MOVPE growth can be used for large area, high performance MWIR HgCdTe detector arrays operating in the 120–180K temperature range.     

1/f noise studies in uncooled narrow gap Hg1−xCdxTe non-equilibrium diodes

We have studied the 1/f noise current in narrow gap semiconductor heterostructure diodes fabricated in mercury cadmium telluride (HgCdTe) and designed to operate in a non-equilibrium mode at room temperature. HgCdTe heterostructure diodes exhibit Auger suppression giving current-voltage characteristics with high peak-to-valley ratios (up to 35), and low extracted saturation current densities (e.g., 20 Acnr⁻² at 10 pm at 295K) but high 1/f knee frequencies (e.g., 100 MHz at 10 μm at 295K). A comparison is made with the noise levels found in room temperature non-equilibrium mode heterostructure InAlSb/InSb diodes. The devices are being used at high frequencies for CO₂ laser heterodyne detector demonstrators. For the devices to be useful in low frame-rate imaging arrays, the 1/f noise level must be sufficiently low that the signal is not swamped. Ideally, the knee frequency should be below the frame rate. The relationship between the noise current and reverse bias voltage, current density, and temperature will be examined in order to attempt to identify the principal 1/f generation mechanisms.