传输/反射法测量复介电常数的若干问题

研究了传输／反射法测量线性材料复介电常数εr的厚度谐振、多值性等问题，得到了解决这些问题的有效方法。通过改进NRW传输／反射法，由散射参数直接得到了归一化特性阻抗与传播常数，从而可以把已有的三个确定复介电常数的方程用到NRW传输／反射法中。联合应用这三个方程解决了上述问题，这使得人们可以用传输／反射法对任意厚度的样品在任意频率上进行复介电常数的稳定测量。用波导取样器与同轴线取样器分别得到的实验结果证明了此方法的有效性与可实现性。     

散射参数法微波材料电磁特性自动测试系统及求解多值性的解决方案

研发了一套利用散射参数法测量材料电磁特性的自动测试系统,其配套软件功能强大完善且完全商业化,可以快速有效地测量正切损耗角大于0.1的微波材料的复介电常数与导磁率等10项特性参数.首次提出了“尝试-比较”法,以实验结果证明了其有效性,解决了长期存在的求解多值性难题,进一步完善了散射参数法.     

带状线法测量微波材料的复介电常数

精确测量低损耗微波材料的复介电常数十分重要。利用带状线法测量微波介质基板常温和变温的复介电常数,得到了高精度的测试结果。结果表明了用带状线法测量低损耗微波介质基板复介电常数的有效性和准确性。还分析了带状线测试方法中产生的误差和应该注意的事项。     

复介电常数和磁导率测量的新方法

本文提出了一种新的确定Ka 波段毫米波损耗材料复介电常数和磁导率的测量方法,给出了确定样品的复介电常数和磁导率的散射方程。与传统采用的NRW 方法相比,这一方法消除了介电常数测量对参考面的位置和样品长度依赖性。     

广义网络原理在电磁散射混合方法中的应用

本文提出了一种分析电大开槽目标电磁散射的混合方法。根据等效原理,将原目标的散射场分解为电大目标和槽缝散射场的叠加。前者用迭代物理光学法计算。对于后者,则先用时域有限差分法计算其导纳矩阵,然后在口径面上建立相应的广义网络模型,用网络分析的方法求得槽缝的等效磁流,最后由互易定理推得散射场的表达式。数值结果证明了本文方法的准确性和高效性。     

双层介质柱损耗正切的逆散射法研究

本文导出了双层复介电常数圆柱体散射场的矩阵解公式,并用所模拟的散射场定量研究了用滤波-反投影技术计算出的介质柱内部介电常数分布特性。文中给出了介质圆柱的二维径向分布曲线以及由重构图象矩阵中统计回收计算出的介电常数损耗。     

微带线法测量微波材料的复介电常数

电磁波传输介质的电磁参数的准确测量,对材料的实际应用十分重要。研究微波材料介电常数的微带线测量方法,通过正演和反演过程的求解分析,对不同介电常数的材料进行了实际计算,同时还对测试误差进行了简要分析。结果表明,微带线测试微波材料的复介电常数方法可行,测量过程较为简单,测量结果准确。     

用自由空间法测试介质电磁参数

提出了一种测试介质材料微波复介电常数和复磁导率的新方法;建立了测试方法的物理模型;通过理论分析,获得了求解被测材料微波电磁参数的计算表达式;研制了测试装置和测试系统,讨论了用于测试系统的校准方法和提高测试准确度的时域门技术.在8～12GHz的频带范围内,对多种介质材料进行了实测,结果表明,本文提出的测试方法和研制的测试系统是正确可靠的,具有实用价值.     

散射参数反演材料电磁参数的新方法

基于传输反射原理,介绍了一种利用散射参数求复数形式的磁导率和介电常数的计算方法。通过建立同轴线的测试模型并将一个待测的材料放入其中,测试出待测材料的散射参数,从而将它们代入算法进行求解。通过与以前的几种反算电磁参数的方法进行比较,该算法可以在较宽的频带内更加准确地得到电磁参数并消除相位误差,这种方法同样适用于测量左手介质的电磁参数。     

液晶介电常数在微波至太赫兹频段测试技术

基于液晶材料的器件成为毫米波及太赫兹波领域的重要方向之一,文中总结了毫米波太赫兹波液晶器件的研究进展,介绍了液晶移相器的基本原理及应用,分析了液晶介电常数的主要测试方法,如传输线/反射法、谐振腔法、自由空间法、时域法等,比较了不同方法的测试频率范围和优缺点,并给出了向列相液晶材料在微波毫米波及太赫兹波段的介电常数的主要测试结果。     

A Graphical Method for Measuring Dielectric Constants at Microwave Frequencies

This paper describes a graphical method for measuring the real and imaginary parts of the dielectric constant epsilon/epsilon/sub 0/ = epsilon' - j epsilon" of materials at microwave frequencies. The method is based on the network approach to dielectric measurements proposed by Oliner and Altschuler in which the dielectric sample fills a section of transmission line or waveguide. In contrast to their method, the network representing the dielectric sample is analyzed in terms of the bilinear transformation Gamma'=(aGamma+b)/(cGamma+d); ad-bc=4. The analysis proceeds from the geometric properties of the image circle in the r plane obtained by terminating the output line in a calibrated sliding short. The technique described retains the desirable features of the network approach but avoids the necessity of measuring both scattering coefficients. As a result the procedure is more direct and, in the case of the TEM configuration, leads to an entirely graphical solution in which the complex dielectric constant can be read from a Smith chart overlay.     

A New Microwave Method for Electrical Characterization of Low-Loss Materials

A microwave method is proposed to effectively determine the complex permittivity of low-loss dielectric materials. The method uses raw scattering parameter measurements of an empty cell and a measurement cell (a waveguide or coaxial-line section) with one sample for its two configurations. There are three advantages of the proposed method. First, it does not necessitate any calibration to carry out the microwave measurements. Second, it eliminates the measurement errors arising from sample thickness and inhomogeneity present in the second sample, which is required by other methods. Third, it uses transmission-only scattering parameters of the sample in the theoretical formulations so that it may decrease the measurement errors happening from the phase uncertainty in reflection scattering parameters. The measurement results of two low-loss dielectric materials confirm the accuracy of the proposed method.      

Forward-backward method for scattering from dielectric rough surfaces

The iterative forward-backward (FB) method is a recently proposed efficient technique for numerical evaluation of scattering from perfectly conducting rough surfaces. Extension of the method to include scattering from imperfect conducting surfaces, with a high imaginary part of the complex dielectric constant, has also been proposed. The FB method is further generalized to analyze scattering from dielectric rough surfaces with arbitrary complex dielectric constant. Electric and magnetic equivalent surface currents are split into forward and backward components and equations governing these current components are obtained. As a solution, an iterative scheme is proposed and its convergence rate is analyzed. Finally, the effectiveness of the method is assessed by comparing the obtained scattering results with "exact" ones, computed by employing the usual method of moments (MoM).     

传输／反射法测量材料电磁参数的研究

分析了材料样品填充的矩形波导或同轴线等效网络的归一化通用矩阵,提出了一种求解材料电磁参数（εr,μr)的解析方法。分析表明,行性阻抗Zc与传播常数数γ均可直接由传/反射参数确定。同时应用特性阻抗与传播常数得到了磁性材料的电磁参数（εr,μr)。利用特性阻抗Zc、传播常数γ以及同时利用二者分别得到了三个确提高测量精度并确定测量误差;同时,可用于解决复介电常数测量的多值性问题与π模糊性问题。实际测试结果证明本文方法的有效的且有实用意义。     

Modified transmission-reflection method for measuring constitutive parameters of thin flexible high-loss materials

The transmission-reflection method is modified for measuring constitutive parameters of thin high-loss materials used as radar absorbers. The method uses a two-layer structure, consisting of a layer of thin flexible unknown material supported by a thicker rigid known material. The analysis and measurements focus on nonmagnetic samples of a high dielectric constant and loss factor and on the waveguide configuration in the X-band. A nonlinear least-squares optimization is used to obtain the complex permittivity from the measured scattering parameters. The uncertainty analysis presented facilitates selection of the support layer thickness. Simulations with the finite-difference time-domain method explore the effects of sample imperfections. Accuracy of a few percent can be achieved for a sample thickness of a fraction of a millimeter, provided that the thickness of the support dielectric is close to optimum and sample has only small surface imperfections.     

多层介质平板结构的传输线等效面模型及相位修正算法

针对电大复杂多层介质结构目标电磁散射特性分析与应用对计算资源和效率的需求,提出了基于传输线理论的等效面模型,推导了相应的相位修正算法,实现对此类目标散射特性的快速准确预估.等效面模型将多层介质平板结构等效为平面,基于传输线理论,采用电路分析中常用的网络分析方法计算该平面的反射系数与透射系数,并通过引入多层介质结构厚度、入射和观测方向等信息实现对反射系数与透射系数的相位修正.仿真结果验证了该文方法的正确性和高效性.      

Full-wave analysis of dielectric frequency-selective surfaces using a vectorial modal method

A novel vectorial modal method is presented for studying guidance and scattering of frequency-selective structures based on lossy all-dielectric multilayered waveguide gratings for both TE and TM polarizations. The wave equation for the transverse magnetic field is written in terms of a linear differential operator satisfying an eigenvalue equation. The definition of an auxiliary problem whose eigenvectors satisfy an orthogonality relationship allows for a matrix representation of the eigenvalue equation. Our proposed technique has been applied to the study of lossy all-dielectric periodic guiding media with periodicity in one dimension. This method yields the propagation constants and field distributions in such media. The reflection and transmission coefficients of a single layer under a plane-wave excitation can be obtained by imposing the boundary conditions. Study of the scattering parameters of the whole multilayered structure is accomplished by the cascade connection of components as characterized by their scattering parameters. Results obtained with this method for the propagation characteristics of a one-dimensional periodic dielectric medium are compared with those presented by other authors, and results for the scattering of several dielectric frequency-selective surfaces (DFSS) are compared with both theoretical and experimental results presented in the literature, finding a very good agreement. A symmetrical band-stop filter with a single waveguide grating is also demonstrated theoretically.     

Dispersion in finlines on semiconductor and the S-parameters of a step discontinuity

The Transverse Transmission Line method is used for the characterization of bilateral and unilateral finlines on a semiconductor substrate and in conjunction with the modal method, for the calculation of the scattering parameters due to a step discontinuity on a unilateral finline with a lossless dielectric substrate. Numerical results of the effective dielectric constant, attenuation constant and characteristic impedance for the bilateral and unilateral finlines on semiconductor substrates, and results of scattering parameters of a step discontinuity for unilateral finline, are presented.     

Strip dielectric wave guide antenna-for the measurement of dielectric constant of low-loss materials

The value of dielectric constant are the most important parameters in material science technology. In micro-wave and millimeter wave circuits using dielectric materials the values of this parameters should be known accurately. It is observed that the number of methods are reported in litrature, however these methods impose difficulties in experimentation and are not very accurate. In this paper a novel approach to the measurement of the dielectric constant of low loss materials at micro-wave and millimeter wave frequencies has been discussed. In this method by using antenna theory, a metallic strip dielectric guide is taken in to constideration and band reject phenomenon of dielectric antenna is used. Frequency response of an antenna in band reject mode is a function of the dimensional parameters, such as the metallic strip period, the profile of the metallic strip and the dielectric constant of the material used. Hence if one measure the frequency responce of the antenna in band reject mode, the dielectric constant of the material is determined provided all other parameters are known. This method gives a direct measure of dielectric constant and is quite accurate as computer techniques are used for evaluating the dielectric constant. This method verified experimentally also.     

Wideband Reference-Plane Invariant Method for Measuring Electromagnetic Parameters of Materials

This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (noniterative) and reference-plane invariant: it uses a certain combination of scattering parameters in conjunction with group-velocity data. This technique can be used to characterize both dielectric and magnetic materials. The proposed method is verified experimentally within a frequency range between 2-18 GHz on polytetrafluoroethylene and polyvinylchloride samples. A comprehensive error and stability analysis reveals that, similar to other methods based on transmission/reflection measurement, the uncertainties are larger at low frequencies and at the Fabry-Perot resonances.