基于插值法的四象限探测器测角算法设计与实现方法分析

四象限探测器测角系统需要同时满足系统反应时间短和误差小的要求.在分析了四象限探测器测角现有算法的基础上,提出了将插值法和传统算法相结合的一种改进算法,测角误差较小且容易实现.设计了适合实际应用的一套测角系统:模拟信号接收后,首先进行放大、去噪、相关检测等处理.随后进行模数转换,这一部分电路设计为目标方位检测电路;得到数...     

机载武器四象限测角制导新算法

通过对传统四象限测角算法误差的分析，提出了一种用于机载武器的四象限测角的高精度快速跟踪算法，并对其进行了分析。     

几种四象限探测器测角算法的分析研究

在不考虑探测器非均匀性影响的情况下,本文分析了传统四象限测角算法和另外几种算法在计算入射光的俯仰角和偏转角时的性能,还比较了在整个平面内各个算法得到的俯仰角的误差曲面.从比较中看出,采用曲线拟和的方法,硬件实现简单,测角精度也比较高.     

大气激光通信中稳定跟踪器件及算法研究

在大气激光通信中捕获对准跟踪(APT)是通信成功的前提。对空间激光通信中的捕获对准跟踪系统常用的两种光束定位探测器件CCD和四象限光电探测器(QD)的特性进行了深入分析,研究了影响大气激光通信跟踪系统性能的5种大气湍流效应,分别讨论了光束漂移、光强起伏、光斑弥散、到达角起伏及光束扩展的原理及对应仿真结果。结合大气湍流和探测器,针对质心跟踪算法和形心跟踪算法进行深入分析,得到并实验验证了在大气条件下形心算法的跟踪误差小于质心误差的结论。     

激光导引头四象限探测器测角精度的建模研究

四象限探测器对目标的测角精度直接影响激光制导武器的制导精度,因此研究四象限探测器测角精度十分重要。采用计算和仿真分析的方法,基于导引头入瞳处脉冲峰值功率密度服从均匀分布,噪声干扰电流服从高斯分布,建立了激光导引头光束偏转角误差模型;但由于噪声干扰使光束偏转角误差具有随机概率性,所以将光束偏转角误差的均值和标准差作为四象限探测器测角精度的衡量标准,分别建立了光束偏转角误差的均值和标准差与导引头光学系统参数、光斑半径、漫反射激光入射角、噪声干扰电流以及导引头入瞳处脉冲峰值功率密度之间的关系,并以导引头光束偏转角误差标准差为例,结合应用背景进行了仿真分析。     

激光角跟踪误差来源分析

采用四象限雪崩管作为激光角跟踪的探测器，对影响激光跟踪精度的随机误差来源做了详细的分析，主要包括：探测器噪声、光斑噪声、大气湍流噪声以及后向散射噪声等，分析它们对系统跟踪精度产生的影响，并提出减小跟踪误差的方法。     

四象限探测器高精度定位算法研究

用于光斑中心位置计算的定位算法是影响四象限探 测器位置测量精度的主要因素之一。为了提高四象限光电探测器的定位精度,分析了目 前通用的质心算法计算 光斑中心的位置误差,提出了一种基于数据库查询的高精度光斑中心定 位算法。算法的原理为:在四象限探测器和光源特性已知的前提下,首先通过仿真方法建 立一个数据库;数据库中光斑中心位置和探测器各象限的电流比具有一一对应关系。实际使 用时,以实测的四象限探测器各象限的电流比为基础查找对应的光斑中心的位置。仿真分 析和实验验证结果同时表明,与通用的质心算法相比,新算法能将光斑中心位置的计算精度 提高10²数量级。这对于使用象限式探测器进行高精度位置测量具有重要 意义。     

影响四象限探测器探测精度的因素

主要分析了影响四象限探测器跟踪精度的因素。对光斑大小、光斑位置、质心计算公式、探测器噪声、放大器噪声等因素进行了理论分析,通过计算和仿真的方法对各种因素的作用进行了验证,并通过实验验证了方法的正确性。研究结果表明,采用常用的四象限质心算法,只要采用合适的光学系统和信号检测电路,就可以实现高精度的跟踪误差检测。     

基于四象限探测器进行太阳跟踪的偏差分析

为了实现基于四象限探测器的太阳自动跟踪,首先分析了四象限光电探测器工作原理,并说明了选择四象限探测器的依据,介绍了使用四象限探测器进行太阳跟踪的装置,深入研究了太阳光斑几何位置与小孔光阑、四象限探测器安装位置可能存在的偏差影响,对四象限探测器与Ⅰ-Ⅴ转换电路系统进行了一致性分析,评价了一致性对跟踪精度的影响,最后介绍了跟踪时四象限探测器电压值存在偏差的原因和合理性.实验证明,基于四象限探测器的跟踪装置适用于高精度太阳跟踪.     

四象限探测仪测角新算法

实验结果表明,传统的四象限探测仪测角算法具有较大的误差。既使落在各个象限的光斑面积均未到饱和,最大误差也在二十角秒以上。本文给出一种新的四象限测角仪测角算法,这种算法不仅可用于在线测量,而且可使最大测量误差降低到2.3761角秒。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

Complete approach to automatic identification and sub-pixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

An Improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.