集成冷光学的双波段杜瓦组件技术

集成冷光学的红外探测器杜瓦封装在中波、长波红外组件研制中具有重要意义,有利于抑制红外辐射背景、提升仪器灵敏度和集成度。提出了集成冷光学的中波、长波双波段探测器杜瓦组件,设计了一体化冷平台支撑、低漏热透镜支撑等新结构,解决了冷光学透镜组与探测器组合、双波段探测器透镜组之间高精度配准及高强度单点支撑钎焊等新工艺,建立了该冷光学集成组件杜瓦的冷面温度均匀性、双温区控制以及低热负载等关键参数。实现了杜瓦液氮热负载小于0.85 W,中波工作于73 K,冷面温度均匀性0.36 K,长波工作于65 K,冷面温度均匀性0.08 K,探测器与透镜组配准精度偏差优于±10μm,探测器光学模组间配准偏差优于±15μm。该新型杜瓦已通过一系列空间环境适应性试验验证,成功应用于风云四号系列气象卫星大气垂直探测仪中。     

红外探测器杜瓦组件的力学薄弱结构优化设计方法

通过对探测器杜瓦组件的悬臂梁结构进行理论分析,提出了杜瓦组件力学薄弱结构的优化设计方法,并利用Ansys软件对优化前后的杜瓦组件结构进行了模拟分析。结果表明,杜瓦组件的模态一阶基频大幅提高,比平行支撑结构的组件增加了130%,比常规无支撑结构的组件增加了317%。通过试验验证后发现,杜瓦组件的抗振动性能也得到了大幅提高,可以抗住15g的耐久随机振动、17.6g的短时大量级随机振动以及2000g的机械冲击。     

红外探测器杜瓦的小型化设计方法

杜瓦小型化是制冷型红外探测器组件的发展方向之一,也是未来红外成像系统小型化、集成化发展的需要。由于杜瓦为探测器组件提供光、机、电接口,其小型化设计要综合考虑制冷机的制冷能力、探测性能、真空性能和系统应用等多方面因素。结合杜瓦的结构组成和工作原理,分析了小型化设计的方法及影响。该研究对杜瓦设计有较好的启发和指导作用。     

一种新型红外探测器／杜瓦瓶的热耗计算

扫积型红外探测器是目前大量使用的一种新型红外探测器,在研制这种红外探测器时,应对这种探测器/杜瓦瓶的热耗(漏热)进行计算,以便对制冷器的制冷功率等参数提出合理的要求。本文从一般传热学原理出发,对该探测器/杜瓦瓶所发生的辐射、传导、焦耳热等漏热进行了计算,从而得到了该探测器/杜瓦瓶所消耗的热量——热耗,并与国内外有关资料、数据进行了比较。     

640×512小型化红外探测器杜瓦组件可靠性研究

在SWaP3(Size,Weight,and Power,Performance and Price)概念的驱使下,第三代制冷红外探测器向着高性能、小型化和轻量化的方向发展.作为军用核心电子元器件,制冷红外探测器的可靠性成为研究的重点.以浙江珏芯微电子有限公司所研制的640×512/15μm小型化杜瓦组件为研究对象,开...     

中波2048元长线列碲镉汞焦平面杜瓦组件

2048元碲镉汞焦平面由8个中波256×1元芯片和8个光伏信号硅读出电路模块交错排列组成,与8个微型滤光片以桥式结构直接耦合后封装在全金属微型杜瓦内,形成了中波2048元长线列碲镉汞红外探测器件组件.基本解决了2048元焦平面杜瓦组件的关键技术,即高均匀性和一致性的焦平面模块技术、高精度的拼接技术、高可靠性的模块及其封...     

红外探测器封装微型杜瓦瓶结构与分析

本文分析了用于多元红外探测器封装的微型杜瓦瓶的三种结构形式，并分析了其漏热，电学性能和工艺性，通过比较对今后我国红外探测器封装技术作出预测。     

红外探测器全金属杜瓦瓶的激光焊接

介绍了脉冲ＹＡＧ激光焊接红外探测器全金属杜瓦瓶的工艺参数及焊接结构的选择，并对焊结结果进行了检测分析。     

低温光学用杜瓦柔性外壳结构热力特性研究

为了满足低温光学系统低背景、低功耗和红外探测器制冷组件高环境适应性的要求,提出了探测器制冷组件杜瓦主体（窗口、窗口帽和引线盘） 200 K低温保持,与制冷机膨胀机或脉管散热面柔性绝热连接的设计思想。针对低温光学用杜瓦柔性外壳工程应用中的特点,文中以某低温光学用长波12.5 μm 2 000元红外探测器杜瓦组件以例,提出了波纹管作为绝热连接的柔性外壳,重点阐述杜瓦柔性波纹管隔热、力学和相关漏热的设计,并开展不同热负载条件下波纹管热特性验证,可实现最小温度梯度为37.22 K,绝热热阻为1142 K/W,误差在37%。为综合评价低温光学用柔性外壳结构杜瓦组件的性能,对某低温光学用长波12.5 μm 2 000元探测器柔性外壳杜瓦组件开展热真空和鉴定级的力学试验考核验证,试验结果表明实现了200 K低温窗口,探测器60 K工作,杜瓦漏热为544 mW,低温工况工作时相对于常温工况制冷机的功耗下降了53%,并通过了4 g的随机力学考核,验证了低温光学用杜瓦柔性波纹管外壳模型合理可行,对于后续低温光学用杜瓦柔性外壳结构工程应用提供了重要参考。     

红外焦平面探测器杜瓦组件杂散辐射研究

在对红外焦平面探测器杜瓦组件杂散辐射分析的过程中,建立了分析模型,通过对模型进行光线追迹,找到了窗片、滤光片、冷屏、探测器芯片的反射是产生杂散辐射的原因。针对这些原因,采取了相应抑制杂散辐射的方式,包括通过镀膜降低窗片、滤光片反射率,通过发黑、设计多层隔板来提高冷屏的吸收能力,通过在探测器芯片上制作可靠性高的微纳结构来降低表面反射率等,起到了较好的效果。     

Mode-selective properties of a metal-clad-dielectric-slab waveguide for integrated optics

Attenuation and phase constants are calculated for a metal-clad-dielectric-slab waveguide and the results show the behavior of the propagating modes as a function of cladding material and dielectric. Analysis indicates that the dielectric properties influence the attenuation and cutoff frequencies whereas the metal cladding influences primarily the attenuation of propagating modes. Variation of the attenuation and phase constant around a center frequency show surface-wave properties of the TM0and TM1modes.     

Telecommunications applications of integrated optics and optoelectronics

Integrated optics and optoelectronics will play key roles in the evolution of the telecommunications network. We briefly review the available and developing technologies for integrated optical and optoelectronic devices, and summarize their characteristics and their natural areas of application in telecommunications. We then describe the trends and developments in fiber communication systems, services, and architectures, and how they can benefit from these devices. Major areas in which these devices are expected to contribute are: lowering the costs of high-speed network termination equipment to aid in providing inexpensive wide-band services to the subscriber; increasing the fraction of the fiber's natural bandwidth that can be made available for network usage; and increasing the network flexibility to facilitate multiservice integration.     

Reflection and scattering by a single groove in integrated optics

The reflection and scattering properties of guided optical waves at a single groove discontinuity are studied in this paper. The groove is on the surface of an optical thin-film waveguide commonly used in integrated optics. Both the fundamental TE0and TM0modes are considered. The problem is treated by a boundary perturbation technique. The power reflection coefficient, the radiation patterns, and the power of waves scattered into the free space and the substrate are found. Numerical results from an example are given to illustrate the effect of the geometric shape of the groove.     

Optimization of multilayer integrated optics waveguides

A numerical method is described that provides the means for optimizing any objective function representing a general multilayer integrated optics waveguide. In this way, the physical parameters of the multilayer structure can be set so that the performance of the device is optimized. The method uses any standard numerical minimization algorithm in conjunction with the argument principle method. The method has been successfully applied for the optimization of a multilayer immunosensor and a TE-mode polarizer. The advantages of the method are its generality, its efficiency, its accuracy, and its applicability to a wide range of planar integrated optics devices     

Analysis of integrated optics parametric oscillators

An almost analytical model for the analysis of integrated optics parametric oscillators is proposed. A comprehensive discussion of the static device characteristics of a doubly resonant oscillator with varying parameters of the optical cavity which influence the operation conditions (single and double pass and resonant pump) is presented. A detailed discussion of the evolution towards the singly resonant condition and the possibility of hysteretic behavior is also included     

超长线列红外探测器杜瓦真空寿命评估方法

针对超长线列红外探测器杜瓦具有容积大、零部件种类多、材料放气源多,特别是集成式超长线列杜瓦与内充3 MPa高压氦气的直线脉管冷指封装集成等特点,基于材料解析放气及渗透理论,建立了超长线列杜瓦组件真空寿命评估模型,对分置式与集成式超长线列杜瓦的真空寿命进行了计算,其真空寿命预计值均可以达到2年。设计了一种杜瓦真空度在线监测结构对这两类杜瓦的真空度进行了实时监测,分置式及集成式杜瓦真空寿命预计值与实测值相对误差分别为5.8%和6.96%。因集成式杜瓦真空寿命估算较为困难,对其热负载通过制冷性能进行实验验证,其热负载2年后未发生明显变化。     

Roughness, inhomogeneity, and integrated optics

Surface roughness (and more generally) inhomogeneity is a constraining factor on optoelectronics devices. Its more conspicuous effect is to scatter light thus leading to power attenuation. This effect partly explains the five orders of magnitude difference in attenuation between fibers and integrated waveguides. Less well known is the effect of roughness on back-coupling and mode coupling in devices such as couplers and gratings. I present here an overview of these effect analyzed from a heuristic approach based upon the length scales of the dominant physical mechanism present in such devices