HgCdTe negative luminescence devices for cold shielding and other applications

Negative luminescence (NL) refers to the suppression of infrared blackbody emission, and hence an apparent temperature reduction, due to free carrier extraction from a reverse-biased p-n junction. A number of applications are envisioned for NL devices, including cold shielding of background-limited uncooled and cryogenic focal-plane arrays, dynamic nonuniformity correction for ir imaging, and ir scene simulation. High-performance NL devices have recently been demonstrated. For example, a HgCdTe/CdZnTe photodiode with 4.8-μm cutoff wavelength achieved an internal NL efficiency of 95% at room temperature. This means that the blackbody emission was suppressed by a factor of 20 and that the apparent temperature of the device surface decreased by 60 K. The corresponding reverse-bias saturation current density was 0.11 A/cm². Even HgCdTe devices (λ _co=5.3 μm) grown on large-area silicon substrates with substantial lattice mismatch displayed 88% internal NL efficiency and saturation current densities no larger than 1.3 A/cm². These results indicate a clear path toward a negative-luminescence device technology that is efficient, operates at low power, and is inexpensive.     

Mid-wavelength infrared p-on-n Hg1−xCdxTe heterostructure detectors: 30–120 kelvin state-of-the-Art performance

We report on Hg_1−xCd_xTe mid-wavelength infrared (MWIR) detectors grown by molecular-beam epitaxy (MBE) on CdZnTe substrates. Current-voltage (I-V) characteristics of HgCdTe-MWIR devices and temperature dependence of focal-plane array (FPA) dark current have been investigated and compared with the most recent InSb published data. These MWIR p-on-n Hg_1−xCd_xTe/CdZnTe heterostructure detectors give outstanding performance, and at 68 K, they are limited by diffusion currents. For temperatures lower than 68 K, in the near small-bias region, another current is dominant. This current has lower sensitivity to temperature and most likely is of tunneling origin. High-performance MWIR devices and arrays were fabricated with median R_oA values of 3.96 × 10¹⁰ Ω-cm² at 78 K and 1.27 × 10¹² Ω-cm² at 60 K; the quantum efficiency (QE) without an antireflection (AR) coating was 73% for a cutoff wavelength of 5.3 μm at 78 K. The QE measurement was performed with a narrow pass filter centered at 3.5 μm. Many large-format MWIR 1024 × 1024 FPAs were fabricated and tested as a function of temperature to confirm the ultra-low dark currents observed in individual devices. For these MWIR FPAs, dark current as low as 0.01 e⁻/pixel/sec at 58 K for 18 × 18 μm pixels was measured. The 1024 × 1024 array operability and AR-coated QE at 78 K were 99.48% and 88.3%, respectively. A comparison of these results with the state-of-the-art InSb-detector data suggests MWIR-HgCdTe devices have significantly higher performance in the 30–120 K temperature range. The InSb detectors are dominated by generation-recombination (G-R) currents in the 60–120 K temperature range because of a defect center in the energy gap, whereas MWIR-HgCdTe detectors do not exhibit G-R-type currents in this temperature range and are limited by diffusion currents.     

MCT-on-Silicon Negative Luminescence Devices with High Efficiency

We used an InSb radiometric thermal imager to characterize the performance of 1″ × 1″ negative luminescent (NL) arrays. The devices grown on both CdZnTe (two arrays) and silicon (three arrays) as substrates have cut-off wavelengths ranging from 5.3 μm to 6.0 μm. The reverse-bias saturation current densities range from 0.3 A cm⁻² (λ _co = 5.3 μm) to 1 A cm⁻² (λ _co = 6.0 μm). The apparent array temperatures decrease by 37.9 K to 42.8 K under reverse bias, which corresponds to external NL efficiencies of 80–85%. Most of the inefficiency results from the non-ideal AR coating, whose reflectivity is ≈15% when weighted over the black body and atmospheric transmission spectra. It is highly encouraging that both the electrical and NL properties are slightly superior for the devices grown on silicon substrates.     

1/f noise in very-long-wavelength infrared Hg1−xCdx Te detectors

This paper investigates 1/f noise performance of very-long-wavelength infrared (VLWIR) Hg_1−xCd_xTe (cutoff wavelengths λ_c=15 μm and λ_c=16 μm) photodiodes at 78 K, where detector current is varied by changing detector area, detector bias, and illumination conditions. Holding detector bias and temperature constant, the 1/f noise current is proportional to the detector current. Significant nonuniformity is observed in the noise data for each detector area because of the varying detector quality. Defects are presumed resident in the detectors to produce greater nonuniformity in 1/f noise as compared to dark current at 100-mV reverse bias. For λ_c=16 μm, 4-μ-radius, diffusion-limited diodes at 78 K and 100-mV reverse bias, the average dark current is I_d=9.76±1.59×10⁻⁸ A, while the average noise current measured at 1 Hz is i_n=1.01±0.63×10⁻¹² A/Hz^1/2. For all detector areas measured, the average ratio in 1-Hz bandwidth is α _D =i_n/I_d=1.39±1.09×10⁻⁵. The 1/f noise was also measured on one diode as a function of detector-dark current as the applied bias is varied. In the diffusion-limited portion of this detector’s current-voltage (I-V) curve, to about 130 mV, the 1/f noise was independent of bias. For this diode, the ratio α_D=i_n/I_d=1.51±0.12×10⁻⁵. The 1/f noise associated with tunneling currents is a factor of 3 greater than the 1/f noise associated with diffusion currents, α_T=i_n/I_T=5.21±0.83×10⁻⁵. In addition, 1/f noise was measured on detectors held at −100 mV and 78K under dark and illuminated conditions. The measured ratios α_P ∼α_D ∼1.5×10⁻⁵ were about the same for the dark and photon-induced diffusion currents. Therefore, the diffusion current appears to have a unique value of α as compared to the tunneling current. This may be indicative of unique noise-generation mechanisms associated with each current.     

Use of two low-temperature emitters to determine the cutoff wavelength of the photosensitivity of infrared photodetectors

This paper is the continuation of the analysis of a method of determining the cutoff wavelength λ _c of infrared photodetectors by irradiating the sample with radiation from two blackbodies with different temperatures. The emitters can operate at lower temperatures as the cutoff wavelength λ _c is increased. The parameters of a system employing two blackbodies, which are placed inside a liquid-nitrogen cryostat and have temperatures of 260 and 320 K, respectively, are presented. It is shown that an error of 1 K in determining the lower or higher temperature produces an error of approximately 0.3 and 0.2 μm, respectively, in λ _c if λ _c=10 μm. Measurements on photodiodes fabricated on the basis of Cd_0.24Hg_0.76Te (λ _c=8.1 μm) epitaxial layers showed that the difference in the values of λ _c obtained by this method and from spectral measurements is no more than several tenths of a micron. It is suggested that this method be used as a standard method. Fiz. Tekh. Poluprovodn. 32, 1135–1138 (September 1998)     

Large VLWIR Hg1−xCdxTe photovoltaic detectors

Very long wavelength infrared (VLWIR; 15 to 17 μm) detectors are required for remote sensing sounding applications. Infrared sounders provide temperature, pressure and moisture profiles of the atmosphere used in weather prediction models that track storms, predict levels of precipitation etc. Traditionally, photoconductive VLWIR (λ_c >15 μm) detectors have been used for sounding applications. However, photoconductive detectors suffer from performance issues, such as non-linearity that is 10X – 100X that of photovoltaic detectors. Radiometric calibration for remote sensing interferometry requires detectors with low non-linearity. Photoconductive detectors also suffer from non-uniform spatial optical response. Advances in molecular beam epitaxy (MBE) growth of mercury cadmium telluride (HgCdTe) and detector architectures have resulted in high performance detectors fabricated in the 15 μm to 17 μmm spectral range. Recently, VLWIR (λ_c ∼ 17 μm at 78 K) photovoltaic large (1000 μm diameter) detectors have been fabricated and measured at flux values targeting remote sensing interferometry applications. The operating temperature is near 78 K, permitting the use of passive radiators in spacecraft to cool the detectors. Detector non-AR coated quantum efficiency >60% was measured in these large detectors. A linear response was measured, while varying the spot size incident on the 1000 μm detectors. This excellent response uniformity, measured as a function of spot size, implies that low frequency spatial response variations are absent. The 1000 μm diameter, λ_c ∼ 17 μm at 78 K detectors have dark currents ∼160 μA at a −100 mV bias and at 78 K. Interfacing with the low (comparable to the contact and series resistance) junction impedance detectors is not feasible. Therefore a custom pre-amplifier was designed to interface with the large VLWIR detectors operating in reverse bias. A breadboard was fabricated incorporating the custom designed preamplifier interfacing with the 1000 μm diameter VLWIR detectors. Response versus flux measurements were made on the large VLWIR detectors and non-linearity <0.15% was measured at high flux values in the 2.5×10¹⁷ to 3.5×10¹⁷ ph-cm⁻²sec⁻¹ range. This non-linearity is an order of magnitude better than for photoconductive detectors.     

Long-wavelength light-emitting diodes (λ=3.4–3.9 µm) based on InAsSb/InAs heterostructures grown by vapor-phase epitaxy

InAs/InAs_0.93Sb_0.07/InAs heterostructures were grown by metal-organic vapor-phase epitaxy in a horizontal reactor at atmospheric pressure. Based on the obtained structures, light-emitting diodes operating at λ=3.45 μm (T=77 K) and λ=3.95 μm (T=300 K) were fabricated. The room-temperature quantum efficiency of light-emitting diodes was 0.12%. __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 34, No. 12, 2000, pp. 1462–1467. Original Russian Text Copyright ? 2000 by Zotova, Kizhaev, Molchanov, Popova, Yakovlev.     

Midwave-infrared negative luminescence properties of HgCdTe devices on silicon substrates

We have investigated the negative luminescence properties of a midwave-infrared (MWIR) HgCdTe photodiode (λ_co = 5.3 μm at 295 K) grown on a silicon substrate. The internal negative luminescence efficiencies measured using a self-referencing optical technique were 88% throughout the 3–5 μm spectral region and nearly independent of temperature in the 240–300 K range. This corresponds to an apparent temperature reduction of 53 K at room temperature and 35 K at 240 K. Efficiencies measured by an electrical modulation technique were consistent with the measured internal efficiencies and the measured reflectivity of the device. This is the highest efficiency and largest apparent reduction in temperature reported to date, and slightly higher than that measured earlier for photodiodes grown on CdZnTe despite a longer cut-off wavelength. These results provide further indication that the HgCdTe/Si photovoltaic device technology is capable of combining high quality with high yield.     

High-pressure preparation and thermoelectric properties of Bi0.85Sb0.15

Nanocrystalline Bi_0.85Sb_0.15 powders were prepared by a novel mechanical alloying method. The bulk samples were formed by applying a pressure of 6 GPa at different pressing temperatures and times. Electrical conductivity, Seebeck coefficients, and thermal conductivity were measured in the temperature range 80–300 K. The Seebeck coefficient reaches a maximum value of −173 μV/K at 150 K. The largest figure of merit, 3.46 × 10⁻³ K⁻¹, achieved in this experiment is 50% higher than that of its single-crystal counterpart at 200 K.     

Conversion of red and infrared luminescence centers as a result of electron bombardment and annealing of CdS and CdS:Cu single crystals

The luminescence centers and their conversion as a result of electron bombardment and annealing in CdS single crystals which were not specially doped and which were doped with copper have been investigated. The Cu atoms, which interact mainly with defects in the cadmium sublattice, form Cu_Cd, which are responsible for luminescence at wavelengths λ_m=0.98−1.00 μm. At annealing temperatures above 50 °C, conversion of the defect complexes, which are responsible for the green (λ_m=0.514 μm), red (λ_m=0.72 μm), and infrared (λ_m=0.98 μm) luminescence, occurs as a result of an increase in the mobility of point defects in the cadmium and sulfur sublattices of CdS:Cu. Fiz. Tekh. Poluprovodn. 31, 1013–1016 (August 1997)     

Interband Cascade Lasers with Wavelengths Spanning 2.9 μm to 5.2 μm

We report an experimental investigation of four interband cascade lasers with wavelengths spanning the mid-infrared spectral range, i.e., 2.9 μm to 5.2 μm, near room temperature in pulsed mode. One broad-area device had a pulsed threshold current density of only 3.8 A/cm² at 78 K (λ = 3.6 μm) and 590  A/cm² at 300 K (λ = 4.1 μm). The room-temperature threshold for the shortest-wavelength device (λ = 2.6 μm to 2.9 μm) was even lower, 450 A/cm². A␣cavity-length study of the lasers emitting at 3.6 μm to 4.1 μm yielded an internal loss varying from 7.8 cm⁻¹ at 78 K to 24 cm⁻¹ at 300 K, accompanied by a decrease of the internal efficiency from 77% to 45%.     

Investigation of mid-infrared type-II “W” diode lasers

We report an experimental investigation of 16 different mid-infrared diode laser samples with type-II “W” active regions. A number of design modifications were employed to study effects on the I–V characteristics, lasing threshold, and wallplug efficiency. Contrary to expectations, the threshold current density at low temperatures did not vary significantly with the number of active quantum-well periods, nor was there any clear correlation between lasing threshold and photoluminescence intensity. A shorter-wavelength device (3.2–3.6 μm) produced >500 mW of cw power at 80 K, and a second device displayed a wallplug efficiency >10%. The maximum lasing temperature was 317 K for pulsed operation and 218 K for cw operation. At T=100 K, cavity-length studies indicated an internal loss of 7 cm⁻¹ and nominal internal efficiency of 96%. Hakki-Paoli measurements of the gain spectrum implied an intrinsic linewidth enhancement factor of ∼1.3, which slightly exceeds the theoretical prediction. Longer-wavelength devices (λ ≈ 3.8–4.5 μm) showed similarly low threshold current densities at T=80 K but degraded more rapidly with increasing temperature.     

Molecular-beam epitaxial growth of HgCdTe infrared focal-plane arrays on silicon substrates for midwave infrared applications

Molecular beam epitaxy has been employed to deposit HgCdTe infrared detector structures on Si(112) substrates with performance at 125K that is equivalent to detectors grown on conventional CdZnTe substrates. The detector structures are grown on Si via CdTe(112)B buffer layers, whose structural properties include x-ray rocking curve full width at half maximum of 63 arc-sec and near-surface etch pit density of 3–5 × 10⁵ cm⁻² for 9 μm thick CdTe films. HgCdTe p⁺-on-n device structures were grown by molecular beam epitaxy (MBE) on both bulk CdZnTe and Si with 125K cutoff wavelengths ranging from 3.5 to 5 μm. External quantum efficiencies of 70%, limited only by reflection loss at the uncoated Si-vacuum interface, were achieved for detectors on Si. The current-voltage (I-V) characteristics of MBE-grown detectors on CdZnTe and Si were found to be equivalent, with reverse breakdown voltages well in excess of 700 mV. The temperature dependences of the I-V characteristics of MBE-grown diodes on CdZnTe and Si were found to be essentially identical and in agreement with a diffusion-limited current model for temperatures down to 110K. The performance of MBE-grown diodes on Si is also equivalent to that of typical liquid phase epitaxy-grown devices on CdZnTe with R₀A products in the 10⁶–10⁷ Θ-cm² range for 3.6 μm cutoff at 125K and R₀A products in the 10⁴–10⁵ Θ-cm² range for 4.7 μm cutoff at 125K.     

Advances in large-area Hg1−xCdxTe photovoltaic detectors for remote-sensing applications

State-of-the-art large-area photovoltaic (PV) detectors fabricated in HgCdTe grown by molecular beam epitaxy (MBE) have been demonstrated for the Crosstrack Infrared Sounder (CrIS) instrument. Large-area devices (1 mm in diameter) yielded excellent electrical and optical performance operating at 81 K for λ_c ∼ 15 μm, at 98 K for λ_c ∼ 9 μm, and λ_c ∼ 5-μm spectral cutoffs. Fabricated detectors have near-theoretical electrical performance, and Anti Reflection coated quantum efficiency (QE) is greater than 0.70. Measured average R₀A at 98 K is 2.0E7 Ωcm², and near-theoretical QEs greater than 0.90 were obtained on detectors with λ_c ∼ 5-μm spectral cutoffs. These state-of-the-art large-area PV detector results reflect high-quality HgCdTe grown by MBE on CdZnTe substrates in all three spectral bands of interest.