共查询到20条相似文献,搜索用时 125 毫秒
1.
车载雷达自动测试系统是军民技术融合的体现。测试系统既是车载雷达产品研发的重要保障,又是车载雷达批量生产、提升产品质量不可缺少的核心设备。电气性能测试系统、射频性能测试系统、探测性能测试系统、密封性能测试系统的成功应用,使车载雷达的生产效率提升70%以上,产品合格率提高到99%以上。自动测试系统将传统军用雷达技术应用到民用车载雷达中,必将为军工研究所的产业发展提供持久动力。 相似文献
2.
智能激光测距机性能测试系统 总被引:6,自引:1,他引:5
为测量激光测距机的性能 ,研制了一种新型的测量系统。系统采用先进的控制技术和方便、快捷的微机软件 ,且配有结构巧妙的分光束光学系统 ,能同时实现对测距机的光轴平行性、激光脉冲宽度、脉冲能量、光束发散角等性能参数的测量。 12 96× 10 30高空间分辨率CCD的引入 ,使系统的角分辨率达到 10″;35 0MHz示波器用于捕捉窄达 10ns的激光脉冲 ;高精度、大动态范围的激光能量计可精确测量出激光脉冲的能量。系统已通过验收 ,各项指标均满足设计要求。目前已正式应用 ,效果良好 相似文献
3.
复杂的半导体自动测试系统如果出现GPIB接口问题将影响测试生产的效率,本文开发的半导体自动测试GPIB接口的联合调试系统,可以分别与测试系统和测试机进行接口调试,以帮助工程师解决在实际测试生产中半导体自动测试系统的GPIB接口问题. 相似文献
4.
5.
6.
7.
介绍了Windows98环境下基于PC机工业控制器自动测试系统,着重论述了如何保证自行设计的ISA总线测试板卡系统精度以及设计实现过程中的抗干扰、总线驱动等关键问题。 相似文献
8.
随着自动测试系统向标准化、模块化和系列化发展,标准化总线技术是满足这三化的关键技术的基础,它的发展推动了自动测试系统的更新。文中通过分析目前流行的PXI和LXI总线的基本特性和优缺点,对基于新型总线AXIe的自动测试系统设计进行了介绍,并预测了自动测试总线未来的发展趋势。 相似文献
9.
在总结自动测试系统(ATS)发展现状的基础上,比对目前美军正在开展的下一代测试计划(NxTest),分析了国内自动测试系统发展存在的不足,提出了国产化通用测试平台的发展思路,开展了相关研制建设工作,希望能够加快国内电子设备自动测试系统的标准化工作进程,丰富国产测试资源种类,提高国产测试产品可靠性,满足国内电子设备的测试保障需要。 相似文献
10.
机载雷达的生产调试、维护保障是一个相当复杂的过程。对此提出了如何通过基于VXI总线的自动测试系统实现两者的统一,以及如何组建这种系统的硬件与软件构架。实验结果证明,该系统改善了机载雷达的调试环境,缩短了研制周期,工作情况良好。 相似文献
11.
基于LXI总线的自动测试系统方案设计 总被引:1,自引:1,他引:0
为了满足军用自动测试系统准确度要求高、测量点多、实施性强的特点,实现提高测试准确度、简化硬件电路设计的目的,采用了基于LXI总线的数字化测试系统方法,做了将数字万用表L4411A和多路开关L4421A应用于ATE的实验。获得了实时性好,准确度高,简化硬件设计的结果,得到了基于LXI总线的数字化测试系统方案很好地满足了军用ATE系统需求的结论。 相似文献
12.
Every engineer has used test instruments. From the humble handheld multimeter to the most complex protocol analyzer, test instruments are used by engineers in the field and the design lab, in repair shops and environmental chambers, in research, and in quality assurance (QA). Visit any electronics lab and you'll likely find arrays of instruments, stacked three high on lab benches, all of them familiar tools from familiar manufacturers. Walk down the hall from the lab to the test floor at a semiconductor manufacturer, a contract PC manufacturer, or even a military repair depot, and the familiarity falls away. Instead of multimeters, oscilloscopes, and precision voltage sources, you will find systems full of specialized instrumentation, often made by unfamiliar companies. The corridor between the design lab and the test floor seems to connect two different worlds. This discontinuity is not because the laws of electronics are different in the two worlds; it's caused by the constraints bounding the test engineer. These constraints have required the creation of a different breed of test instrument, called automatic test equipment (ATE). The line between lab equipment and ATE isn't a sharp one but it's sometimes sharp enough to necessitate entirely different instrument designs. This article explores some of the general themes driving production instrument designs and gives some examples of the impact of production requirements on ATE design. The challenge for ATE designers is to cover all the boundary conditions while making sure that performance is always valued and cost effective. 相似文献
13.
14.
15.
内部示波器是ATE测试设备上的一个调试工具模块,它的主要功能就是可以动态地显示ATE被测芯片某个输出管脚的实时波形,是ATE测试设备进入中高端市场必备的一个模块。对于测试工程师来说,在编写测试程序或者调试测试程序的时候,相对于外部示波器来说,内部示波器的优点是非常明显的。本文主要讨论了如何在数字ATE上实现内部示波器的功能,以及实现上的一些难点和波形优化的问题。 相似文献
16.
在介绍一种多对象适用自动检测设备硬件结构的基础上,详细叙述了该自动检测设备应用软件设计时将被测对象信息、检测设备硬件平台同被测对象间的硬件关联信息相对于测控程序进行分离并规范的思路及方法。通过硬件规范信息库的构建,该自动测试设备测控程序大大地减少了对检测设备与多被测对象硬件的关联性,具有一对多、易于扩充的优点。 相似文献
17.
18.
For reducing the test application time and required tester pins per device, we propose the use of multi-valued logic (MVL) signals, which increases data rate between the device under test (DUT) and automatic test equipment (ATE). An MVL signal sends multiple bits of information per clock cycle on a physical channel. Conversion of signals between binary and MVL is accomplished by digital to analog and analog to digital converters available in the mixed-signal technology. To support MVL test application and avoid reliability issues, we add necessary modifications on ATE and DUT sides. Theoretical calculation and a prototype experiment demonstrate significant data rate increase. We integrate the proposed MVL technique into test methodologies involving reduced pin-count test (RPCT) for multi-core system-on-chip (SoC) and test compression. An actual automatic test equipment (ATE) based test of a DUT shows notable reduction in test application time with MVL test application. 相似文献
19.
电流输出控制设备在ATE上的TPS开发设计 总被引:1,自引:1,他引:0
简要阐述了ATE测试平台的应用背景和在电子设备测试维修中的必要性,对ATE测试平台的功能、组成和工作原理做了概括描述。介绍了测试程序集(TPS)的组成及在ATE测试平台上的开发设计思路。并以电流输出控制设备为例进行TPS开发设计,在分析了电流输出控制设备测试需求的基础上,具体设计了电流输出控制设备在TPS开发中的测试接... 相似文献
20.
This paper presents a novel method that utilizes multi-site and multi-probe capabilities of an ATE for testing of pre-assembly MCM substrates. Testing multiple SUTs (substrates under test) simultaneously can improve the efficiency of the probes in an ATE and considerably reduce the total test time. An analytical model that predicts very accurately the testing time of a SUT batch is proposed. Based on this model, the optimal multi-site testing configuration as corresponding to the batch size can be established. Simulation results for an ATE with 12 flying-probes as an example of a commercially available tester are provided; for this ATE the proposed method achieves a reduction of 54.66% in test time over a single-site method (both at complete coverage of the modeled faults). 相似文献