光电探测器组件辐照后性能退化的噪声表征

本文用爆裂噪声表征总剂量电离辐射(TID)对光电探测器组件的损伤情况。通过对辐照前后的光电探测器组件进行噪声测试,然后对比分析其结果。实验结果表明,总剂量辐照后,相对于辐照前,光电探测器组件内部明显出现了爆裂噪声,即组件内部出现了大量缺陷,导致组件的可靠性降低。     

基于低频电噪声的光电耦合器可靠性筛选方法研究

低频电噪声是表征电子器件质量和可靠性的敏感参数,通过测试低频噪声,可以快速、无损地实现光耦器件的可靠性评估。通过开展可靠性老化对光电耦合器低频噪声特性影响的试验研究,提出基于低频段宽频带噪声参数的光电耦合器可靠性筛选方法,并将可靠性筛选结果与点频噪声筛选方法结果进行对比分析。结果表明,与点频噪声参数等现有方法相比,宽频带噪声参数可以更灵敏和准确地表征器件可靠性,同时计算简便,基于宽频带噪声参数的光电耦合器可靠性筛选方法可以实现更为准确合理的可靠性分类筛选。     

噪声作为红外探测器可靠性评价的探讨

红外探测器的可靠性是一个重要的指标,当前利用噪声来表征器件的可靠性受到了广泛的关注.文分析了红外探测器的电噪声,它包括热噪声、散粒噪声、g-r噪声和1/f噪声,再结合g-r噪声和1/f噪声的产生,对噪声用作InSb光伏探测器可靠性的评价进行了详细分析.     

基于界面材料损伤的晶体管辐射噪声表征模型

在双极晶体管界面材料辐照损伤机理及缺陷产生微观机制分析的基础上,结合缺陷与电参量及1/f噪声参量之间的关系,建立了辐照损伤的1/f噪声模型.通过讨论噪声与晶体管可靠性之间的关系,探讨所建立的噪声模型用于双极晶体管辐射表征的方法的可靠性.结果表明此方法为晶体管的可靠性筛选,提供了理论依据.     

基于太赫兹半导体量子阱器件的光电表征技术及应用

光电表征技术是太赫兹应用技术的重要基础,涵盖了太赫兹频段光电器件表征、光谱测量、光束改善以及通信和成像应用等多个方面,在太赫兹应用领域中发挥着重要作用。介绍了太赫兹频段两种半导体量子器件的工作原理和最新进展,综述了二者在太赫兹脉冲功率测量、探测器响应率标定等光电表征技术中的应用及其在太赫兹快速调制与探测、太赫兹扫描成像系统中的应用,最后介绍了太赫兹光电表征技术的改善,包括激光源光束质量改善和探测器有效探测面积的提高方法等,并给出了器件及表征技术的潜在应用。     

碲镉汞红外光电探测器局域场表征研究进展（特邀）

碲镉汞材料 (HgCdTe) 是第三代红外探测系统中使用的重要探测材料,其发展水平能基本反映当前红外探测器最优性能指标。近年来,天文、遥感和民用设备对探测器性能提出了更高的要求,这对HgCdTe红外探测器的设计和制备提出了新的挑战。HgCdTe红外探测器更精细的设计和加工技术为提高HgCdTe红外探测器性能提供解决思路。抑制器件的有害局域场、调控器件的有益局域场可以实现器件性能进一步的突破。但是,如何对HgCdTe光电器件局域场进行表征与分析,澄清HgCdTe光电器件中局域场相关的噪声及暗电流起源,是推动器件性能突破需解决的重要关键科学与技术问题。文中将总结HgCdTe红外光电探测器局域场表征与分析的研究进展,为新一代HgCdTe红外光电探测器发展提供基础支撑。     

光电耦合器件低频噪声特性与可靠性老化研究

在宽的输入偏置电流范围条件下,开展了光电耦合器件低频噪声特性测试与功率老化和高温老化的可靠性试验研究。结果表明,光电耦合器件的低频噪声主要是内部光敏晶体管1/f噪声,并随输入偏置电流的增大呈现先增大后减小的规律,这与器件的工作状态密切相关。功率老化试验后,高输入偏置电流条件下的低频噪声有所增大,这归因于电应力诱发的有源区缺陷。高温老化试验后,整个器件线性工作区条件下的低频噪声都明显增大,说明温度应力能够更多地激发器件内部的缺陷。相对于1/f噪声幅度参量,低频噪声宽带噪声电压参量可以更灵敏准确地进行器件可靠性表征。     

光电耦合器电流传输比的噪声表征

光电耦合器中可俘获载流子的陷阱密度是影响其电流传输比(CTR)的重要因素,并与器件可靠性有密切关系.在器件内部的多种噪声中,1/f噪声可有效地表征器件陷阱密度.本文在研究光电耦合器工作原理以及1/f噪声理论的基础上,建立了光电耦合器的CTR表征模型和1/f噪声模型.在输入电流宽范围变化的条件下,测量了器件的电学噪声和CTR变化,实验结果验证了以上模型的正确性.将CTR模型与噪声模型相结合,得到了CTR与1/f噪声之间的关系.此关系应用于对光电耦合器辐照实验结果的分析,实验结果与理论得到的结论一致.理论与实验结果表明,噪声幅值越大,电流指数越接近于2,则器件的可靠性越差,相同工作条件下CTR的老化衰减量越大,其失效率显著增大.从而证明噪声可表征光电耦合器的CTR并能准确地反映器件的可靠性.     

光电耦合器电流传输比的噪声表征

光电耦合器中可俘获载流子的陷阱密度是影响其电流传输比(CTR)的重要因素,并与器件可靠性有密切关系.在器件内部的多种噪声中,1/f噪声可有效地表征器件陷阱密度.本文在研究光电耦合器工作原理以及1/f噪声理论的基础上,建立了光电耦合器的CTR表征模型和1/f噪声模型.在输入电流宽范围变化的条件下,测量了器件的电学噪声和CTR变化,实验结果验证了以上模型的正确性.将CTR模型与噪声模型相结合,得到了CTR与1/f噪声之间的关系.此关系应用于对光电耦合器辐照实验结果的分析,实验结果与理论得到的结论一致.理论与实验结果表明,噪声幅值越大,电流指数越接近于2,则器件的可靠性越差,相同工作条件下CTR的老化衰减量越大,其失效率显著增大.从而证明噪声可表征光电耦合器的CTR并能准确地反映器件的可靠性.     

光电耦合器的辐照损伤机理研究现状及趋势

随着光电耦合器件在空间环境和核辐射领域的广泛应用,近年来对光电耦合器件的抗辐照性能的研究越来越多.文章主要介绍了辐照对光电耦合器的损伤机理,重点介绍了光电耦合器的辐照效应,特别是电参数辐照效应;针对光电耦合器目前研究的情况,分析了其研究趋势,并提出了一种新的光电耦合器辐照研究方法--低频噪声可靠性表征方法.     

Travelling-wave photodetectors with 172-GHz bandwidth and 76-GHzbandwidth-efficiency product

Results of the first fabrication and measurement of travelling-wave photodetectors are reported. The devices have bandwidths as high as 172 GHz, the highest reported for a p-i-n photodetector, and bandwidth-efficiency products as large as 76 GHz, the largest reported for any photodetector without gain. Comparisons with vertically illuminated and waveguide photodetectors fabricated on the same wafer establish the superior performance of travelling-wave photodetectors. Microwave loss on the travelling-wave photodetector structure is identified as a bandwidth limitation     

Ultrahigh‐Performance Flexible and Self‐Powered Photodetectors with Ferroelectric P(VDF‐TrFE)/Perovskite Bulk Heterojunction

Flexible and self‐powered perovskite photodetectors attract widespread research interests due to their potential applications in portable and wearable optoelectronic devices. However, the reported devices mainly adopt an independent layered structure with complex fabrication processes and high carrier recombination. Herein, an integrated ferroelectric poly(vinylidene‐fluoride‐trifluoroethylene) (P(VDF‐TrFE)) and perovskite bulk heterojunction film photodetector on the polyethylene naphthalate substrate is demonstrated. Under the optimum treatment conditions (the polarization voltage and time, and the concentration of P(VDF‐TrFE)), the photodetector exhibits a largely enhanced performance compared to the pristine perovskite device. The resulting device exhibits ultrahigh performance with a large detectivity (1.4 × 10¹³ Jones) and fast response time (92/193 µs) at the wavelength of 650 nm. The improved performance is attributed to the fact that the polarized P(VDF‐TrFE)/perovskite hybrid film provides a stronger built‐in electric field to facilitate the separation and transportation of photogenerated carriers. These findings provide a new route to design self‐powered photodetectors from the aspect of device structure and carrier transport.     

超宽带高饱和单行载流子光探测器研究 （特邀）

超宽带单行载流子（UTC）光电探测器因其仅需快速的电子输运过程,较传统PIN探测器具有明显宽带优势,是6G宽带无线通信、太赫兹成像、超宽带噪声发生器等亚太赫兹频段系统中的核心光电子器件之一。面向亚太赫兹频段光电转换需求,针对UTC探测器中大带宽与高饱和功率之间的矛盾问题,分别研究并突破了光生载流子高速输运机理、感性共面波导器件（CPW）结构等关键技术,研制成功带宽106 GHz、饱和输出功率7.3 dBm的双漂移层结构MUTC探测器芯片,和带宽超过150 GHz的超宽带MUTC探测器芯片。     

Analysis and circuit modeling of waveguide-separated absorption charge multiplication-avalanche photodetector (WG-SACM-APD)

Waveguide photodetectors are considered leading candidates to overcome the bandwidth efficiency tradeoff of conventional photodetectors. In this paper, a theoretical physics-based model of the waveguide separated absorption charge multiplication avalanche photodetector (WG-SACM-APD) is presented. Both time and frequency modeling for this photodetector are developed and simulated results for different thicknesses of the absorption and multiplication layers and for different areas of the photodetector are presented. These simulations provide guidelines for the design of these high-performance photodiodes. In addition, a circuit model of the photodetector is presented in which the photodetector is a lumped circuit element so that circuit simulation of the entire photoreceiver is now feasible. The parasitics of the photodetector are included in the circuit model and it is shown how these parasitics degrade the photodetectors performance and how they can be partially compensated by an external inductor in series with the load resistor. The results obtained from the circuit model of the WG-SACM-APD are compared with published experimental results and good agreement is obtained. This circuit modeling can easily be applied to any WG-APD structure. The gain-bandwidth characteristic of WG-SACM-APD is studied for different areas and thicknesses of both the absorption and the multiplication layers. The dependence of the performance of the photodetector on the dimensions, the material parameters and the multiplication gain are also investigated.     

Efficient Assembly of Bridged β‐Ga2O3 Nanowires for Solar‐Blind Photodetection

An increasing number of applications using ultraviolet radiation have renewed interest in ultraviolet photodetector research. Particularly, solar‐blind photodetectors sensitive to only deep UV (<280 nm), have attracted growing attention because of their wide applicability. Among recent advances in UV detection, nanowire (NW)‐based photodetectors seem promising, however, none of the reported devices possesses the required attributes for practical solar‐blind photodetection, namely, an efficient fabrication process, a high solar light rejection ratio, a low photocurrent noise, and a fast response. Herein, the assembly of β‐Ga₂O₃ NWs into high‐performance solar‐blind photodetectors by use of an efficient bridging method is reported. The device is made in a single‐step chemical vapor deposition process and has a high 250‐to‐280‐nm rejection ratio (～2 × 10³), low photocurrent fluctuation (<3%), and a fast decay time (<<20 ms). Further, variations in the synthesis parameters of the NWs induce drastic changes in the photoresponse properties, which suggest a possibility for tuning the performance of the photodetectors. The efficient fabrication method and high performance of the bridged β‐Ga₂O₃ NW photodetectors make them highly suitable for solar‐blind photodetection.     

基于湿法腐蚀工艺的高性能黑硅光电探测器

采用基于硝酸/氢氟酸/磷酸/硫酸混合液的湿法腐蚀工艺,实现了高吸收效率的黑硅结构的制备与工艺集成,获得了具有近红外响应增强效果的黑硅PIN光电探测器,并与未集成黑硅的PIN光电探测器的性能参数进行了对比测试.测试结果显示,黑硅光电探测器在1 060 nm波长下的响应度达到0.69 A/W(量子效率80.7％),较未集成黑硅的器件提高了 116％;黑硅探测器暗电流小于8 nA,响应时间小于8 ns,电容小于9 pF,与未集成黑硅的器件相当.得益于工艺兼容性,所采用的黑硅技术具有广泛应用于硅基近红外PIN,APD,SPAD,SPM等光电探测器的潜力,可显著提高器件的响应率、量子效率、响应速度、击穿电压温度系数等性能.     

局域场增强石墨烯近红外光电探测器（特邀）

近红外光电探测器在夜视监控、生物医学、环境监测等诸多领域有广泛应用。由于二维石墨烯材料具有独特性质（零带隙结构、高载流子迁移率、功函数可调）使其在红外探测领域具有巨大潜质。为了充分利用石墨烯的优势,并克服其吸收率低、暗电流噪声大的不足,研究者利用局域场调控设计混合结构以提高红外探测器性能。文中总结了局域场增强石墨烯近红外光电探测器的研究成果,介绍了单吸收层局域场增强器件并分析基于不同类型感光材料器件的优缺点,进一步介绍了双吸收层局域场增强器件,对笔者所做的双吸收层器件中电流极性等相关研究进行了简述。最后对局域场增强探测器相关功能拓展领域研究进行了简介,对该类器件的发展趋势进行了简要的总结和展望。     

电场及力场增强二维材料光电探测器的研究进展北大核心CSCD

二维材料光电探测器作为新型光电探测器,具有带隙可调、易于制备柔性器件等诸多优点。进一步丰富了光电探测器的应用前景。与此同时,二维材料光电探测器也需要一定程度的优化,例如解决二硫化钼难以实现双极性调控的问题。本文着重介绍科研人员通过利用离子导体,铁电材料,局域栅等电场方式以及施加应力的力场方式对二维材料光电探测器进行增强。从而解决二维材材制备的探测器存在的一些问题,并分析现有研究的不足之处,并对其未来发展进行展望。为相关研究人员提供一定程度的参考。     

Estimation of the reliability of digital systems implemented on programmable devices

In this paper, the authors propose to use the functional reliability parameters as a criterion for consistent choice of a project solution on the basis of the forecast reliability parameters. The authors take into account the failures as the main reason of incorrect performance of the designed digital systems, implemented on programmable devices. The electromagnetic parasitic noises arising in the microelectronics chip is one of the main reason of failure occurrences. Their influence on the reliability parameters of the designed project has been determined. Mathematical models (MM) of internal noises have been developed. On the basis of these MM and with the noise immunity margin as well, the developer is able to estimate the functional reliability parameters of logic gate at single switching. The received evaluations of the failure probabilities are accepted as the basic characteristics and are used hereinafter when evaluating the probability of correct functioning of a designed project.The obtained reliability parameters permit the developer to choose the optimal architecture of the designed project by comparing the alternative variants. For practical realization of the proposed approach, the software subsystem “FunNad-2” has been developed.     

Electroluminescence Device to Implement the Clipped Hopfield Neural Network

The method,which used an electroluminescent device to implement the clipped Hopfield neural network,is presented in detail.The electrolumisescence devices are used to represent the neurons and the photodetectors are used to represent the con-nection matrix.The characteristics of the electroluminescence device and the photodetec-tor are tseted.And the charapteristics of this system is discussed briefly.