共查询到20条相似文献,搜索用时 62 毫秒
1.
2.
随钻测井中,井场上的机电干扰和工业干扰对信号有明显的影响,为此提出了利用自适应噪声干扰抵消技术滤除噪声,提高信噪比。自适应噪声抵消器是自适应滤波的一种重要应用,它利用对消的方法抑制干扰,而把被污染的信号提取出来,因此可以将一路以有用信号为主同时含有部分噪声干扰和另一路主要是噪声信号的两路信号分别作为自适应噪声干扰抵消器的原始输入和参考输入进行自适应滤波。实验结果表明,自适应噪声抵消器能够有效滤除井场噪声,提高信号的信噪比。 相似文献
3.
本文为了在语音信号处理中能消除含噪语音信号中的背景噪音,采用自适应信号处理的理论和技术来达到提高语音信号质量的目的。通过介绍自适应滤波器原理,在对自适应滤波器相关理论研究的基础上,研究了LMS自适应滤波算法,并对LMS自适应算法进行了分析。同时为了使输入的参考信号与噪声相关,加入分离周期信号与带有窄带干扰抑制的宽带信号。通过分析仿真结果表明基于LMS算法的自适应噪声抵消技术可以有效地抵消正弦干扰信号,同时加入宽带信号中的周期性噪声,在没有另外的与噪声相关的参考信号的情况下,可以使用自适应噪声抵消系统来消除这种同期性干扰噪声。 相似文献
4.
5.
6.
7.
8.
相位噪声会限制全双工(FD)收发机的自干扰抑制能力,恶化有用信号解调性能,即使全双工收发机采用发射机、接收机共用本振的结构,也无法消除相位噪声的限制作用。为了降低多径自干扰(SI)分量中相位噪声的影响,该文提出一种多通道变时延下变频全双工收发方法,具体包括可以补偿相位噪声的全双工收发机设计和能够抑制残余相位噪声的自干扰抑制算法。多通道变时延下变频全双工收发机采用多条通道接收同一天线的信号,各接收本振信号为经过不同延时调整的发射本振信号,可以在下变频时补偿多径自干扰中的相位噪声。自干扰抑制算法利用不同接收信号估计相位噪声参数,进一步降低残余相位噪声的影响。此外,该文推导了这种全双工收发方法的自干扰抑制能力,并给出了其随发射功率、接收通道数量的变化关系。分析与仿真结果表明,当接收通道数量高于自干扰信道强径数量时,多通道变时延下变频全双工接收方法不受相位噪声影响。 相似文献
9.
《信息通信》2016,(10)
在无线噪声干扰下通信信号的信噪比较低,难以实现对微弱通信信号的准确捕获,通信信号的检测性能较低,传统方法采用高阶谱检测方法进行噪声干扰下的微弱通信信号捕获,随着噪声干扰强度的增大,检测性能不好。提出一种基于微弱通信信号空间波达信号特征参量估计的无线噪声干扰下微弱通信信号捕获方法。首先进行了无线噪声干扰下微弱通信号的信号模型构建和通信信道分析,设计自适应匹配滤波器进行噪声干扰抑制,对滤波信号进行空间波达信号特征参量估计,实现对无线噪声干扰下微弱通信信号的准确捕获和检测,实现算法改进。仿真结果表明,采用该方法进行无线噪声干扰下微弱通信信号捕获的检测性能较好,对虚警干扰的抑制能力较高,提高对微弱信号的准确检测概率,展示了优越性能。 相似文献
10.
11.
Meihua Shen Wilfred Pau Nicolas Gani Jianping Wen Shashank Deshmukh Thorsten Lill Jian Zhang Hanming Wu Guqing Xing 《半导体技术》2004,29(8)
This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration. 相似文献
12.
White organic light-emitting devices based on fac tris(2- phenylpyridine) iridium sensitized 5,6,11,12-tetraphenylnap -hthacene 总被引:1,自引:0,他引:1
We have fabricated the white organic light-emitting devices (WOLEDs) based on 4,4' -bis(2,2 -diphenyl vinyl)-1,1' - biphenyl (DPVBi) and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene (rubrene). The device structure is ITO/2T-NATA (20 nm)/NPBX (20 nm)/CBP: x%Ir(ppy)3:0.5% rubrene (8 nm)/NPBX (5 nm)/DPVBi (30 nm)/Alq(30 nm)/LiF(0.5 nm)/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris (2-phenylpyridine) iridium [Ir(ppy)3], acts as a yellow light-emitting layer, and N,N' -bis- (1-naphthyl)- N,N' -diphenyl -1, 1' -biphenyl-4,4' -diamine (NPBX) acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir (PPY)3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V. 相似文献
13.
Complete approach to automatic identification and subpixel center location for ellipse feature 总被引:1,自引:0,他引:1
XUE Ting WU Bin SUN Mei YE Sheng-hua 《光电子快报》2008,4(1):51-54
To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction. 相似文献
14.
15.
In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy. 相似文献
16.
High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center. 相似文献
17.
Credence Systems Corporation 《半导体技术》2004,29(9)
Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V. 相似文献
18.
This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors. 相似文献
19.
YUXiao-hua XIANGYu-qun 《半导体技术》2005,30(2):30-32,37
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB. 相似文献
20.
It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer (LDV). 相似文献