SiC MESFET微波功率测试技术

对SiC MESFET的微波测试技术进行了分析,并针对这一采用第三代半导体材料研制的器件,结合硅微波双极功率晶体管和GaAs MESFET的测试技术,建立了SiC MESFET的微波测试系统,完成了2GHz工作频率下瓦级功率输出SiC MESFET的测试,功率增益大于6dB,器件的fT为6.7GHz,fmax达25GHz.     

SiC MESFET微波功率测试技术

对SiC MESFET的微波测试技术进行了分析,并针对这一采用第三代半导体材料研制的器件,结合硅微波双极功率晶体管和GaAs MESFET的测试技术,建立了SiC MESFET的微波测试系统,完成了2GHz工作频率下瓦级功率输出SiC MESFET的测试,功率增益大于6dB,器件的fT为6.7GHz,fmax达25GHz.     

SiC MESFET微波功率测试技术

对SiC MESFET的微波测试技术进行了分析，并针对这一采用第三代半导体材料研制的器件，结合硅微波双极功率晶体管和GaAs MESFET的测试技术，建立了SiC MESFET的微波测试系统，完成了2GHz工作频率下瓦级功率输出SiC MESFET的测试，功率增益大于6dB，器件的fT为6.7GHz, fmax达25GHz.     

微波大功率SiC MESFET及MMIC

利用本实验室生长的4H-SiC外延材料开展了SiC MESFET和MMIC的工艺技术研究.研制的SiC MESFET采用栅场板结构,显示出优异的脉冲功率特性,20 mm栅宽器件在2 GHz脉冲输出功率达100 W.将四个20 mm栅宽的SiC MESFET芯片通过内匹配技术进行功率合成,合成器件的脉冲功率超过320 W,增益8.6 dB.在实现SiC衬底减薄和通孔技术的基础上,设计并研制了国内第一片SiC微波功率MMIC,在2～4 GHz频带内小信号增益大于10 dB,脉冲输出功率最大超过10 W.     

4H-SiC MESFET器件工艺

介绍了制作4H-SiC MESFET器件的关键工艺.通过改进工艺,采用半绝缘衬底的国产SiC三层外延片,制造出总栅宽为1mm,2GHz连续波下输出功率大于4W,小信号增益大于10dB的SiC MESFET.     

4H-SiC MESFET器件工艺

介绍了制作4H-SiC MESFET器件的关键工艺.通过改进工艺,采用半绝缘衬底的国产SiC三层外延片,制造出总栅宽为1mm,2GHz连续波下输出功率大于4W,小信号增益大于10dB的SiC MESFET.     

SiC MESFET微波功率器件的研制

利用本实验室生长的4H-SiC外延材料开展了SiC微波功率器件的研究.通过对欧姆接触和干法刻槽工艺的优化,研制出高性能的SiC MESFET.利用1mm栅宽SiC MESFET制成的微波功率放大器在2GHz 64V工作时,连续波输出功率达4.09W,功率增益为9.3dB,PAE为31.3%.文中还给出了SiC功率放大器在微波大信号工作时的稳定性的初步测试结果.     

体积小重量轻的SiC微波脉冲功率晶体管

采用自主开发的工艺加工技术和设计方法,直接将两个微波SiC MESFET管芯在管壳内部进行并联,实现了器件在S波段脉冲状态下(工作频率2GHz,脉冲宽度30μs,占空比10%)输出功率大于30W、功率增益12dB、功率附加效率大于30%的性能指标。由于直接采用管芯并联结构,省略了内匹配网络,器件的体积和重量较以往的Si微波双极功率晶体管大为降低;采用高温氧化技术克服了传统MESFET工艺中PECVD介质产生较高界面态的不足,减小了器件的泄漏电流,提高了器件性能。器件的研制成功,初步显示了SiC微波脉冲功率器件在体积小、重量轻、增益高、脉冲大功率输出和制作工艺简单等方面的优势。     

8.9W/mm高功率密度SiC MESFET器件研制

基于自主研发的碳化硅(SiC)材料外延技术,优化了材料各层结构及参数,减小了Al记忆效应,最终得到了高质量SiC外延片。采用自主研发成熟的SiC MESFET工艺平台,制作了多凹栅器件结构,优化了凹槽尺寸,采用细栅制作技术完成了栅电极制作,最终得到了不同栅宽的SiC MESFET芯片。突破了大栅宽芯片流片、封装及大功率脉冲测试技术,研制成功了微波功率特性良好的MESFET器件。微波测试结果表明,在2 GHz脉冲条件下,0.25 mm栅宽器件,输出功率密度达到8.96 W/mm,功率附加效率达到30%。单胞20 mm大栅宽器件,3.4 GHz脉冲条件下,功率输出达到94 W,功率附加效率达到22.4%。     

S波段连续波输出功率20W的SiC MESFET

采用自主开发的SiC外延材料和工艺技术,相继实现了S波段连续波状态下输出功率瓦级和10 W的SiC MESFET。经过版图设计的改进和工艺条件的优化,取得了S波段连续波状态下输出功率大于20 W,功率增益大于12 dB,功率附加效率大于30%的SiC MESFET研制结果。器件的功率增益和输出功率较以往的研制结果均得到显著提高,器件的反向截止泄漏电流也大幅度降低。由于器件未采用内匹配结构,其体积也比一般内匹配器件的体积小。研制结果为多胞合成实现更大功率输出的器件创造了条件,也使S波段连续波大功率输出器件的研制水平上了一个新的台阶。     

Silicon carbide high-power devices

In recent years, silicon carbide has received increased attention because of its potential for high-power devices. The unique material properties of SiC, high electric breakdown field, high saturated electron drift velocity, and high thermal conductivity are what give this material its tremendous potential in the power device arena. 4H-SiC Schottky barrier diodes (1400 V) with forward current densities over 700 A/cm² at 2 V have been demonstrated. Packaged SITs have produced 57 W of output power at 500 MHz, SiC UMOSFETs (1200 V) are projected to have 15 times the current density of Si IGBTs (1200 V). Submicron gate length 4H-SiC MESFETs have achieved f_max=32 GHz, f_T=14.0 GHz, and power density=2.8 W/mm @ 1.8 GHz. The performances of a wide variety of SiC devices are compared to that of similar Si and GaAs devices and to theoretically expected results     

Power Performance of AlGaN/GaN HEMTs Grown on SiC by Ammonia-MBE at 4 and 10 GHz

In this letter, we report on the microwave power and efficiency performance of AlGaN/GaN high-electron mobility transistors (HEMTs) grown by ammonia molecular beam epitaxy (ammonia-MBE) on SiC substrates. At 4 GHz, an output power density of 11.1 W/mm with an associated power-added efficiency (PAE) of 63% was measured at V _ds = 48 V on passivated devices. At 10 GHz, an output power density of 11.2 W/mm with a PAE of 58% was achieved for V _ds = 48 V. These results are the highest reported power performance for AlGaN/GaN HEMTs grown by ammonia-MBE and the first reported for ammonia-MBE on SiC substrates.     

Comparison of GaN HEMTs on Diamond and SiC Substrates

The performance of AlGaN/GaN high-electron-mobility transistors (HEMTs) on diamond and SiC substrates is examined. We demonstrate GaN-on-diamond transistors with periphery WG = 250 mum, exhibiting ft = 27.4 GHz and yielding a power density of 2.79 W/mm at 10 GHz. Additionally, the temperature rise in similar devices on diamond and SiC substrates is reported. To the best of our knowledge, these represent the highest frequency of operation and first-reported thermal and X -band power measurements of GaN-on-diamond HEMTs.     

n沟道4H-SiC MESFET研究

报告了4H-SiCMESFET的研制。通过对SiC关键工艺技术进行研究,设计出初步可行的工艺流程,并且制成单栅宽120μmn沟道4H-SiCMESFET,其主要直流特性为在Vds=30V时,最大漏电流密度Idss为56mA/mm,最大跨导Gm为15mS/mm;漏源击穿电压最高达150V;微波特性测试结果在fo=1GHz、Vds=32V时该器件最大输出功率7.05mW,在fo=1.8GHz、Vds=32V时最大输出功率3.1mW。     

Fabrication and characterization of field-plated buried-gate SiC MESFETs

Silicon carbide (SiC) MESFETs were fabricated using a standard SiC MESFET structure with the application of the "buried-channel" and field-plate (FP) techniques in the process. FPs combined with a buried-gate are shown to be favorable concerning output power density and power-added efficiency (PAE), due to higher breakdown voltage and decreased output conductance. A very high power density of 7.8 W/mm was measured on-wafer at 3 GHz for a two-finger 400-/spl mu/m gate periphery SiC MESFET. The PAE for this device was 70% at class AB bias. Two-tone measurements at 3 GHz /spl plusmn/ 100 kHz indicate an optimum FP length for high linearity operation.     

High-power 10-GHz operation of AlGaN HFET's on insulating SiC

We report the first high-power RF characterization of AlGaN HFET's fabricated on electrically insulating SiC substrates. A record total power of 2.3 W at 10 GHz was measured from a 1280-μm wide HFET at V _ds=33 V. An excellent RF power density of 2.8 W/mm was measured on a 320-μm wide HFET. These values are a result of the high thermal conductivity of SiC, relative to the typical substrate, sapphire     

Performance comparison of wide bandgap semiconductor rf power devices

Impressive radio frequency power performance has been demonstrated by three radically different wide bandgap semiconductor power devices, SiC metal semiconductor field effect transistors (MESFETs), SiC static induction transistors (SITs), and AlGaN heterojunction field effect transistors (HFETs). AlGaN HFETs have achieved the highest f_max of 97 GHz. 4H-SiC MESFETs have achieved the highest power densities, 3.3 W/mm at 850 MHz (CW) and at 10 GHz (pulsed). 4H-SiC SITs have achieved the highest output power, 450 W (pulsed) at 600 MHz and 38 W (pulsed) at 3 GHz. Moreover, a one kilowatt, 600 MHz SiC power module containing four multi-cell SITs with a total source periphery of 94.5 cm has been demonstrated.     

High-power-density 4H-SiC RF MOSFETs

The authors have made the first 4H-SiC RF power MOSFETs with cutoff frequency up to 12 GHz, delivering RF power of 1.9 W/mm at 3 GHz. The transistors withstand 200 V drain voltage, are normally off, and show no gate lag, which is often encountered in SiC MESFETs. The measured devices have a single drain finger and a double gate finger, and a total gate width of 0.8 mm. To their knowledge, this is the first time that power densities above 1 W/mm at 3 GHz are reported for SiC MOSFETs.     

Nonlinear characterization of GaN HEMT

DC I-V output, small signal and an extensive large signal characterization (load-pull measurements) of a GaN HEMT on a SiC substrate with different gate widths of 100μm and 1 mm have been carried out. From the small signal data, it has been found that the cutoff frequencies increase with gate width varying from 100μm to 1 mm, owing to the reduced contribution of the parasitic effect. The devices investigated with different gate widths are enough to work in the C band and X band. The large signal measurements include the load-pull measurements and power sweep measurements at the C band (5.5 GHz) and X band (8 GHz). When biasing the gate voltage in class AB and selecting the source impedance, the optimum load impedances seen from the device for output power and PAE were localized in the load-pull map. The results of a power sweep at an 8 GHz biased various drain voltage demonstrate that a GaN HEMT on a SiC substrate has good thermal conductivity and a high breakdown voltage, and the CW power density of 10.16 W/mm was obtained. From the results of the power sweep measurement at 5.5 GHz with different gate widths, the actual scaling rules and heat effect on the large periphery device were analyzed, although the effects are not serious.The measurement results and analyses prove that a GaN HEMT on a SiC substrate is an ideal candidate for high-power amplifier design.