A 0.75‐V, 4‐μW, 15‐ppm/°C, 190 °C temperature range,voltage reference

A low‐voltage, low‐power, low‐area, wide‐temperature‐range CMOS voltage reference is presented. The proposed reference circuit achieves a measured temperature drift of 15 ppm/°C for an extremely wide temperature range of 190 °C (?60 to 130 °C) while consuming only 4 μW at 0.75 V. It performs a high‐order curvature correction of the reference voltage while consisting of only CMOS transistors operating in subthreshold and polysilicon resistors, without utilizing any diodes or external components such as compensating capacitors. A trade‐off of this circuit topology, in its current form, is the high line sensitivity. The design was fabricated using TowerJazz semiconductor's 0.18‐µm standard CMOS technology and occupies an area of 0.039 mm². The proposed reference circuit is suitable for high‐precision, low‐energy‐budget applications, such as mobile systems, wearable electronics, and energy harvesting systems. Copyright © 2015 John Wiley & Sons, Ltd.     

A sub‐1V supply CMOS voltage reference generator

An integrated sub‐1V voltage reference generator, designed in standard 90‐nm CMOS technology, is presented in this paper. The proposed voltage reference circuit consists of a conventional bandgap core based on the use of p‐n‐p substrate vertical bipolar devices and a voltage‐to‐current converter. The former produces a current with a positive temperature coefficient (TC), whereas the latter translates the emitter‐base voltage of the core p‐n‐p bipolar device to a current with a negative TC. The circuit includes two operational amplifiers with a rail‐to‐rail output stage for enabling stable and robust operation overall process and supply voltage variations while it employs a total resistance of less than 600 K Ω. Detailed analysis is presented to demonstrate that the proposed circuit technique enables die area reduction. The presented voltage reference generator exhibits a PSRR of 52.78 dB and a TC of 23.66ppm/^°C in the range of ? 40 and 125^°C at the typical corner case at 1 V. The output reference voltage of 510 mV achieves a total absolute variation of ± 3.3% overall process and supply voltage variations and a total standard deviation, σ, of 4.5 mV, respectively, in the temperature range of ? 36 and 125^°C. Copyright © 2011 John Wiley & Sons, Ltd.     

An ultra‐thin oxide sub‐1 V CMOS bandgap voltage reference

This paper presents a sub‐1 V CMOS bandgap voltage reference that accounts for the presence of direct tunneling‐induced gate current. This current increases exponentially with decreasing oxide thickness and is especially prevalent in traditional (non‐high‐κ/metal gate) ultra‐thin oxide CMOS technologies (t_ox < 3 nm), where it invalidates the simplifying design assumption of infinite gate resistance. The developed reference (average temperature coefficient, T_{C_AVG}, of 22.5 ppm/°C) overcomes direct tunneling by employing circuit techniques that minimize, balance, and cancel its effects. It is compared to a thick‐oxide voltage reference (T_{C_AVG} = 14.0 ppm/°C) as a means of demonstrating that ultra‐thin oxide MOSFETs can achieve performance similar to that of more expensive thick(er) oxide MOSFETs and that they can be used to design the analog component of a mixed‐signal system. The reference was investigated in a 65 nm CMOS technology with a nominal V_DD of 1 V and a physical oxide thickness of 1.25 nm. Copyright © 2013 John Wiley & Sons, Ltd.     

A portable class of 3‐transistor current references with low‐power sub‐0.5 V operation

This work proposes a new class of current references based on only 3 transistors that allows sub‐0.5 V operation. The circuit consists of a 2‐transistor block that generates a proportional‐to‐absolute‐temperature or a complementary‐to‐absolute‐temperature voltage and a load transistor. The idea of a 3T current reference is validated by circuit simulations for different complementary metal‐oxide‐semiconductor technologies and by experimental measurements on a large set of test chips fabricated with a commercial 0.18 μm complementary metal‐oxide‐semiconductor process. As compared to the state‐of‐art competitors, the 3T current reference exhibits competitive performance in terms of temperature coefficient (578 ppm/°C), line sensitivity (3.9%/V), and power consumption (213 nW) and presents a reduction by a factor of 2 to 3 in terms of minimum operating voltage (0.45 V) and an improvement of 1 to 2 orders of magnitude in terms of area occupation (750 μm²). In spite of the extremely reduced silicon area, the fabricated chips exhibit low‐process sensitivity (2.7%). A digital trimming solution to significantly reduce the process sensitivity is also presented and validated by simulations.     

A high‐order curvature‐corrected CMOS bandgap voltage reference with constant current technique

A high‐order curvature‐corrected complementary metal–oxide–semiconductor (CMOS) bandgap voltage reference (BGR), utilizing the temperature‐dependent resistor and constant current technique, is presented. Considering the process variation, a resistor trimming network is introduced in this work. The circuit is implemented in a standard 0.35‐µm CMOS process. The measurement results have confirmed that the proposed BGR operates with a supply voltage of 1.8 V, consuming 45 μW at room temperature (25 °C), and the temperature coefficient of the output voltage reference is about 5.5 ppm/°C from −40 °C to 125 °C. The measured power supply rejection ratio is −38.8 dB at 1 kHz. The BGR is compatible with low‐voltage and low‐power circuit design when the structure of operational amplifiers and all the devices in the proposed bandgap reference are properly designed. Copyright © 2012 John Wiley & Sons, Ltd.     

A low‐voltage band‐gap reference circuit with second‐order analyses

A new band‐gap reference (BGR) circuit employing sub‐threshold current is proposed for low‐voltage operations. By employing the fraction of V_BE and the sub‐threshold current source, the proposed BGR circuit with chip area of 0.029mm² was fabricated in the standard 0.18µm CMOS triple‐well technology. It generates reference voltage of 170 mV with power consumption of 2.4µW at supply voltage of 1 V. The agreement between simulation and measurement shows that the variations of reference voltage are 1.3 mV for temperatures from ?20 to 100^°C, and 1.1 mV per volt for supply voltage from 0.95 to 2.5 V, respectively. Copyright © 2010 John Wiley & Sons, Ltd.     

0.5‐V bulk‐driven differential amplifier

A new 0.5‐V fully differential amplifier is proposed in this article. The structure incorporates a differential bulk‐driven voltage follower with conventional gate‐driven amplification stages. The bulk‐driven voltage follower presents differential gain equal to unity while suppressing the input common‐mode voltage. The amplifier operates at a supply voltage of less than 0.5 V, performing input transconductance almost equal to a gate transconductance and relatively high voltage gain without the need for gain boosting. The circuit was designed and simulated using a standard 0.18‐µm CMOS n‐well process. The low‐frequency gain of the amplifier was 56 dB, the unity gain bandwidth was approximately 3.2 MHz, the spot noise was 100 nV/√Hz at 100 kHz and the current consumption was 90 μΑ. Copyright © 2012 John Wiley & Sons, Ltd.     

1‐V continuous‐time equalizers for multi‐gigabit short‐haul optical fiber communications

Two new CMOS analog continuous‐time equalizers for high‐speed short‐haul optical fiber communications are presented in this paper. The proposed structures compensate the limited bandwidth‐length product of 1‐mm step‐index polymer optical fiber channels (45 MHz, 100 m) and have been designed in a standard 0.18‐µm CMOS process. The equalizers are aimed for multi‐gigabit short‐range applications, targeting up to 2 Gb/s through a 50‐m step‐index polymer optical fiber. The prototypes operate with a single supply voltage of only 1 V and overcome the severe limitations suffered by the widely used degenerated differential pair caused by the low supply voltage. Copyright © 2012 John Wiley & Sons, Ltd.     

A 0.7 V, 2.7 μW, 12.9 ppm/° C over 180° C CMOS subthreshold voltage reference

An all‐CMOS, low‐power, wide‐temperature‐range, curvature‐compensated voltage reference is presented. The proposed topology achieves a measured temperature coefficient of 12.9 ppm/°C for a wide temperature range of 180°C ( − 60 to 120°C) at a bias voltage of 0.7 V while consuming a mere 2.7 μW. The high‐order curvature compensation, which leads to a low‐temperature sensitivity of the reference voltage, is performed using a new, simple, but efficient methodology. The non‐linearities of an N‐type metal‐oxide‐semiconductor (NMOS) device operated in subthreshold are combined with the non‐linearities of two different kinds of polysilicon resistors, leading to the improved performance. The extended temperature range of this voltage reference gives it an important competitive advantage, especially at lower temperatures, where prior art designs' performance deteriorate abruptly. In addition, it utilizes an innovative trimming methodology whereby two trimmable resistors enable the tuning of both the overall slope and non‐linearities of the temperature sensitivity. The design was fabricated using TowerJazz Semiconductor's CMOS 0.18 μm technology, without using diodes or any external components such as compensating capacitors. It has an area of 0.023 mm² and is suitable for high‐performance power‐aware applications as well as applications operating in extreme temperatures. Copyright © 2016 John Wiley & Sons, Ltd.     

0.3‐V bulk‐driven programmable gain amplifier in 0.18‐µm CMOS

A new solution for an ultra low voltage bulk‐driven programmable gain amplifier (PGA) is described in the paper. While implemented in a standard n‐well 0.18‐µm complementary metal–oxide–semiconductor (CMOS) process, the circuit operates from 0.3 V supply, and its voltage gain can be regulated from 0 to 18 dB with 6‐dB steps. At minimum gain, the PGA offers nearly rail‐to‐rail input/output swing and the input referred thermal noise of 2.37 μV/Hz^1/2, which results in a 63‐dB dynamic range (DR). Besides, the total power consumption is 96 nW, the signal bandwidth is 2.95 kHz at 5‐pF load capacitance and the third‐order input intercept point (IIP₃) is 1.62 V. The circuit performance was simulated with LTspice. Copyright © 2016 John Wiley & Sons, Ltd.     

A 0.6‐V sub‐mW X‐band RFSOI CMOS LNA with novel complementary current‐reused technique

A fully integrated 0.6 V low‐noise amplifier (LNA) for X‐band receiver application based on 0.18 μm RFSOI CMOS technology is presented in this paper. To achieve low noise and high gain with the constraint of low voltage and low power consumption, a novel modified complementary current‐reused LNA using forward body bias technique is proposed. A diode connected MOSFET forward bias technique is employed to minimize the body leakage and improve the noise performance. A notch filter isolator is constructed to improve the linearity of low voltage. The measured results show that the proposed LNA achieves a power gain of 11.2 dB and a noise figure of 3.8 dB, while consuming a DC current of only 1.6 mA at supply voltage of 0.6 V. Copyright © 2017 John Wiley & Sons, Ltd.     

0.5‐V bulk‐driven OTA and its applications

A new 0.5‐V bulk‐driven operational transconductance amplifier (OTA), designed in 50 nm CMOS technology, is presented in the paper. The circuit is characterized by improved linearity and dynamic range obtained for MOS devices operating in moderate inversion region. Some basic applications of the OTA such as a voltage integrator and a second‐order low‐pass filter have also been described. The filter is compared to other low‐voltage filters presented in the literature. Copyright © 2013 John Wiley & Sons, Ltd.     

A CCII‐based wide frequency range square waveform generator

In this paper, we propose a novel current‐mode solution suitable for the square waveform generation. The designed oscillator, which utilizes only two positive second‐generation current conveyors as active blocks, six resistors and a capacitor, is based on a current differentiation, instead of voltage integration, typical of developed solutions both in voltage‐mode and in current‐mode approaches, so avoiding circuit limitations due to the node saturation effects. The proposed circuit has been designed, as an integrated solution at transistor level, in a standard CMOS technology, with low‐voltage (± 1V) and low‐power (430µW) characteristics. Simulation results have confirmed the good circuit behaviour, also for working temperature drifts, showing good linearity in a wide oscillation frequency range, which can be independently adjusted through either capacitive (in the range pF ? µF) or resistive (in the range M Ω–G Ω) external passive components. Waiting for the chip fabrication, preliminary measurements have been performed using a laboratory breadboard employing the CCII with AD844 commercial component and sample capacitors and resistors. The experimental results have shown good agreement with both simulations and theoretical expectations. Copyright © 2011 John Wiley & Sons, Ltd.     

±0.18‐V supply voltage gate‐driven PGA with 0.7‐Hz to 2‐kHz constant bandwidth and 0.15‐μW power dissipation

A simple gate‐driven scheme to reduce the minimum supply voltage of AC coupled amplifiers by close to a factor of two is introduced. The inclusion of a floating battery in the feedback loop allows both input terminals of the op‐amp to operate very close to a supply rail. This reduces essentially supply requirements. The scheme is verified experimentally with the example of a PGA that operates with ±0.18‐V supply voltages in 0.18‐μm CMOS technology and a power dissipation of about 0.15 μW. It has a 4‐bit digitally programmable gain and 0.7‐Hz to 2‐kHz true constant bandwidth that is independent on gain with a 25‐pF load capacitor. In addition, simulations of the same circuit in 0.13‐μm CMOS technology show that the proposed scheme allows operation with ±0.08‐V supplies, 7.5‐Hz to 8‐kHz true constant bandwidth with a 25‐pF load capacitor, and a total power dissipation of 0.07 μW.     

Complete delay modeling of sub‐threshold CMOS logic gates for low‐power application

In this paper, the propagation delay of a complementary metal‐oxide semiconductor (CMOS) inverter circuit in sub‐threshold regime has been analyzed thoroughly with respect to variable loads, rise and fall time of input, device dimensions and temperature, without neglecting the significant drain induced barrier lowering (DIBL) and body bias effects. In particular, sub‐threshold slope factor and current strength have been modeled with respect to temperature, which would be efficacious for the analysis of sub‐threshold circuit as temperature plays an important role in propagation delay. Transistor stacking has also been modeled considering variation in threshold voltage, sub‐threshold slope factor and DIBL coefficient owing mainly to fluctuation in doping levels. The CMOS inverter delay model together with transistor stacking model has been incorporated in the analysis of propagation delays of NAND and NOR gates. Extensive simulations have been performed under 45 and 22 nm CMOS technology using simulation program with integrated circuit emphasis (SPICE) to ensure the correctness of the analysis. Simulation shows that this model is applicable for the analysis of digital sub‐threshold circuit in sub‐90 nm technology. Copyright © 2015 John Wiley & Sons, Ltd.     

A 5.25‐V‐tolerant bidirectional I/O circuit in a 28‐nm CMOS process

A 5.25‐V‐tolerant bidirectional I/O circuit has been developed in a 28‐nm standard complementary metal‐oxide‐semiconductor (CMOS) process with only 0.9 and 1.8 V transistors. The transistors of the I/O circuit are protected from over‐voltage stress by cascode transistors whose gate bias level is adaptively controlled according to the voltage level of the I/O pad. The n‐well bias level of the p‐type metal‐oxide‐semiconductor transistors of the I/O circuit is also adapted to the voltage level of the I/O pad to prevent any junction leakage. The 5.25‐V‐tolerant bidirectional I/O circuit occupies 40 µm × 170 µm of silicon area. Copyright © 2014 John Wiley & Sons, Ltd.     

An amplifier‐offset‐insensitive and high PSRR subthreshold CMOS voltage reference

An amplifier‐offset‐insensitive complementary metal‐oxide‐semiconductor (MOS) voltage reference (CVR) circuit with high power supply ripple rejection (PSRR) is presented. Due to the novel structure of employing subthreshold MOS transistors, the proposed CVR circuit can suppress the direct current offset effects of the internal amplifier. Design considerations in optimizing the power and area consumptions and improving the PSRR are presented. The proposed CVR circuit is implemented in a standard 0.18 μm complementary MOS process. Measured results show that the reference can run with down‐to 0.9 V supply voltage, while the power consumption is only 70 nW. The measured PSRR is better than ?37 dB over the full frequency range.     

Design and implementation of sub 0.5‐V OTAs in 0.18‐μm CMOS

A family of bulk‐driven CMOS operational transconductance amplifiers (OTAs) has been designed for extremely low supply voltages (0.3‐0.5 V). Three OTA design schemes with different gain boosting techniques and class AB input/output stages are discussed. A detailed comparison among these schemes has been presented in terms of performance characteristics such as voltage gain, gain‐bandwidth product, slew rate, circuit sensitivity to process/mismatch variations, and silicon area. The design procedures for all the compared structures have been developed. The OTAs have been fabricated in a standard 0.18‐μm n‐well CMOS process from TSMC. Chip test results are in good agreement with theoretical predictions and simulations.     

A 0.5 V bulk‐driven voltage follower/DC level shifter and its application in class AB output stage

A simple realization of a 0.5 V bulk‐driven voltage follower/direct current (DC) level shifter designed in a 0.18 µm CMOS technology is presented in the paper. The circuit is characterized by large input and output voltage swings and a DC voltage gain close to unity. The DC voltage shift between input and output terminals can be regulated in a certain interval around zero, by means of biasing current sinks. An application of the proposed voltage follower circuit for realization of a low‐voltage class AB output stage has also been described in the paper. Finally, the operational amplifier exploiting the proposed output stage has been presented and evaluated in detail. Copyright © 2014 John Wiley & Sons, Ltd.     

A CMOS voltage regulator for passive RFID tag ICs

A low‐power voltage regulator for passive RFID tag ICs is proposed in this paper. It consists of a self‐biased mutually compensated voltage reference, a low dropout (LDO) voltage regulation circuit and a power‐on‐reset (POR) circuit. It is fabricated in a commercial 0.18?µm CMOS technology and applied to a passive UHF RFID tag IC. The total quiescent current is 700 nA under a 1.8‐V supply. The output voltage of the regulator is 1.45 V with load capability of 50 µA. The temperature coefficients of the voltage reference and the output voltage are only 9 and 43 ppm/^°C, respectively. A POR signal with width pulse of 150 ns is generated for the digital part in the tag IC. Copyright © 2010 John Wiley & Sons, Ltd.