共查询到18条相似文献,搜索用时 984 毫秒
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传感器的制作是利用的28μm厚的4层结构的PVDF压电薄膜,传感器表面电极形状的制作采用了剪切加丙酮腐蚀的方法,保证了传感器有一定的非金属化的边缘.对于电极的引出,我们的设计是将传感器上、下电极面引脚错开,引出电极是我们比较容易做到的穿透式,我们用了压接端子压接和空心小铆钉铆接的两种方法. 相似文献
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PVDF压电薄膜制作传感器的理论研究 总被引:10,自引:0,他引:10
赵东升 《计算机测量与控制》2005,13(7):748-750
用PVDF压电薄膜设计传感器是近年来在传感器领域研究的一个新热点,通过对PVDF压电薄膜的压电性能的分析,根据弹性力学的薄板理论和压电效应的物态方程,导出PVDF压电薄膜的传感方程,并对偏转角口的情况进行了讨论;为用PVDF压电薄膜制作传感器提供理论基础。 相似文献
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压电传感器与前置放大器的配接 总被引:3,自引:0,他引:3
从提高传感器和测量电路的灵敏度出发,根据压电传感器压电元件串联和并联2种连接方式,电压放大器和电荷放大器2种前置电路的特点,对压电传感器与前置电路如何配接进行研究。提出了压电元件串联应配接电压放大器,压电元件并联应配接电荷放大器。当压电传感器与测量电路之间的距离较远时,宜采用后一种方式。此方法具有实际的指导意义。 相似文献
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提出了一种利用高压静电纺丝工艺制备PVDF/ZnO及PVDF/Graphene(以下简称GR)共聚物膜的方法并对其压电性能进行了研究。通过在传统的PVDF溶液中混入氧化锌和石墨烯,制备得到PVDF共聚物膜,对PVDF,PVDF/ZnO,PVDF/GR三种膜进行电镜扫描以表征其表面结构。对三种压电薄膜进行了压电响应对比实验,PVDF,PVDF/ZnO,PVDF/GR三种薄膜的压电响应峰值分别达到16.8 V,29.6 V,21.7 V。PVDF/ZnO压电薄膜对比PVDF压电薄膜的电压峰值提高12.8 V。PVDF/GR压电薄膜对比PVDF压电薄膜的电压峰峰值提高了4.9 V。对三种压电薄膜进行了能量收集实验,PVDF,PVDF/ZnO,PVDF/GR三种薄膜分别令LED灯点亮11.3 s,17 s,14.6 s,输出功率密度为6.79μW/cm^2,19.28μW/cm^2,15.11μW/cm^2。PVDF共聚物膜对比PVDF膜在压电性上有显著提高,可应用于压电能量收集或可穿戴传感器等应用领域。 相似文献
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介绍了基于ZnO压电薄膜的微型弯曲板波(FPW)器件的设计与制作。为减小薄膜的应力,器件采用LTO/ZnO/LTO/Si3N4多层复合板结构,并采用直流磁控溅射工艺制备ZnO压电薄膜,在压电复合板结构上沉积两对叉指电极,分别用于Lamb波的激发和接收。X射线衍射分析表明,沉积的ZnO薄膜C轴高度择优;扫描电子显微镜分析表明,制备的ZnO薄膜平整、致密,晶粒生长呈现明显的柱状结构;通过分析制备的高次谐波体声波谐振器(HBAR)器件性能来间接检验ZnO压电薄膜的电学性能,HBAR器件的品质因子较高,表明薄膜有较好的压电性能。利用安捷伦E5071C网络分析仪检测FPW器件的频率响应,结果表明反对称A0模式Lamb波的实测中心频率与理论计算的频率结果基本一致。 相似文献
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PVDF压电薄膜在结构监测中的应用初探 总被引:11,自引:0,他引:11
本研究对采秀PVDF压电薄膜监测结构的基本特性进行了较为系统的研究,分别做了PVDF压电薄膜监测结构的静态和动态响应实验,实验结果表明,PVDF压电薄膜监测结构应变的灵敏度提高,其静态响应的线性度好很好,而其动态响应同则有非线性和迟滞现象,对于用PVDF压电薄膜监测结构的冲击载荷也进行了初步的研究,实验结果表明采用PVDF压电薄膜可以实时监测结构所受的冲击载荷,并能及时反应出结构所受到的冲击损伤。 相似文献
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A “square” binding alignment pattern, with relatively higher energy barrier but four fully aligned orientations at four off-set angles of 0°, 90°, 180°, and 270°, has been analyzed by introducing a concept of the overlap ratio, compared to a “rectangular” one. Both the “square-pattern” micro-chips and the substrate with the “square-pattern” binding sites were fabricated using one-mask micromachining process, and the self-alignment in situ observation under three different off-set orientation angles of 35°, 46°, and 90° was demonstrated using a high-speed video camera. Sequential images reveal a slow translational motion in the early stage followed by a faster rotational alignment. A novel technique has been further proposed for the conductivity evaluation by using three kinds of SAM films, i.e., C12, C18, and Terphenyl. The preliminary measurements indicate that, using the proposed novel structure, the Terphenyl film is believed to be desirable as a conductive SAM film for self-alignment of micro-chips. 相似文献
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乐甫波器件适于液体检测,但在工程上经常因为激发效率较低而影响应用。与“压电基底-非压电薄膜”的单压电结构乐甫波器件相比,双压电结构的特点是薄膜也选用压电材料,以期增大器件整体的压电效应。在建立理论模型的基础上,通过空气中和液体检测时双压电结构乐甫波与声表面波、单压电结构乐甫波的机电耦合系数仿真并对比,表明对于某些压电基底和薄膜,双压电结构具有更高的乐甫波激发效率。并且,以液体介电常数检测为例,仿真结果还表明了双压电结构乐甫波比单压电结构具有更高的灵敏度。 相似文献
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Bulk PZT thick film actuator integrated with displacement sensor, the so-called self-sensing actuator, is presented in this paper. The PZT film is used as not only an actuating layer but also a displacement sensor, which is achieved by dividing the electrode on the top surface of the PZT film into two parts: central top electrode for actuating and outer annular sensor electrode for piezoelectric displacement detection. When the actuator moves, the piezoelectric charge is induced in the outer annular PZT due to the piezoelectric effect. The total amount of accumulated charge is proportional to the stress acting on the PZT, which is in turn proportional to the actuator displacement. By collecting the piezoelectric charge, the actuator displacement can be detected. A theoretical model is proposed to determine the structure parameters of the sensor and predict the sensor sensitivity. Experiments were performed on the micro-fabricated sensor integrated PZT thick film actuator, and the measured piezoelectric charge is close to the theoretical predictions. The integrated piezoelectric sensor has a displacement sensitivity of approximately 4 pC/nm. In addition, the integration of displacement sensor into the actuator needs no additional fabrication process and has no influence on the actuator performances. 相似文献
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This paper deals with the modeling aspects of the stress singularity at the interface edges between piezoelectric thin film and elastic substrate. The electro-elastic problem of a transversely isotropic piezoelectric thin film attached to an elastic substrate is treated theoretically. Emphasis is placed on the investigation of the singularity in the stress field at the free edge of interface. The eigen-equation determining the order of the singularity is derived. Numerical results for two edge geometries are presented for PZT film/silicon substrate combinations. It is shown that the orders of the stress singularities range from 0.1 to 0.3 for the considered cases. Moreover, piezoelectric effects may alter the singularity order to some extent, but not significantly. 相似文献