基于UML时序图的集成测试序列自动生成

该文研究了基于UML时序图的集成测试序列自动生成方法。该方法分析了时序图的语义信息并添加语义约束规约生成可测试模型,从中提取相关信息生成有限状态机;然后使用Wp方法构造测试序列;最后使用中国邮递员算法对Wp方法进行改进生成最优测试序列。该方法生成的测试序列长度相对较短,并能充分满足测试用例覆盖需求。     

基于同步有向图的同步测试序列生成方法

使用多测试单元的测试系统可以对多端口协议实现进行一致性测试，但是在进行这种一致性测试时，测试系统各个端口之间可能会出现同步问题，现在，解决同步问题常用的办法是在测试单元相应端口之间增加同步连接，然后通过此同步连接相互发送同步消息来进行同步，多端口协议和其它类型的分布式系统可以用有限状态机模型来描述，目前，同步问题被分为双端口同步问题，多端口同步问题，紧同步问题等多种类型，该文考虑两种有限状态机测试问题，第一种是面向端口的测试，不考虑有限状态机测试单元之间的通信问题，第二种面向组的测试，有限状态机中的各个端口被分成互不相关的多个组，属于不同组中的测试单元之间互不通信，该文提出了一种基于同步有向图的同步测试序列生成方法，这种生成方法适用于Pair同步，Port同步和组同步问题，并且，这种方法也可以用来判断如何在非同步测试序列中增加同步通信，将非同步测试序列转化为同步测试序列。     

基于扩展有限状态机测试中测试输入数据自动选取的研究

扩展有限状态机(EFSM)模型是有限状态机(FSM)模型的一个扩展，它在FSM模型的基础上增加了变量、操作以及状态迁移的前置条件，通过EFSM我们可以更加精确地刻画软件系统的动态行为．基于EFSM的测试可以应用到许多领域，因此具有重要的研究价值和实际意义．许多研究人员已经提出了基于FSM测试的测试输入序列的构造方法，但基于EFSM的测试与FSM相比由于变量和状态迁移的前置条件的引入，增加了构造其测试输入的复杂性．我们认为基于EFSM测试的测试输入应该包含两个部分：即测试输入序列以及该输入序列上包含的输入变量的确定值(测试输入数据)．手工选取这些测试数据的工作十分繁琐，极大地增加了测试的花费，因此自动选取这些测试数据可以大大提高实际测试工作的效率．该文提出一种基于EFSM测试的测试数据自动选取方法，该方法利用两个关键的步骤：①区间削减和②分段梯度最优下降算法来自动选取测试数据．实验表明利用该方法可以自动选取大部分的测试数据，并且收敛速度较快；在某些无法得到确定解的情况下，区间削减也可以为测试人员提供一个较小的输入变量取值区间，方便了测试人员从中手工选择测试数据．     

基于通信多端口有限状态机的协议互操作性测试生成研究

协议测试是一种保证网络通信协议实现质量的重要技术，互操作性测试是一类常用的协议测试技术．文章提出了一种基于通信多端口有限状态机模型的协议互操作忡测试生成方法．首先采用已有的基于可达性分析的方法生成集中式测试序列；然后采用单一错误模型对其进行系统的错误覆盖分析，为达到更高的错误覆盖度，进一步提出一种增强的测试生成算法；最后讨论了互操作性测试巾的控制观察问题，选择适当的分布式测试架构，并进而生成分布式同步测试序列．实验结果表明：与原有方法相比，该方法可以有效地提高测试集的错误覆盖，并具备一定的可行性和有效性．     

基于CFSM的一致性测试序列生成方法

本文采用通信有限状态机模型描述通信协议,基于通信有限状态机模型提出了协议一致性测试的测试序列生成方法,解决了构件化协议的测试序列生成的问题。本文实现了测试序列的生成算法,通过实例说明了采用测试序列生成算法生成了比传统算法更少的测试序列。同时本算法还可以用于多层协议测试。     

基于CFSM的一致性测试序列生成方法

本文采用通信有限状态机模型描述通信协议,基于通信有限状态机模型提出了协议一致性测试的测试序列生成方法,解决了构件化协议的测试序列生成的问题。本文实现了测试序列的生成算法,通过实例说明了采用测试序列生成算法生成了比传统算法更少的测试序列。同时本算法还可以用于多层协议测试。     

多单元协议一致性测试中的同步序列的生成

有限状态机模型一般被用来描述通信协议和其它各类的分布式系统,对于一个多端口的有限状态机,需要多个测试单元进行测试,使用一个包括K个（K≥2）测试单元的测试系统可以检查一个多单元通信协议软件的收发行为是否与协议规格一致,在测试过程中,K个测试单元之间可能会出珊步问题,目前,主要是通过增加外部同步操作来解决同步问题,提出了一种新的同步测试序列生成模型－－同步有向图,它可以判断一个给定的协议规格是否可以在不需要外部同步操作的情况下,产生同步测试序列;如果可以产生,则此生成中以将非同步测试相应的同步测试序列;另外此生成模型还可以用来选择为测试系统增加外部同步通道的方法。     

基于UIO的协议一致性测试序列生成方法研究

测试序列的生成是协议一致性测试中重要的研究领域,怎样使生成的测试序列既具有较强的检错能力又具有较广的差错覆盖范围成为许多科研人员研究的重点。文章在介绍了有限状态机族型和唯一输入／输出序列后,对基于UIO的测试序列生成方法进行了分析,然后对该方法进行了优化研究。使用优化后的算法可以缩短测试序列的长度,提高了测试效率和差错...     

BGP-4协议一致性测试序列生成

该文讨论了一种协议测试序列生成的方法,它使用有限状态机模型作为协议的形式化描述规范,然后基于UIO序列和中国乡村邮路算法生成测试序列。该文将其应用于对BGP-4协议的一致性测试中。这种方法以协议的形式化描述为输入,易于自动化实现,同时生成的测试序列较短,提高了测试效率。     

基于有限状态机的健壮性测试研究

健壮性测试对软件尤其是安全产品有极其重要的意义,本文使用有限状态机来对软件产品进行建模,通过状态扩充和状态对各种异常事件的响应,构建完备的增强有限状态机,使用该模型可以进行健壮性测试。我们利用该方法对GlobalPlatform卡规范中安全通信的安全通道协议SCP02进行了测试。测试结果表明,该方法产生的测试案例包比GP组织认可的测试包具有更高的覆盖性和错误检测能力,该方法产生的案例不仅可以用于健壮性测试,也可以用于功能性和符合性测试。     

Test selection based on communicating nondeterministic finite-statemachines using a generalized Wp-method

Presents a method of generating test sequences for concurrent programs and communication protocols that are modeled as communicating nondeterministic finite-state machines (CNFSMs). A conformance relation, called trace-equivalence, is defined within this model, serving as a guide to test generation. A test generation method for a single nondeterministic finite-state machine (NFSM) is developed, which is an improved and generalized version of the Wp-method that generates test sequences only for deterministic finite-state machines. It is applicable to both nondeterministic and deterministic finite-state machines. When applied to deterministic finite-state machines, it yields usually smaller test suites with full fault coverage than the existing methods that also provide full fault coverage, provided that the number of states in implementation NFSMs are bounded by a known integer. For a system of CNFSMs, the test sequences are generated in the following manner: a system of CNFSMs is first reduced into a single NFSM by reachability analysis; then the test sequences are generated from the resulting NFSM using the generalized Wp-method     

UML statecharts的测试用例生成方法

测试用例生成是软件测试的关键。根据UML statecharts的层次和并发结构,研究相应的测试用例产生方法。它视复合状态为抽象状态,分别构造主UML statecharts和复合状态所对应的子UML statecharts的测试基,并依据一定的合成规则和Wp－方法生成整个UML statecharts的测试用例。这种方法能够支持递增式测试用例的生成。理论和实验结果说明,如果满足测试条件,它们保证全故障覆盖,且产生较好的测试用例。这种改进对大型复杂系统尤其有效,也便于构造自动测试工具。     

Mutation-oriented test data augmentation for GUI software fault localization

ContextFault localization lies at the heart of program debugging and often proceeds by contrasting the statistics of program constructs executed by passing and failing test cases. A vital issue here is how to obtain these “suitable” test cases. Techniques presented in the literature mostly assume the existence of a large test suite a priori. However, developers often encounter situations where a failure occurs, but where no or no appropriate test suite is available for use to localize the fault.ObjectiveThis paper aims to alleviate this key limitation of traditional fault localization techniques for GUI software particularly, namely, it aims at enabling cost-effective fault localization process for GUI software in the described scenario.MethodTo address this scenario, we propose a mutation-oriented test data augmentation technique, which actually is directed by the “similarity” criterion in GUI software’s test case context towards the generation of test suite with excellent fault localization capabilities. More specifically, the technique mainly uses four proposed novel mutation operators to iteratively mutate some failing GUI test cases’ event sequences to derive new test cases potentially useful to localize the specific encountered fault. We then compare the fault localization performance of the test suite generated using this technique with that of an original provided large event-pair adequate test suite on some GUI applications.ResultsThe results indicate that the proposed technique is capable of generating a test suite that has comparable, if not better, fault localization effectiveness to the event-pair adequate test suite, but it is much smaller and it is generated immediately once a failure is encountered by developers.ConclusionIt is concluded that the proposed technique can truly enable quick-start cost-effective fault localization process under the investigated all-too-common scenario, greatly alleviating one key limitation of traditional fault localization techniques and prompting the test–diagnose–repair cycle.     

软件多缺陷定位方法研究综述

软件多缺陷定位(Multiple Fault Localization,简称MFL)尝试在含有多个缺陷的软件程序中自动标识出这些缺陷所在的位置.传统的缺陷定位研究一般假设被测软件内仅含有一个缺陷,而实际情况下软件内往往包含多个缺陷,因此MFL问题更加贴近实际场景.当程序中存在多个缺陷时,由于缺陷数量难以准确估计,同时缺...     

Deriving Test Suites with the Guaranteed Fault Coverage for Extended Finite State Machines

Extended finite state machines (EFSMs) are widely used when deriving tests for checking the functional requirements for software implementations. However, the fault coverage of EFSMbased tests covering appropriate paths, variables, etc., remains rather obscure. Furthermore, these tests are known be incapable of detecting many functional faults frequently occurring in EFSM-based implementations. In this paper, an approach is proposed for deriving complete tests with the help of a proper Java EFSM implementation. Since the software is based on a template, the faults turn directly into EFSM faults. The method proposed here makes it possible to derive test suites that can detect functional faults. In the first step, the EFSM-based test suite derived by a well-known method is checked for completeness with respect to the faults generated by the μJava tool. Then, each undetected fault is easily mapped into an EFSM mutant. In the next step, some FSM abstraction is used to derive a distinguishing sequence for two finite-state machines (if such a sequence exists), which is added to the current test suite. The test derived in this way is complete with respect to the faults generated by μJava. If the corresponding FSM derived by EFSM modeling is too complex or no such FSM can be derived, the resulting test suite can be incomplete. However, the experiments performed by us clearly show that the original test suite extended by distinguishing sequences can detect many functional faults in software implementations when the given EFSM is used as a specification for the system.     

A cost effective fault-tolerant scheme for RAIDs

The rapid progress in mass storage technology has made it possible for designers to implement large data storage systems for a variety of applications.One of the efficient ways to build large storage systems is to use RAIDs only when one error occurs .But in large RAIDs systems ,the fault probability will increase when the number of disks increases ,and the use of disks with big storage capacity will cause the recovering time to prolong,thus the probability of the second disk‘‘‘‘‘‘‘‘s fault will incerease Therefore,it is necessary to develop methods to recover data when two or more errors have occurred In this paper,a fault tolerant scheme is proposed based on extended Reed-Solomon code,a recovery procedure is designed to correct up to two errors which is implemented by software and hardware together,and the scheme is verified by computer simulation,In this scheme,only two redundant disks are used to recover up to two disks‘‘‘‘‘‘‘‘ fault .The encoding and decoding methods,and the implementation based on software and hardware are described.The application of the scheme in software RAIDs that are builit in cluster computers are also described .Compared with the existing methods such as EVENODD and DH ,the proposed scheme has distinct improvement in implementation and redundancy.     

基于LASAR软件仿真的板级自动测试研究

随着仪器与系统硬件的不断完善以及新的仪器设计思想的发展,软件的重要性变得越来越突出;针对电路板故障诊断的要求,采用先进仿真软件与系统硬件结合的技术,介绍了一种基于LASAR仿真软件的板级自动测试方法,分析了先进的LASAR仿真软件,研究了应用该软件开发测试程序的流程,结合系统硬件完成了对包含复杂可编程逻辑器件(PLDs)电路板的动态自动测试;经验证,该方法能够实现复杂电路板的引脚级故障诊断,有效降低了电路板的维修测试费用,缩短了维修周期;基于LASAR仿真软件开发的程序有较好的可移植性,因而具有广泛的应用价值。     

Predicting fault incidence using software change history

This paper is an attempt to understand the processes by which software ages. We define code to be aged or decayed if its structure makes it unnecessarily difficult to understand or change and we measure the extent of decay by counting the number of faults in code in a period of time. Using change management data from a very large, long-lived software system, we explore the extent to which measurements from the change history are successful in predicting the distribution over modules of these incidences of faults. In general, process measures based on the change history are more useful in predicting fault rates than product metrics of the code: For instance, the number of times code has been changed is a better indication of how many faults it will contain than is its length. We also compare the fault rates of code of various ages, finding that if a module is, on the average, a year older than an otherwise similar module, the older module will have roughly a third fewer faults. Our most successful model measures the fault potential of a module as the sum of contributions from all of the times the module has been changed, with large, recent changes receiving the most weight     

An efficient algorithm for calculating Boolean difference

In this paper we have proposed a method of computing Boolean difference by means of transition operators. This method considerably simplifies the computational complexity. Particularly, when the method is used in the test generation of digital circuits, the Boolean difference can be calculated iteratively from the outputs of gates to their inputs level by level, no matter whether there are reconvergent fanout lines or not. When there are m different paths from a given fault line to the primary output of the circuit, using traditional Boolean difference methods, the result formula will contain 2 ^m ?1 product terms, whereas using the method presented in this paper, the result formula will contain onlym product terms. On the other hand, the m product terms are connected by “OR” operators, therefore it is very convenient to generate partial test patterns. We also introduce a method in which partial test patterns along a given path can be generated. The method discussed in this paper have been used in the test generation of the PCBs of several computers and the results were quite satisfactory.