Comparisons of Shewhart-type rank based control charts for monitoring location parameters of univariate processes

The nonparametric (distribution-free) control charts are robust alternatives to the conventional parametric control charts when the form of underlying process distribution is unknown or complicated. In this paper, we consider two new nonparametric control charts based on the Hogg–Fisher–Randle (HFR) statistic and the Savage rank statistic. These are popular statistics for testing location shifts, especially in right-skewed densities. Nevertheless, the control charts based on these statistics are not studied in quality control literature. In the current context, we study phase-II Shewhart-type charts based on the HFR and Savage statistics. We compare these charts with the Wilcoxon rank-sum chart in terms of false alarm rate, out-of-control average run-length and other run length properties. Implementation procedures and some illustrations of these charts are also provided. Numerical results based on Monte Carlo analysis show that the new charts are superior to the Wilcoxon rank-sum chart for a class of non-normal distributions in detecting location shift. New charts also provide better control over false alarm when reference sample size is small.     

An Efficient Nonparametric EWMA Wilcoxon Signed‐Rank Chart for Monitoring Location

The statistical performance of traditional control charts for monitoring the process shifts is doubtful if the underlying process will not follow a normal distribution. So, in this situation, the use of a nonparametric control charts is considered to be an efficient alternative. In this paper, a nonparametric exponentially weighted moving average (EWMA) control chart is developed based on Wilcoxon signed‐rank statistic using ranked set sampling. The average run length and some other associated characteristics were used as the performance evaluation of the proposed chart. A major advantage of the proposed nonparametric EWMA signed‐rank chart is the robustness of its in‐control run length distribution. Moreover, it has been observed that the proposed version of the EWMA signed‐rank chart using ranked set sampling shows better detection ability than some of the competing counterparts including EWMA sign chart, EWMA signed‐rank chart, and the usual EWMA control chart using simple random sampling scheme. An illustrative example is also provided for practical consideration. Copyright © 2016 John Wiley & Sons, Ltd.     

A distribution-free CUSUM chart for joint monitoring of location and scale based on the combination of Wilcoxon and Mood statistics

We propose a distribution-free cumulative sum (CUSUM) chart for joint monitoring of location and scale based on a Lepage-type statistic that combines the Wilcoxon rank sum and the Mood statistics. Monte Carlo simulations were used to obtain control limits and examine the in-control and out-of-control performance of the new chart. A direct comparison of the new chart was made with the original CUSUM Lepage based on Wilcoxon rank sum and Ansari-Bradley statistics. The result is a more powerful chart in most of the considered scenarios and thus a more useful CUSUM chart. An example using real data illustrates how the proposed control chart can be implemented.     

Optimal one- and two-sided adaptive EWMA scheme for monitoring Poisson count data

The Poisson distribution assumption often arises in several industrial applications for modeling defects or nonconformities. In this work, we investigate the one- and two-sided performance of a new adaptive EWMA (exponentially weighted moving average)-type chart for monitoring Poisson count data. An appropriate discrete-state Markov chain technique is provided to compute the exact ARL (average run length) properties. Moreover, comparative studies are conducted to demonstrate the higher sensitivity of the proposed chart in the detection of shifts with various magnitudes. Advices on how to select the appropriate chart parameters are provided and an illustrative numerical example is proposed.     

A nonparametric CUSUM chart for process dispersion

In the present article, we propose a nonparametric cumulative sum control chart for process dispersion based on the sign statistic using in‐control deciles. The chart can be viewed as modified control chart due to Amin et al, 6 which is based on in‐control quartiles. An average run length performance of the proposed chart is studied using Markov chain approach. An effect of non‐normality on cumulative sum S² chart is studied. The study reveals that the proposed cumulative sum control chart is a better alternative to parametric cumulative sum S² chart, when the process distribution is non‐normal. We provide an illustration of the proposed cumulative sum control chart.     

Optimal design of a distribution-free quality control scheme for cost-efficient monitoring of unknown location

Traditionally, a cost-efficient control chart for monitoring product quality characteristic is designed using prior knowledge regarding the process distribution. In practice, however, the functional form of the underlying process distribution is rarely known a priori. Therefore, the nonparametric (distribution-free) charts have gained more attention in the recent years. These nonparametric schemes are statistically designed either with a fixed in-control average run length or a fixed false alarm rate. Robust and cost-efficient designs of nonparametric control charts especially when the true process location parameter is unknown are not adequately addressed in literature. For this purpose, we develop an economically designed nonparametric control chart for monitoring unknown location parameter. This work is based on the Wilcoxon rank sum (hereafter WRS) statistic. Some exact and approximate procedures for evaluation of the optimal design parameters are extensively discussed. Simulation results show that overall performance of the exact procedure based on bootstrapping is highly encouraging and robust for various continuous distributions. An approximate and simplified procedure may be used in some situations. We offer some illustration and concluding remarks.     

Nonparametric signed‐rank control charts with variable sampling intervals

Variable sampling interval (VSI) charts have been proposed in the literature for normal theory (parametric) control charts and are known to provide performance enhancements. In the VSI setting, the time between monitored samples is allowed to vary depending on what is observed in the current sample. Nonparametric (distribution‐free) control charts have recently come to play an important role in statistical process control and monitoring. In this paper a nonparametric Shewhart‐type VSI control chart is considered for detecting changes in a specified location parameter. The proposed chart is based on the Wilcoxon signed‐rank statistic and is called the VSI signed‐rank chart. The VSI signed‐rank chart is compared with an existing fixed sampling interval signed‐rank chart, the parametric VSI ‐chart, and the nonparametric VSI sign chart. Results show that the VSI signed‐rank chart often performs favourably and should be used.     

Design of control charts with m‐of‐m runs rules

This paper investigates economic–statistical properties of the X? charts supplemented with m‐of‐m runs rules. An out‐of‐control condition for the chart is either a point beyond a control limit or a run of m‐of‐m successive points beyond a warning limit. The sampling process is modeled by a Markov chain with 2m states. The steady‐state probability for each state and the average run length (ARL) from each state of the Markov chain are derived in explicit formulas. Then the stationary average run length (SALR) is derived so as to develop an economic–statistical model. Using this model, the design parameters are optimized by minimizing the cost function with constraints on the average time to signal (ATS). The X? chart supplemented with m‐of‐m runs rules is compared with the Shewhart X? chart in terms of the SARL and the cost function. Sensitivity of the design parameters with respect to the cost function is also analyzed. General guidelines for implementing the X? chart with m‐of‐m runs rules are presented from those observations. It should be emphasized that supplementing run rules may provide feasible and efficient solutions even if the sample size is limited, while the Shewhart X? chart may not. Copyright © 2009 John Wiley & Sons, Ltd.     

A Bivariate Semiparametric Control Chart Based on Order Statistics

In this article, a new bivariate semiparametric Shewhart‐type control chart is presented. The proposed chart is based on the bivariate statistic (X_(r), Y_(s)), where X_(r) and Y_(s) are the order statistics of the respective X and Y test samples. It is created by considering a straightforward generalization of the well‐known univariate median control chart and can be easily applied because it calls for the computation of two single order statistics. The false alarm rate and the in‐control run length are not affected by the marginal distributions of the monitored characteristics. However, its performance is typically affected by the dependence structure of the bivariate observations under study; therefore, the suggested chart may be characterized as a semiparametric control chart. An explicit expression for the operating characteristic function of the new control chart is obtained. Moreover, exact formulae are provided for the calculation of the alarm rate given that the characteristics under study follow specific bivariate distributions. In addition, tables and graphs are given for the implementation of the chart for some typical average run length values and false alarm rates. The performance of the suggested chart is compared with that of the traditional χ² chart as well as to the nonparametric SN² and SR² charts that are based on the multivariate form of the sign test and the Wilcoxon signed‐rank test, respectively. Finally, in order to demonstrate the applicability of our chart, a case study regarding a real‐world problem related to winery production is presented. Copyright © 2016 John Wiley & Sons, Ltd.     

Control Charts with Variable Dimension for Linear Combination of Poisson Variables

This article analyzes the simultaneous control of several correlated Poisson variables by using the Variable Dimension Linear Combination of Poisson Variables (VDLCP) control chart, which is a variable dimension version of the LCP chart. This control chart uses as test statistic, the linear combination of correlated Poisson variables in an adaptive way, i.e. it monitors either p₁ or p variables (p₁ < p) depending on the last statistic value. To analyze the performance of this chart, we have developed software that finds the best parameters, optimizing the out‐of‐control average run length (ARL) for a shift that the practitioner wishes to detect as quickly as possible, restricted to a fixed value for in‐control ARL. Markov chains and genetic algorithms were used in developing this software. The results show performance improvement compared to the LCP chart. Copyright © 2015 John Wiley & Sons, Ltd.     

A moving average S control chart for monitoring process variability

An efficient alternative to the S control chart for detecting shifts of small magnitude in the process variability using a moving average based on the sample standard deviation s statistic is proposed. Control limit factors are derived for the chart for different values of sample size and span w. The performance of the moving average S chart is compared to the S chart in terms of average run length. The result shows that the performance of moving average S chart for varying values of w outweigh those of the S chart for small and moderate shifts in process variability.     

The Negative Binomial Exponentially Weighted Moving Average Chart with Estimated Control Limits

The control chart based on the compound Poisson distribution (the negative binomial exponentially weighted moving average (EWMA) chart) has been shown to be more effective than the c‐chart to monitor the wafer nonconformities in semiconductor production process. The performance of the negative binomial EWMA chart is generally evaluated with the assumption that the process parameters are known. However, in many control chart applications, the process parameters are usually unknown and are required to be estimated. For an accurate parameter estimate, a very large sample size may be required, which is seldom available in the applications. This article investigates the effect of parameter estimation on the run length properties of the negative binomial EWMA charts. Using a Markov chain approach, we show that the performance of the negative binomial EWMA chart is affected when parameters are estimated compared with the known‐parameter case. We also provide recommendations regarding phase I sample sizes, smoothing constant and clustering parameter. The sample size must be quite large for the in‐control chart performance to be close to that for the known‐parameter case. Finally, a wafer process example has been used to highlight the practical implications of estimation error and to offer advice to practitioners when constructing/analysing a phase I sample. Copyright © 2013 John Wiley & Sons, Ltd.     

A Distribution‐free Control Chart for the Joint Monitoring of Location and Scale

Traditional statistical process control for variables data often involves the use of a separate mean and a standard deviation chart. Several proposals have been published recently, where a single (combination) chart that is simpler and may have performance advantages, is used. The assumption of normality is crucial for the validity of these charts. In this article, a single distribution‐free Shewhart‐type chart is proposed for monitoring the location and the scale parameters of a continuous distribution when both of these parameters are unknown. The plotting statistic combines two popular nonparametric test statistics: the Wilcoxon rank sum test for location and the Ansari–Bradley test for scale. Being nonparametric, all in‐control properties of the proposed chart remain the same and known for all continuous distributions. Control limits are tabulated for implementation in practice. The in‐control and the out‐of‐control performance properties of the chart are investigated in simulation studies in terms of the mean, the standard deviation, the median, and some percentiles of the run length distribution. The influence of the reference sample size is examined. A numerical example is given for illustration. Summary and conclusions are offered. Copyright © 2011 John Wiley & Sons, Ltd.     

A side-sensitive synthetic coefficient of variation chart

Control charts for monitoring the coefficient of variation (γ) are useful for processes with an inconsistent mean (μ) and a standard deviation (σ) which changes with μ, by monitoring the consistency in the ratio σ over μ. The synthetic-γ chart is one of the charts proposed to monitor γ, and its attractiveness lie in waiting until a second point to fall outside the control limits before a decision is made. However, existing synthetic-γ charts do not differentiate between the points falling outside the upper control limit (UCL) and lower control limit (LCL). Hence, this paper proposes a side-sensitive synthetic-γ chart, where successive nonconforming samples must either fall above the UCL or below the LCL. Formulae to compute the average run length (ARL), the standard deviation of the run length (SDRL) and expected average run length (EARL) are derived using the Markov chain approach, and the algorithms to obtain the optimal charting parameters are proposed. Subsequently, the optimal charting parameters, ARL, SDRL and EARL values for various numerical examples are shown. Comparisons show that the side-sensitive synthetic-γ chart consistently outperforms the existing synthetic-γ chart, especially for small shifts. The proposed chart also consistently outperforms the Shewhart-γ chart, while showing comparable or better performance than the Exponentially Weighted Moving Average (EWMA) chart for most shift sizes, except for very small shifts. Finally, this paper shows the implementation of the proposed chart on an industrial example.     

A EWMA Control Chart for Exponential Distributed Quality Based on Moving Average Statistics

We propose an exponentially weighted moving average (EWMA) control chart for monitoring exponential distributed quality characteristics. The proposed control chart first transforms the sample data to approximate normal variables, then calculates the moving average (MA) statistic for each subgroup, and finally constructs the EWMA statistic based on the current and the previous MA statistics. The upper and the lower control limits are derived using the mean and the variance of EWMA statistics. The in‐control and the out‐of‐control average run lengths are derived and tabularized according to process shift parameters and smoothing constants. It is shown that the proposed control chart outperforms the MA control chart for all shift parameters. Copyright © 2015 John Wiley & Sons, Ltd.     

The effectiveness of Max-half-Mchart over Max-Mchart in simultaneously monitoring process mean and variability of individual observations

Control charts are widely used in industrial environments for the simultaneous or separate monitoring of the process mean and process variability. The Max-Mchart is a multivariate Shewhart-type simultaneous control chart that is used when monitoring subgroups. While this sampling design allows the computation of the generalized variance (GV) used to calculate the process variability, a GV chart cannot be plotted for individual observations. Hence, we cannot compute the single statistic in the Max-Mchart. This study aims to overcome the aforementioned issue. To this end, first, we develop a new Max-Mchart for individual observations by utilizing the statistic in the dispersion control chart. Second, instead of the standard normal distribution, we propose a new transformation using a half-normal distribution to calculate the statistic for the process mean and process variability. Thus, the proposed chart is called the Max-Half-Mchart, whose control limit is calculated using the bootstrap approach. An evaluation based on the average run length values shows the robustness of the Max-Half-Mchart for the simultaneous monitoring of the process mean and process variability. The single statistic in the Max-Half-Mchart is more consistent with the statistic in Hotelling's T² and the dispersion chart than that of the Max-Mchart.     

A moving average control chart using a robust scale estimator for process dispersion

Control charts are one of the most powerful tools used to detect and control industrial process deviations in statistical process control. In this paper, a moving average control chart based on a robust scale estimator of standard deviation, namely, the sample median absolute deviation (MAD) statistic, for monitoring process dispersion, is proposed. A simulation study is conducted to evaluate the performance of the proposed moving average median absolute deviation (MA‐MAD) chart, in terms of average run length for various distributions. The results show that the moving average MAD chart performs well in detecting small and moderate shifts in process dispersion, especially when the normality assumption is violated. In addition, this chart is very efficient, especially when the quality characteristic follows a skewed distribution. Numerical and simulated examples are given at the end of the paper.     

Practitioner advice: ERLDAT–A web-based tool to design and analyze EWMA control charts

The performance of a control chart is completely characterized by its run length distribution. Quality practitioners usually do not have access to the run length distribution but rely on the average run length (ARL) to design and evaluate the performance of an exponentially weighted moving average (EWMA) control chart. This article presents a web-based tool that provides users easy access to the Phase 2 (online or monitoring phase) run length distribution for a two-sided EWMA control chart with known parameters. The web-based tool calculates the run length distribution, percentiles of the run length distribution, as well as the mean (ARL) and variance (VRL) of the run length distribution. Additional functionality of the web-based tool includes plotting the run length distribution functions, building tables of the quantiles of the run length distribution, finding the smoothing parameter (λ) for an EWMA control chart for fixed control limit that satisfies ARL, VRL or percentile performance, and finding the control chart limit (k) for an EWMA control chart that satisfies ARL, VRL, or percentile performance. This tool and these techniques enable quality practitioners to better design and evaluate EWMA control charts.     

Design of a Control Chart Using a Modified EWMA Statistic

In this paper, the design of a control chart is given using a modified exponentially weighted moving average statistic under the assumption that the quality characteristic of interest follows the normal distribution. The structure of the proposed control chart is developed, and the necessary measures are derived to find the average run length for in‐control and out‐of‐control processes. The efficiency of the proposed chart is compared with two existing control charts in terms of the average run length. The results are explained with the help of industrial example. Copyright © 2016 John Wiley & Sons, Ltd.     

Delay in Statistical Control of Systems with Wear

The target of statistical process control is to identify changes in the behavior of controlled process as quickly as possible. Therefore, as a quality measure of control charts, we use characteristics which quantify the delay between the occurrence of change and its identification by the control chart. The average run length is a commonly used characteristic which does not reflect a real situation. A new characteristic is suggested which is computed in the case of progressive wearing out of the system. We assume several types of progression. The Markov chain approach is used for computation of average delay. Copyright © 2011 John Wiley & Sons, Ltd.