基于NTN技术的宽带取样示波器带宽不确定度的研究

NTN技术是一种校准宽带取样示波器的新方法,其提供的测量量是kick-out脉冲响应(显示)波形数据,而宽带取样示波器的带宽是对kick-out脉冲响应波形数据进行反卷积分离等处理获得的导出量.提出了一种基于NTN技术的宽带取样示波器带宽不确定度的评定方法.首先分析了NTN技术引入不确定度的主要因素;然后提出了由测量量导出带宽的不确定度的传递算法流程,并推导了线性内插的不确定度传递算法;最后给出了宽带取样示波器带宽不确定度的评定结果.     

基于NTN校准技术的脉冲标准法

脉冲标准法是校准宽带取样示波器的一种行之有效的方法,但它需要波形参数已知的脉冲信号源,当取样示波器的带宽很宽时,这种脉冲信号源是很难得到的。近年来发展起来的NTN校准技术可以不受带宽的限制,但是它只限于对某些结构的取样示波器的校准。提出了一种基于NTN校准技术的脉冲标准法,该法克服了上述限制,可以实现更多种类的宽带取样示波器的校准。实验结果表明,该方法是非常有效的。     

宽带取样示波器时基误差补偿的新方法研究

时基误差严重影响宽带取样示波器的高精准测量,但对时基误差进行精确估计和补偿极为困难。针对宽带取样示波器的时基误差(含时基失真与抖动引起的误差),首次运用正交距离回归算法对宽带取样示波器时基误差进行估计。对比多相位、多频率最小二乘法,该方法仅用一组近似正交的正弦信号对宽带取样示波器的时基误差进行有效估计,实现了对测量信号的时基补偿,得出了低于0.3ps的时基误差,显著提高了宽带取样示波器测量准确度。     

基于NTN技术的宽带取样示波器自动校准系统

与其它宽带取样示波器校准技术相比,NTN校准技术能够精确地获得取样示波器的冲激响应和复传递函数。但是,由于NTN校准技术要求两台取样示波器的输入端直接对接,这样就很难通过前面板对取样示波器进行操作。为此,介绍了一种基于NTN校准技术的宽带取样示波器自动校准系统,并详细介绍了系统的组成、功能及校准结果。该系统的整个校准工作是在PC机控制下完成的。     

示波器使用中应注意的问题

本文介绍了示波器使用中经常遇到的一些诸如示波器的带宽、上升时间、微调、扩展旋钮的状态对测量结果的影响等方面的问题。     

航天科工二院二○三所首次研建国内太赫兹脉冲波形校准系统

<正>本刊讯近日,航天科工二院二○三所通过开展"太赫兹电脉冲产生与测量技术预先研究"项目,在国内率先具备太赫兹脉冲波形的校准能力。系统实现了半幅度脉冲宽度小于8ps、上升时间小于6ps的太赫兹脉冲的产生,脉冲宽度仅为传统电脉冲的1/3,系统测量带宽比传统宽带示波器提升6倍以上,具备了超高速、超带宽光     

86100A/B(DCA)宽带取样示波器原理、用途及校准方法

86100A/B取样示波器是一种宽频带、多功能的电子测量仪器.本文简叙了该仪器特有的功能、测量原理以及校准方法.由于高达50GHz的频带宽度,用经典的标准脉冲法已无法进行校准(即无法量值溯源),文中介绍了用NTN校准技术的新方法,进行50GHz取样示波器的上升时间、频带宽度的测量.     

基于NTN技术的宽带取样示波器过渡时间不确定度的研究

NTN技术是一种校准宽带取样示波器的新方法，NTN技术提供的测量量是kick—out脉冲响应（显示）波形数据，而宽带取样示波器的过渡时间是对kick—out脉冲响应波形数据进行反卷积分离等处理才能获得的导出量。提出了一种基于NTN技术的宽带取样示波器过渡时间的不确定度的全面评定方法。首先分析了NTN技术引入不确定度的主要因素，给出了不确定度计算公式；然后结合数据处理过程推导出不确定度的传递算法；最后给出了宽带取样示波器过渡时间不确定度的评定结果。     

示波器测量结果不确定度的分析与评定

主要论述了示波器垂直偏转系数、扫描时间、上升时间、频带宽度示值误差测量结果不确定度的分析与评定。     

示波器测量上升时间的动态误差评估

就使用示波器进行上升时间测量时,选用不同的带宽、采用率、采样方式、拟合方式及打开通道数目的不同对测量结果所产生的动态误差进行了评估,最后说明了探头、反射、非线性对测试结果的影响.     

A fast-pulse oscilloscope calibration system

A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast-pulse oscilloscope calibration system (FPOCS) is to be used to determine the step response parameters for digitizing oscilloscopes having bandwidths of ~20 GHz. The system can provide measurement traceability to standards maintained at the U.S. National Institute of Standards and Technology (NIST). It comprises fast electrical step generation hardware, a personal computer (PC) and software, and a reference waveform, i.e., a data file containing an estimate of the step generator output signal. The reference waveform is produced by prior measurement by NIST of the step generator output signal (calibration step signal). When the FPOCS is in use, the calibration step signal is applied to the device under test, which is an oscilloscope sampling channel. The measured step waveform is corrected for timebase errors, then the reference waveform is deconvolved from it. The results are impulse, step, and frequency response estimates, and their associated parameters (e.g., transition duration, transition amplitude, -3 dB bandwidth) and uncertainties. The system and its components are described, and preliminary test results are presented     

Broadband sampling oscilloscope characterization with the“Nose-to-Nose” calibration procedure: a theoretical andpractical analysis

In the past the “nose-to-nose” calibration procedure has been introduced as probably the most accurate method to determine the impulse response of broadband sampling oscilloscopes like the HP54124T. The method is based on the hypothesis “sampler kick-out equals oscilloscope impulse response”. This hypothesis was originally based on an intuitive approach and was later verified experimentally (comparison with power measurements) as well as with SPICE simulations. Until now, however, there was no generalized mathematical evidence supporting this basic hypothesis. In this paper a mathematical theory is developed, which starts from a generalized sampler equivalent scheme, and which shows that, under conditions which are valid in practice, the sampler kick-out indeed equals the sampler impulse response. Experimental results are reported concerning the accuracy and precision of the calibration procedure. These experiments involve the investigation of experiment repeatability, noise, sampler linearity and timebase effects     

基于VB与9500B示波器校准仪的自动校准系统

介绍了以9500B示波器校准仪为标准器,针对示波器DSO-X3034A为被校对象做主要阐述,采用Visual Basic Studio 2010为上位机人机交互界面开发语言,利用Agilent Connection Expert搭建通信平台,通过SCPI指令来实现上位机对9500B示波器校准仪、数字示波器之间的程控功能,按国家校准规范自动完成上升时间、直流增益、扫描时间系数、频带宽度四大模块校准工作,最后保存数据自动生成报告。     

取样示波器nose-to-nose校准技术中kick-out脉冲的研究

研究了nose-to-nose校准技术中关键信号kick-out脉冲产生的机理以及影响因素,并通过将两台Agilent86100系列的50GHz的取样示波器对接,获得了kick-out脉冲的响应波形.     

A 100-Msps sampling analog-to-digital converter chip set

The authors describe a 100-Msps sampling analog-to-digital converter (ADC) chip set that can be used for a wideband high-resolution digital storage oscilloscope (DSO). A high conversion rate and a 500-MHz sampling bandwidth with an 8-b effective resolution are obtained by a combination of three Si-bipolar chips and two GaAs-diode chips. the ADC uses a pipelined two-step subranging architecture that uses two cascade wideband track-and-hold (T/H) circuits. The design features of the T/H circuits and the residual amplifier are also presented     

Improved Bias Supply for Tunnel-Diode Picosecond Pulse Generators

An improved bias supply for tunnel-diode (TD) picosecond-pulse generators is described. The supply is stable with temperature and, in a commercial 35-ps (nominal) risetime tunneldiode pulse generator/sampling oscilloscope system, has produced a 4:1 reduction in time-base jitter and 2:1 reduction in time-base drift. Also described is a tunnel-diode pulse generator, which, when used with the bias supply, produces a stable pulse having a flat-top sag of no more than 2 percent in 1 ?s.