共查询到18条相似文献,搜索用时 62 毫秒
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探索了纯石墨电极在水中放电制备洋葱状富勒烯(Onion-like fullerenes,OLFs)的过程和工艺。用高分辨透射电镜(High resolution transmission electron microscope。HRTEM)对生成的OLFs进行了形貌、结构的观察与表征。分析结果表明制得的OLFs具有各种不同形状的内核。石墨化程度很高,直径分布在5nm~40nm范围内。在一定范围内随着电流强度的增大OLFs的产量和产率都有不同程度的提高。 相似文献
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采用水下电弧放电法制备了洋葱状富勒烯(OLFs),通过高分辨透射显微镜(HRTEM)、拉曼散射(Raman)和X射线衍射分析(XRD)等分析方法对产物的形貌、尺寸、微观结构及其物相结构进行表征。结果表明,所制备产物其外观呈准球状或多面体状,最外碳层由闭合的、呈波浪状的石墨片构成,且石墨化程度很高。OLFs的直径分布不均匀,从而造成其拉曼谱峰相对于石墨特征峰发生了频移;TGA考察了OLFs的热稳定性,实验表明OLFs在空气中的热稳定性大于600℃,在氩气中能够维持到1000℃以上。 相似文献
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Yanli Yao 《Materials Letters》2008,62(16):2524-2527
Onion-like fullerenes (OLFs) were generated by arc discharge in water between pure graphite electrodes. The size and crystalline morphology of the generated OLFs were characterized by means of the high-resolution transmission electron microscopy and X-ray diffraction. Furthermore, OLFs were added to base lubricant and the tribological property of OLFs was investigated by using a four-ball type tribometer. The results indicated that the OLFs with diameter about 25 nm were of high degree graphitization. Good friction-reduction property at different additive concentration and applied load as lubricant additive was obtained. The scratches on the worn surfaces become slighter and more uniform with addition of OLFs to the base lubricant. In addition, the tribological mechanism of the sliding-bearing system was proposed. 相似文献
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The structural properties of microcrystalline Si films prepared by hot-wire/catalytic chemical vapor deposition, with various dilution ratios of silane in hydrogen, were investigated as regards to the role of hydrogen. A large surface roughness correlated with a low crystalline nuclei density was observed for microcrystalline Si films deposited near the transition from amorphous to microcrystalline growth. Investigations of hydrogen-related properties suggest the presence of molecular hydrogen in these films. We tentatively propose that the diffusion of atomic hydrogen into the subsurface layer of growing films, which leads to the relaxation of amorphous Si network and to the generation of molecular hydrogen, plays an important role for determining the film properties, besides top surface reactions. 相似文献
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S. Osono Y. Uchiyama M. Kitazoe K. Saito M. Hayama A. Masuda A. Izumi H. Matsumura 《Thin solid films》2003,430(1-2):165-169
The coverage properties of silicon nitride (Si3N4) films prepared by the catalytic chemical vapor deposition (Cat-CVD) technique were systematically studied. By increasing the catalyzer–substrate distance, the coverage was improved from 46 to 67% on a 1.0-μm line and space pattern. The etching rate of Cat-CVD Si3N4 film measured using 16BHF solution was independent of the deposited position of the micro-patterns deposited, and was approximately 3 nm/min, one order of magnitude lower than that of plasma-enhanced CVD (PE-CVD) Si3N4 film. This means that Cat-CVD Si3N4 films are denser than PE-CVD Si3N4 films, and that the quality at the side wall is equivalent to that on the top surface. That is, Cat-CVD Si3N4 films show a passivation effect, which was excellent, even at the side wall of micro-patterns. These results suggest that Si3N4 films prepared by Cat-CVD are suitable for the passivation films in microelectronic devices having a step configuration, such as TFT-LCDs and ULSIs. 相似文献
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纳米洋葱状富勒烯的研究现状及前景 总被引:1,自引:1,他引:0
通过述评纳米洋葱状富勒烯的结构、制备、生长机理、纯化、修饰及性能,指出:纳米洋葱状富勒烯具有独特的中空笼状及同心壳层结构,是富勒烯家族的一个重要成员,具有许多特殊性能,有望在能源材料、高性能、高温耐磨材料、超导材料和生物医用材料等领域得到广泛的应用. 相似文献
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Crystallization by excimer laser annealing for a-Si:H films with low hydrogen content prepared by Cat-CVD 总被引:1,自引:0,他引:1
Crystallization by excimer-laser annealing (ELA) for hydrogenated amorphous silicon (a-Si:H) films with low hydrogen content (CH) prepared by catalytic chemical vapor deposition (Cat-CVD) was systematically studied. From optical microscopy images, no hydrogen bubbling was observed during ELA, even without a dehydrogenation process. As the laser energy density was increased to 300 mJ cm−2, the full width at half-maximum of the Raman signal from the crystalline phase decreased to approximately 4 cm−1. This value is almost equal to or even smaller than that reported for polycrystalline Si (poly-Si) films prepared from plasma-enhanced CVD (PECVD) a-Si:H films by ELA so far. The average grain size, estimated from scanning electron microscopy, was approximately 500 nm for CH of 1.3 at.%. On the other hand, the grain size of poly-Si films prepared from PECVD a-Si:H films with a dehydrogenation process was only 200 nm. The technique using Cat-CVD films is expected to be used for fabrication of low-temperature high-mobility thin-film transistors. 相似文献
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We demonstrate the excellent performance of a 140 W AlGaN/GaN HEMT in the C-band, which is passivated by a Cat-CVD SiN film. The interface trap density of the AlGaN surface passivated by Cat-CVD film after NH3 treatment is 3 × 1012 cm− 2, which is the smallest of investigated deposition techniques. The lowest interface trap density achieved by the Cat-CVD technique makes it possible to operate the AlGaN/GaN HEMT in the C-band. We clarify that the Cat-CVD technique is necessary for developing future amplifiers. 相似文献