Nano-grain Al2O3 crystals grown by sputtering of aluminium on CoCrPt thin films for potential application in ultra-high-density recording media

Designing supraceramic assemblies based on Al₂O₃ has remained a challenge due to the problems associated with the suitable dispersion in neat compounds and ability to control the preferred orientation in a unique fashion. Herein, granular HCP-(CoCrPt)_100−X(Al₂O₃)_X (X represents the percent weight) thin films with Si(1 0 0) substrates have been fabricated using sputtering technique followed by annealing treatment. Structural and magnetic properties of thin film have been investigated for potential application in magnetic recording media. It was shown that coercivity increased from 0.5 to 2.5 kOe by increasing the nano-grain Al₂O₃ content in the CoCrPt magnetic layers. In CoCrPt-Al₂O₃ thin films coercivity of 2.5 kOe has been obtained with increasing the Al₂O₃ content from 3 to 13 wt.% in the annealed thin films. The structural properties of the samples were studied using X-ray diffraction (XRD) and transmission electron microscope (TEM) equipped with selected area electron diffraction (SAED). The magnetic properties of the samples were measured with a vibrating sample magnetometer (VSM). The VSM results showed that the HCP-CoCrPt-Al₂O₃ granular films are a promising candidate for ultra-high-density recording media because of its low Al₂O₃ content and simple manufacturing process.     

Effect of Ag（Ti） underlayers on CoCrPt thin film media

1　INTRODUCTIONMany works have been done in recent years onCo based granular alloys for potential applicationsas recording magnetic media[1 5]. The ideal granu lar media should consist of small and uniformgrains. High anisotropy magnetic grains embeddedin a robust non magnetic matrix are required. Highcoercivity, large squareness and negative nuclea tion field are very important for magnetic recordingfilms.The addition of Pt to the recording layer canincrease the anisotrop…     

Cr和CrTi底层对CoCrPt薄膜介质的磁和结构性能的影响

为了改善记录介质的磁性能,研究了溅射Cr和CrTi底层对Co68Cr17Pt15性能的影响。发现在玻璃盘基和CoCrPt磁性层之间引入100nm厚的Cr底层,可使介质矫顽力从56kA·m-1增加到127kA·m-1,同时剩磁比和矫顽力矩形比分别增加66%和74%。同时还发现Cr底层厚度对介质磁性能有较大影响。考虑到减小Cr底层和磁性层的晶格匹配,在Cr底层里添加Ti元素,当Ti原子分数达到1.5%时,即使在室温下溅射,薄膜也有好的面内磁滞回线,此时矫顽力可达到160kA·m-1。X射线衍射表明在介质中引入Cr和CrTi底层,由于薄膜能更好的沿着垂直于易磁化轴方向生长而使介质性能提高。     

GMR读磁头用面内取向CoCrPt永磁薄膜的结构与性能

用磁控溅射的方法在Cr1-xWx衬底上制备了GMR读磁头中用来提供水平偏置磁场的易轴水平取向的CoCrPt合金薄膜.研究了Cr1-xWx衬底(200)织构与W含量之间的关系,沉积在CrW衬底上的CoCrPt合金薄膜微结构及磁性能,以及CoCr中间层的添加对CoCrPt合金薄膜生长出面内取向的()织构的影响及磁性能的影响.实验结果表明,CoCr中间层的引入对CoCrPt合金薄膜易磁化轴的面内取向起到了十分关键的作用.