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71.
Although conventional electron microscopy (EM) requires samples to be in vacuum, most chemical and physical reactions occur in liquid or gas. The Atmospheric Scanning Electron Microscope (ASEM) can observe dynamic phenomena in liquid or gas under atmospheric pressure in real time. An electron-permeable window made of pressure-resistant 100 nm-thick silicon nitride (SiN) film, set into the bottom of the open ASEM sample dish, allows an electron beam to be projected from underneath the sample. A detector positioned below captures backscattered electrons. Using the ASEM, we observed the radiation-induced self-organization process of particles, as well as phenomena accompanying volume change, including evaporation-induced crystallization. Using the electrochemical ASEM dish, we observed tree-like electrochemical depositions on the cathode. In silver nitrate solution, we observed silver depositions near the cathode forming incidental internal voids. The heated ASEM dish allowed observation of patterns of contrast in melting and solidifying solder. Finally, to demonstrate its applicability for monitoring and control of industrial processes, silver paste and solder paste were examined at high throughput. High resolution, imaging speed, flexibility, adaptability, and ease of use facilitate the observation of previously difficult-to-image phenomena, and make the ASEM applicable to various fields.  相似文献   
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Superoleophobic thin films have many potential applications including fluid transfer, fluid power systems, stain-resistant and antifouling materials, and microfluidics. Transparency is also desired with superhydrophobicity for numerous applications; however, transparency and oleophobicity are almost incompatible with each other from the point of view of surface structure. Oleophobicity requires a rougher structure on the nano–microscale than hydrophobicity, and this rough structure brings light scattering. So far, there are few reports of compatible transparency and superoleophobicity. In this report, we propose see-through-type fabrics having nanoparticle-based hierarchical structure thin films to improve both oleophobicity and transparency. The vacant space between the fibers of the fabric has two important roles: to allow light to pass through and to induce an air layer to produce a Cassie state of a liquid droplet on the resulting thin film. To realize a low surface energy and nanoscale rough structured surface on fabric fibers, we used a spray method with perfluoroalkyl methacrylic copolymer, silica nanoparticles, and volatile solvent. Scanning electron microscopy images revealed that hierarchical nanoparticle structures were uniformly formed on the fabrics. The transparency of the obtained thin film was approximately 61 %, and the change of transparency between the non-coated and coated fabrics was 11 %. The contact angles of oil (rapeseed oil and hexadecane) and water droplets on the fabricated film were observed to be over 150° during investigation of its surface wettability.  相似文献   
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Many research groups are developing series voltage compensators. In a series converter, since a transformer is used in series in the power system, the power system current flows into the voltage source inverter through the transformer. The inverter current, which is determined by the transformation ratio, gives rise to an error voltage that consists of a dead‐time voltage and an impedance voltage. The error voltage is generated even when the reference voltage is zero. This paper describes the mechanism by which the error voltage occurs and proposes a method for reducing the error voltage. © 2013 Wiley Periodicals, Inc. Electr Eng Jpn, 186(3): 85–93, 2014; Published online in Wiley Online Library ( wileyonlinelibrary.com ). DOI 10.1002/eej.22333  相似文献   
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A molecular glass resist with an ionic photoacid generator and a single protection group (MR‐1) has been developed. MR‐1 exhibited good thermal properties, such as a 5% weight loss temperature (Td5%) of 167°C and a glass transition temperature (Tg) of 80°C. MR‐1 showed the good sensitivity of 80 μC/cm2 and high contrast of 4.9 with e‐beam exposure (50 keV). A relatively high resolution of 50 nm and low Line‐Edge‐Roughness of 3.8 nm were obtained by e‐beam exposure (100 keV). © 2013 Wiley Periodicals, Inc. J. Appl. Polym. Sci. 2014 , 131, 39769.  相似文献   
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