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991.
AFM探针的形貌和尺寸对纳米尺度线宽的测量有较大影响.首先建立了一个基于最小二乘的应用于AFM测量技术的线宽计量模型,并使用三种不同探针在NanoScopeⅢa型AFM上对设计线宽尺寸为1000nm的样本进行了测量.应用该模型和算法对线宽进行计算,揭示出探针尺寸对线宽测量结果的影响以及该模型对探针尺寸的依赖性. 相似文献
992.
Changing the method of tip/sample interaction leads to contact, tapping and other dynamic imaging modes in atomic force microscopy (AFM) feedback controls. A common characteristic of these feedback controls is that the primary control signals are based on flexural deflection of the cantilever probes, statically or dynamically. We introduce a new AFM mode using the torsional resonance amplitude (or phase) to control the feedback loop and maintain the tip/surface relative position through lateral interaction. The torsional resonance mode (TRmode™) provides complementary information to tapping mode for surface imaging and studies. The nature of tip/surface interaction of the TRmode facilitates phase measurements to resolve the in-plane anisotropy of materials as well as measurements of dynamic friction at nanometer scale. TRmode can image surfaces interleaved with TappingMode™ with the same probe and in the same area. In this way we are able to probe samples dynamically in both vertical and lateral dimensions with high sensitivity to local mechanical and tribological properties. The benefit of TRmode has been proven in studies of water adsorption on HOPG surface steps. TR phase data yields approximately 20 times stronger contrast than tapping phase at step edges, revealing detailed structures that cannot be resolved in tapping mode imaging. The effect of sample rotation relative to the torsional oscillation axis of the cantilever on TR phase contrast has been observed. Tip wear studies of TRmode demonstrated that the interaction forces between tip and sample could be controlled for minimum tip damage by the feedback loop. 相似文献
993.
S. Arul L. Vijayaraghavan S.K. Malhotra R. Krishnamurthy 《The International Journal of Advanced Manufacturing Technology》2006,29(7-8):655-662
Drilling trials have been carried out on glass Fibre reinforced plastics (GFRP) with plain high speed steel (HSS), TiN coated
HSS and tipped tungsten carbide drills. Most of the defects in drilling of composites are due to thrust force experienced
by the workpiece. The parametric influence on cutting force was experimentally evaluated. The experimental results show that
the defects toleranced drilling can be attained by proper selection of cutting parameters and tool material. This is substantiated
by monitoring flank wear, hole shrinkage and acoustic emission during drilling. 相似文献
994.
X.-W. Liu K. Cheng A.P. Longstaff M.H. Widiyarto D. Ford 《The International Journal of Advanced Manufacturing Technology》2005,26(5-6):457-465
An accurate cutting force model of ball-end milling is essential for precision prediction and compensation of tool deflection that dominantly determines the dimensional accuracy of the machined surface. This paper presents an improved theoretical dynamic cutting force model for ball-end milling. The three-dimensional instantaneous cutting forces acting on a single flute of a helical ball-end mill are integrated from the differential cutting force components on sliced elements of the flute along the cutter-axis direction. The size effect of undeformed chip thickness and the influence of the effective rake angle are considered in the formulation of the differential cutting forces based on the theory of oblique cutting. A set of half immersion slot milling tests is performed with a one-tooth solid carbide helical ball-end mill for the calibration of the cutting force coefficients. The recorded dynamic cutting forces are averaged to fit the theoretical model and yield the cutting force coefficients. The measured and simulated dynamic cutting forces are compared using the experimental calibrated cutting force coefficients, and there is a reasonable agreement. A further experimental verification of the dynamic cutting force model will be presented in a follow-up paper. 相似文献
995.
Electrostatic force microscopy was used to directly probe solvent‐induced charge degradation in electret filter media. Electrostatic force gradient images of individual polypropylene electret fibres were used to quantify the extent of charge degradation caused by the immersion of the fibres into isopropanol. Electrostatic force gradient images were obtained by monitoring the shifts in phase and frequency between the oscillations of the biased atomic force microscopy (AFM) cantilever and those of the piezoelectric driver. Electrostatic force microscopy measurements were performed using non‐contact scans at a constant tip‐sample separation of 75 nm with varied bias voltages applied to the cantilever. Mathematical expressions, based on the capacitance of the tip‐sample system, were used to model the phase and frequency shifts as functions of the applied bias voltage to the tip and the offset voltage due to the fibre's charge. Quantitative agreement between the experimental data and the simplified model was observed. 相似文献
996.
997.
998.
新型过约束正交并联六维力传感器测量模型与静态标定试验 总被引:1,自引:0,他引:1
面向航空航天领域对重载大吨位多维测力传感器的急需,通过引入冗余测力分支,提出一种适用于重载测力场合的新型过约束正交并联六维力传感器结构,在提高传感器结构刚度和承载能力的同时有效抑制了关节摩擦对多维力传感器测量精度的影响。基于螺旋理论,推导得到了该并联传感器一阶静力影响系数矩阵,建立理想状态下该新型过约束正交并联六维力传感器测量数学模型。考虑各测量分支的初始预紧力与刚度,基于传感器静力平衡方程与补充建立的位移协调方程,推导建立考虑初始预紧力与分支刚度因素下该新型过约束正交并联六维力传感器测量数学模型。在此基础上,设计并研制该新型过约束正交并联六维力传感器样机,搭建传感器加载标定与信号采集及处理试验系统,对新型过约束正交并联六维力传感器进行了加载标定试验。根据试验结果计算了传感器测量误差矩阵,分析得到了传感器测量精度,从而为重载过约束并联六维力传感器的开发与应用提供了参考。 相似文献
999.
1000.
It is difficult to predict the measurement bias arising from the compliance of the atomic force microscope (AFM) probe. The issue becomes particularly important in this situation where nanometer uncertainties are sought for measurements with dimensional probes composed of flexible carbon nanotubes mounted on AFM cantilevers. We have developed a finite element model for simulating the mechanical behavior of AFM cantilevers with carbon nanotubes attached. Spring constants of both the nanotube and cantilever in two directions are calculated using the finite element method with known Young's moduli of both silicon and multiwall nanotube as input data. Compliance of the nanotube-attached AFM probe tip may be calculated from the set of spring constants. This paper presents static models that together provide a basis to estimate uncertainties in linewidth measurement using nanotubes. In particular, the interaction between a multiwall nanotube tip and a silicon sample is modeled using the Lennard-Jones theory. Snap-in and snap-out of the probe tip in a scanning mode are calculated by integrating the compliance of the probe and the sample-tip interacting force model. Cantilever and probe tip deflections and points of contact are derived for both horizontal scanning of a plateau and vertically scanning of a wall. The finite element method and the Lennard-Jones model provide a means to analyze the interaction of the probe and sample and measurement uncertainty, including actual deflection and the gap between the probe tip and the measured sample surface. 相似文献