基于迈克耳孙干涉仪的凝视型激光告警系统设计

设计了一种基于迈克耳孙干涉仪的凝视型激光告警系统,理论分析了系统定向精度和滤光片透射率的变化规律。结果表明,入射激光经过告警系统后,形成环形干涉条纹,根据条纹中心的坐标和条纹间隔可解算入射激光的方向和波长;在探测器像元尺寸固定的情况下,系统的定向精度由光束变换透镜和球面反射镜焦距的比值决定,定向精度随该比值的减小而提高;告警系统滤光片的透射率取决于变换透镜的焦距,当变换透镜焦距为鱼眼镜头焦距10倍时,滤光片对系统入射角为0°~90°范围内激光的透射率为90.0%~87.5%,这保证了系统对各角度的入射激光都有较高的探测灵敏度。     

基于激光干涉仪的影像测量仪定位误差和补偿的研究

在介绍激光干涉仪的工作原理后,并用激光干涉仪对测量仪工作平台进行了误差检测。运用分段插补数学模型进行定位精度的补偿,得出了2组的实验数据,误差产生的原因以及证实了补偿的有效性。     

空间型Raman脉冲冷原子陀螺仪的绝对角速度测量

介绍了图解法分析冷原子干涉仪的基本原理,建立了空间型Raman脉冲冷原子陀螺仪的理论模型。通过对冷原子干涉仪近似数学模型的变换,研究了原子初速度与跃迁概率之间的关系,阐述了基于辅助角速度测量的原子速度扫描法测量原理。在原子干涉仪精确模型的基础上,利用Raman激光频率调制对多普勒效应进行补偿,并利用相位调制进行修正以满足原子速度扫描法中的相位关系。数值仿真计算结果表明,在辅助角速度测量量程内,经过补偿修正后的原子速度扫描法能实现对绝对角速度的高精度测量。     

利用光纤马赫曾德尔干涉仪实现的光学双稳性研究

以光纤马赫曾德尔干涉仪作为光强度调制器件,通过光纤耦合器构造光电反馈回路搭建了一种新型电光混合型光学双稳装置。对光学双稳原理进行了研究分析,用图解法形象地解释了双稳工作原理,并且通过在实验中改变该器件的输入光强实现了光学双稳态,得到的光学双稳现象显著,双稳工作状态稳定。该器件有诸多重要应用,如工作在稳态区域时可用做光纤激光功率稳定器,工作在开关区域时可用作光开光、光路由器。     

电子战装备干涉仪相位稳定性分析

立足于电子战装备工程设计与应用,对干涉仪测向体制电子战装备的相位稳定性进行了探索与分析,开展相关试验,结合试验数据进行了原因分析,提出部分预防与改进措施,以期改善系统性能,提高装备测向精度,并为同类工程设计应用提供一定参考。     

一种新型光纤干涉测距系统及其定位信号处理

本文提出一种新型的光纤干涉测距系统 ,可以测量 1m以上的绝对距离。整个系统采用两部分干涉结构 ,分别对目标进行定位、光程调谐以及对距离的测量 ,并通过引入已精确标定的光纤进行光程倍增以扩大系统的动态范围。文中论述了系统的基本测量原理及其数字化定位信号处理系统 ,并给出此定位信号处理系统的实验结果     

Absolute Measurement Fiber—optic Sensors in Large Structural Monitoring

The security of civil engineering is an important task due to the economic,social and evironmental significance.Compared with conventional sensors.the optical fiber sensors have their unique characteristics.Beijing durable,stable and insensitive to external perturbations,they are particular interesting for the long-term monitoring of civil structures.Focus is on absolute measurement optical fiber sensors,which are emerging from the monitoring large structural,including SOFO system,F-P optical fiber sensors,and fiber Bragg grating sensors.The principle,characteristic and application of these three kinds of optical fiber sensors are described together with their future prospects.     

Dynamic probe calibration in the μm region with nanometric accuracy

This paper describes a system that enables a traceable dynamic calibration of probes of roughness testers and roundness testers, for example. The system is based on a digital piezo translator (DPT). For the calibration of the DPT itself, an interferometric technique was used. After calibration by laser interferometry, the DPT is used as a transfer standard that can be driven by signals of various, but exactly known, form. This time-displacement form can range from square to sinusoidal or quasi-random with a maximum displacement of 15 ,μm and a maximum frequency of about 300 Hz. From a practical calibration of a roughness tester, it is shown that, depending upon the profile, roughness parameters can be measured with an uncertainty ranging from a few nm to 1%.     

移相器类进动现象对干涉测量的影响

压电晶体(PZT)光学移相器作为移相干涉仪(PSI)的关键部件，其移相误差直接影响被测波面的相位复原精度。分析了压电晶体移相器在移相过程中导致干涉图旋转的原因——类进动，其本质是移相器在伸长的同时其参考镜端面法线方向绕着伸长方向产生旋转。利用典型的Hariharan五步移相算法。得出了类进动现象所导致的波面相位复原误差计算公式，给出了在测试孔径上的误差分布图。对影响误差大小的主要因素如干涉条纹的宽度、旋转的角度和测试口径等进行了具体分析，由此推导出在移相干涉仪光学调整过程中控制干涉图旋转误差的准则。     

New nano-contouring measurement techniques for a nano-stage

Among the most commonly used contouring measurement methods, no measuring techniques have been available with nanometer resolution except for the grating encoder measurement system. Although the grating encoder measurement system can reach the resolution of nanometers for nano-contouring, its resolution and accuracy of measurement are limited by the manufacturing accuracy of the size of the grating etching, the size of the light-spot and the pitch of the grating. When the contouring radius is less then the pitch of the grating, the grating encoder system does not work. So, no measuring instrument could simultaneously measure the nano-stage contouring error. In this paper, three new nano-contouring measurement techniques for a nano-stage have been successfully developed by employing laser interferometers, corner cubes and some developed fixture. By specified light path arrangements, three different setting-ups are described in this paper. The measuring resolution of these techniques is 10 nm. Contouring tests with a very small radius were carried out. A 500 nm radius contouring test result was given. Since the techniques are simple, it is very easy to set up and to carry out the tests, compared to other systems. Also, the setting-up error can be ignored when the contouring radius is small. A Heidenhain measuring system was employed to verify these three new techniques. Good verification results were obtained to prove these systems.