生长条件对KDP晶体中散射颗粒的影响

利用透射电子显微技术对不同条件下生长的KDP晶体中包裹物进行了观察并测量了其相应尺寸。结果表明，晶体中的生长缺陷、pH值、生长速度和杂质与KDP晶体散射颗粒的形态存在密切关系。     

A new precipitate phase in Al-4wt. % Cu thin-film interconnects

We report here the identification of a new precipitate phase in thin-film Al-4wt.%Cu metallization used for interconnects on integrated circuits. The phase is based on a trigonal distortion of a face centered cubic lattice. Computer simulation of electron diffraction intensities suggests that the basis structure is isomorphous with Al₂Ca but with a large and ordered population of vacancies on Cu sites. The reason for the formation of the new phase and its implications for electromigration reliability are discussed.     

Microstructural investigation of the breakdown of the protective oxide scale on a 304 steel in the presence of oxygen and water vapour at 600 °C

This article focuses on the detailed microstructural investigation of the oxide scale formed on a 304 steel in the presence of oxygen and water vapour (40%) at 600 °C. The work has been carried out using a combination of microanalytical techniques including FIB, TEM, EDX and electron diffraction. The local breakdown of the initially protective oxide scale and the growth of island/crater oxide morphology are described. Special consideration is given to the influence of the microstructure of the steel and the oxide scale on the breakdown behaviour.     

液态搅拌铸造颗粒增强Al－4％Mg复合材料的微观结构研究

本文以ＴＥＭ和ＥＤＳ为主要分析手段，研究了不同颗粒增强的Ａｌ－４％Ｍｇ复合材料的界面及其基体中的微观结构，探讨了它们的形成原因。结果表明：ＳｉＯ_２颗粒与基体间为反应结合，Ａｌ_２Ｏ_３和ＳｉＣ则基本上为机械结合。     

Structural properties of 0.65Pb(Mg1/3Nb2/3)O3–0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides

Coating of 0.65Pb(Mg_1/3Nb_2/3)O₃–0.35PbTiO₃ (PMN–PT) relaxor ferroelectrics by a sol–gel method is followed by growth of epitaxial SrRuO₃ (SRO) metallic oxide electrodes on SrTiO₃ (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN–PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN–PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.     

Organic‐acid‐catalyzed sol–gel route for preparing poly(methyl methacrylate)–silica hybrid materials

In this study, a series of organic–inorganic hybrid sol–gel materials consisting of a poly(methyl methacrylate) (PMMA) matrix and dispersed silica (SiO₂) particles were successfully prepared through an organic‐acid‐catalyzed sol–gel route with N‐methyl‐2‐pyrrolidone as the mixing solvent. The as‐synthesized PMMA–SiO₂ nanocomposites were subsequently characterized with Fourier transform infrared spectroscopy and transmission electron microscopy. The solid phase of organic camphor sulfonic acid was employed to catalyze the hydrolysis and condensation (i.e., sol–gel reactions) of tetraethyl orthosilicate in the PMMA matrix. The formation of the hybrid membranes was beneficial for the physical properties at low SiO₂ loadings, especially for enhanced mechanical strength and gas barrier properties, in comparison with the neat PMMA. The effects of material composition on the thermal stability, thermal conductivity, mechanical strength, molecular permeability, optical clarity, and surface morphology of the as‐prepared hybrid PMMA–SiO₂ nanocomposites in the form of membranes were investigated with thermogravimetric analysis, differential scanning calorimetry, dynamic mechanical analysis, gas permeability analysis, ultraviolet–visible transmission spectroscopy, and atomic force microscopy, respectively. © 2008 Wiley Periodicals, Inc. J Appl Polym Sci, 2008     

Quantification of the layer dispersion degree in polymer layered silicate nanocomposites by transmission electron microscopy

As the performance of polymer layered silicate nanocomposites strongly depends on their interior layer dispersion, quantification of the layer dispersion degree is needed. In this work, a new methodology was developed to determine the dispersion parameter D_0.1, based on the measurement of the free-path spacing distance between the single clay sheets from the transmission electron microscopy (TEM) images. Several examples of exfoliated, intercalated, and immiscible composites were studied. It was found that the exfoliated composites had D_0.1 over 8%, while that of intercalated composites were between 4 and 8%. In the case of intercalation, a high frequency peak appeared at a short spacing distance in the histogram, which was a characteristic of the intercalation, distinct from the exfoliation. The main utility of this TEM methodology is for the quantification of exfoliated or intercalated samples with small number of layers with stacks. The dispersion parameter D_0.1 below 4% was suggested to classify as immiscible. A unique advantage of the TEM measurement is that the dispersion degree of different fillers can be counted individually.     

电话通信设备电磁干扰的测量分析

本文探讨了ＴＥＭ室测量电话通信设备辐射干扰的原理、方法，得出了在线电话终端０．１５～３０ＭＨｚ频段辐射干扰测量结果，并进行了分析。     

Models and observations of fcc/bcc interfaces

Whereas models of the structure and periodicity of CSL or near CSL high angle grain boundaries are relatively well developed and have been to some extent verified by experiment, the nature of more general (e.g. fcc/bcc) interfaces is very imperfectly understood. One of the major differences between homo- and heterophase boundaries is the occurrence, in the latter case, of reproducible orientation relationships due to the crystallographic requirements of phase transformation (e.g. a glissile interface for martensitic growth, low energy interfaces for classical nucleation). A review is given of the relationships commonly observed to obtain between fcc and bcc crystals (as well as ordered phases based upon these structures). Within a given relationship, it is possible to use models of the available interfaces to predict their dislocation content; the success of the various approaches is considered. It is shown that the dislocation arrays identified on fcc/bcc boundaries are consistent with the occurrence of a primary structural relaxation, but that the latter does not appear to be complete. Possible reasons for this are discussed, together with the extent to which secondary structural models may be applicable. Attempts to rationalize the observed orientation relationships and morphologies are discussed, and it is pointed out that these all rely on searches for situations of minimum primary misfit, but that the way in which the latter is quantified determines the results of the analyses. Nevertheless, the implication is that the primary misfit does appear to determine the actual behaviour, though no structural or mechanistic conclusions can safely be drawn from this observation.     

Electron microscope studies of InxGav1−xAs/GaAs/Si grown by metalorganic chemical vapor deposition

The microstructure of In_xGa_1−xAs/GaAs (5 nm/5 nm, x < 0 to 1.0), as grown by a metalorganic chemical vapor deposition two-step growth technique on Si(100) at 450‡C, and subsequently annealed at 750‡C, is investigated using plan-view and cross-sectional transmission electron microscopy. The variations in resultant island morphology and strain as a function of the In content were examined through the comparison of the misfit dislocation arrays and moirés observed. The results are discussed in relation to the ways in which the island relaxation process changes for high In content.