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121.
122.
TAN Zuo-wen 《通讯和计算机》2007,4(5):40-46
Signcryption is a public key or asymmetric cryptographic method that provides simultaneously both message confidentiality and integrity at a lower computational and communication cost. This paper presents a (t, n) threshold proxy signcryption scheme in which no less than t proxy agents in the proxy group can produce the signcryption cryptogram. combines the functionality of threshold proxy signing and encryption. The proposed scheme combines the functionality of both threshold proxy signing and encryption, and provides fair protection for the sender and the proxy agents. This scheme is secure against attack of public key substitution. It also satisfies security properties such as confidentiality and authenticity. 相似文献
123.
本文对白云鄂博主矿采场铁公路联合运输向公路运输转换位置是否确定为1638m水平以及运输工艺转换过程中相关问题进行分析论证,提出主矿采场铁路至少可向下延深一个水平,技术上可行,节约运费千万元以上。 相似文献
124.
S. Zaefferer 《Advanced Engineering Materials》2003,5(8):607-613
In recent years the investigation of local texture and microstructure by analysis of electron backscatter diffraction patterns (EBSP) in the SEM has become a very powerful and popular method. With the introduction of SEM with field emission guns (FEG) the spatial resolution of EBSP measurements could be enhanced from 500 nm with a tungsten emitter to better than 50 nm. This evolution of SEM techniques raises the question whether transmission electron microscopy (TEM) still has fields of application in texture research. The present article answers this question with a clear “yes” and presents three examples of investigations where TEM is indispensable. The three examples comprise the investigation of the correlation between dislocation structure and deformation texture, a study on nucleation mechanisms of recrystallization in highly deformed metals and the investigation of microtexture and microstructure in nanocrystalline materials. Together with the presentation of these cases some of the necessary measurement techniques are described briefly. It is shown that TEM has to be applied when highest spatial resolution of orientation determination and imaging and high accuracy of orientation determination are to be reached, when the three‐dimensional and quantitative characterization of lattice defects is required or when materials with a high density of lattice defects are to be investigated. 相似文献
125.
厦门市气源转换的技术分析 总被引:3,自引:2,他引:1
分析了气源转换时原有输配系统的管道、调压设备、计量设备、用气设备与天然气系统相适应的问题,提出了相应的措施。 相似文献
126.
介绍了光纤传输数字电视的意义,电视信号分量数字化的标准和优点。利用自行研制的270Mb/s光发射机和光接收机,建立了分量数字电视信号的光纤传输系统,直接传输了100km光纤,系统传输无误码,传输后图像质量不变。光接收机灵敏度达-29.24dBm,动态范围为13.5dB。无压缩电视图像的传输对于远程医疗和演播室间转输节目等有非常实际的意义。 相似文献
127.
用优化设计方法,以曲柄滑块机构最小传动角为最大作为目标函数,给出了最优解的解析计算方法,从而得到机构的最佳设计。 相似文献
128.
A fundamental research of structural defects induced upon post-growth processing of ZnSe/GaAs epilayers grown on (100) GaAs
was done by identifying defect-related reflections in the transmission electron diffraction (TED) patterns of ZnSe. Structural
artifacts, other than the as-grown defects, on this material system could be excluded according to our results. Four types
of abnormal reflections have been observed in addition to primary reflections. These extra reflections are sensitive to the
post-growth processing of ZnSe epilayers and may arise from various external effects, rather than epitaxy growth, such as
irradiation damage, surface oxidation, and surface contamination. By mapping these reflections at several major zone axes
using TED patterns, we found that the reciprocal lattice for a ZnSe crystal with structural defects consists of two distinct
types of extra reflections associated with irradiation damage. The first type of extra reflections is ±1/3{111} and the other
is ±1/2{111} corresponding to pure-edge and non-edge dislocation loops, respectively. For (100) oriented wafers, the ±1/3{111}
and ±1/2{111} reflections were observed only on two of the four possible 〈111〉 variants (i.e. [111]Zn and [111]Zn)and this phenomenon was attributed to the anisotropy of defect distribution. Extra reflections associated with surface oxidation
and contamination are also observed. The orientation relationships between a surface hexagonal ZnO and a cubic ZnSe film are
[0001]ZnO//[−111]ZnSe, and [01−11]ZnO//[011]ZnSe. The origin, characterization, and elimination of these induced reflections are discussed. With the knowledge about these
extra effects on structural defect formation, we have shown the real microstructure of ZnSe epilayers. 相似文献
129.
130.
在对同杆4回线解耦的基础上,提出了一种适合于同杆4回线的故障测距方法。同杆4回线内部发生故障时,可以将故障分量分解为12序分量,且利用该12序分量进行故障测距。考虑到在任何故障类型下,同杆4回线内部都会存在反序分量,所以提出了基于反序环流分量的故障测距方法。当同杆4回线内部发生故障时,从线路两端计算到故障点的反序环流分量电压相等,利用该关系可以求出故障点的精确位置。由于相互独立的12序分量完全能够解决线间耦合问题,文中提出的测距算法能够精确测距,测距精度不受故障类型影响。大量ATP仿真结果表明所提出的测距算法完全适用于同杆4回线的故障测距,测距精度不受过渡电阻、系统运行方式、线路两端功角的影响。 相似文献