国内光学测试仪器发展与现状思考

简要回顾了国内光学测试仪器发展史,论述了国内光学测试仪器发展现状的四个主要特征和五个方面的差距,以及造成差距的一些主要原因,提出了加快提升国内光学测试仪器竞争能力和堵住进口的三项对策.最后,对相关领导和管理者以及专家技术人员提出了五点建议.     

太阳能热水远程监控与能耗计量系统开发

阐述了太阳能热水工程的研究发展及特点,提出了太阳能热水远程监控与能耗计量系统的设计与实现方案,并且依据技术经济指标计算公式得到系统的节能减排数据。配备了具有GPRS/以太网模块的数据采集装置,开发了基于.Net平台的数据中心软件以及web发布平台,具有数据接收、处理、分析、查询等功能。应用结果表明,系统运行稳定,操作简单,数据可靠性高。     

基于阈值增量的动态眩光测量方法

通过分析阈值增量的评价标准得到影响其变化的基础分量为亮度信息和位置信息,提出了一种基于阈值增量的动态眩光测量方法,建立了实验测量系统.该系统利用图像采集器获取环境图像信息,通过图像亮度标定与双目摄像机的视觉特性分别获取图像亮度信息和三维坐标信息,实现对单帧图像阈值增量的计算,最后依据系统运算时间估算出系统的检测频率,并...     

激光剪切干涉用于在线表面测量的特性分析

为探讨和证明双折射晶体激光剪切干涉仪用于在线表面精密测量的可能性,推导了该干涉仪中光传输和实现表面测量的模型,分析了其抗振特性,模拟了相当的振动条件对其抗振特性进行实验测试.分析和实验证明了该干涉仪具有良好的抗振能力,适合应用于在线表面精密测量.     

基于智能相机的高速三维表面信息获取

为了大幅度提高三维信息获取速度,提出了一种基于智能相机和激光三角法的高速三维信息获取与表面重建的系统,介绍了该系统的硬件架构和信号处理。实验结果表明,采用数字信号处理器和并行处理方式,该系统获取三维表面信息速度可达5600点/s以上。     

Uncertainty in NIST Force Measurements

This paper focuses upon the uncertainty of force calibration measurements at the National Institute of Standards and Technology (NIST). The uncertainty of the realization of force for the national deadweight force standards at NIST is discussed, as well as the uncertainties associated with NIST’s voltage-ratio measuring instruments and with the characteristics of transducers being calibrated. The combined uncertainty is related to the uncertainty of dissemination for force transfer standards sent to NIST for calibration.     

国防军工计量人员管理系统分析与设计

国防军工计量人员管理系统是国防军工计量信息管理系统的一个子系统，它的目标和主要功能是通过不同的组合查询，打印与统计，提供国防军工计量技术机构各级计量管理人员，科研人员，检定人员及监督人员的年龄，素质等自然状况，为人员培训及持证上岗，人才流动的管理等提供咨询服务，本文从软件工程的角度较全面地描述了国防军工计量人员管理系统的分析与设计。     

In-proces sensors for surface roughness and their applications

Potential non-contact optical methods for in-process surface roughness measurement are described, including reflected light position detection, focu     

RM 8111: Development of a Prototype Linewidth Standard

Staffs of the Semiconductor Electronics Division, the Information Technology Laboratory, and the Precision Engineering Laboratory at NIST, have developed a new generation of prototype Single-Crystal CD (Critical Dimension) Reference (SCCDRM) Materials with the designation RM 8111. Their intended use is calibrating metrology instruments that are used in semiconductor manufacturing. Each reference material is configured as a 10 mm × 11 mm silicon test-structure chip that is mounted in a 200 mm silicon carrier wafer. The fabrication of both the chip and the carrier wafer uses the type of lattice-plane-selective etching that is commonly employed in the fabrication of micro electro-mechanical systems devices. The certified CDs of the reference features are determined from Atomic Force Microscope (AFM) measurements that are referenced to high-resolution transmission-electron microscopy images that reveal the cross-section counts of lattice planes having a pitch whose value is traceable to the SI meter.     

Fiber-optical measurement of form deviations of rotation-symmetric parts

The quality inspection of products poses a challenge towards existing production metrology techniques in terms of accuracy and speed, especially when it comes to inline or in-process measurements. In this terms, optical metrology proves its capabilities, in particular for sensible and fragile work pieces. For the inspection inside small spaces and cavities or for complex geometries, many optical metrology system are to inflexible or cannot be miniaturized enough. Within this work a set-up for a fiber-optic low-coherence interferometer system is described. Due to the high degree of miniaturization of the sensing probe, the system can be used for demanding measuring tasks like roundness of small drilling holes or the run-out of shafts. Different evaluation measurement are presented, which underline the potential of the described system for highly accurate, non-contact inspection of rotational parts.