TiO_2压敏陶瓷晶粒半导化

本文主要研究 TiO_2陶瓷晶粒半导化的途径及晶粒电阻率的测试方法。实验结果表明,通过掺入Nb_2O_5施主杂质可以有效地降低晶粒电阻率,并使 TiO_2系陶瓷具有良好的压敏特性。     

非线性半导体SiC微粉及其半导体漆（带）特性试验方法的研究

本文介绍了非线性半导体 SiC 微粉及其半导体漆(带)伏安特性的测量方法,以及用微机程序计算其非线性特征参数的方法,从而为研究新型防晕结构提供了科学有效的手段。     

Structural and optical properties of AIN sputtering deposited on sapphire substrates with various orientations

AIN thin films were deposited on c-,a-and r-plane sapphire substrates by the magnetron sputtering technique.The in-fluence of high-temperature thermal annealing (HTTA) on the structural,optical properties as well as surface stoichiometry were comprehensively investigated.The significant narrowing of the (0002) diffraction peak to as low as 68 arcsec of AIN after HTTA implies a reduction of tilt component inside the AIN thin films,and consequently much-reduced dislocation densities.This is also supported by the appearance of E2(high) Raman peak and better Al-N stoichiometry after HTTA.Furthermore,the in-creased absorption edge after HTTA suggests a reduction of point defects acting as the absorption centers.It is concluded that HTTA is a universal post-treatment technique in improving the crystalline quality of sputtered AIN regardless of sapphire orienta-tion.     

In-Situ Observation of SiC Bulk Single Crystal Growth by XRD System

In-situ analysis for SiC bulk single crystal growth was reported using vertical X-ray diffractometer system. A furnace for SiC sublimation growth combined with the XRD system which possessed three kinds of functions including topography, rocking curve measurement and crystal growth rate monitoring was developed. These functions could contribute as a powerful tool finding the optimum growth condition by dynamic observation in the crucible. In this study, the in-situ X-ray topographs succeeded to capture dynamic elongation of defects and dislocation generated in the SiC growing crystals. The in-situ rocking curve measurement reviled appearance of mosaic structure in the SiC crystal grown with high growth rate. The in-situ growth rate monitoring also succeeded very precisely using the direct X-ray beam absorption. On the base of findings and facts obtained by the in-situ observations, the importance for the SiC growth was discussed.     

(Sr,Ca)TiO_3系复合功能陶瓷的涂覆离子热扩散

采用碱金属离子液相涂覆热扩散方法,研究了涂覆离子、热扩散条件等对(Sr,Ca)TiO_3系陶瓷电性能的影响;用电子探针(EPA)分析了涂覆离子在晶粒边界的浓度分布;根据中间夹层的双 Schottky势垒模型,对测量出的C—V特性进行了计算和拟合,求得各种热扩散条件下的晶界势垒高度。讨论了扩散条件、电性能、晶界势垒之间的内在联系。     

Enhancement in crystallinity of poly(3-hexylthiophene) thin films prepared by low-temperature drop casting

Low-temperature casting of high molecular weight (HMW > 40 kDa) regioregular poly(3-hexylthiophene) (P3HT) is demonstrated to yield highly crystalline P3HT thin films with well defined and preferentially edge-on oriented [(100) contact plane] nanocrystallites on the pure and silanized Si/SiO₂ substrates. Transmission electron microscopy and X-ray diffraction provide evidence for the increase in preferential edge-on orientation of P3HT-conjugated backbone while decreasing the film preparation temperature below room temperature. The optimum growth temperature is about −12°C for the given concentration (2 mg/mL in CHCl₃). The reduced evaporation rate of the solvent results in a better selection of the thermodynamically stable orientation of nanocrystallites onto the substrate. The degree of preferential orientation and size of the crystallites can be further increased on n-octadecyltrichlorosilane-treated SiO₂ substrates as well as by annealing the films at 200°C for 1 h. © 2012 Wiley Periodicals, Inc. J Appl Polym Sci, 2012