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非线性半导体SiC微粉及其半导体漆(带)特性试验方法的研究 总被引:1,自引:0,他引:1
本文介绍了非线性半导体 SiC 微粉及其半导体漆(带)伏安特性的测量方法,以及用微机程序计算其非线性特征参数的方法,从而为研究新型防晕结构提供了科学有效的手段。 相似文献
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Xianchun Peng Jie Sun Huan Liu Liang Li Qikun Wang Liang Wu Wei Guo Fanping Meng Li Chen Feng Huang Jichun Ye 《半导体学报》2022,43(2):79-85
AIN thin films were deposited on c-,a-and r-plane sapphire substrates by the magnetron sputtering technique.The in-fluence of high-temperature thermal annealing (HTTA) on the structural,optical properties as well as surface stoichiometry were comprehensively investigated.The significant narrowing of the (0002) diffraction peak to as low as 68 arcsec of AIN after HTTA implies a reduction of tilt component inside the AIN thin films,and consequently much-reduced dislocation densities.This is also supported by the appearance of E2(high) Raman peak and better Al-N stoichiometry after HTTA.Furthermore,the in-creased absorption edge after HTTA suggests a reduction of point defects acting as the absorption centers.It is concluded that HTTA is a universal post-treatment technique in improving the crystalline quality of sputtered AIN regardless of sapphire orienta-tion. 相似文献
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Visual Immunoassays: Layered Aggregation with Steric Effect: Morphology‐Homogeneous Semiconductor MoS2 as an Alternative 2D Probe for Visual Immunoassay (Small 7/2018) 下载免费PDF全文
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In-situ analysis for SiC bulk single crystal growth was reported using vertical X-ray diffractometer system. A furnace for SiC sublimation growth combined with the XRD system which possessed three kinds of functions including topography, rocking curve measurement and crystal growth rate monitoring was developed. These functions could contribute as a powerful tool finding the optimum growth condition by dynamic observation in the crucible. In this study, the in-situ X-ray topographs succeeded to capture dynamic elongation of defects and dislocation generated in the SiC growing crystals. The in-situ rocking curve measurement reviled appearance of mosaic structure in the SiC crystal grown with high growth rate. The in-situ growth rate monitoring also succeeded very precisely using the direct X-ray beam absorption. On the base of findings and facts obtained by the in-situ observations, the importance for the SiC growth was discussed. 相似文献
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Thankaraj Salammal Shabi Souren Grigorian Martin Brinkmann Ullrich Pietsch Nils Koenen Navaphun Kayunkid Ullrich Scherf 《应用聚合物科学杂志》2012,125(3):2335-2341
Low-temperature casting of high molecular weight (HMW > 40 kDa) regioregular poly(3-hexylthiophene) (P3HT) is demonstrated to yield highly crystalline P3HT thin films with well defined and preferentially edge-on oriented [(100) contact plane] nanocrystallites on the pure and silanized Si/SiO2 substrates. Transmission electron microscopy and X-ray diffraction provide evidence for the increase in preferential edge-on orientation of P3HT-conjugated backbone while decreasing the film preparation temperature below room temperature. The optimum growth temperature is about −12°C for the given concentration (2 mg/mL in CHCl3). The reduced evaporation rate of the solvent results in a better selection of the thermodynamically stable orientation of nanocrystallites onto the substrate. The degree of preferential orientation and size of the crystallites can be further increased on n-octadecyltrichlorosilane-treated SiO2 substrates as well as by annealing the films at 200°C for 1 h. © 2012 Wiley Periodicals, Inc. J Appl Polym Sci, 2012 相似文献
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The Density of States and the Transport Effective Mass in a Highly Oriented Semiconducting Polymer: Electronic Delocalization in 1D 下载免费PDF全文
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