Adaptive investigation of the optical properties of polymer fibers from mixing noisy phase shifting microinterferograms using deep learning algorithms

In this article, an adaptive denoising method is suggested to accurate investigate the optical and structural features of polymeric fibers from noisy phase shifting microinterferograms. The mixed class of noise that may produce in the phase-shifting interferometric techniques is established. To our knowledge, this is an early study considered the mixing noises that may occur in microinterferograms. The suggested method utilized the convolution neural networks to detect the noise class and then denoising, it according to its class. Four convolution neural networks (Googlenet, VGG-19, Alexnet, and Alexnet–SVM) are refined to perform the automatic classification process for the noise class in the established data set. The network with the highest validation and testing accuracy of these networks is considered to apply the suggested method on realistic noisy microinterferograms for polymeric fibers, polypropylene and antimicrobial polyethylene terephthalate)/titanium dioxide, recoded using interference microscope. Also, the suggested method is applied on noisy microinterferograms include crazing and nanocomposite material. The demodulated phase maps and the three-dimensional birefringence profiles are calculated for tested fibers according to the suggested method. The obtained results are compared with the published data for these fibers and found to be in good agreements.     

2种灰色模型在矿区地表沉陷预计中的适用性

目前矿区地表单点沉陷动态预计方法主要基于传统的水准测量数据,监测方法单一,成本高,观测点易破坏,不能保证地表形变信息的实时性,且采用灰色模型进行地表沉陷预计时只针对单一模型的应用,没有结合模型自身特点分析其适用性。以袁店二矿7221工作面为试验区域,采用合成孔径雷达差分干涉测量技术监测矿区地表沉陷量,分别建立了描述沉陷量与时间关系的GM(1,1)与灰色Verhulst模型进行地表沉陷量预计,实现了矿区地表沉陷监测与动态预计一体化。通过比较、分析GM(1,1)与灰色Verhulst模型对地表沉陷量的拟合及预计结果,得出了2种灰色模型在矿区地表沉陷预计中的适用性:在矿区开采沉陷开始至活跃前期,若地表单点沉陷量曲线呈近似单峰型,则宜采用GM(1,1)进行短期预计;当矿区地表沉陷进入衰退阶段,单点沉陷量曲线呈平底饱和状态,则宜采用灰色Verhulst模型进行中长期预计。     

Diagnosis of the surface morphology of laser-ablated materials using the weighted- DCT approach in laser speckle interferometry for application to plasma facing materials

To implement on-line, real-time monitoring for the surface morphology of Plasma-Facing Materials (PFMs) in tokamak, we developed a Laser Speckle Interferometry measurement approach. A laser ablation method was used to simulate the erosion process during Plasma-Wall Interactions in a tokamak. In the present investigation, we evaluated the results of laser ablation morphology changes on the surface of Mo material reconstructed by four different approaches (Flood-fill, Quality-guided, Discrete Cosine Transform (DCT) and Weighted-DCT). The morphology results measured by the weighted-DCT approach are very close to the measurement results from confocal microscopy with an average error rate within 7%. It is verified that the weighted-DCT algorithm has high accuracy and can efficiently reduce the influence of noise pollution coming from laser ablation, which is used as a proxy for erosion from plasma wall interaction. Additionally, the CPU computer time has been shortened. This is of great significance for the real-time monitoring of PFMs’ morphology in the Experimental Advanced Superconducting Tokamak (EAST) in the future.     

Facile Morphological Qualification of Transferred Graphene by Phase-Shifting Interferometry

Post-growth graphene transfer to a variety of host substrates for circuitry fabrication has been among the most popular subjects since its successful development via chemical vapor deposition in the past decade. Fast and reliable evaluation tools for its morphological characteristics are essential for the development of defect-free transfer protocols. The implementation of conventional techniques, such as Raman spectroscopy, atomic force microscopy (AFM), and transmission electron microscopy in production quality control at an industrial scale is difficult because they are limited to local areas, are time consuming, and their operation is complex. However, through a one-shot measurement within a few seconds, phase-shifting interferometry (PSI) successfully scans ≈1 mm² of transferred graphene with a vertical resolution of ≈0.1 nm. This provides crucial morphological information, such as the surface roughness derived from polymer residues, the thickness of the graphene, and its adhesive strength with respect to the target substrates. Graphene samples transferred via four different methods are evaluated using PSI, Raman spectroscopy, and AFM. Although the thickness of the nanomaterials measured by PSI can be highly sensitive to their refractive indices, PSI is successfully demonstrated to be a powerful tool for investigating the morphological characteristics of the transferred graphene for industrial and research purposes.     

林分平均高度卫星遥感新进展

林分平均高度是生态系统模型重要的输入参数之一,与生物量估算与碳循环研究高度相关。通过系统回顾林分平均高度研究的发展历史和最新进展,总结了不同传感器林分平均高度(SAR树高与LiDAR冠层高度)研究的主要模型和方法,通过单一传感器技术进行林分平均高度研究的内在特征的不同,分析了多传感器的区域林分平均高度联合反演方法的优劣性,并从科学发展趋势和社会需求出发,认识目前存在的主要问题与难点及未来面临的挑战和机遇,为今后更好地进行森林垂直结构和全球碳循环研究提供思路和借鉴。     

Forest parameters retrieval with dual-baseline polarimetric SAR interferometry based on clustering analysis

Forest parameters inversion is an important application of Polarimetric Synthetic Aperture Radar Interferometry(PolInSAR). To resolve the volume decorrelation coefficient ambiguity of single-baseline PolInSAR, a new dual-baseline PolInSAR approach is proposed in this paper. The correlation of dual-baseline data is fully investigated to resolve the ambiguity problem effectively, and the performance of the proposed approach is proved to be of great robustness in a very small baseline ratio system. Finally, experimental results with ESA dual-baseline PolInSAR simulated data validate the effectiveness and robustness of the proposed approach.     

Study of aging behavior of 9/70/30 and 9/65/35 PLZT by optical interferometric technique

In this work Pb_0.91La_0.09(Zr_0.70Ti_0.30)_0.9775O₃ PLZT (9/70/30) and Pb_0.91La_0.09(Zr_0.65Ti_0.35)_0.9775O₃ PLZT (9/65/35) ceramics were prepared at four different sintering temperatures by solid solution method. The samples were aged by keeping at room temperature for 19 days. After the aging process, structural and electrical properties of the samples were studied using Modified Michelson Interferometer, LCR meter and X-ray diffraction. The effect of the Zr/Ti ratios on the dielectric and ferroelectric properties was also investigated. The aged PLZT (9/70/30) showed pinched P–E loop and remnant strain in rhombohedral phase, while PLZT (9/65/35) showed distort s–E shape implying non-180° domain in tetragonal phase.     

Unraveling the film-formation kinetics of interfacial polymerization via low coherence interferometry

Interfacial polymerization (IP) is one of the most important methods for fabricating thin film composite (TFC) membranes. Understanding the film-formation mechanisms is of great value for developing membranes with enhanced performance. This work proposed a novel method to in situ characterize the film-formation kinetics via low coherence interferometry (LCI). The polyamide film formed at the liquid–substrate interface was scanned in real time; the polymerization induced significant variations in the optical properties around the reaction zone. After mitigating the effects of the perturbed interface, the surface-averaged intensity profiles provide a solid basis for analyzing the film-formation kinetics at various depths. In particular, the effects of the monomer concentrations were investigated to reveal the asymmetric growth and development of irregular substructures. All the characterization results confirm that the LCI-based characterization is a powerful tool for studying the structural evolution of the IP layer and thereby providing deeper insights for optimizing TFC membranes.     

Development of surface reconstruction algorithms for optical interferometric measurement

Optical interferometry is a powerful tool for measuring and characterizing areal surface topography in precision manufacturing. A variety of instruments based on optical interferometry have been developed to meet the measurement needs in various applications, but the existing techniques are simply not enough to meet the ever-increasing requirements in terms of accuracy, speed, robustness, and dynamic range, especially in on-line or on-machine conditions. This paper provides an in-depth perspective of surface topography reconstruction for optical interferometric measurements. Principles, configurations, and applications of typical optical interferometers with different capabilities and limitations are presented. Theoretical background and recent advances of fringe analysis algorithms, including coherence peak sensing and phase-shifting algorithm, are summarized. The new developments in measurement accuracy and repeatability, noise resistance, self-calibration ability, and computational efficiency are discussed. This paper also presents the new challenges that optical interferometry techniques are facing in surface topography measurement. To address these challenges, advanced techniques in image stitching, on-machine measurement, intelligent sampling, parallel computing, and deep learning are explored to improve the functional performance of optical interferometry in future manufacturing metrology.