云测试综述

针对云计算的定义及云计算的特点做出分析。认为云计算有着良好的发展趋势,并在次基础上展开对云测试的讨论,主要涉及云测试的特点、优点、应用现状,云测试平台以及云测试技术,并探讨云测试的对现有测试服务模式的影响及存在的缺陷,预测云测试的发展趋势。     

货运通道控制系统设计与实现

本文介绍了一种应用于出口加工区的货运通道控制系统的设计思路与实现方法。该系统作为出口加工区的卡口控制管理系统的前台部分,主要实现对过往车辆的集装箱号与电子车牌的识别、数据查验比对和外围设备控制等功能。     

基于测度贴近度的电子剪切散斑轮胎检测

本文把测度贴近度的概念引进到电子剪切散斑检测中,提出了一种基于测度贴近度的条纹形成算法。该算法大大地消除了条纹可见度对光照强度的依赖,提高了电子剪切散斑无损检测对工业环境的适应性,并且该算法可以在条纹产生的同时对其进行滤波,减轻了后续工作。本文从数学分析和实验两个角度证实了该算法的以上特点。     

The Distribution of the Maximum Sum of Rank

In this paper a c-sample slippage analogue of the Wilcoxon [11] test is considered. Given a sample of size n for each of c populations, the test rejects the hypothesis that the c populations are identical when max_1≤i≤c σ _k r _ik > λ, where r _i1, …, r _in are the ranks of the observations from the i-th population in the combined sample of size cn. The small and large sample distributions of the test statistic are derived. Tables of the exact distribution are given for c = 2(1)5, n = 2(1)5. Tables of critical values are given for c = 2(1)6, n = 2(1)8 for values of α = 0.001, 0.005, 0.01, 0.025, 0.05, 0.10, and 0.20.     

V5.x协议测试系统

首先概述了 V5 .x接口的功能及 V5 .x协议的结构 ,在此基础上 ,详细阐述了在 PC机上实现 V5 TS (V5 .x协议测试系统 )的测试原理及方法。最后 ,通过一个测试举例 ,描述协议消息的传输过程。     

多种燃料转子机高压共轨喷油器试验装置的研制与应用

多种燃料转子发动机高压共轨喷油器试验装置由控制逻辑电路和功率驱动电路两部分组成,可对喷油器的响应时间、保持电流及流量特性等参数分别进行测试.试验装置的全部功能完全由硬件实现,结构简单,工作可靠.在此基础上,将该装置直接应用于柴油高压共轨转子发动机电控系统,成功地完成了着车试验.     

新型模块组合式温控器测试仪的研制

本文分析了温控器测试仪存在的主要问题,针对这些问题,提出了优化设计方案,并且介绍了最新开发成功的模块组合式温控器测试仪的主要性能。     

Explosion－insulated Full Optical Fiber Diferential－presure Measuring Instrument

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Subtle gate oxide defect elimination to improve the reliability of a 32M-bit SRAM product

Tiny defects may escape from in-line defect scan and pass WAT (Wafer Acceptance Test), CP (Chip Probing), FT (Final Test) and SLT (System Level Test). Chips with such kind of defects will cause reliability problem and impact revenue significantly. It is important to catch the defects and derive the prevention strategy earlier in the technology development stage. In this paper, we investigate an SRAM with tiny defects which passed in-line defect scan, WAT, CP and FT but failed in HTOL (High Temperature Operation Life) test, one of the product reliability qualification items. FA (Failure Analysis) reveals gate oxide missing defect is the root cause. The goal is to pass reliability qualification and release product into production on schedule. The failure mechanism, optimization of gate oxide process, enhancement of defect scan and testing methodology will be introduced. Experiment results show very good HTOL performance by the combination of process and testing optimization.     

红外小光点扫描测试系统

介绍了中波和长波“红外小光点扫描测试系统”。该系统由红外聚焦光学子系统，六维精密扫描工件台及数据采集子系统构成。可用于红外焦平面器件重要性能参数如串音、响应均匀性、转移效率的测量，也可用于单元红外探测器有效响应面积和响应均匀性等参数的测量。