在不断创新中开创新的百年——水口山有色金属集团有限公司110年创新发展历程和展望

回顾了水口山有色金属集团有限公司的发展历程，概述了取得的技术进步和主要成就．提出了企业今后的发展方向。     

An automated coding and classification system with supporting database for effective design of manufacturing systems

The philosophy of group technology (GT) is an important concept in the design of flexible manufacturing systems and manufacturing cells. Group technology is a manufacturing philosophy that identifies similar parts and groups them into families. Beside assigning unique codes to these parts, group technology developers intend to take advantage of part similarities during design and manufacturing processes. GT is not the answer to all manufacturing problems, but it is a good management technique with which to standardize efforts and eliminate duplication. Group technology classifies parts by assigning them to different families based on their similarities in: (1) design attributes (physical shape and size), and/or (2) manufacturing attributes (processing sequence). The manufacturing industry today is process focused; departments and sub units are no longer independent but are interdependent. If the product development process is to be optimized, engineering and manufacturing cannot remain independent any more: they must be coordinated. Each sub-system is a critical component within an integrated manufacturing framework. The coding and classification system is the basis of CAPP and the functioning and reliability of CAPP depends on the robustness of the coding system. The proposed coding system is considered superior to the previously proposed coding systems, in that it has the capability to migrate into multiple manufacturing environments. This article presents the design of a coding and classification system and the supporting database for manufacturing processes based on both design and manufacturing attributes of parts. An interface with the spreadsheet will calculate the machine operation costs for various processes. This menu-driven interactive package is implemented using dBASE-IV. Part Family formation is achieved using a KAMCELL package developed in TURBO Pascal.     

匿名技术的研究进展

对匿名技术的研究情况进行了综述。统一给出了关联性、匿名性、假名等概念,探讨了Crowds、洋葱路由、Mix nets等匿名通信的实现机制,介绍了有关的研究进展,指出了匿名性度量、环签名和群签名等匿名签名算法、匿名应用中信赖的建立等技术中需要进一步研究的问题。     

关于电视群信号对光纤副载波调频传输中的信噪比平衡问题的分析

本文对微波副载波用电视群信号调频的光纤传输中的信噪比平衡问题进行了分析,推导出VSB-AM信号在解调后的信噪比表达式,引入了信噪比恶化系数的概念.为了实现多路VSB-AM信号间的信噪比的平衡,相应的微波副载波频偏应有确定的比例关系.     

一个安全有效的身份鉴别协议与对应的数字签名方案

本文利用二元一次不定方程和Schnorr身份鉴别协议，构造出一个新的身份鉴别协议，该协议在RSA问题和离散对数问题是难解的假设下是安全的，同时给出了所对应的数字签名方案。     

基于Lotus Notes软件平台创建江铜办公自动化系统

本文介绍利用LotusNotes软件平台的电子邮件、复合文档数据库、工作流和完全的Client/Server技术 ,建立一个以开放、先进的Intranet/web及消息传递和工作流管理技术为核心的新一代全方位网络办公自动化系统。     

深大露天矿综合开采工艺主要设计参数的研究

深大露天矿的间断向半连续开采工艺过渡时，合理深度及半连续开采工艺的移设步距是两个重要的开采参数，对矿山的经济效果影响巨大，本文首次提出采用组合台阶单位体的开采来分析确定这两个重要的参数，得到的结论在霍林河煤矿的应用中取得了满意的结果，对其它类似矿山具有应用价值。     

Trade-offs in scan path and BIST implementations for RAMs

In this article we propose efficient scan path and BIST schemes for RAMs. Tools for automatic generation of these schemes have been implemented. They reduce the design effort and thus allow the designer to select the more appropriate scheme with respect to various constraints.     

Zero aliasing ROM BIST

Signature analyzers are very efficient output response compactors for BIST design. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this article, in order to increase the effectiveness of ROM BIST, we take advantage from the simplicity of the error patterns generated by ROMs and we show that aliasing free signature analysis can be achieved in ROM BIST.This work was performed when the author was on leave from Minsk Radio Engineering Institute, Computer Department, Belorus.     

Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme

Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods, especially in a BIST structure. To fully exploit these advantages a suitable choice of the pseudo-random input parameters should be done and an investigation on the accuracy of the circuit response samples needed to reduce the risk of misclassification should be carried out. Here these issues have been addressed for a testing scheme based on the estimation of the impulse response of the device under test (DUT) by means of input-output cross-correlation. Moreover, new acceptance criteria for the DUT are suggested which solve some ambiguity problems arising if the classification of the DUT as good or bad is based on a few samples of the cross-correlation function. Examples of application of the proposed techniques to real cases are also shown in order to assess the impact of the measurement system inaccuracies on the reliability of the test.