Good dielectric performance and broadband dielectric polarization in Ag,Nb co-doped TiO2

Due to the demand of miniaturization and integration for ceramic capacitors in electronic components market, TiO₂-based ceramics with colossal permittivity has become a research hotspot in recent years. In this work, we report that Ag⁺/Nb⁵⁺ co-doped (Ag_1/4Nb_3/4)_xTi_1−xO₂ (ANTOx) ceramics with colossal permittivity over a wide frequency and temperature range were successfully prepared by a traditional solid–state method. Notably, compositions of ANTO0.005 and ANTO0.01 respectively exhibit both low dielectric loss (0.040 and 0.050 at 1 kHz), high dielectric permittivity (9.2 × 10³ and 1.6 × 10⁴ at 1 kHz), and good thermal stability, which satisfy the requirements for the temperature range of application of X9R and X8R ceramic capacitors, respectively. The origin of the dielectric behavior was attributed to five dielectric relaxation phenomena, i.e., localized carriers' hopping, electron–pinned defect–dipoles, interfacial polarization, and oxygen vacancies ionization and diffusion, as suggested by dielectric temperature spectra and valence state analysis via XPS; wherein, electron-pinned defect–dipoles and internal barrier layer capacitance are believed to be the main causes for the giant dielectric permittivity in ANTOx ceramics.     

电网设备线夹开裂原因

某电力公司变电站用铝合金设备线夹在运行过程发生批次开裂事故,通过宏观观察、断口分析、化学成分分析、力学性能测试、冷冻模拟试验等方法,对设备线夹的开裂原因和开裂机理进行了分析。结果表明:设备线夹焊缝存在焊接缺陷,导致焊缝强度下降;设备线夹接线管底部存在积水空间,寒冷天气下积水结冰,体积膨胀,使焊缝承受设计工况外的负载而过载开裂,造成了线夹开裂。     

基于改进相干增强扩散与纹理能量测度和高斯混合模型的导光板表面缺陷检测方法

针对液晶屏(LCD)导光板表面缺陷检测方法存在漏检率和误检率较高,对产品表面复杂渐变的纹理结构适应性差的问题,提出一种基于改进相干增强扩散(ICED)与纹理能量测度和高斯混合模型(TEM-GMM)的LCD导光板表面缺陷检测方法。首先,构建ICED模型,基于结构张量引入平均曲率流扩散(MCF)滤波,使得相干增强扩散(CED)模型对缺陷的细线状纹理有良好的边缘保持效果,并利用相干性得到缺陷纹理增强和背景纹理抑制的滤波后图像;然后,根据Laws纹理能量测度(TEM)提取图像纹理特征,将图像的背景纹理特征作为离线阶段高斯混合模型(GMM)的训练数据,使用期望最大化(EM)算法估计GMM参数;最后,计算待检测图像各像素的后验概率,并将其作为在线检测阶段缺陷像素的判断依据。实验结果表明,该检测方法在导光颗粒随机、规则两种分布的缺陷图像测试数据组上的漏检率和误检率分别为3.27%、4.32%和3.59%、4.87%。所提检测方法适用范围广,可有效检测出LCD导光板表面划痕、异物、脏污和压伤等类型的缺陷。     

某X65钢级输气管道环焊缝泄漏失效分析

针对某X65输气管道环焊缝泄漏失效问题，通过无损探伤、硬度试验、金相组织分析、扫描电镜分析等方法，对钢管环焊缝进行了分析研究。分析结果显示，焊接接头组织未见明显异常，但裂纹附近存在疏松组织，该疏松组织主要元素为铁和氧，以及少量铝、硅、钙、硫元素。研究表明，该疏松组织为焊接时未清理干净的焊渣，在外力和内压作用下，夹渣处裂纹相互贯穿形成穿透性裂纹，裂纹由内表面向外表面扩展，导致焊缝产生开裂而发生泄漏。     

双金属复合管缺陷弱磁检测影响因素仿真分析

应用ANSYS有限元软件对双金属复合管弱磁检测技术进行仿真,通过改变管道腐蚀面积、腐蚀深度、管道裂纹形状以及设置管道多缺陷组合,得到磁感应强度变化规律,分析不同缺陷对弱磁检测技术的影响。结果表明:磁感应强度变化规律不仅与裂纹形状的改变有一定的关系,且与管道腐蚀深度的改变有较大的关系,而腐蚀面积的改变以及多缺陷组合两种情况对磁感应强度变化规律影响较小。     

GaN中质子辐照损伤的分子动力学模拟研究

本文利用分子动力学方法研究了GaN在质子辐照下的损伤。对不同能量（1~10 keV）初级离位原子（PKA）引起的级联碰撞进行了研究，分析了点缺陷与PKA能量的关系、点缺陷随时间的演化规律、点缺陷的空间分布及点缺陷团簇的尺寸特征。研究结果表明，点缺陷的产生与PKA能量呈线性关系，不同类型的点缺陷随时间演化规律相似，点缺陷多产生在PKA径迹旁，点缺陷团簇多为孤立的点缺陷和小团簇。     

Origin of the temperature stability of dielectric constant in CaCu3Ti4O12

The temperature and dc bias stability of the dielectric constant and loss tangent of CaCu₃Ti₄O₁₂ samples sintered under different oxygen atmospheres are discussed. The results suggest that the metal-oxygen vacancy related defects not only provide the charge carriers for the conduction (defect doping) but also contribute to the huge permittivity in the way of defect dipoles repositioning under charge carrier hopping. The charge localization in a specific copper-oxygen vacancy defect complex is the reason of the huge and stable permittivity and low dielectric loss in the middle temperature range, 90 K-200 K (20 Hz), while the implementation of the large barrier layer height needs a contribution by the titanium oxygen vacancy related trap charges in the grain boundaries, which also lead to a second permittivity stable range in a higher temperature range 200 K–300 K.     

高熵合金的抗辐照性能研究进展

高熵合金作为一种新型多主元固溶体合金，成分复杂、全局无序，且具有多主元效应，表现出较为优异的综合性能，有望作为新型抗辐照结构材料应用于先进核能反应堆系统。本文介绍了目前高熵合金抗辐照性能的研究现状，主要涉及高熵合金辐照缺陷演化、微观结构变化和性能退化等辐照损伤演化过程，梳理了多主元效应对辐照损伤演化过程的影响规律。针对高熵合金的抗辐照性能研究，总结了目前高熵合金的几种抗辐照损伤机制，归纳了高熵合金抗辐照性能研究存在的问题，以及对高熵合金后续的研究方向进行了展望。