基于可靠性评价的含缺陷核压力管道疲劳寿命预测方法

含缺陷压力管道经缺陷评定合乎使用后,其疲劳寿命的估计具有重要的工程意义。将整个含缺陷压力管道作为一个整体,分析了含缺陷压力管道的疲劳裂纹扩展特点,提出了相应的含缺陷压力管道疲劳寿命的计算过程,并在基于可靠性评价的基础上,给出了核压力管道的可接受失效概率,最终得到了含缺陷核压力管道疲劳寿命预测方法。     

Thermodynamic modeling of native point defects and dopants of GaN semiconductors

A thermodynamic modeling of GaN was carried out to describe the thermodynamic behavior of native defects, dopants, and carriers (free electrons and holes) in GaN semiconductors. The compound energy model (CEM) was used. An unintentionally doped GaN was taken as an example. Oxygen was introduced into the model as the unintentionally doped impurity, according to the practical experimental phenomena. The energies of component compounds in the model were defined based on the results of the ab initio calculations and adjusted to fit experimental data. The thermodynamic properties of the defects and the oxygen doped were calculated to show the facility of the model.     

Highly oriented star-like patterns observed on GaSe epilayers grown on Si(111)

Epitaxial lamellar gallium selenide (GaSe) semiconductors have been grown on trench-patterned silicon (Si) substrates by molecular beam epitaxy. An intriguing star-like patterned morphology was identified by atomic force microscopy on these epilayers. This non-trivial feature can be correlated with the accumulation of stacking faults of two concurrent epitaxial domains around self-oriented triangular pits developed earlier on the Si(111) surface by the chemical etching. Crystallographic considerations show how the stars can be formed.     

注氢硅中微结构缺陷的TEM观察

通过透射电子显微镜观察到注氢硅片中存在损伤带，损伤带的位置和注人氢的分布几乎一致，推断损伤带是由于氢的注入引起的。损伤带内主要以平行于正表面的{111}面状缺陷为主，另外还有斜交于正表面的{111}面状缺陷以及{100}面状缺陷，这是由于氢朝能量低的位置的迁移聚集而形成的。在损伤带的中间还可见到晶格紊乱团块和空洞，这是由于损伤带中间存在高浓度的氢和高密度的面状缺陷面导致形成的。     

论普通型胶辊表面不处理的合理工艺参数

论述了普通胶辊表面不处理的性能特点和存在问题，技术措施和合理工艺参数，提高了成纱条干水平，减少缠绕和磨损。     

Relaxation phenomena caused by equilibration of point defects

Relaxation phenomena due to equilibration of point defects in metals are reviewed. The relaxation effect in specific heat observed in tungsten and platinum confirms that in both cases the nonlinear increase in the high-temperature specific heat has to be attributed to point-defect formation. Relaxation phenomena observed by measurements of electrical resistivity and positron annihilation are also considered. The comparison of the data seems to be favorable for the conclusion that all the phenomena are of one origin.     

Effect of Forming Pressure on the Internal Structure of Alumina Green Bodies Examined with Immersion Liquid Technique

Green bodies prepared by compaction of alumina granules were made transparent by an immersion liquid technique, and the internal structure was characterized with an optical microscope to study the effect of forming pressure on the internal structure. Clear images obtained by the technique provide more detailed information than other existing methods for structures ranging from one to tens of micrometers. Intergranular pores were present between unfractured granules. Their sizes and concentration tended to decrease with increasing forming pressure. However, pores were clearly present even in the green body prepared at 600 MPa. A rod- and needlelike feature was also found and was concluded to correspond to a high-density region. The significance of large pores and high-density regions on processing as well as the details of the technique is discussed.     

Shallow hydrogen-induced donor in monocrystalline silicon and quantum wires

Electrical and optical properties of bistable shallow donors in monocrystalline silicon, which are introduced by proton implantation followed by annealing at 450 °C, have been studied. The temperature dependences of equilibrium and non-equilibrium carrier concentration and relaxation kinetics were investigated. IR absorption lines of bistable shallow donor electronic excitations were detected. The obtained experimental data demonstrate that the bistable shallow donors can be identified as quantum wire defect nanoclusters.     

Changes in Aging Behavior and Defect Structure of Yttria-Fully-Stabilized ZrO2 with Sc2O3 Doping

Methods of suppressing decreased conductivity in 8 mol% Y₂O₃-stabilized–92 mol% ZrO₂ (8YSZ) with aging were investigated. Different amounts of Sc₂O₃ were doped into 8YSZ. The electrochemical properties of Sc₂O₃-doped 8YSZ were measured, and the microstructural and local structural changes were characterized. The present results indicate that an appropriate amount of Sc₂O₃ doping, 3 or 4 mol%, effectively suppresses decreased conductivity with aging in 8YSZ.