Quasi three-dimensional, n-bit optical memory based on the ellipsometric principle: model calculations

Model calculations on the ellipsometric memory are presented. The ellipsometric memory is an n-bit optical memory whose information is extracted by use of the ellipsometric principle. The memory cells of the device consist of thin-film multilayer structures, and the information of each memory cell is contained in the optical properties of the thin films. Several thin-film multilayer structures were examined in order to find out how different choices of layer materials and other system parameters such as layer thicknesses and wavelength affect resolutions and limitations of the ellipsometric memory. Such calculations are also useful for optimizing the readout resolution. It was found that it is possible to use memory cells having up to at least eight layers, which would permit 8-bit words to be stored at each location. It was also found that, in principle, several types of materials can be used as layer materials, and various aspects of different choices of materials are discussed.     

Democratic Legitimacy of New Forms of Water Management in the Netherlands

Due to changes in the Dutch flood management paradigm, governance practices have been shifting from technocratic and state-oriented towards more collaborative governance approaches in which many governmental actors, together with private and societal actors, search out integral solutions. This shift has had an impact on how water management is legitimized. This paper evaluates two water governance processes that reflect the new management paradigm in different ways, and analyzes how these changing paradigms influence the democratic legitimacy of water governance. It is concluded that the extent to which the new paradigm is implemented influences the way in which democratic legitimacy is organized. It is also shown that new forms of democratic legitimacy do not replace existing ones but rather contribute to hybrid and contextualized forms of legitimacy.     

Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films

Carbon nitride (CN_x) and amorphous carbon (a-C) thin films are deposited by reactive magnetron sputtering onto silicon (001) wafers under controlled conditions to achieve amorphous, graphitic and fullerene-like microstructures. As-deposited films are analyzed by Spectroscopic Ellipsometry in the UV-VIS-NIR and IR spectral ranges in order to get further insight into the bonding structure of the material. Additional characterization is performed by High Resolution Transmission Electron Microscopy, X-ray Photoelectron Spectroscopy, and Atomic Force Microscopy. Between eight and eleven resonances are observed and modeled in the ellipsometrically determined optical spectra of the films. The largest or the second largest resonance for all films is a feature associated with C-N or C-C modes. This feature is generally associated with sp³ C-N or sp³ C-C bonds, which for the nitrogen-containing films instead should be identified as a three-fold or two-fold sp² hybridization of N, either substituted in a graphite site or in a pyridine-like configuration, respectively. The π→π? electronic transition associated with sp² C bonds in carbon films and with sp² N bonds (as N bonded in pyridine-like manner) in CN_x films is also present, but not as strong. Another feature present in all CN_x films is a resonance associated with nitrile often observed in carbon nitrides. Additional resonances are identified and discussed and moreover, several new, unidentified resonances are observed in the ellipsometric spectra.     

Optimization of azimuth angle settings in polarizer-compensator-sample-analyzer off-null ellipsometry

The dependence of the azimuth angle settings on the change in off-null intensity of a polarizer-compensator-sample-analyzer ellipsometer owing to changes in sample properties is studied. First, a closed-form expression for the relationship between azimuth angles that fulfill the null condition is presented. An approximation for the off-null light intensity near null that is valid for small changes of the p- and s-reflection coefficients of an isotropic sample is then derived. This approximation shows that the intensity change near the null can be described by changes in the ellipsometric parameters tan phi and A only. Expressions for finding the azimuth angle that gives the maximum possible intensity change for a given change in the sample parameters are also derived. The importance of optimization of azimuth angle settings for different samples is investigated and found to depend on tan psi. Numerical and experimental results chosen from the investigation of gas sensors based on porous silicon are included to verify the approximations as well as the optimization.     

Transport of mineral oil components to groundwater—II influence of lime, clay and organic soil components on the rate of transport

The adsorption of a model compound and of oil components on lime, clay and organic soil components is discussed. It is demonstrated that adsorption may reduce the total amount of oil transport to groundwater, reduce concentrations and delay transport. It is further shown that persistent smells, originating from these physical processes, are to be expected mainly when oil components in a boiling range of 175–350°C (gas oil) are involved.     

Optimization of off-null ellipsometry in sensor applications

The optimization of azimuth angle settings of a polarizer-compensator-sample-analyzer off-null ellipsometric sensor system to obtain maximum intensity changes with respect to changes in the properties of a sensing layer, with and without considering changes in s reflectance, is studied. Optimal conditions in the two cases are derived analytically under the assumption that linear relationships exist among the changes in the parameters of the sensing layer. The validity of these optimal conditions is verified by numerical examples. The advantage of using ellipsometry compared with reflectometry to readout sensing information for some sensing samples is also discussed.     

Optical properties of thin films of mixed Ni-W oxide made by reactive DC magnetron sputtering

Thin films of Ni_xW_1 − x oxides with x = 0.05, 0.19, 0.43 and 0.90 were studied. Films with thicknesses in the range 125-250 nm were deposited on silicon wafers at room temperature by reactive DC magnetron co-sputtering from targets of Ni and W. The films were characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM), and spectroscopic ellipsometry (SE). XRD spectra and SEM micrographs showed that all films were amorphous and possessed a columnar structure. The ellipsometric angles Ψ and Δ of as-deposited films were measured by a rotating analyzer ellipsometer in the UV-visible-near infrared range (0.63-6.18 eV) and by an infrared Fourier transform rotating compensator ellipsometer in the 500-5200 cm⁻¹ wavenumber range. SE measurements were performed at angles of incidence of from 50 ° to 70 °. Parametric models were used to extract thicknesses of the thin films and overlayers of Ni_xW_1 − x oxide at different compositions, band gaps and optical constants. Features in the optical spectra of the Ni_xW_1 − x oxides were compared with previous data on tungsten oxide, nickel oxide and nickel tungstate.     

Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer

Optical and structural properties of a hybrid metallic chevron sculptured thin film from titanium coated with the semiconducting polymer poly(3-dodecylthiophene) (P3DDT) are reported. The nanostructured thin film with two subsequent layers of oppositely slanted nanocolumns was fabricated by glancing angle deposition and coated with P3DDT by a spin-cast process. Spectroscopic generalized ellipsometry is employed to determine geometrical structure properties and the anisotropic optical constants of the coated and uncoated film in the spectral range from 400 to 1700 nm. The nanostructured thin films before and after hybridization show highly anisotropic optical properties. The complex refractive indices along major polarizability directions of the hybridized chevrons are increased in the entire investigated spectral range with respect to the as-deposited chevrons. Changes in birefringence and dichroism upon polymer infiltration are observed.