Features of the magnetic properties of Co/Si/Co thin-film systems

The magnetic properties of Co/Si/Co thin-film structures grown by magnetron sputtering have been studied using magnetooptical techniques. It is established that the saturation field (H _S) of trilayers exhibits oscillations as a function of the thickness of the semiconductor (silicon) interlayer. This behavior is explained by structural features of the Co/Si/Co system and the presence of antiferromagnetic exchange coupling between magnetic layers via the silicon interlayer.     

Influence of quantum confinement on magnetic properties of Fe/Mo/Fe and Fe/Ta/Fe thin-film systems

The magnetic properties of Fe/NML/Fe thin-film structures with Mo and Ta non-magnetic layers (NMLs) grown by magnetron sputtering have been studied using magnetooptical techniques. It is established that the saturation field (H _S) of the samples exhibits oscillations as a function of the NML thickness (t _NML) and the period of oscillations depends on the thickness of iron layers. This behavior of H _S(t _NML) is explained by the oscillatory character of exchange coupling between the ferromagnetic layers.     

Influence of Magnetochemical Treatment on Morphology and Magnetic Properties of FeN Films

The results on investigation of the magnetochemical effect on morfology and magnetic properties of FeN thin-film systems are presented.It was established that the chemical etching of the FeN samples in the presence of a magnetic field influences strongly on both surface morphology and their magnetic properties.In particular,the local values of the saturation field of the chemically treated FeN thin-film systems differ significantly as compared to the as-deposited samples.This fact was explained by the appearance of relief inhomogeneities on surface of the studied samples,which intensified the stray fields influence on the measured magnetic characteristics.