Technology-transfer analysis of the materials research program “Matfo”

The commercial success of the German Federal Ministry's materials research program “Mafto” (1985–1994) was recently evaluated to determine the effectiveness of the direct-funding model in supporting innovative industrial research. Based on the results of a questionnaire, where a 97% return rate was achieved, it was found that the results obtained in 27% of the projects have already been commercialized to some degree, for 26% of the projects a commercialization of the results is planned but has not yet taken place, and for 54% of the projects no commercialization is planned. This study included only projects where at least four years had elapsed since project completion. The reasons why scientifically and technically successfully projects were not commercialized were also surveyed.     

Dynamic Complexity Theory Revisited

Dynamic complexity investigates the required effort to maintain knowledge about a property of a structure under changing operations. This article introduces a refined notion of dynamic problems which takes the initial structure into account. It develops the basic structural complexity notions accordingly. It also shows that the dynamic version of the LOGCFL-complete problem D₂LREACH(acyclic) can be maintained with first-order updates.     

Limits of the output power in Er3+:ZBLAN singlemodefibre lasers

The saturation of the 2.71 μm laser output has been measured in erbium-doped ZBLAN singlemode fibres with Er³⁺ concentrations of 1000, 5000 and 10000 ppm mol. Limits of the single-mode-laser output are discussed     

Potency comparison of peptidomimetic inhibitors against HIV-1 and HIV-2 proteinases: design of equipotent lead compounds

The results of investigation of haptoglobin (Hp) types in 596 donor blood samples in some towns of Ukraine (Dnepropetrovsk, Kharkov, Odessa, Kiev, Uzhgorod, Zhitomir) are presented. Three normal Hp types (Hp1-1, Hp2-1 and Hp2-2) have been found. The reliable interpopulation differences in the Hp types frequency were not found. On the whole the Hp types frequency in the type Hp1-1 comprised 12.7%. In the type Hp2-1-48.1% and in the type Hp2-2-36.5%. The frequency of the gene Hp1 is 0.38. The frequency of the Hp types and of the gene Hpl in Ukraine is similar to that in population of Eastern Europe and European Part of Russia.     

On the ontological expressiveness of information systems analysis and design grammars

Abstract. Information systems analysis and design (ISAD) methodologies provide facilities for describing existing or conceived real-world systems. These facilities are ontologically expressive if they are capable of describing all real-world phenomena completely and clearly. In this paper we formally examine the notion of the ontological expressiveness of a grammar and discuss some of its implications for the design and use of ISAD methodologies. We identify some generic ways in which ontological expressiveness may be undermined in a grammar and some potential consequences of these violations. We also examine ontological expressiveness within the context of some other desirable features that might be considered in the design of ISAD methodologies.     

Dynamic effects in hot-carrier degradation relevant for CMOS operation

We describe different dynamic degradation effects in n- and p-MOSFETs as they are clearly proven and generally accepted to date. It turns out that they are connected with time constants in the oxide and at the interface and that time constants related to the device operation are too short to be relevant in this context. The effects are detrapping of fixed charges, the slow movement of holes in the oxide, an enhanced-degradation effect caused by alternating voltage conditions, during dynamic stress, and a post-stress interface state formation effect in nitride passivated n-MOSFETs. Furthermore, we discuss the relevance of those effects, under different operation conditions, finding that the fast non-stationary effects are of little significance. Only the “slow” effects, with time constants of seconds and above, play a role in reliability issues of MOSFETs.