Editorial: the March 2022 cover paper

Journal of Materials Science -     

Effect of Co,Pd and Pt ultra-thin films on the Ni-silicide formation: investigating the sandwich configuration

The effect of Co, Pd and Pt ultrathin films on the kinetics of the formation of Ni-silicide by reactive diffusion is investigated. 50 nm Ni/1 nm X/ 50 nm Ni (X?=?Co, Pd, Pt) deposited on Si(100) substrates are studied using in-situ and ex-situ measurements by X-ray diffraction (XRD). The presence of Co, Pd or Pt thin films in between the Ni layers delays the formation of the metal rich phase compared to the pure Ni/Si system and thus these films act as diffusion barriers. A simultaneous silicide formation (δ-Ni₂Si and NiSi phases) different from the classic sequential formation is found during the consumption of the top Ni layer for which Ni has to diffuse through the barrier. A model for the simultaneous growth in the presence of a barrier is developed, and simulation of the kinetics measured by XRD is used to determine the permeability of the different barriers. Atom probe tomography (APT) of the Ni/Pd/Ni system shows that the Pd layer is located between the Ni top layer and δ-Ni₂Si during the silicide growth, in accordance with a silicide formation controlled by Ni diffusion through the Pd layer. The effect of the barrier on the silicide formation and properties is discussed.

     

Ultra-compact with improved data rate optical encoder based on 2D linear photonic crystal ring resonator

Photonic Network Communications - In the present work, a high-speed optical encoder is proposed based on two-dimensional photonic crystal ring resonator using coupled mode theory and resonance...     

Buffer transference strategy for power control in B5G-ultra-dense wireless cellular networks

Wireless Networks - Beyond five generation (B5G) systems will demand strict and heterogeneous service requirements for the emerging applications. One solution to meet these demands is the dense...     

Effect of ‘Zn’ substitution on structural,morphological, magnetic and optical properties of Co–Zn ferrite nanoparticles for ferrofluid application

Journal of Materials Science: Materials in Electronics - The Co1?xZnxFe2O4 (Co–Zn) ferrite nanoparticles with x varying from 0.0 to 0.4 have been manufactured by facile chemical...     

Optical-luminescence properties of ZnO and TiO2 nanopowders obtained by pulsed laser reactive ablation

Journal of Materials Science: Materials in Electronics - The ZnO and TiO2 nanopowders have been prepared by means of the pulsed laser reactive ablation of metallic (Zn, Ti) targets. The Structural,...     

Resistive organic memory devices based on nitrogen-doped CNTs/PSS composites

Journal of Materials Science: Materials in Electronics - Non-volatile organic memory devices were fabricated using polystyrene sulfonate (PSS)?+?nitrogen-doped multi-walled carbon...     

Structure and bandgap determination of InN grown by RP-MOCVD

InN thin films are grown on sapphire substrates by remote plasma-assisted metal organic chemical vapor deposition while varying the indium pulse length and substrate temperature. The effects of the indium pulse length and temperature on the structural, morphological, electronic, and optical properties of the thin films are studied. The structural parameters are determined by X-ray diffraction and X-ray photoelectron spectroscopy and the effects of incorporating oxygen atoms in the structure is described. The N K-edge X-ray absorption spectroscopy (XAS) and X-ray emission spectroscopy (XES) measurements are used to determine the band gap and it is found to be 1.80?±?0.25 eV for all samples. A complementary measurement namely, X-ray excited optical luminescence measurement is performed to confirm the band gap value obtained from XAS and XES measurements. O K-edge XAS measurements are performed to determine the presence of oxygen impurities in the samples. Meanwhile, we carry out the density functional theory calculations for Wurtzite InN, hypothetical Wurtzite-type InO_0.5N_0.5, and InO_0.0625N_0.9375 structures. We find that the measured N-edge spectra agree well with our Wurtzite InN calculations and the measured O K-edge spectra agree better with hypothetical Wurtzite-type InO_0.0625N_0.9375 than Wurtzite-type InO_0.5N_0.5.

     

Synergic effect of Sn-doped TiO2 nanostructures for enhanced visible light photocatalysis

Journal of Materials Science: Materials in Electronics - In the recent years, metal oxides have attracted more interest for researchers because of their applications in energy and...     

Intensity tunable optical limiting behaviour of an organic material 2-aminopyridinium succinate succinic acid single crystal

Journal of Materials Science: Materials in Electronics - A mixed solution of 2-aminopyridine and succinic acid, with a 1:1 molar ratio, was kept at room temperature to develop a 2-aminopridinium...