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Fabrication and characteristics of a 4H-SiC junction barrier Schottky diode
Authors:Chen Fengping  Zhang Yuming  Lü Hongliang  Zhang Yimen  Guo Hui  Guo Xin
Affiliation:School of Microelectronics,Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,Xidian University,Xi'an 710071,China
Abstract:4H-SiC junction barrier Schottky(JBS)diodes with four kinds of design have been fabricated and characterized using two different processes in which one is fabricated by making the P-type ohmic contact of the anode independently,and the other is processed by depositing a Schottky metal multi-layer on the whole anode.The reverse performances are compared to find the influences of these factors.The results show that JBS diodes with field guard rings have a lower reverse current density and a higher breakdown v...
Keywords:4H-SiC  junction barrier Schottky  field guard ring  
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